KR20240150470A - 이상 검지 장치, 기계 시스템 및 이상 검지 방법 - Google Patents

이상 검지 장치, 기계 시스템 및 이상 검지 방법 Download PDF

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Publication number
KR20240150470A
KR20240150470A KR1020247030464A KR20247030464A KR20240150470A KR 20240150470 A KR20240150470 A KR 20240150470A KR 1020247030464 A KR1020247030464 A KR 1020247030464A KR 20247030464 A KR20247030464 A KR 20247030464A KR 20240150470 A KR20240150470 A KR 20240150470A
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KR
South Korea
Prior art keywords
learning
state
condition
abnormality
feature
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KR1020247030464A
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English (en)
Korean (ko)
Inventor
나오토 다카노
요이치 호리사와
Original Assignee
미쓰비시덴키 가부시키가이샤
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Publication of KR20240150470A publication Critical patent/KR20240150470A/ko
Pending legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34—Testing dynamo-electric machines
    • G01R31/343—Testing dynamo-electric machines in operation
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
KR1020247030464A 2022-03-29 2022-03-29 이상 검지 장치, 기계 시스템 및 이상 검지 방법 Pending KR20240150470A (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/015595 WO2023188018A1 (ja) 2022-03-29 2022-03-29 異常検知装置、機械システム及び異常検知方法

Publications (1)

Publication Number Publication Date
KR20240150470A true KR20240150470A (ko) 2024-10-15

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Family Applications (1)

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KR1020247030464A Pending KR20240150470A (ko) 2022-03-29 2022-03-29 이상 검지 장치, 기계 시스템 및 이상 검지 방법

Country Status (6)

Country Link
US (1) US20250216459A1 (https=)
JP (1) JP7260069B1 (https=)
KR (1) KR20240150470A (https=)
CN (1) CN119072667A (https=)
DE (1) DE112022006990T5 (https=)
WO (1) WO2023188018A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7587172B2 (ja) * 2023-03-31 2024-11-20 ダイキン工業株式会社 情報処理装置、方法、およびプログラム
WO2024247716A1 (ja) * 2023-05-31 2024-12-05 パナソニックＩｐマネジメント株式会社 情報処理方法、情報処理装置、及びプログラム
CN121794636A (zh) * 2023-08-21 2026-04-03 发那科株式会社 异常检测装置、控制装置、异常检测方法、程序以及综合型异常检测系统
JP2026047561A (ja) * 2024-09-04 2026-03-16 日立Ｇｅベルノバニュークリアエナジー株式会社 制御棒駆動装置の異常検知装置、異常検知方法、及び、プログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021086220A (ja) 2019-11-25 2021-06-03 キヤノン株式会社 制御方法、制御装置、機械設備、制御プログラム、記録媒体

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102870057B (zh) * 2010-04-08 2015-01-28 株式会社日立制作所 机械设备的诊断装置、诊断方法及诊断程序
JP2013045325A (ja) * 2011-08-25 2013-03-04 Hitachi Ltd 制御システムの制御装置及びエレベータシステム
JP6840953B2 (ja) * 2016-08-09 2021-03-10 株式会社リコー 診断装置、学習装置および診断システム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021086220A (ja) 2019-11-25 2021-06-03 キヤノン株式会社 制御方法、制御装置、機械設備、制御プログラム、記録媒体

Also Published As

Publication number Publication date
JP7260069B1 (ja) 2023-04-18
WO2023188018A1 (ja) 2023-10-05
DE112022006990T5 (de) 2025-01-16
CN119072667A (zh) 2024-12-03
US20250216459A1 (en) 2025-07-03
JPWO2023188018A1 (https=) 2023-10-05

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PA0105 International application

Patent event date: 20240911

Patent event code: PA01051R01D

Comment text: International Patent Application

PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20240911

Comment text: Request for Examination of Application

PG1501 Laying open of application