KR880001082A - 레이저 기록 과정에서의 시스템 동작 정밀도 증진 방법 및 장치 - Google Patents

레이저 기록 과정에서의 시스템 동작 정밀도 증진 방법 및 장치 Download PDF

Info

Publication number
KR880001082A
KR880001082A KR1019870006250A KR870006250A KR880001082A KR 880001082 A KR880001082 A KR 880001082A KR 1019870006250 A KR1019870006250 A KR 1019870006250A KR 870006250 A KR870006250 A KR 870006250A KR 880001082 A KR880001082 A KR 880001082A
Authority
KR
South Korea
Prior art keywords
laser beam
control logic
output
scanning laser
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1019870006250A
Other languages
English (en)
Korean (ko)
Inventor
마인라드 캠프레르
파울 그리우즈
Original Assignee
에른스트 우훌만
라자레이 홀딩 악티엔 게젤샤후트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에른스트 우훌만, 라자레이 홀딩 악티엔 게젤샤후트 filed Critical 에른스트 우훌만
Publication of KR880001082A publication Critical patent/KR880001082A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H10W46/00
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/04Automatically aligning, aiming or focusing the laser beam, e.g. using the back-scattered light
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/007Marks, e.g. trade marks

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Electromagnetism (AREA)
  • Lasers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Laser Beam Processing (AREA)
  • Optical Communication System (AREA)
  • Facsimile Heads (AREA)
  • Exposure Or Original Feeding In Electrophotography (AREA)
  • Optical Recording Or Reproduction (AREA)
KR1019870006250A 1986-06-25 1987-06-19 레이저 기록 과정에서의 시스템 동작 정밀도 증진 방법 및 장치 Withdrawn KR880001082A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH2565/86A CH670211A5 (cg-RX-API-DMAC10.html) 1986-06-25 1986-06-25
CH02565/86-6 1986-06-25

Publications (1)

Publication Number Publication Date
KR880001082A true KR880001082A (ko) 1988-03-31

Family

ID=4236665

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870006250A Withdrawn KR880001082A (ko) 1986-06-25 1987-06-19 레이저 기록 과정에서의 시스템 동작 정밀도 증진 방법 및 장치

Country Status (10)

Country Link
US (1) US4871896A (cg-RX-API-DMAC10.html)
EP (1) EP0253764B1 (cg-RX-API-DMAC10.html)
JP (1) JPS6313687A (cg-RX-API-DMAC10.html)
KR (1) KR880001082A (cg-RX-API-DMAC10.html)
AT (1) ATE61264T1 (cg-RX-API-DMAC10.html)
CH (1) CH670211A5 (cg-RX-API-DMAC10.html)
DE (1) DE3768358D1 (cg-RX-API-DMAC10.html)
ES (1) ES2020580B3 (cg-RX-API-DMAC10.html)
IL (1) IL82761A (cg-RX-API-DMAC10.html)
ZA (1) ZA873900B (cg-RX-API-DMAC10.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5793052A (en) * 1997-03-18 1998-08-11 Nikon Corporation Dual stage following method and apparatus
DE10105794A1 (de) * 2001-02-07 2002-08-08 Philips Corp Intellectual Pty Kommunikationssystem, Verfahren und Signal für zeitlagencodierte Datenübertragung
US7638731B2 (en) * 2005-10-18 2009-12-29 Electro Scientific Industries, Inc. Real time target topography tracking during laser processing
JP5620669B2 (ja) * 2009-10-26 2014-11-05 東芝機械株式会社 レーザダイシング方法およびレーザダイシング装置
EP2508096B1 (en) * 2009-11-30 2015-09-02 YKK Corporation Liquid-tight slide fastener and manufacturing method therefor
JP5452247B2 (ja) * 2010-01-21 2014-03-26 東芝機械株式会社 レーザダイシング装置
US20130200053A1 (en) * 2010-04-13 2013-08-08 National Research Council Of Canada Laser processing control method
JP5981094B2 (ja) 2010-06-24 2016-08-31 東芝機械株式会社 ダイシング方法
JP5140198B1 (ja) 2011-07-27 2013-02-06 東芝機械株式会社 レーザダイシング方法
JP2014011358A (ja) 2012-06-29 2014-01-20 Toshiba Mach Co Ltd レーザダイシング方法
TWI619445B (zh) 2017-08-07 2018-04-01 冠宇拉鍊股份有限公司 防水拉鍊布及其防水拉鍊

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4213117A (en) * 1977-11-28 1980-07-15 Hitachi, Ltd. Method and apparatus for detecting positions of chips on a semiconductor wafer
US4691434A (en) * 1982-02-19 1987-09-08 Lasarray Holding Ag Method of making electrically conductive regions in monolithic semiconductor devices as applied to a semiconductor device
JPH0722166B2 (ja) * 1982-09-22 1995-03-08 株式会社東芝 ダイボンダ等におけるペレツト認識方法
DE3371946D1 (en) * 1983-06-17 1987-07-09 Lasarray Holding Ag Reference determining process for correcting mechanical movements when writing lines in a metallized grid by means of a laser, and apparatus therefor
US4695698A (en) * 1984-07-10 1987-09-22 Larassay Holding Ag Method of, and apparatus for, generating a predetermined pattern using laser radiation

Also Published As

Publication number Publication date
ATE61264T1 (de) 1991-03-15
IL82761A0 (en) 1987-12-20
ES2020580B3 (es) 1991-08-16
EP0253764A1 (de) 1988-01-20
DE3768358D1 (de) 1991-04-11
JPS6313687A (ja) 1988-01-20
IL82761A (en) 1991-09-16
ZA873900B (en) 1987-12-10
US4871896A (en) 1989-10-03
CH670211A5 (cg-RX-API-DMAC10.html) 1989-05-31
EP0253764B1 (de) 1991-03-06

Similar Documents

Publication Publication Date Title
KR880001082A (ko) 레이저 기록 과정에서의 시스템 동작 정밀도 증진 방법 및 장치
ATE165173T1 (de) Vorrichtung zur erzeugung von laserstrahlen
JPS5598842A (en) Position detection system
KR880013147A (ko) 광 디스크 구동장치
JPS61218277A (ja) ダイナミツク スレシユホールド バイナリ イメージ ジエネレータ
ATE130983T1 (de) Positionsmesseinrichtung mit einer unterteilungsschaltung.
KR890007237A (ko) 광기록 매체의 트래킹 방법 및 그 장치
DE59103707D1 (de) Verfahren zur Fehlererkennung und -lokalisierung von redundanten Signalgebern einer Automatisierungsanlage.
KR900018932A (ko) 정보 패턴 판독 장치
KR940006057A (ko) 문자가 불필요한 영상과 접촉된 경우 문자에 관련하여 판독 에러를 감소시키는 광학식 문자 판독 장치
JPS5582380A (en) Pattern processing unit
US4950899A (en) Position detecting circuit with CCD and relatively moving source
JPS5320904A (en) Optical information reader
CA2021744A1 (en) Fast maximum likelihood decoder
ATE173109T1 (de) Kompatibles optisches lesegerät
JPS57104363A (en) Frame pattern discriminating method
SU661830A1 (ru) Устройство дл исправлени стираний
KR910008669A (ko) 트랙점프 제어회로
KR860009395A (ko) 광학 판독 레코드 캐리어상의 광빔 주사용장치
SU1667119A2 (ru) Устройство дл считывани графической информации
JPS5467724A (en) Optical reader
SU684567A1 (ru) Фотоэлектрическое считывающее устройство
JPH0192888A (ja) バーコード検出装置
JPS5555446A (en) Information reader
DE59102457D1 (de) Verfahren zur Ermittlung von Bewegungsinformationen aus Bildsignalen.

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

PC1203 Withdrawal of no request for examination

St.27 status event code: N-1-6-B10-B12-nap-PC1203

WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid
P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000