KR20200057201A - Handler for testing electronic components - Google Patents

Abstract

The present invention relates to a handler for testing an electronic component. According to the present invention, the handler has a connection portion allowing electronic components to be tested without individual movement of electronic components separated from a tray supplied from the outside while being loaded on the tray. According to the present invention, the operation efficiency and processing efficiency of a tester are increased.

Description

Handler for testing electronic parts {HANDLER FOR TESTING ELECTRONIC COMPONENTS}

The present invention relates to a handler for testing an electronic component that electrically connects an electronic component loaded on a tray to a tester.

After the electronic components are produced, they are divided into good and bad products, and only good products are shipped.

In general, the electronic component to be tested is supplied as a handler for electronic component testing (hereinafter abbreviated as 'handler'). In addition, the electronic component and the tester are electrically connected by the handler, so that the electronic component can be tested.

The handler can be manufactured in a number of forms depending on the type of electronic component to be tested, and the form of the test system is changed accordingly.

Let's take a look at three representative test systems among many types.

The handler applied to the test system according to the first form may refer to Korean Patent Publication No. 10-2009-0044164 (hereinafter referred to as 'prior art 1'). The handler of the prior art 1 is mainly manufactured for the purpose of electrically connecting the memory element to the tester. The handler according to the prior art 1 moves the memory element loaded on the customer tray to the test tray circulating a constant circulation path, and electrically connects the memory element loaded on the test tray to the tester. Then, the memory device after the test is moved from the test tray to the customer tray by the handler. At this time, the handler classifies the memory devices according to the test result. The role of the test tray in these handlers also functions as a transporter for transporting electronic components (memory devices), but also functions for proper electrical connection between electronic components and testers. Here, the function for the electrical connection of the test tray is secured by matching the spacing between the electronic components mounted on the test tray to the spacing between the test sockets of the tester. To this end, the moving device that moves the electronic component from the customer tray to the test tray also performs a function of adjusting the spacing between the electronic components in the process of moving the electronic component. As described above, the handler to which the test tray provided separately from the customer tray supplied from the outside is applied is prepared for testing of electronic parts that are mass-produced while being small items.

The handler applied in the test system according to the second aspect does not have a separate test tray that circulates to transport electronic components, and is mainly prepared for testing electronic components produced in small quantities among multiple products. Republic of Korea Patent Publication No. 10-2017-0111497 (hereinafter referred to as 'prior art 2') is a handler that is not applied to the test tray is presented. In the handler according to the prior art 2, each movement table or the like reciprocatingly functions to transport the customer tray, and the distance between the electronic parts in the process of moving the electronic parts between different loading elements such as the customer tray or the movement table. This can be adjusted. Even if the test tray is not applied as described above, the electronic component is classified according to the test result by the handler.

In the third type of test system, a separate sorter separate from the tester is required to classify the electronic parts according to the test result, and Korean Patent Application Publication No. 10-2009-0085734 may be referred to in relation to the sorter. Sorter loads electronic components to be tested on a test board, a type of tray, or classifies electronic components that have been tested according to test results, and helps to efficiently perform a test process with a very long test time. For example, when the test time is very long, the time to classify the electronic parts according to the test result is significantly shorter than the test time. So, the electronic components that have been tested in several places are sorted in one sorter. In addition, the electronic components to be tested are unloaded from the test board in the sorting process, and then the electronic components to be tested are loaded into the test board. ). Accordingly, it is possible to improve the space efficiency and the operation efficiency in terms of the construction and operation of the test system.

Meanwhile, there are additional considerations in the above test systems.

The first consideration is related to the first and second forms above, and the test time for electronic components is very short. In this case, the processing capacity of the handler can be determined by the loading, unloading, and sorting processes longer than the test time, and further, the operation of moving the electronic parts between different loading elements also leads to a reduction in processing capacity.

The second consideration is related to the third form above, where the test time for electronic components is very long. In this case, there may be a defect because the electronic components loaded from the sorter to the test board are electrically connected to the tester. The causes of defects can be various, but most of them are mainly caused by defects in the electrical connection between electronic components and testers.

The test board consists of a pocket for loading electronic components and an installation board in which the pocket is installed. So, in order for the electronic components loaded in the pocket to be properly electrically connected to the tester, the following three requirements must be satisfied.

First, the electrical connection between the pocket and the installation board must be properly made.

Second, the terminal of the electronic component seated in the pocket and the terminal of the pocket should be in electrical contact with each other.

Third, there should be no defects in the electrical circuits of the electronic components themselves.

The most frequent of the above three factors is that the sorter's work is not satisfied and the second requirement is not satisfied. This second requirement cannot be satisfied when the electronic component is not properly seated in the pocket due to the malfunction of the sorter, thereby causing a defect in the electrical connection between the electronic component and the pocket.

If the above requirements are disqualified while the electronic components are loaded on the test board and some electronic components cannot be electrically connected to the tester, a long test time test is performed, eventually some electronic components cannot be tested. In addition, since it takes time for the subsequent processing (classification or retesting) of some electronic components that are not properly tested and determined to be defective, the tester's operation efficiency decreases and the resulting processing capacity decreases. do.

An object of the present invention is to provide a technique for a handler for electronic component testing that can satisfy both of the two considerations described above, and can be properly combined with a sorter.

The handler for testing an electronic component according to the present invention includes a connecting portion provided for supplying a tray supplied from the outside to a tester to electrically connect electronic components loaded on the tray to a tester; And a control device that controls the connection portion. Including, the connection portion is supplied to the tray directly from the outside to the tester so that the electronic components in the state loaded on the tray is electrically connected to the tester, the electronic components for testing of the electronic components and the tray The process of separating and moving individually is omitted.

The connecting portion includes a supply / receiving device for supplying the tray supplied from the outside to the tester and recovering when the test ends.

The tester performs a preliminary test to confirm whether the requirements for performing the main test have been met prior to the main test, which is an electrical property test.

The connection part may further include an exchange device for exchanging the sorter and the tray by sending the tray loaded with the electronic components whose main test has been completed to the sorter, and receiving the tray loaded with the electronic components to be subjected to the main test from the sorter.

A reseating device for separating and reseating an electronic component that has been determined to be defective among the electronic components tested by the tester; Further comprising, the control device controls the electronic component is determined to be re-seated to the tray by the re-seating device, and controls to perform the test again by the tester when the re-seating of the electronic component is completed.

A camera for inspecting a seating defect of an electronic component judged to be defective among electronic components tested by the tester; A rotation table that rotates the electronic component in a normal state when the defective electronic component determined as defective through inspection by the camera is caused to deviate from each position of the electronic component; And a rotating machine rotating the rotating table. Further comprising, the control device controls the re-seating device for the normal re-seating of the electronic component determined as a seating failure through the image taken by the camera.

The rotating table is made of a transparent material, the camera is disposed below the rotating table, and the control device controls the re-seating device to move the electronic component determined to be defective to the rotating table, and by the camera After reading the electronic part's seating defect through the photographed image, the angular position of the electronic part is corrected through the rotation of the rotating table, and the positional defect on the XY axis of the electronic part is returned to the tray by the re-seating device. Correction is made by adjusting the moving coordinates of the moving electronic component.

The reseating device includes a picking module for gripping or releasing the electronic component; An elevator that enables the gripping or holding-off operation of the picking module by elevating the picking module; And a mobile device that allows the electronic components held on the picking module to be moved by horizontally moving the picking module. The picking module includes: a picker for drawing electronic components that are determined to be defective from the tray and moving them to the rotating table or moving and loading electronic components from the rotating table to the tray; A first opening element that opens a pocket on which an electronic component judged to be defective is placed so that the picker withdrawal operation is performed; A second opening element for opening a pocket on which the electronic component is to be seated so that the picker is loaded; And reciprocating the picker so that the picker is paired with the first open element when the picker is withdrawn, and the picker is paired with the second open element when loading the picker. ; It includes.

The first open element has a first through hole through which the electronic component gripped by the picker can pass upwards, and the second open element has a first through hole through which the electronic component gripped by the picker can pass downward. There are two through holes, and the cross-sectional area of the first through hole is larger than that of the second through hole.

According to the present invention has the following effects.

First, since the process of moving the individual parts separated from the tray from which the electronic parts have been supplied is omitted, the processing capacity for the electronic parts is improved, especially in a test with a very short test time.

Second, the operation efficiency and the processing efficiency of the tester are ultimately improved by removing the electronic component (s) in a bad state in advance when a test with a long test time needs to be performed.

Third, by relocating electronic components that are inadequate to perform the test so that the test is properly performed, the tester's operation efficiency and processing efficiency are ultimately improved.

Fourth, in the process of relocating the electronic parts, the specifications of the configuration of withdrawing and resupplying the electronic parts from the tray differ, thereby ensuring the ease of withdrawal and the precision of resupply.

Fifth, in particular, it is possible to significantly improve the operability and efficiency of the overall test system because it is possible to pre-exclude electronic components that are not suitable for performing the test, in addition to simply changing the tray by combining with a sorter.

1 is a conceptual plan view of a tray handled by a handler according to an embodiment of the present invention.
2 illustrates a combination structure of a handler for testing an electronic component and a sorter according to the present invention.
3 is a schematic diagram of a tester coupled to a handler according to an embodiment of the present invention.
4 is a conceptual plan view of a handler according to an embodiment of the present invention.
5 shows a cart applied to the handler of FIG. 4.
FIG. 6 is a reference diagram for explaining an arrangement relationship between a camera and a rotation table applied to the handler of FIG. 4.
FIG. 7 is an excerpt of the socket imager applied to the handler of FIG. 4.
8 is an excerpt of the connection portion applied to the handler of FIG. 4.
9 is an excerpt of the supply and demand device configured in the connection portion of FIG.
10 is a reference diagram for explaining the operation of the input and output machine applied to the supply and reception device of FIG.
11 is an excerpt of an exchange device configured in the connection portion of FIG. 8.
12 is an excerpt of the reseat device applied to the handler of FIG. 4.
FIG. 13 is a partially enlarged view of FIG. 12.
14 is a flowchart illustrating a first operation example of a handler according to the present invention.
15 is a flowchart illustrating a second operation example of the handler according to the present invention.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, but for the sake of brevity, descriptions of redundant or substantially identical configurations are omitted or compressed as much as possible.

In addition, the handler according to the present invention can be preferably considered to be provided in a form in which it is combined with the sorter. In the following description of the main configuration, the handler according to the present invention considering the combination with the sorter will be described as an example.

<Description of the tray>

1 is a conceptual plan view of a tray T handled by a handler according to an embodiment of the present invention.

The tray T includes an installation board B and pockets P.

The installation board (B) has a first contact terminal (T ₁ ) that is in electrical contact with the test sockets of the tester on one side thereof, and a second pocket that can be in electrical contact with electronic components by placing a pocket (P) It has contact terminals (T ₂ ). Of course, the first contact terminals T ₁ and the second contact terminals T ₂ are electrically connected to each other through an electric circuit. A gripping groove G is formed on the installation board B for electrical connection with a tester, which will be described later.

Pocket (P) is provided with a seating space (S) for seating the electronic components, it is installed on the installation board (B). These pockets (P) have connection terminals (T ₃ ), the connection terminal (T ₃ ) is electrically connected between the second contact terminal (T ₂ ) of the installation board (B) and the terminal of the electronic component. Accordingly, the electronic component seated in the pocket P may be electrically connected to the tester through the connection terminal T ₃ , the second contact terminal T ₃ , and the first contact terminal T ₁ . This pocket (P) has a locking element (L) for closing the seating space (S), as is well known, which is known as the seating space (S) by pressing the operating member forming the locking element (L) downward ) Is opened, and the seating space S is closed when the operating member is raised by the elastic force.

<Description of the relationship between Sorter and Handler>

2 illustrates a structure in which a handler for testing an electronic component according to the present invention (HR, hereinafter referred to as 'handler') is combined with a sorter (ST).

The handler HR is coupled to the right side of the sorter ST to provide a tray T loaded with electronic components whose main test has been completed by the sorter ST, or a tray T loaded with electronic components to be tested from the sorter ST. ).

In the combination system of the sorter ST and the handler HR, the sorter ST classifies the electronic components loaded on the tray T from the handler HR from the tray T and sorts them according to the test result, After the electronic components to be tested are loaded in the empty tray T, it is returned to the handler HR.

And the handler HR sends the tray T which is supplied while being loaded in the cart 100 to the sorter ST, and loads the tray T coming from the sorter ST into the cart 100. At this time, the tray T sent to the sorter ST is loaded with electronic components whose main test has been completed, and the tray T coming from the sorter ST is loaded with electronic components to be tested.

As described above, the exchange of the tray T between the sorter ST and the handler HR (see arrow a) is the same as the technology made between the sorter and the board receiving device in the burn-in test system.

However, the characteristic function of the handler HR according to the present invention in the coupling system shown in FIG. 2 is to the electronic components loaded on the tray T before loading the tray T from the sorter ST to the cart 100. Preliminary test is in progress. That is, the handler HR according to the present invention can be applied as a substitute for a board supply and demand device that has previously exchanged a sorter and a tray, and in addition, it is possible to conduct a pre-test on electronic components loaded on the tray T. . This will be described later with different contents.

Among the above terms, the term 'main test' is intended to determine whether the electronic components are good for electrical characteristics before shipping the produced electronic parts, and the pre-test refers to the main test prior to the main test. It is to check whether the requirements necessary to perform have been met. One of the requirements here is that the electronic components on the tray are in a state where they can be electrically connected to the tester as mentioned in the background art.

For reference, the handler HR according to the present invention has a tester TESTER coupled to the rear thereof, and the tester TESTER has a socket block SB having test sockets TS as shown in FIG. 3, The test sockets TS are electrically connected to the first contact terminals T ₁ of the tray T that is pushed rearward.

<Schematic description of the configuration of the handler>

4 is a conceptual plan view of a handler HR according to an embodiment of the present invention.

As shown in FIG. 4, the handler HR according to the present invention includes a cart 100, a connecting portion 200, a reseating device 300, a camera 400, a rotating table 500, a rotating machine 600, and a socket photographing machine. 700, a removal table 800 and a control device 900.

The cart 100 is provided in pairs to shorten the processing capacity and the overall processing time, and the worker can be coupled to or removed from the handler HR. 5, the cart 100 may load the trays T in the vertical direction, as shown in FIG. 5, and the trays T on which the main electronic components have been tested are supplied to the handler HR by the cart 100 , The trays (T) loaded with electronic components to be the main test can be recovered from the handler (HR) while loaded in the cart (100).

The connection part 200 supplies the tray T, which has been supplied from the outside (in this embodiment, the sorter side) to the tester, thereby electrically connecting the electronic components loaded on the tray T to the tester, , It performs the function of exchanging the sorter (ST) and the tray (T). According to the present embodiment, the tray T on which the electronic components having the main test is loaded is supplied by the cart 100, and the tray T on which the electronic components to be main tested is supplied by the sorter ST. Coming, the connection part 200 processes all the trays T supplied from the outside through the cart 100 or the sorter ST. The connection part 200 will be described with a different table of contents.

The re-seating device 300 separates and pulls out the electronic parts that have been determined as defective among the electronic parts that have been pre-tested by the tester from the tray T, and then re-secures them. The re-seating device 300 will be described later with a different table of contents.

The camera 400 is provided to photograph an electronic component judged to be defective among electronic components that have been pre-tested and calculate the degree of seating defect.

The rotary table 500 is provided to rotate the electronic components in a normal state when the failure of the electronic components is determined to be defective through the inspection by the camera 400, causing the electronic components to deviate from each position. It is provided.

And, as shown in Figure 6, the camera 400 is disposed below the rotary table 500.

The rotating machine 600 rotates the rotating table 500.

The socket photographing unit 700 is provided to photograph the test sockets TS in the socket block SB of the tester TESTER. That is, a defect may occur in the test socket TS due to frequent use. In this case, the test socket TS does not function, and thus the test socket TS is periodically checked for defects, thereby causing a defect. It is necessary to replace the socket TS in a timely manner. Therefore, the handler HR according to the present embodiment includes a socket photographing unit 700. As shown in FIG. 7, the socket photographing unit 700 includes a photographing unit 710 and a mover 720.

The photographing unit 710 photographs the test socket TS seen from the rear.

The mover 720 sequentially moves the camera 710 in the X-axis direction so that the camera 710 can sequentially shoot a plurality of test sockets TS.

The removal table 800 is provided to ultimately remove the electronic component that is determined to be defective when the electronic component reseated by the reseating apparatus 300 is determined to be defective even after being retested. The removal table 800 may be provided as a fixed type, but may be provided to be movable in the Y-axis or X-axis direction depending on the implementation.

The control device 900 controls each of the above components, and thus, the logistics of the tray T and the processing of the electronic parts may be referred to in an operation description to be described later with different contents.

<Description of connection part>

The connection part 200 includes a supply and reception device 210, a support plate 220, an exchange device 230, an elevator 240 and a mobile device 250, as in the excerpt of FIG. 8.

The supply / receiving device 210 supplies the tray T from the sorter ST to the tester or recovers the tray T after the pre-test is completed and moves it to the cart 100, and the tray from the cart 100 Take (T) and send it to the sorter (ST) side. To this end, as shown in the excerpt of FIG. 9, the supply / reception device 210 includes an in / out machine 211, a rotating source 212, a connector 213, and a driving source 214.

The input / output machine 211 is provided in a pair of left and right, and withdraws the tray T from the cart 100 or draws the tray T into the cart 100, and includes a first gripping member 211a rotatably provided And a second gripping member 211b.

The first gripping member 211a protrudes more forward than the second gripping member 211b, and has a clasp shape in which the front end is bent in an 'a' (base) shape.

The second gripping member 211b is provided at the rear of the first gripping member 211a, has a gripping groove GG opened downward, and is integrally coupled with the first gripping member 211a.

The rotation source 212 rotates the first gripping member 211a and the second gripping member 211b forward and backward, such that the first gripping member 211a or the second gripping member is as shown in FIGS. 10A and 10B. 211b makes the tray T grip or release the grip. Here, although the upper and lower positions of the tray T have been changed for comparison, the upper and lower positions of the tray T are not changed, and the first and second gripping members 211a are lifted by the elevator 211. ) Or the second gripping member 211b is in a state capable of gripping the tray T.

Here, the first gripping member 211a has a shape that extends forward more finely than the second gripping member 211b, because the space between the trays T loaded in the vertical direction on the cart 100 is narrow. to be. Therefore, when the tray T is initially withdrawn from the cart 100, the first gripping member 211a is used, and after the tray T is withdrawn at least partially or entirely from the cart 100, the second gripping member ( 211a) is used. Therefore, the operation of moving the tray T out of the cart 100 and moving it to the standby position (WP, see FIG. 4) is performed in multiple stages. At this time, the first gripping member 211a and the second gripping member 211b are It functions sequentially.

That is, when the tray T is to be withdrawn from the cart 100, the first gripping member 211a first grips the tray T. At this time, the front end of the first gripping member 211a is attached to the cart 100. Since one of the trays (T) stacked in the up-and-down direction has to be pulled out, the tray (T) and the tray (T) must enter at a narrow interval. Therefore, the first gripping member 211a must have a configuration capable of entering at a narrow interval between the tray T and the tray T. And after the operation of moving the tray T using the first gripping member 211a, the tray T is ultimately moved to the standby position WP using the second gripping member 211b.

The connector 213 has a gripping projection 213a that can be inserted into the gripping groove G of the tray T. Therefore, when the gripping protrusion 213a is inserted into the gripping groove G, the connector 213 is in a state of gripping the tray T, and when the gripping protrusion 213a is removed from the gripping groove G, the connector 213 The tray T is released.

The driving source 214 moves the input / output machine 211, the rotating source 212, and the connector 213 in the Y-axis direction, which is a front-rear direction. Accordingly, the tray T gripped by the first gripping member 211a, the second gripping member 211b, and the connector 213 may be moved in the front-rear direction. At this time, when the tray T held by the connector 213 is moved to the rear, the tray T is pressed toward the tester (TESTER) and the first contact terminal T ₁ is brought into contact with the test socket TS. The tray T and the tester are electrically connected.

The support plate 220 supports the tray T in the standby position WP or in which the pre-test is in progress. Here, the support plate 220 may be replaced with a support rail, or the support plate 220 may be provided to have a support rail.

The exchange device 230 is configured to exchange the tray T with the sorter ST, and pushes the tray T in the standby position WP to the side of the sorter ST on the left side or the sorter ST side. Pull the tray (T) coming from to the standby position (WP) on the right. To this end, as shown in the excerpt of FIG. 11, the exchange device 230 is provided in a pair of front and rear and includes a grip lever 231, a wave support 232, and a moving source 233.

The gripping lever 231 has a gripping groove 231a, and the tray T can be gripped or released by rotation.

The wave support 232 rotates the grip lever 231 forward and backward to allow the grip lever 231 to grip or release the tray T.

The moving source 233 moves the tray T gripped by the gripping lever 231 in the X-axis direction by moving the gripping lever 231 in the X-axis direction, which is a left-right direction.

The elevator 240 allows the tray T loaded in the vertical direction to be pulled out of the cart 100 by lifting the supply / receiving device 210 and the exchange device 230 above, or the tray T is placed at an appropriate position. It is possible to draw the cart 100.

The mobile device 250 enables the input / output operation of the tray T to the two carts 100 arranged side by side in the X-axis direction to secure the processing capacity, or to utilize the two testers (TESTER). The elevator 240 is moved in the X-axis direction. At this time, when the elevator 240 is moved, the supply and demand device 210, the base plate 220 and the exchange device 230 combined with the elevator 240 are also moved.

<Description of the reseat device>

The reseating device 300 performs two functions. The first function is a function of separating and reloading the electronic component which is judged to be defective in the preliminary test from the tray T, and the second function is to continuously load the electronic component judged to be defective in the repetitive pretest (T It is a function to withdraw and move to the removal table 800. In order to perform these functions, as shown in the excerpt of FIG. 12, the re-seating device 300 includes a picking module 310, an X-axis mover 320, a Y-axis mover 330, and a Z-axis mover 340. .

The picking module 310 is provided for gripping or releasing the electronic component, and the picker 311, the lifter 312, and the first open element 313 as in the excerpt of FIG. 12 and the partial enlarged view of FIG. , A first downer 314, a second open element 315, a second downer 316 and a reciprocator 317.

The picker 311 adsorbs electronic parts to grip or release the grip.

The lifter 312 elevates the picker 311 so that the picker 311 can grip or release the electronic component. For reference, FIGS. 12 and 13 illustrate a state in which the picker 311 is lowered from the second open element 315 by the lifter 312.

The first opening element 313 opens the pocket P so that the picker 311 can withdraw electronic components from the tray T. To this end, the first opening element 313 has a first through hole 313a having a square shape in order to allow the electronic component to pass through while the pocket P can be opened.

The first downer 314 lowers the first opening element 313 to allow the first opening element 313 to press the operating member of the pocket P downward to open the pocket P.

The second opening element 315 opens the pocket P so that the picker 311 can load electronic components into the tray T. To this end, the second opening element 315 has a second through hole 315a having a square shape through which electronic components can pass.

In addition, the first open element 313 and the second open element 315 are disposed side by side adjacent to each other in the X-axis direction, and are detachably provided to be replaceable because the size of the electronic component to be tested can be changed.

The second downer 316 lowers the second opening element 315 to allow the second opening element 315 to open the pocket P.

The reciprocator 317 reciprocates the picker 311 in the X-axis direction, whereby the picker 311 and the first opening element 313 move up and down when the picker 311 withdraws an electronic component from the tray T. To be positioned side by side to pair with each other, and when the picker 311 loads the electronic component into the tray T, the picker 311 and the second open element 315 are positioned side by side in the vertical direction to be paired with each other. do.

Here, the cross-sectional area of the first through hole 313a is larger than that of the second through hole 315a. Because, it is preferable that the first through hole 313a is considerably wider than the outer specification of the electronic part in order to withdraw the electronic part seated outside the fixed position from the tray T, but the second through hole 315a is an electronic part. This is because it is desirable to have a width that is almost the same as the outer standard of the electronic component because it is necessary to guide the seating accurately when being loaded on the tray T.

The X-axis mover 320 and the Y-axis mover 330 move the picking module 310 in the X-axis or Y-axis direction, so that the picking module 310 has a tray T, a rotation table 500, or a removal table 800 ) So that it can be located at the required coordinates above.

The Z-axis mover 340 enables the gripping or releasing of electronic components by the picking module 310 by lowering the picking module 310, and also the picking module 310 is raised to raise the picking module 310. It functions as an elevator that allows the gripped electronic components to move in the X-axis and Y-axis directions without interference with other configurations.

<Operation Explanation-First Example>

This operation description relates to the operation of the handler HR and the sorter ST according to the control of the control device 900 when the sorter ST and the handler HR are combined. This will be described with reference to FIG. 14.

First, the operator supplies the handlers HR with the trays T loaded with the electronic components whose main tests have been completed loaded on the cart 100 <S101>.

When the cart 100 is supplied to the handler HR, the control device 900 controls the supply and reception device 210 and the exchange device 230, so that the supply and reception device 210 removes the tray T from the cart 100. Move to the standby position WP <S102>, and the exchange device 300 pushes the tray T in the standby position WP to the sorter ST side. That is, the trays T on which the electronic components having the main test are loaded are moved to the sorter ST through the standby position WP.

Accordingly, the sorter ST moves the tray T to the sorter ST by pulling and pulling the tray T whose main test has been completed <S103>. Then, the sorter ST classifies the electronic components loaded on the tray T according to the test result <S104>, and the empty tray T loads electronic components to be subjected to the main test <S105>. At this time, according to the normal operation of the sorter ST, the electronic components may be properly seated on the tray T, but the seating state of some electronic components may be defective due to various mechanical tolerances or operating errors. On the other hand, when all of the electronic components to be tested are loaded on the tray T, the sorter ST sends the corresponding tray T to the handler HR, and the exchange device 230 of the handler HR is the sorter ( ST) Pull the tray T coming from the side and move it to the standby position WP <S106>. Then, the supply / reception device 210 operates to electrically connect the tray T to the tester TESTER, and then pre-test electronic components by the tester TESTER. Then, determination of good or bad is made according to the result of the pre-test <S109>.

If there is no abnormality in the pre-test, the tray T is moved to the cart 100 via the standby position WP by the supply / receiving device 210 <S110>.

However, if it is determined in the pre-test that a defect has occurred in the electrical connection of a specific electronic component, the re-seating device 300 operates to separate the electronic component judged to be defective from the tray T and pull it out <S111>, and then rotate the table. Move to (500) <S112>. At this time, the picker 311 and the first open element 313 are paired for gripping the electronic component by the reseating device 300.

 When the electronic component is placed on the rotary table 500, the camera 400 operates to shoot the electronic component <S113>, and compares the photographed image with a previously stored normal image to compare the X-axis of the electronic component placed on the rotary table 500 -Calculate the position defect and angular position defect in the Y-axis direction <S114>. Here, the angular position defect is corrected by rotating the rotary table 500, and the electronic component whose angular position is corrected is defective in the X-axis direction through the adjustment of the movement coordinates of the electronic component gripped by the picker 311. After correcting, the electronic component is re-seated on the tray T <S115>. At this time, in the re-seating process, the picker 311 and the second open element 315 are paired.

When the re-seating is completed, the pre-test <S116> is again performed by the tester (TESTER), and after the trial <S117>, the tray T is transferred to the cart 100 in the normal case according to the result of the repeated pre-test. If it is defective, and if it is defective, the re-seating device 300 is operated to withdraw the electronic component that has been determined as defective from the tray T, move it to the removal table 800, and then remove the defective electronic component from the tray (S118) ( T) is moved to the cart 100.

For reference, the above steps S108, S109, S111 to S117 may be repeated several times. For example, if a bad decision is made even after the re-seating and the trial have been made once, it is implemented to repeat the re-seating and the trial process several times again.

If, in spite of other electronic components being pre-tested in the same pocket (P) position, the defect repeatedly occurs, the test socket of the tester (TESTER) is defective rather than an error in the electrical connection between the electronic component and the tray (T). Since the possibility is high, the socket photographing device 700 is driven to test the test socket. Here, the socket photographing unit 700 may be basically driven to check whether the test socket is defective first by driving it once before the handler HR is operated, but as mentioned, if a test socket is suspected to be defective, It is preferable that the socket photographing unit 700 is driven.

However, the above operation can be variously modified as follows.

First, the second open element 315 having the second through hole 315a is provided with a function to correct the position of the electronic component, so that it does not go through the reading process by the camera 400, but simply re-secures. You might consider an example. In this case, the camera 400 or the rotary table 500 may be omitted.

Second, the re-seating process may be repeated multiple times depending on the processing speed of the sorter ST.

Third, it is also possible to omit the re-seating process, and to move the electronic component that is determined to be defective in the pre-tester once to the removal table 800. In this case, the re-seating device 300 may be simply replaced with a removing device that removes electronic components from the tray T.

<Operation Explanation-Second Example>

This example can be applied when a tester (TESTER) can test the function of an electronic component, and can be preferably considered when a test processing time by the tester (TESTER) is short. This will be described with reference to FIG. 15.

The operator supplies the handlers HR with the trays T on which the electronic components to be tested are loaded on the cart 100 <S201>.

When the cart 100 is supplied to the handler HR, the supply / reception device 210 moves the tray T from the cart 100 to the standby position WP <S202>, and then the tray at the standby position WP. (T) is electrically connected to the tester (TESTER) <S203>. Accordingly, the tester (TESTER) will test the electronic components <S204>. Subsequently, it is determined whether it is defective <S205>.

If it is determined in the test that there is no abnormality, the tray T is moved to the cart 100 via the standby position WP by the supply / receiving device 210 <S206>.

Likewise, if it is determined in the test that the function of a specific electronic component is defective, the re-seating device 300 operates to separate and pull out the electronic component judged to be defective from the tray T, and then rotate the rotary table 500 ) To <S208>. Of course, even at this time, the picker 311 and the first opening element 313 are paired for gripping the electronic component by the reseating device 300.

 When the electronic component is placed on the rotary table 500, the camera 400 operates to photograph the electronic component <S209>, and compares the photographed image with a pre-stored normal image to determine the position of the defect in the X-axis and Y-axis directions. The position defect is calculated <S210>. And, as in the first example, the angular position defect is corrected by rotating the rotary table 500, and the electronic component whose angular position is corrected is gripped by the picker 311 from the rotary table 500, and then the moving coordinates of the electronic component. The position in the X-Y-axis direction is corrected through the adjustment of <S211>. In this example, the picker 311 and the second open element 315 are naturally paired in the re-seating process.

When the re-seating is completed, the test is performed again by the tester (TESTER), and if it is normal according to the result of the repeated test through <S212>, the trial <S213>, the tray T is moved to the cart 100, In the case of a defect, the re-seating device 300 operates to withdraw the electronic component determined as defective from the tray T and move it to the removal table 800 <S214>. In addition, the tray T, in which the electronic components determined to be defective are separated, is moved to the cart 100 by the supply / reception device 210.

In the same manner as in the first example, the present example can be variously modified, and according to this example, it is possible to omit the exchange device 230 for exchanging the sorter ST and the tray T.

Meanwhile, the above embodiment has been described in consideration of the case where the tray T is provided with the first contact terminal T ₁ and the second contact terminal T ₂ .

However, as in the prior art 1, the present invention can be applied even when the tray is simply provided as a carrier for moving electronic components. For example, even in the case where the electronic component and the tester can be directly electrically connected without posting a separate connection structure as in the prior art 1, the test socket of the tester is provided in a matrix form, and the spacing between the test sockets is a tray. If it is equal to the spacing between the electronic components in the loaded state, the electronic components and the tester can be electrically connected to the electronic components as they are on the tray supplied from the outside without individual movement of the electronic components. As such, the present invention can be modified in various applications. As in this modified example, the present invention is one of the main basic features that the process of separately moving an electronic component from a tray for testing an electronic component can be omitted.

As described above, the detailed description of the present invention has been made by the embodiments with reference to the accompanying drawings, but since the above-described embodiments have been described with reference to preferred examples of the present invention, the present invention is limited to the above-described embodiments. It should not be understood as being limited, and the scope of rights of the present invention should be understood as the following claims and their equivalents.

HR: Electronic component test handler
200: connection part
210: supply and demand equipment
230: exchange device
300: reseating device
310: picking module
311: Picker
313: first open element
313a: 1st through hole
315: second open element
315a: second through hole
320: X axis mover
330: Y axis mover
340: Z axis mover
400: camera
500: rotating table
600: rotator
T: Tray
B: Installation board
T ₁ : First contact terminal T ₂ : Second contact terminal P: Pocket
T ₃ : Connection terminal
900: Control device

Claims (9)

A connecting portion provided to supply the tray supplied from the outside to the tester to electrically connect the electronic components loaded on the tray to the tester; And
A control device for controlling the connection portion; It includes,
The connection part separates the electronic components from the tray for testing of electronic components by individually supplying the tray from the outside to the tester so that electronic components loaded on the tray are electrically connected to the tester. The process to be done is omitted
Handler for electronic component testing. According to claim 1,
The connection part includes a supply and reception device for supplying a tray that has been supplied from the outside to the tester and recovering when the test ends.
Handler for electronic component testing. The method of claim 12,
The tester performs a pre-test to confirm whether the requirements for performing the main test have been met prior to the main test, which is an electrical property test.
Handler for electronic component testing. According to claim 3,
The connection part further includes an exchange device for exchanging the sorter and the tray by sending the tray loaded with the electronic components to which the main test is completed to the sorter, and receiving the tray loaded with the electronic components to be subjected to the main test from the sorter.
Handler for electronic component testing. According to claim 1,
A reseating device for separating and reseating an electronic component that has been determined to be defective among the electronic components tested by the tester; Further comprising,
The control device controls the electronic component to be re-seated to the tray by the re-seating device, and controls to perform the test again by the tester when the re-seating of the electronic component is completed.
Handler for electronic component testing. The method of claim 65,
A camera for inspecting a seating defect of an electronic component judged to be defective among electronic components tested by the tester;
A rotation table that rotates the electronic component in a normal state when the defective electronic component determined as defective through inspection by the camera is caused to deviate from each position of the electronic component; And
A rotating machine rotating the rotating table; Further comprising,
The control device controls the re-seating device for normal re-seating of an electronic component determined to have poor seating through an image photographed by the camera.
Handler for electronic component testing. The method of claim 6,
The rotary table is made of a transparent material,
The camera is disposed below the rotary table,
The control device controls the re-seating device to move the electronic component determined to be defective to the rotating table, and after reading the defective electronic component through the image captured by the camera, the angular position of the electronic component is defective. Correction is made through rotation of the rotating table, and defects on the XY axis of the electronic component are corrected by adjusting the movement coordinates of the electronic component moving back to the tray by the re-seating device.
Handler for electronic component testing. The method of claim 5,
The reseating device,
Picking module for gripping or releasing the electronic parts;
An elevator that enables the gripping or holding-off operation of the picking module by elevating the picking module; And
A mover that allows the electronic components held on the picking module to be moved by horizontally moving the picking module; Including,
The picking module,
A picker for fetching electronic components that are determined to be defective from the tray and moving them to the rotating table or moving electronic components from the rotating table to the tray;
A first opening element that opens a pocket on which an electronic component judged to be defective is placed so that the picker withdrawal operation is performed;
A second opening element that opens a pocket on which the electronic component is to be seated so that the picker loads; And
A reciprocating unit that moves the picker to reciprocate so that the picker is paired with the first open element during the picker's withdrawal operation, and when the picker is loaded, the picker is paired with the second open element; Containing
Handler for electronic component testing. The method of claim 8,
The first open element has a first through hole through which the electronic component gripped by the picker can pass upward,
The second open element has a second through hole through which the electronic component gripped by the picker can pass downward,
The cross-sectional area of the first through hole is larger than that of the second through hole.
Handler for electronic component testing.

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