KR840004572A - 선조체 표면의 요철 검출장치 - Google Patents

선조체 표면의 요철 검출장치 Download PDF

Info

Publication number
KR840004572A
KR840004572A KR1019830001511A KR830001511A KR840004572A KR 840004572 A KR840004572 A KR 840004572A KR 1019830001511 A KR1019830001511 A KR 1019830001511A KR 830001511 A KR830001511 A KR 830001511A KR 840004572 A KR840004572 A KR 840004572A
Authority
KR
South Korea
Prior art keywords
linear structure
detection device
striatum
photoelectric conversion
taken out
Prior art date
Application number
KR1019830001511A
Other languages
English (en)
Other versions
KR870000477B1 (ko
Inventor
에쓰로오 닛다 (외 1)
Original Assignee
나까하라 쓰네오
스미도모덴기 교오교오 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 나까하라 쓰네오, 스미도모덴기 교오교오 가부시기가이샤 filed Critical 나까하라 쓰네오
Publication of KR840004572A publication Critical patent/KR840004572A/ko
Application granted granted Critical
Publication of KR870000477B1 publication Critical patent/KR870000477B1/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Filamentary Materials, Packages, And Safety Devices Therefor (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)

Abstract

내용 없음

Description

선조체 표면의 요철 검출장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 장치의 단면도.
제2도는 광전변화소자 부분의 정면도이다.

Claims (1)

  1. 평행광의 투광부와 그 수광부를 대향배치하고, 양자간에 피검사물을 선조체를 통과시키고, 선조체의 투영면적의 변동에 의한 수광량의 변화를 취출하는 선조체조면의 요철검출장치에 있어서, 상기 수광부에 투영된 상기 선조체의 투영폭보다 긴 변(邊)을 선조체의 통과 방향과 직각으로 향한 한쌍의 광전변환소자를 선조체의 통과 방향으로 일정한 간격을 두고 배치하고, 상기 각 광전변환소자의 전기출력을 차동증폭기에 입력하여 그 차동출력을 취출하는 것을 특징으로 하는 선조체 표면의 요철 검출장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019830001511A 1982-05-10 1983-04-12 선조체 표면의 요철 검출장치 KR870000477B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP57-78644 1982-05-10
JP57078644A JPS58207254A (ja) 1982-05-10 1982-05-10 線条体表面の凹凸検出装置
JP78644 1982-05-10

Publications (2)

Publication Number Publication Date
KR840004572A true KR840004572A (ko) 1984-10-22
KR870000477B1 KR870000477B1 (ko) 1987-03-11

Family

ID=13667568

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019830001511A KR870000477B1 (ko) 1982-05-10 1983-04-12 선조체 표면의 요철 검출장치

Country Status (5)

Country Link
EP (1) EP0093890B1 (ko)
JP (1) JPS58207254A (ko)
KR (1) KR870000477B1 (ko)
CA (1) CA1203597A (ko)
DE (1) DE3372306D1 (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1190091B (it) * 1985-04-26 1988-02-10 Hauni Werke Koerber & Co Kg Dispositivo per sorvegliare un trasportatore tessile per un filone dell'industria di lavorazione del tabacco
GB8806592D0 (en) * 1988-03-19 1988-04-20 Cabot Plastics Ltd Method & apparatus for evaluating surface of object
DE19958993A1 (de) * 1999-12-07 2001-06-28 Christoph Berthold Anordnung zur zerstörungsfreien und berührungslosen Produktionsüberwachung der Dicke und/oder der Geometrie von Fasern in allen Bereichen der Faserproduktion mit Hilfe der Lichtstreuung
EP1643246A1 (en) * 2004-10-01 2006-04-05 Barco NV Compact filamentous material detector
EP2461157B1 (en) 2005-04-21 2018-10-03 Sumitomo Electric Industries, Ltd. Superconducting wire inspection device and inspection method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4007992A (en) * 1975-06-02 1977-02-15 Techmet Company Light beam shape control in optical measuring apparatus
GB1525157A (en) * 1975-08-06 1978-09-20 Ellenberger & Poensgen Multi-pole excess current circuit breaker
FR2389099A1 (fr) * 1977-04-25 1978-11-24 Sopelem Procede optique de controle dimensionnel
JPS5853861B2 (ja) * 1978-04-14 1983-12-01 小林 彬 表面欠陥検出装置
JPS54146656A (en) * 1978-05-08 1979-11-16 Kobe Steel Ltd Method and device for measuring quantity of bend of rod

Also Published As

Publication number Publication date
EP0093890B1 (en) 1987-07-01
JPS58207254A (ja) 1983-12-02
CA1203597A (en) 1986-04-22
DE3372306D1 (en) 1987-08-06
KR870000477B1 (ko) 1987-03-11
EP0093890A3 (en) 1984-08-15
EP0093890A2 (en) 1983-11-16

Similar Documents

Publication Publication Date Title
IT1209442B (it) Rivelatore di fumo polarizzato otticamente.
IT8421570A0 (it) Rivelatore di fughe a flusso in controcorrente con trappola per vapore.
SE420776B (sv) Sett att fixera bilder samt derfor avsedd anordning
FR2545606B1 (fr) Capteur de torseur de forces
SE7703612L (sv) Overgangsdetektor
NL177252B (nl) Bundelvormend stelsel met sterke signaalbegrenzing en bijzondere signaalweging.
KR840009135A (ko) 공연비 검출장치
DE3586233D1 (de) Arithmetischer prozessor mit paralleler akkumulierfunktion.
NL7713485A (nl) Karakterkenmerk-detectiestelsel.
ES509497A0 (es) Aparato para detectar un objeto en una zona de paso.
DK401384D0 (da) Indretning til sammenfoejning af komponenter, isaer posedele
NL7606899A (nl) Opto-elektrisch detectiestelsel.
FR2349136A1 (fr) Capteur de pression
KR840004572A (ko) 선조체 표면의 요철 검출장치
NL178047C (nl) Vaste-stof beeldopneeminrichting met ten minste twee vaste-stofbeeldsensorpanelen.
SE8004005L (sv) Fotodetektoranordning
IT7924174A0 (it) Quantimetro per la rivelazione di contaminanti gassosi con suo dispositivo di diffusione e metodo di suo impiego.
ES507660A0 (es) Perfeccionamientos en los aparatos para detectar y medir la densidad de flujo nuclear .
KR920001192A (ko) 입도분포측정장치
FR2450530B1 (fr) Circuit de detection notamment detecteur am
MX151554A (es) Mejoras en aparato medidor de la presion
GB1023893A (en) Improvements in or relating to liquid level indicators
NL7902282A (nl) Halfgeleiderinrichting met ten minste twee halfgeleiderelementen.
IT8321927A0 (it) Morsa parallela con dispositivo per ridurre compressioni degli spigoli dipendenti dalla forza di fissaggio.
SE8300112L (sv) For anvendning i ett fonster, en dorr eller annan sasom ramkonstruktion utford anordning lempat, langstreckt ramelement

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 19950306

Year of fee payment: 9

LAPS Lapse due to unpaid annual fee