KR20260021049A - 전류 센서 - Google Patents

전류 센서

Info

Publication number
KR20260021049A
KR20260021049A KR1020267000629A KR20267000629A KR20260021049A KR 20260021049 A KR20260021049 A KR 20260021049A KR 1020267000629 A KR1020267000629 A KR 1020267000629A KR 20267000629 A KR20267000629 A KR 20267000629A KR 20260021049 A KR20260021049 A KR 20260021049A
Authority
KR
South Korea
Prior art keywords
substrate
thin plate
magnetic shield
current sensor
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020267000629A
Other languages
English (en)
Korean (ko)
Inventor
마나부 다무라
유우 구마가이
준이치 호소고에
Original Assignee
알프스 알파인 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 알프스 알파인 가부시키가이샤 filed Critical 알프스 알파인 가부시키가이샤
Publication of KR20260021049A publication Critical patent/KR20260021049A/ko
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/18—Screening arrangements against electric or magnetic fields, e.g. against earth's field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
KR1020267000629A 2023-08-24 2024-02-21 전류 센서 Pending KR20260021049A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2023136639 2023-08-24
JPJP-P-2023-136639 2023-08-24
PCT/JP2024/006260 WO2025041367A1 (ja) 2023-08-24 2024-02-21 電流センサ

Publications (1)

Publication Number Publication Date
KR20260021049A true KR20260021049A (ko) 2026-02-12

Family

ID=94731938

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020267000629A Pending KR20260021049A (ko) 2023-08-24 2024-02-21 전류 센서

Country Status (4)

Country Link
JP (1) JPWO2025041367A1 (cg-RX-API-DMAC7.html)
KR (1) KR20260021049A (cg-RX-API-DMAC7.html)
CN (1) CN121569201A (cg-RX-API-DMAC7.html)
WO (1) WO2025041367A1 (cg-RX-API-DMAC7.html)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016148032A1 (ja) 2015-03-18 2016-09-22 トヨタ自動車株式会社 電流センサ
JP2018096793A (ja) 2016-12-12 2018-06-21 株式会社デンソー 電流センサ

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013156123A (ja) * 2012-01-30 2013-08-15 Auto Network Gijutsu Kenkyusho:Kk 電流検出装置及び磁性体コア
JP2015083950A (ja) * 2013-10-25 2015-04-30 株式会社フジクラ 電流検出装置
JP2015194349A (ja) * 2014-03-31 2015-11-05 株式会社フジクラ 電流検出装置
JP6919609B2 (ja) * 2018-03-20 2021-08-18 株式会社デンソー 電流センサ
US20190320524A1 (en) * 2018-04-13 2019-10-17 GM Global Technology Operations LLC Pcba with point field detector and magnetic shielding array located on same side of a conductor
EP3696556A3 (en) * 2019-02-15 2020-09-09 LG Electronics Inc. Printed circuit board assembly
JP7349573B2 (ja) * 2020-05-27 2023-09-22 アルプスアルパイン株式会社 電流センサ

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016148032A1 (ja) 2015-03-18 2016-09-22 トヨタ自動車株式会社 電流センサ
JP2018096793A (ja) 2016-12-12 2018-06-21 株式会社デンソー 電流センサ

Also Published As

Publication number Publication date
JPWO2025041367A1 (cg-RX-API-DMAC7.html) 2025-02-27
CN121569201A (zh) 2026-02-24
WO2025041367A1 (ja) 2025-02-27

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Legal Events

Date Code Title Description
D11 Substantive examination requested

Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D11-EXM-PA0201 (AS PROVIDED BY THE NATIONAL OFFICE)

PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

Q12 Application published

Free format text: ST27 STATUS EVENT CODE: A-1-1-Q10-Q12-NAP-PG1501 (AS PROVIDED BY THE NATIONAL OFFICE)