KR20240082317A - Handler for testing electronic components - Google Patents

Abstract

The present invention relates to a handler for testing electronic components.
The handler according to the present invention has a connection part that allows electronic components to be tested without individual movement of the electronic components separated from the tray while being placed on a tray supplied from the outside.
According to the present invention, the operation efficiency and processing efficiency of the tester are improved.

Description

Handler for testing electronic components {HANDLER FOR TESTING ELECTRONIC COMPONENTS}

The present invention relates to a handler for testing electronic components that electrically connects electronic components loaded on a tray to a tester.

Produced electronic components are tested by testers and then divided into good and defective products, and only good products are shipped.

Generally, electronic components to be tested are supplied to a handler for electronic component testing (hereinafter abbreviated as 'handler'). And the handler electrically connects the electronic components and the tester to enable testing of the electronic components.

Handlers can be manufactured in multiple forms depending on the type of electronic component to be tested, and the form of the test system varies accordingly.

Let's look at three representative types of test systems among many types.

For the handler applied to the test system according to the first form, refer to Republic of Korea Patent Publication No. 10-2009-0044164 (hereinafter referred to as 'Prior Art 1'). The handler of prior art 1 is mainly manufactured for the purpose of electrically connecting the memory element to the tester. The handler according to prior art 1 moves memory elements loaded on a customer tray to a test tray that circulates in a certain circulation path, and electrically connects the memory elements loaded on the test tray to the tester. Then, the memory elements for which the test has been completed are moved from the test tray to the customer tray by the handler, and at this time, the handler classifies the memory elements according to the test results. The role of the test tray in this handler is not only to serve as a carrier for transporting electronic components (memory elements), but it also has a function to ensure proper electrical connection between the electronic components and the tester. Here, the function for electrical connection of the test tray is ensured by ensuring that the spacing between the electronic components seated on the test tray matches the spacing between the test sockets of the tester. To this end, the moving device that moves electronic components from the customer tray to the test tray also performs the function of adjusting the spacing between electronic components in the process of moving the electronic components. In this way, the handler with the test tray provided separately from the customer tray supplied from outside is prepared for testing small-scale but mass-produced electronic components.

The handler applied in the test system according to the second type does not have a separate test tray that circulates to transport electronic components, and is mainly prepared for testing electronic components that are produced in small quantities among many products. Republic of Korea Patent Publication No. 10-2017-0111497 (hereinafter referred to as 'Prior Art 2') proposes a handler to which a test tray is not applied. In the handler according to prior art 2, each moving table that moves back and forth is responsible for transporting the customer tray, and the gap between the electronic components is maintained in the process of moving the electronic components between different loading elements such as the customer tray or the moving table. This can be adjusted. Even in cases where the test tray is not applied, the classification of electronic components according to the test results is performed by the handler.

The third type of test system requires a separate sorter separate from the tester to classify electronic components according to test results. Regarding the sorter, Korean Patent Publication No. 10-2009-0085734, etc. may be referred to. The sorter loads electronic components to be tested on a test board, a type of tray, or sorts electronic components that have been tested according to test results, supporting the efficient performance of a test process that requires a very long test time. For example, when the test time is very long, the time to classify electronic components according to the test results is considerably shorter than the test time. Therefore, electronic components that have been tested in several places are sorted in one sorter, and in the sorting process, electronic components that have been tested are unloaded from the test board, and then electronic components to be tested are loaded onto the test board. ). Accordingly, space efficiency and operation efficiency can be improved in terms of construction and operation of the test system.

Meanwhile, there are additional considerations in the above test systems.

The first consideration is related to types 1 and 2 above, where test times for electronic components are very short. In this case, the handling capacity of the handler may be determined by loading, unloading, and sorting processes that are longer than the test time, and furthermore, the task of moving electronic components between different loading elements also results in a decrease in throughput capacity.

The second consideration is related to the third type above, and is when the test time for electronic components is very long. In this case, defects may exist because the electronic components loaded from the sorter to the test board are electrically connected to the tester. There can be many causes of defects, but in most cases, the main cause is a defect in the electrical connection between electronic components and the tester.

The test board consists of a pocket for loading electronic components and an installation board where the pocket is installed. Therefore, in order for the electronic components loaded in the pocket to be properly electrically connected to the tester, the following three requirements must be satisfied.

First, the electrical connection between the pocket and the installation board must be properly made.

Second, the terminal of the electronic component seated in the pocket and the terminal of the pocket must be in proper electrical contact with each other.

Third, there must be no defects in the electrical circuit of the electronic component itself.

Among the three factors above, the one that occurs most frequently is the failure to satisfy the second requirement due to poor work of the sorter. This second requirement cannot be satisfied if the electronic component is not properly seated in the pocket due to poor sorter work, resulting in a defect in the electrical connection between the electronic component and the pocket.

If a test with a long test time is performed under conditions where the above requirements are disqualified and some electronic components cannot be electrically connected to the tester while electronic components are loaded on the test board, eventually some electronic components cannot be tested. In addition, since the subsequent processing (classification, re-testing, etc.) of some electronic components that were not properly tested and determined to be defective takes time, the operation efficiency of the tester is naturally reduced and the processing capacity is naturally reduced accordingly. do.

The purpose of the present invention is to provide technology for a handler for testing electronic components that can satisfy all of the two considerations described above and, in particular, can be appropriately combined with a sorter.

A handler for testing electronic components according to the present invention includes a connecting portion provided to supply a tray supplied from outside to a tester and electrically connect the electronic components loaded on the tray to the tester; and a control device that controls the connection portion; It includes, wherein the connection part supplies the tray from the outside directly to the tester so that the electronic components loaded on the tray are electrically connected to the tester, thereby connecting the electronic components to the tray for testing the electronic components. The process of separating and moving them individually is omitted.

The connection part includes a supply device that supplies a tray supplied from outside to the tester and retrieves it when the test is completed.

The tester performs a preliminary test to determine whether the requirements necessary to perform the main test are met prior to the main test, which is an electrical characteristics test.

The connection part may further include an exchange device that exchanges the sorter and the tray by sending the tray containing the electronic components for which the main test has been completed to the sorter and receiving the tray containing the electronic components for which the main test is to be performed from the sorter.

A re-seat device that separates and re-seats electronic components that are determined to be defective among the electronic components tested by the tester from the tray; It further includes, wherein the control device controls the electronic component determined to be defective to be re-seated on the tray by the re-seating device, and controls the tester to perform the test again when the re-seating of the electronic component is completed.

a camera for inspecting poor seating of electronic components determined to be defective among the electronic components tested by the tester; a rotary table that rotates the electronic component to a normal state if the defective seating of the electronic component determined through inspection by the camera is caused by the deviation of the electronic component's angular position; and a rotator that rotates the rotary table. It further includes, wherein the control device controls the re-seat device for normal re-seat of the electronic component determined to be poorly seated through the image captured by the camera.

The rotary table is made of a transparent material, the camera is disposed below the rotary table, and the control device controls the re-settling device to move the electronic component determined to be defective to the rotary table, and the camera After reading the seating defect of the electronic component through the captured image, the angular positioning defect of the electronic component is corrected through rotation of the rotary table, and the positioning defect of the electronic component on the X-Y axis is returned to the tray by the re-seating device. Compensation is made by adjusting the movement coordinates of moving electronic components.

The re-seating device includes a picking module that grips or releases electronic components; An elevator that enables gripping or de-grasping of the picking module by elevating the picking module; and a mover that horizontally moves the picking module so that the electronic component held by the picking module can be moved. It includes a picker, wherein the picking module extracts electronic components determined to be defective from the tray and moves them to the rotary table, or moves and stacks the electronic components from the rotary table to the tray; a first opening element that opens the pocket in which the electronic component determined to be defective is seated so that the picker can be extracted; a second opening element that opens the pocket where the electronic component is to be seated so that the picker can be loaded; and a reciprocating device that reciprocates the picker so that the picker is paired with the first open element during a drawing operation of the picker and so that the picker is paired with the second open element during a loading operation of the picker. ; Includes.

The first open element has a first pass hole through which the electronic component held by the picker can pass upward, and the second open element has a first pass hole through which the electronic component held by the picker can pass downward. There are two through holes, and the cross-sectional area of the first through hole is larger than that of the second through hole.

According to the present invention, the following effects are achieved.

First, because the process of separating electronic components from the supplied tray and moving them individually is omitted, the processing capacity for electronic components is improved, especially in tests where the test time is very short.

Second, when a test with a long test time must be performed, the operation efficiency and processing efficiency of the tester are ultimately improved by removing electronic component(s) in a defective state in advance.

Third, by rearranging electronic components that are inappropriate for testing to ensure proper test performance, the tester's operation efficiency and processing efficiency are ultimately improved.

Fourth, in the process of relocating electronic components, the ease of withdrawal work and the precision of resupply work are guaranteed by varying the specifications of the configuration for withdrawing electronic components from the tray and the configuration for resupplying them.

Fifth, especially when combined with a sorter, it goes beyond simply exchanging trays and filters out electronic components that are inappropriate for testing in advance, greatly improving the operability and efficiency of the overall test system.

1 is a conceptual plan view of a tray handled by a handler according to an embodiment of the present invention.
Figure 2 illustrates the combined structure of a handler and sorter for testing electronic components according to the present invention.
Figure 3 is a schematic diagram of a tester coupled to a handler according to one embodiment of the present invention.
Figure 4 is a conceptual plan view of a handler according to an embodiment of the present invention.
Figure 5 shows a cart applied to the handler of Figure 4.
FIG. 6 is a reference diagram for explaining the arrangement relationship between the camera and the rotary table applied to the handler of FIG. 4.
Figure 7 is an excerpt of the socket camera applied to the handler of Figure 4.
Figure 8 is an excerpt of a connection part applied to the handler of Figure 4.
Figure 9 is an excerpt of the supply and demand device configured in the connection part of Figure 8.
Figure 10 is a reference diagram for explaining the operation of the input/output device applied to the supply/demand device of Figure 9.
Figure 11 is an excerpt of the exchange device configured in the connection part of Figure 8.
Figure 12 is an excerpt of the re-seating device applied to the handler of Figure 4.
FIG. 13 shows a portion of FIG. 12 in partial enlargement.
Figure 14 is a flowchart for explaining a first operation example of the handler according to the present invention.
Figure 15 is a flowchart for explaining a second operation example of the handler according to the present invention.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, but for brevity of explanation, descriptions of overlapping or substantially identical configurations will be omitted or compressed as much as possible.

Since the handler according to the present invention may be preferably provided in a form combined with a sorter, the main configuration description below will take the handler according to the present invention considering combination with a sorter as an example.

<Description of the tray>

1 is a conceptual plan view of a tray T handled by a handler according to an embodiment of the present invention.

The tray (T) is composed of an installation board (B) and pockets (P).

The installation board (B) has first contact terminals (T ₁ ) on one side that are in electrical contact with the test sockets of the tester, and a pocket (P) is placed on the second side that can be in electrical contact with the electronic components. It has contact terminals (T ₂ ). Of course, the first contact terminals (T ₁ ) and the second contact terminals (T ₂ ) are electrically connected to each other through an electric circuit. A gripping groove (G) is formed on this installation board (B) for electrical connection with a tester, which will be described later.

The pocket (P) has a seating space (S) for seating electronic components and is installed on the installation board (B). This pocket (P) has connection terminals (T ₃ ), which electrically connect the second contact terminal (T ₂ ) of the installation board (B) with the terminal of the electronic component _. Accordingly, the electronic component seated in the pocket (P) may be electrically connected to the tester through the connection terminal (T ₃ ), the second contact terminal (T ₃ ), and the first contact terminal (T ₁ ). As is well known, this pocket (P) has a locking element (L) for closing the seating space (S), which presses downward on the operating member constituting the locking element (L), as is well known, to close the seating space (S). ) is opened and the seating space (S) is closed when the operating member rises due to elastic force.

<Explanation of relationship between sorter and handler>

Figure 2 shows a structure in which a handler (HR, hereinafter abbreviated as 'handler') for testing electronic components according to the present invention is combined with a sorter (ST).

The handler (HR) is coupled to the right side of the sorter (ST) to provide a tray (T) loaded with electronic components for which the main test has been completed by the sorter (ST) or a tray (T) loaded with electronic components to be tested from the sorter (ST). ) will be received.

In this combined system of the sorter (ST) and the handler (HR), the sorter (ST) unloads the electronic components loaded on the tray (T) from the handler (HR) from the tray (T) and classifies them according to test results. Electronic components to be tested are loaded into the empty tray (T) and then returned to the handler (HR).

Then, the handler (HR) sends the tray (T) loaded on the cart (100) to the sorter (ST) and loads the tray (T) from the sorter (ST) into the cart (100). At this time, the tray (T) sent to the sorter (ST) is loaded with electronic components for which the main test has been completed, and the tray (T) coming from the sorter (ST) is loaded with electronic components for which the main test is to be performed.

As above, the exchange of trays (T) between the sorter (ST) and the handler (HR) (see arrow a) is the same as the technology used between the sorter and the board supply device in the burn-in test system.

However, in the combination system as shown in FIG. 2, the characteristic function of the handler (HR) according to the present invention is to load the tray (T) from the sorter (ST) on the electronic components loaded on the tray (T) before loading it on the cart (100). A preliminary test is in progress. In other words, the handler (HR) according to the present invention can be applied to replace the board supply and demand device that previously exchanged the sorter and tray, and in addition, a preliminary test can be performed on the electronic components loaded on the tray (T). . This will be described later in a different table of contents.

Among the above terms, 'main test' refers to the purpose of determining the quality of electrical characteristics of electronic components before shipping them, and pre-test refers to the main test prior to the main test. This is to check whether the requirements necessary for performance have been met. One of the requirements here, as mentioned in the background technology, is that the electronic components loaded on the tray can be electrically connected to the tester.

For reference, the handler (HR) according to the present invention is coupled to a tester (TESTER) at the rear, and the tester (TESTER) has a socket block (SB) equipped with test sockets (TS) as shown in FIG. 3, The test sockets (TS) are electrically connected to the first contact terminals (T ₁ ) of the tray (T) that are pressed backwards.

<A brief description of the handler configuration>

Figure 4 is a conceptual plan view of a handler (HR) according to an embodiment of the present invention.

As shown in Figure 4, the handler (HR) according to the present invention includes a cart 100, a connection part 200, a re-seat device 300, a camera 400, a rotary table 500, a rotator 600, and a socket camera. It includes (700), a removal table (800), and a control device (900).

Carts 100 are provided in pairs to reduce processing capacity and overall processing time, and can be coupled to or removed from the handler (HR) by an operator. This cart 100 can load trays (T) in the vertical direction as shown in FIG. 5, and the trays (T) loaded with electronic components for which the main test has been completed are supplied to the handler (HR) by the cart 100. , trays (T) loaded with electronic components to be tested can be recovered from the handler (HR) while being loaded on the cart (100).

The connection part 200 supplies the tray T supplied from the outside (the sorter side in this embodiment) to the tester and electrically connects the electronic components loaded on the tray T to the tester. , Performs the function of exchanging the sorter (ST) and tray (T). According to this embodiment, the tray (T) containing the electronic components for which the main test has been completed is supplied by the cart 100, and the tray (T) containing the electronic components to be main tested is supplied by the sorter (ST). In this way, the connection part 200 processes all the trays (T) supplied from the outside through the cart 100 or the sorter (ST). This connection part 200 will be explained differently in the table of contents.

The re-seating device 300 separates and withdraws electronic components determined to be defective among electronic components pre-tested by a tester from the tray T and re-seats them. This re-seating device 300 will also be described later in a different table of contents.

The camera 400 is provided to calculate the degree of defective seating by photographing electronic components that are determined to be defective among electronic components that have been pre-tested.

The rotary table 500 is provided to rotate the electronic component to its normal state when the defective seating of the electronic component determined to be defective through inspection by the camera 400 is caused by the deviation of the electronic component's angular position, and is made of a transparent material. It is provided.

And as shown in FIG. 6, the above camera 400 is placed below the rotary table 500.

The rotator 600 rotates the rotary table 500.

The socket camera 700 is provided to photograph test sockets (TS) in the socket block (SB) of the tester (TESTER). In other words, defects may occur in the Test Socket (TS) due to frequent use. In this case, the Test Socket (TS) cannot function, so periodically check whether the Test Socket (TS) is defective and check the test socket (TS) for defects. It is necessary to replace the socket (TS) at an appropriate time. Therefore, the handler (HR) according to this embodiment is provided with a socket camera 700. As shown in Figure 7, the socket camera 700 includes a camera 710 and a mover 720.

The camera 710 photographs the test socket (TS) visible from the rear.

The mover 720 sequentially moves the camera 710 in the X-axis direction so that the camera 710 can sequentially photograph a plurality of test sockets (TS).

The removal table 800 is provided to ultimately remove the electronic component that has been re-seated by the re-seating device 300 if it is determined to be defective even after being retested. This removal table 800 may be provided as a fixed type, but may also be provided to be movable in the Y-axis or X-axis direction depending on implementation.

The control device 900 controls each of the above components, and the logistics of the tray T and the processing of electronic components accordingly may be referred to in the operation description that will be described later by changing the table of contents.

<Explanation of connection parts>

The connection part 200 includes a supply/demand device 210, a support plate 220, an exchange device 230, an elevator 240, and a moving device 250, as shown in the excerpt of FIG. 8.

The supply device 210 supplies the tray (T) from the sorter (ST) to the tester (TESTER), or retrieves the tray (T) after the pre-test is completed and moves it to the cart 100, and collects the tray from the cart 100. Take (T) and send it to the sorter (ST). To this end, as shown in the excerpt of FIG. 9, the supply/demand device 210 includes an input/output device 211, a rotation source 212, a connector 213, and a drive source 214.

The input/output device 211 is provided as a left and right pair, withdraws the tray T from the cart 100 or inserts the tray T into the cart 100, and includes a first holding member 211a that is rotatable. and a second gripping member 211b.

The first holding member 211a protrudes further forward than the second holding member 211b, and has a latch shape with the front end bent in an 'L' shape.

The second holding member 211b is provided at the rear of the first holding member 211a, has a holding groove GG opening downward, and is integrally coupled with the first holding member 211a.

The rotation circle 212 rotates the first holding member 211a and the second holding member 211b forward and backward, so that the first holding member 211a or the second holding member 211b is rotated as shown in Figures 10 (a) and (b). (211b) is brought into a state in which the tray T is gripped or the grip is released. Here, in FIG. 10, the vertical position of the tray (T) is shown to be changed for comparison purposes, but in reality, the vertical position of the tray (T) does not change and the input/exit machine 211 is raised and lowered to hold the first holding member 211a. ) or the second holding member 211b is in a state in which the tray (T) can be held.

Here, the first holding member 211a has a shape that extends forward more thinly than the second holding member 211b. This is because the gap between the trays T loaded in the vertical direction on the cart 100 is narrow. am. Therefore, when the tray (T) is initially withdrawn from the cart 100, the first holding member (211a) is used, and after the tray (T) is at least partially or fully withdrawn from the cart 100, the second holding member ( 211a) is used. Therefore, the operation of withdrawing the tray T from the cart 100 and moving it to the waiting position (WP, see FIG. 4) is performed in multiple steps, and at this time, the first holding member 211a and the second holding member 211b are Functions sequentially.

That is, when the tray (T) is to be pulled out from the cart (100), the first holding member (211a) first holds the tray (T), and at this time, the front end of the first holding member (211a) is attached to the cart (100). Since one of the trays (T) loaded in the vertical direction must be withdrawn, it must enter the narrow gap between the trays (T). Therefore, the first holding member 211a must have a configuration that allows it to enter the narrow gap between the trays (T). And after moving the tray (T) using the first holding member (211a), the tray (T) is ultimately moved to the waiting position (WP) using the second holding member (211b).

The connector 213 has a gripping protrusion (213a) that can be inserted into the gripping groove (G) of the tray (T). Therefore, when the gripping protrusion (213a) is inserted into the gripping groove (G), the connector 213 is in a state of gripping the tray (T), and when the gripping protrusion (213a) is removed from the gripping groove (G), the connector (213) The tray (T) is in a state where the grip is released.

The drive source 214 moves the input/output device 211, the rotation source 212, and the connector 213 in the Y-axis direction, which is the front-back direction. Accordingly, the tray T held by the first holding member 211a, the second holding member 211b, and the connector 213 can be moved in the forward and backward directions. At this time, when the tray (T) held by the connector 213 is moved backward, the tray (T) is pressed toward the tester (TESTER) and the first contact terminal (T ₁ ) comes into contact with the test socket (TS). The tray (T) and the tester (TESTER) are electrically connected.

The support plate 220 supports the tray (T) that is in the waiting position (WP) or in progress of a pre-test. Here, the support plate 220 may be replaced with a support rail, or the support plate 220 may be provided with a support rail.

The exchange device 230 is configured to exchange the sorter (ST) and the tray (T), and pushes the tray (T) in the standby position (WP) to the sorter (ST) side on the left or moves it to the sorter (ST) side. Pull the tray (T) coming from to the waiting position (WP) on the right. For this purpose, as shown in the excerpt of FIG. 11, the exchange device 230 is provided as a front and rear pair and includes a grip lever 231, a grip source 232, and a moving source 233.

The grip lever 231 has a grip groove 231a, and can grip or release the tray T by rotating it.

The grip source 232 rotates the grip lever 231 forward and backward, thereby allowing the grip lever 231 to grip or release the tray T.

The moving source 233 moves the tray T held by the gripping lever 231 in the X-axis direction by moving the gripping lever 231 in the left and right direction.

The elevator 240 elevates the above supply/receiver 210 and the exchange device 230 to remove the tray (T) loaded in the cart 100 in the vertical direction, or moves the tray (T) to an appropriate position. Allow it to be introduced into the cart (100).

In order to secure processing capacity, the moving device 250 enables loading and unloading of trays (T) on two carts (100) located side by side in the The elevator 240 is moved in the X-axis direction. At this time, when the elevator 240 moves, the supply/demand device 210, the support plate 220, and the exchange device 230 coupled with the elevator 240 also move.

<Description of re-seating device>

The re-seat device 300 performs two functions. The first function is to separate and remove electronic components that were determined to be defective in the pre-test from the tray (T) and then reload them, and the second function is to continuously remove the electronic components that were determined to be defective in the repeated pre-test to the tray (T). ) is a function to withdraw from and move to the removal table (800). To perform these functions, as shown in the excerpt of FIG. 12, the re-seat device 300 includes a picking module 310, an X-axis mover 320, a Y-axis mover 330, and a Z-axis mover 340. .

The picking module 310 is provided to grip or release electronic components, and as shown in the excerpt of FIG. 12 and the partially enlarged view of FIG. 13, the picker 311, the lifting member 312, and the first opening element 313 , includes a first downer 314, a second open element 315, a second downer 316, and a shuttle 317.

The picker 311 adsorbs and grips electronic components or releases the grip.

The lift source 312 lifts the picker 311 so that the picker 311 can grip or release the electronic component. For reference, Figures 12 and 13 show the picker 311 being lowered from the side of the second open element 315 by the lifting source 312.

The first opening element 313 opens the pocket P so that the picker 311 can extract the electronic component from the tray T. To this end, the first open element 313 has a first passage hole 313a of a square shape in order to open the pocket P and allow electronic components to pass through.

The first downer 314 lowers the first opening element 313 so that the first opening element 313 presses the operating member of the pocket P downward to open the pocket P.

The second opening element 315 opens the pocket P so that the picker 311 can load electronic components into the tray T. For this purpose, the second open element 315 has a second passage hole 315a of a square shape through which electronic components can pass.

Additionally, the first open element 313 and the second open element 315 are arranged adjacent to each other in the

The second downer 316 lowers the second opening element 315 so that the second opening element 315 can open the pocket P.

The reciprocating machine 317 moves the picker 311 back and forth in the They are positioned side by side and paired with each other, and when the picker 311 loads electronic components on the tray (T), the picker 311 and the second open element 315 are positioned side by side in the vertical direction so that they are paired with each other. do.

Here, the cross-sectional area of the first through hole 313a is wider than the cross-sectional area of the second through hole 315a. This is because the first through hole 313a is preferably significantly wider than the outer standard of the electronic component in order to pull out the electronic component that is seated out of position from the tray (T), but the second through hole 315a is used to remove the electronic component from the tray (T). This is because it is necessary to guide the tray so that it is seated precisely when loaded on the tray (T), so it is desirable to have an area that is almost the same as the outer standard of the electronic component.

The X-axis mover 320 and the Y-axis mover 330 move the picking module 310 in the ) so that it can be located at the required coordinates above.

The Z-axis mover 340 lowers the picking module 310 to enable the picking or releasing of electronic components by the picking module 310, and also raises the picking module 310 to allow the picking module 310 to move. It functions as an elevator that allows the held electronic component to be moved in the X- and Y-axis directions without interfering with other components.

<Operation Description - Example 1>

This operation description relates to the operation of the handler (HR) and the sorter (ST) under the control of the control device 900 when the sorter (ST) and the handler (HR) are combined. This is explained with reference to FIG. 14.

First, the operator supplies trays (T) containing electronic components for which the main test has been completed to the handler (HR) in a state in which they are loaded on the cart 100 <S101>.

When the cart 100 is supplied to the handler (HR), the control device 900 controls the supply device 210 and the exchange device 230, so that the supply device 210 removes the tray T from the cart 100. It is moved to the standby position (WP) <S102>, and the exchange device 300 pushes the tray (T) in the standby position (WP) toward the sorter (ST). That is, the trays (T) loaded with electronic components for which the main test has been completed are moved to the sorter (ST) through the standby position (WP).

Accordingly, the sorter (ST) pulls and takes the tray (T) on which the main test has been completed, and the tray (T) is moved to the sorter (ST) <S103>. Then, the sorter (ST) unloads the electronic components loaded on the tray (T) and sorts them according to the test results <S104>, and loads the electronic components to be tested on the emptied tray (T) <S105>. At this time, the electronic components may be properly seated on the tray T according to the normal operation of the sorter ST, but the seating condition of some electronic components may be defective due to various mechanical tolerances or operating errors. Meanwhile, when all the electronic components to be tested are loaded on the tray (T), the sorter (ST) sends the tray (T) to the handler (HR), and the exchange device 230 of the handler (HR) is operated by the sorter (ST). Pull the tray (T) coming from the ST) side and move it to the standby position (WP) <S106>. Next, the supply/demand device 210 operates to electrically connect the tray T to the tester <S107>, and then the electronic components are pre-tested by the tester <S108>. And a decision of good or bad is made based on the results of the pre-test <S109>.

If there is no problem in the pre-test, the tray (T) is moved to the cart 100 through the waiting position (WP) by the supply device 210 <S110>.

However, if it is determined in the pre-test that a defect has occurred in the electrical connection of a specific electronic component, the re-seat device 300 operates to separate the electronic component determined to be defective from the tray T and withdraws it <S111>, and then places the electronic component on the rotary table. Move to (500) <S112>. At this time, the picker 311 and the first open element 313 are paired to grip the electronic component by the re-seat device 300.

When the electronic component is placed on the rotary table 500, the camera 400 operates to photograph the electronic component <S113>, and compares the captured image with the previously stored normal image to determine the X-axis of the electronic component placed on the rotary table 500. -Calculate positional defects and angular positional defects in the Y-axis direction <S114>. Here, angular position defects are corrected by rotating the rotary table 500, and electronic components with corrected angular positions are corrected in the X-axis-Y axis direction by adjusting the movement coordinates of the electronic components held by the picker 311. After correcting, re-seat the electronic component on the tray (T) <S115>. At this time, during the re-seating process, the picker 311 and the second open element 315 are paired.

When re-seating is completed, a pre-test <S116> is performed again by the tester, and after re-judgment <S117>, if normal according to the results of the repeated pre-test, the tray (T) is returned to the cart 100. If it is defective, the re-seat device 300 operates to remove the electronic component determined to be defective from the tray T and move it to the removal table 800 <S118>, and then to the tray ( T) is moved to the cart 100.

For reference, the above steps S108, S109, S111 to S117 may be repeated several times. For example, if it is determined to be defective even after re-settlement and re-adjudication once, the re-settlement and re-adjudication process is implemented to repeat the process several times a set number of times.

If a defect occurs repeatedly even though other electronic components have been pre-tested at the same pocket (P) location, it may be a defect in the test socket of the tester rather than an error in the electrical connection between the electronic component and the tray (T). Since the possibility is high, the socket camera 700 is operated to inspect the test socket. Here, the socket camera 700 can be operated once before the operation of the handler (HR) to first check whether the test socket is defective. However, as mentioned, if a situation occurs during which a test socket is suspected to be defective, It is desirable to allow the socket camera 700 to operate.

However, the above operation can be modified in various ways as follows.

First, by giving the second open element 315 with the second through hole 315a the function of correcting the position of the electronic component, it is possible to simply re-seat it without going through the reading process by the camera 400. You might consider an example. In this case, the camera 400 or the rotation table 500 may be omitted.

Second, depending on the processing speed of the sorter (ST), the re-seat process may be repeated multiple times.

Third, it may be considered to omit the re-seating process and move the electronic components determined to be defective in the one-time preliminary tester to the removal table 800. In this case, the re-seat device 300 can be replaced with a removal device that simply removes the electronic component from the tray (T).

<Operation Description - Example 2>

This example can be applied when a tester can test the function of electronic components, and can be considered desirable when the test processing time by the tester is short. This will be explained with reference to FIG. 15.

The operator places trays (T) containing electronic components to be tested on the cart (100) and supplies them to the handler (HR) <S201>.

When the cart 100 is supplied to the handler (HR), the supply device 210 moves the tray (T) from the cart 100 to the waiting position (WP) <S202>, and then moves the tray in the waiting position (WP) Connect (T) electrically to the tester (TESTER) <S203>. Accordingly, the tester tests the electronic components <S204>. Next, it is determined whether it is defective or not <S205>.

If it is determined that there is no problem in the test, the tray T is moved to the cart 100 through the waiting position WP by the supply device 210 <S206>.

Likewise, if it is determined in the test that the function of a specific electronic component is defective, the re-seat device 300 operates to separate and withdraw the electronic component determined to be defective from the tray T <S207>, and then rotates the rotary table 500. ) and move it to <S208>. Of course, even in this case, the picker 311 and the first opening element 313 are paired to grip the electronic component by the re-seat device 300.

When the electronic component is placed on the rotary table 500, the camera 400 operates to photograph the electronic component <S209>, and compares the captured image with the previously stored normal image to determine positional defects in the Calculate positional defects <S210>. And, as in the first example, the angular position defect is corrected by rotating the rotary table 500, and the electronic component whose angular position has been corrected is held by the picker 311 from the rotary table 500 and then the moving coordinates of the electronic component are determined. Through adjustment, the position in the X-axis-Y axis direction is corrected and it is re-seated on the tray (T) <S211>. In this example as well, the picker 311 and the second open element 315 are naturally paired during the re-seat process.

When re-seating is completed, the test is performed again by the tester, and if normal according to the results of the repeated tests through <S212> and re-judgment <S213>, the tray (T) is moved to the cart 100, In the case of a defect, the re-seat device 300 operates to remove the electronic component determined to be defective from the tray T and move it to the removal table 800 <S214>. And the tray T from which the electronic components determined to be defective are separated is moved to the cart 100 by the supply device 210.

Like the first example, this example can be modified in various ways, and in particular, according to this example, the exchange device 230 for exchanging the sorter (ST) and the tray (T) can be omitted.

Meanwhile, the above embodiment has been described considering the case where the tray T is provided with the first contact terminal T ₁ and the second contact terminal T ₂ .

However, as in prior art 1, the present invention can be applied even when the tray is simply provided as a carrier for moving electronic components. For example, even in the case where the electronic components and the tester can be directly electrically connected without a separate connection structure as in prior art 1, the test sockets of the tester are provided in a matrix form, and the spacing between the test sockets is the tray. If the spacing between the electronic components in the loaded state is the same, the electronic components and the tester can be electrically connected directly as they are loaded on the tray supplied from outside without individual movement of the electronic components. In this way, the present invention can be modified into various applications. As in this modified example, one of the main and basic features of the present invention is that the process of separating the electronic components from the tray and moving them individually in order to test the electronic components can be omitted.

As described above, the specific description of the present invention has been made by way of examples with reference to the accompanying drawings. However, since the above-described embodiments are only explained by referring to preferred examples of the present invention, the present invention is limited to the above-described embodiments. It should not be understood as limited, and the scope of rights of the present invention should be understood as the scope of the claims and equivalents described later.

HR: Handler for electronic component testing
200: connection part
210: Supply and demand device
230: Exchange device
300: Reseat device
310: Picking module
311: picker
313: first open element
313a: first through hole
315: second open element
315a: second through hole
320: X-axis mover
330: Y-axis mover
340: Z-axis mover
400: Camera
500: Rotating table
600: Rotator
T: tray
B: Installation board
T ₁ : 1st contact terminal T ₂ : 2nd contact terminal
P: Pocket
T ₃ : Connection terminal
900: Control device

Claims (8)

A connection part provided to supply a tray supplied from outside to the tester and electrically connect the electronic components loaded on the tray to the tester; and
A control device that controls the connection part; Includes,
The connection part is
A supply device that supplies a tray supplied from outside to the tester and retrieves it when the test is completed, and includes an input/output device that withdraws the tray from the cart or inserts the tray into the cart; and
A tray containing electronic components for which the main test, which is an electrical characteristic test, has been completed is sent to the sorter, and a tray containing electronic components to be tested for main testing is received from the sorter, thereby exchanging the sorter and the tray.
The tester performs a pre-test prior to the main test to determine whether the requirements necessary to perform the main test are met,
The connection part supplies the tray from the outside directly to the tester so that the electronic components loaded on the tray are electrically connected to the tester. In order to test the electronic components, the electronic components must be separated from the tray and moved individually. This is omitted
Handler for testing electronic components. In paragraph 1
The connection part processes all the trays supplied from the outside through the cart or the sorter.
Handler for testing electronic components. In paragraph 2
Trays containing electronic components for which main testing has been completed are supplied by the above cart.
Handler for testing electronic components. In paragraph 1
The supply device moves a tray loaded with electronic components that show no abnormalities in a pre-test to the cart.
Handler for testing electronic components. In paragraph 4
It further includes a re-seat device for separating and withdrawing electronic components determined to be defective in a pre-test from the tray,
The supply device moves the tray from which electronic components determined to be defective are separated to a cart.
Handler for testing electronic components. In paragraph 1
The entry and exit device is
a first gripping member that grips or releases the tray; and
A second holding member provided behind the first holding member to hold or release the tray,
The first holding member has a shape that extends forward more thinly than the second holding member and enters the gap between trays to remove one of the trays loaded in the vertical direction on the cart,
The second holding member is used after the tray is at least partially withdrawn from the cart.
Handler for testing electronic components. In paragraph 6
The supply and demand device is
It further includes a rotation circle that rotates the first and second grip members forward and backward so that the first and second grip members are in a state of gripping or releasing the tray,
The first gripping member has a latch shape where the front end is bent into an 'L' shape,
The second gripping member has a gripping groove opening downward and is integrally coupled with the first gripping member.
Handler for testing electronic components. In paragraph 1
The supply and demand device is
A connector capable of gripping or releasing the tray; and
It further includes a driving source capable of moving the connector in the forward and backward directions,
When the tray held by the connector is moved backward, the tray is pressed toward the tester and the tray and the tester are electrically connected.
Handler for testing electronic components.