KR880002996U - 콘덴서 측정회로 - Google Patents

콘덴서 측정회로

Info

Publication number
KR880002996U
KR880002996U KR2019860010331U KR860010331U KR880002996U KR 880002996 U KR880002996 U KR 880002996U KR 2019860010331 U KR2019860010331 U KR 2019860010331U KR 860010331 U KR860010331 U KR 860010331U KR 880002996 U KR880002996 U KR 880002996U
Authority
KR
South Korea
Prior art keywords
condenser
measurement circuit
measurement
circuit
condenser measurement
Prior art date
Application number
KR2019860010331U
Other languages
English (en)
Other versions
KR890004532Y1 (ko
Inventor
감도영
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR2019860010331U priority Critical patent/KR890004532Y1/ko
Publication of KR880002996U publication Critical patent/KR880002996U/ko
Application granted granted Critical
Publication of KR890004532Y1 publication Critical patent/KR890004532Y1/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
KR2019860010331U 1986-07-16 1986-07-16 콘덴서 측정회로 KR890004532Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019860010331U KR890004532Y1 (ko) 1986-07-16 1986-07-16 콘덴서 측정회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019860010331U KR890004532Y1 (ko) 1986-07-16 1986-07-16 콘덴서 측정회로

Publications (2)

Publication Number Publication Date
KR880002996U true KR880002996U (ko) 1988-04-11
KR890004532Y1 KR890004532Y1 (ko) 1989-07-08

Family

ID=19253807

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019860010331U KR890004532Y1 (ko) 1986-07-16 1986-07-16 콘덴서 측정회로

Country Status (1)

Country Link
KR (1) KR890004532Y1 (ko)

Also Published As

Publication number Publication date
KR890004532Y1 (ko) 1989-07-08

Similar Documents

Publication Publication Date Title
DK590187D0 (da) Trykt-kredsloebsantenne
DK638687D0 (da) Baereboelgereproducerende kredsloeb
KR880700419A (ko) 집적회로
DE3886244T2 (de) Kapazitätsmessschaltung.
DE3751708T2 (de) Elektronisches thermometer
KR880700420A (ko) 집적회로
DK600085D0 (da) Integreret kredsloeb
KR870009546A (ko) 지연회로
ATA74886A (de) Messwertaufnehmer
NO850262L (no) Stroemlinjet t-formet intrauterininnretning
DE3751125D1 (de) Feuchtigkeitsmesskreis.
DK437387D0 (da) Maalekredsloeb
KR890700287A (ko) 셀프-타이밍 회로
DE8620276U1 (de) Messzirkel.
KR890700245A (ko) 회로장치
KR880701484A (ko) 커패시터 회로 차단 장치
KR880002996U (ko) 콘덴서 측정회로
KR910013424U (ko) 감도향상회로
KR860700077A (ko) 집적회로 조합소자
KR880012888U (ko) 더미스터를 이용한 특정온도 검지회로
KR890700223A (ko) 전자 체온계
KR870018764U (ko) 저항 측정 회로
KR870019298U (ko) 상태변화 감지회로
KR880013909U (ko) 주파수 변화 감지회로
KR890003237U (ko) 캐패시턴스 측정회로

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 19970829

Year of fee payment: 11

LAPS Lapse due to unpaid annual fee