KR20230110007A - Handling apparatus for testing electronic component - Google Patents

Abstract

The present invention relates to a handling device for testing electronic components.
In the handling apparatus for testing electronic parts according to the present invention, a loading stacker for storing customer trays loaded with electronic parts to be tested and an unloading stacker for storing customer trays loaded with electronic parts to be tested protrude forward from the wall frame. By being disposed outside the wall frame, even when one handler is in charge of multiple testers, no down time of the handler is required, so the handling capacity can be greatly improved.

Description

Handling device for testing electronic components {HANDLING APPARATUS FOR TESTING ELECTRONIC COMPONENT}

The present invention relates to a handling device for testing electronic components that supplies electronic components for testing and supports them to be tested.

Produced electronic components are shipped after passing through a test process. In this process, a handling device for testing electronic components (hereinafter, abbreviated as 'handler') for processing electronic components is used.

The handler is a large-scale device that supplies electronic components to be tested to the tester, electrically connects them to the tester, and divides and collects the electronic components that have been tested according to test results.

Conventionally, as in Korean Patent Registration No. 10-2322242, one handler corresponds to one tester. Therefore, the number of handlers was required as much as the number of testers. However, since the handler operates by organically combining tens of thousands of parts, its large size occupies a large area of space. For this reason, the number of handlers installed is limited by the limited installation space, which limits the processing capacity in one factory.

So, as in Korean Patent Publication No. 10-2018-0028882 (hereinafter referred to as 'prior art'), one handler is divided into left and right directions to supply or retrieve electronic components to several testers lined up in the front and rear directions. By minimizing the number of handlers, it is possible to improve the utilization of limited installation space.

On the other hand, in the prior art, there is an advantage that one handler is in charge of several testers, but because the number of electronic parts supplied to the handler is limited, it must often have a break time. For example, if the maximum supply capacity that can be supplied to the handler at one time is 10,000, when the test of 10,000 supplied is completed, the tested electronic parts are recovered from the handler, and then 10,000 electronic parts to be newly tested are supplied. The operation of the handler must be stopped. This point is a stumbling block to ultimately maximizing the processing capacity by reducing the operation rate of the handler.

Of course, in recent years, the time required for supplying and collecting electronic parts is reduced by automatically supplying or automatically collecting electronic parts to the handler by automated equipment such as OHT (Overhead Hoist Transport) or AGV (Automated Guided Vehicle). However, even in this case, in order to supply or retrieve the customer tray containing electronic parts to the handler, the door must be opened and the stacker (configuration for storing the customer tray loaded with electronic parts) must be pulled out of the handler's wall frame. As a result, the downtime of the handler is required, resulting in a decrease in the operation rate and processing capacity of the handler. In addition, the downtime of such a handler is required more when more testers correspond to one handler.

The present invention was devised from the consideration of a technology in which the downtime of the handler is not required even when several testers correspond to one handler.

A handling apparatus for testing an electronic component according to the present invention includes a test hand supplying electronic components to be tested to testers and recovering electronic components from the tester after the test has been completed; a wall frame forming a space in which testers can be disposed in left and right directions with the test hand interposed therebetween; at least one loading stacker provided in front of the test hand to send electronic components to be tested to the test hand, and on which customer trays on which the electronic components to be tested are seated can be loaded; At least one unloading stacker provided in front of the test hand to receive the tested electronic components coming from the test hand, on which customer trays on which the tested electronic components are seated can be stacked; A loading conveyor provided between the test hand and the at least one loading stacker and transferring a customer tray on which electronic components to be tested are seated from the loading stacker to a supply position inside the wall frame; And an unloading conveyor provided between the test hand and the at least one unloading stacker and transferring the customer tray on which the tested electronic components are seated from a recovery position inside the wall frame to the unloading stacker; Including, the test hand can grip or release the gripping of the electronic component, picker modules provided on the left and right respectively to supply or retrieve the electronic component to the tester; left and right movers for moving the picker modules in a left and right direction; forward and backward movers for moving the picker modules forward and backward; and elevators for elevating the picker modules. Including, the loading stacker and the unloading stacker protrude forward of the wall frame and are disposed outside the wall frame, and the test hand, the loading conveyor and the unloading conveyor are arranged inside the wall frame.

a relay table for relaying the movement of electronic components between the loading stacker and unloading stacker and the test hand, on which electronic components can be seated; and a moving hand for moving electronic components to be tested from the customer tray at the supply position to the relay table, or for moving electronic components to be tested from the relay table to the customer tray at the collection position. The test hand supplies the electronic component to be tested in the relay table to the tester or places the tested electronic component retrieved from the tester on the relay table, and the relay table and the moving hand are disposed inside the wall frame.

relay movers for moving the relay tables in forward and backward directions, respectively; may further include.

The loading stacker and the unloading stacker are coupled to the wall frame so as to protrude forward of the wall frame, thereby automatically supplying customer trays to the loading stacker or automatically recovering customer trays from the unloading stacker. Interference between the wall frame and an automated device is implemented.

The wall frame forms a space so that testers are arranged in multiple stages in the vertical direction, respectively, on both left and right sides.

connectors provided to correspond to the testers to electrically connect the electronic component to be tested supplied from the test hand to the tester to the tester; anti-vibration frames in which the connectors are respectively installed; and blocking dampers that block vibration of the wall frame from moving to the coupler through the anti-vibration frames by allowing the anti-vibration frames to be elastically supported on the side of the wall frame. may further include.

According to the present invention, even when one handler is in charge of several testers, the handling capacity can be greatly improved because the handler does not require idle time.

1 is a conceptual plan view of a handling device for testing an electronic component according to an embodiment of the present invention.
FIG. 2 is a schematic diagram of a test hand applied to the handling apparatus for testing electronic components of FIG. 1 .
FIG. 3 is a schematic view of a wall frame applied to the handling apparatus for testing electronic components of FIG. 1 .
4 is a conceptual plan view of a handling device for testing an electronic component according to another embodiment of the present invention.
FIG. 5 is a perspective view schematically illustrating a part of the handling apparatus for testing an electronic component of FIG. 1 .
FIG. 6 is an example of a stacker applicable to the handling apparatus for testing electronic components of FIG. 1 .

Hereinafter, preferred embodiments according to the present invention as described above will be described with reference to the accompanying drawings, but redundant descriptions are omitted or compressed as much as possible for brevity of description.

As shown in the conceptual plan view of FIG. 1, the handler 100 according to an embodiment of the present invention includes a test hand 110, a wall frame 120, a loading stacker 131, an unloading stacker 132, a loading transfer machine 141, an unloading transfer machine 142, a relay table 151, a relay mover 152, a moving hand 160, and a connector 17 0), the anti-vibration frame 180 and the blocking dampers 190.

First, the arrangement positions of the main components will be described.

The loading stacker 131 and the unloading stacker 132 are located at the most front, and the test hand 110 is provided long in the front and rear directions behind the loading stacker 131 and the unloading stacker 132. And between the loading stacker 131 and the unloading stacker 132 and the test hand 110, a loading transfer machine 141 and an unloading transfer machine 142 are disposed. In the arrangement structure of these main components, several testers (T) are arranged in the front-back direction on each of the left and right sides of the test hand 110. Here, the tester (T) may be a part including a test socket for electrical connection with electronic components, and the rest of the main body may be located somewhere outside the wall frame. That is, the tester T defined in this specification may be the body itself having the test socket, but may also be only a portion of the test socket connected to the body through electrical wiring.

Next, the function of each component of the handler 100 will be described.

The test hand 110 supplies electronic components to be tested to the tester T, and recovers electronic components that have been tested from the tester T. To this end, as shown in the schematic diagram of FIG. 2, the test hand 110 includes a picker module 111, a left and right mover 112, a forward and backward mover 113, and an elevator 114.

The picker module 111 may hold the electronic component or release the grip. Therefore, the picker module 111 can supply or retrieve electronic components to the tester T, and is provided on the left and right sides of the front and rear movers 113, respectively.

The left and right movers 112 are provided on the left and right sides of the forward and backward movers 113, and move the picker module 111 in the left and right directions. The picker module 111 can be selectively positioned at a point at which electronic components can be supplied to or retrieved from the tester T, at a point where the electronic component can be supplied to or retrieved from the tester T, at a point where the electronic component can be gripped at the relay table 151 or at a point where the electronic component can be seated on the relay table 151 by the left and right mover 112.

The forward and backward movers 113 move the left and right movers 112 forward and backward to move the picker modules 111 forward and backward.

The elevator 114 is coupled to the left and right mover 112 and lifts the picker module 111 . Accordingly, the number of elevators 114 is also provided as the number of left and right movers 112 . The picker module 111 is coupled to an elevator, and can be selectively positioned at a height capable of holding electronic components on the lower relay table 151 or seating electronic components on the relay table 151 by the elevator 114, and at a height capable of supplying electronic components to the tester T or recovering electronic components from the tester T.

The wall frame 120 forms a space in which the testers T can be disposed in the left and right directions with the test hand 110 interposed therebetween. In addition, the wall frame 120 generally forms an outer frame of the handler 100.

The loading stacker 131 is provided in front of the test hand 110 to send electronic components to be tested to the test hand 110 . In the loading stacker 131, customer trays are loaded with electronic parts to be tested.

The unloading stacker 132 is provided in front of the test hand 110 to receive the electronic components that have been tested from the test hand 110 . In this unloading stacker 132, customer trays are loaded with electronic components that have been tested.

In addition, one or more loading stackers 131 and unloading stackers 132 may be provided according to implementation.

The loading transfer machine 141 corresponds to the loading stacker 131, is provided between the test hand 110 and the loading stacker 131, and serves to transfer the customer tray on which the electronic components to be tested are seated from the loading stacker 131 to the supply position SP inside the wall frame 120.

The unloading transfer machine 142 corresponds to the unloading stacker 132, is provided between the test hand 110 and the unloading stacker 132, and serves to transfer the customer tray on which the tested electronic components are seated to the unloading stacker 132 from the recovery position (WP) inside the wall frame 120.

For reference, the symbols ES and RS lined up in the left and right directions along with the loading stacker 131 and the unloading stacker 132 are an empty stacker capable of accommodating an empty customer tray, respectively, and a reject stacker capable of accommodating a customer tray in which electronic components judged unsuitable as a result of the test are seated. In addition, behind the empty stacker (ES) and the reject stacker (RS), tray transfer machines (TT) are arranged to transfer customer trays in pairs with the empty stacker (ES) and reject stacker (RS), respectively.

Tray transfer machines (TT) including the above loading transfer machine 141 and unloading transfer machine 142 may be considered preferable to be provided with a conveyor belt structure. In addition, the loading stacker 131, the unloading stacker 132, the empty stacker (ES), and the reject stacker (RS) can be implemented so that their roles can be changed by a control program.

On the other hand, since the customer tray must pass through the front wall of the wall frame 120 when being transported by the tray transfer machines (TT) including the loading transfer machine 141 and the unloading transfer machine 142, as shown in FIG. 3, through holes (TH) through which customer trays can pass are formed in the front wall of the wall frame 120 at positions corresponding to the respective stackers 131, 132, ES, and RS.

The relay table 151 relays the movement of electronic components between the loading stacker 131 and the unloading stacker 132 and the test hand 110 . To this end, the relay table 151 has a structure in which electronic components can be seated, and is provided on the left and right sides of the front and rear mover 113, respectively. Therefore, the test hand 110 is implemented to supply the electronic component to be tested in the relay table 151 to the tester T or place the tested electronic component collected from the tester T on the relay table 151.

The relay mover 152 moves the relay table 151 forward and backward. Accordingly, the relay table 151 can be positioned in advance on the side of the tester T to be supplied with electronic components or the tester T to be collected from electronic components, so that the test hand 110 can quickly supply and collect electronic components. Of course, depending on the implementation, even if the processing speed is somewhat slow, the relay table 151 may be provided fixedly behind the loading conveyor 141 or the unloading conveyor 142.

In addition, depending on the implementation, the relay table 151 and the relay mover 152 may be omitted, and in this case, the test hand 110 directly supplies the electronic components of the customer tray at the supply position SP to the tester T, or directly places the electronic components of the tester T into the customer tray at the retrieval position WP.

The moving hand 160 moves the electronic components to be tested from the customer tray at the supply position SP to the relay table 151, or moves the electronic components to be tested from the relay table 151 to the customer tray at the recovery position WP.

The connector 170 electrically connects the electronic component to be tested supplied to the tester T to the tester T. The connectors 170 are provided to correspond to the testers T, and are provided as many as the number of testers T. According to one example, the connector 170 may have a structure for electrically connecting the electronic component to the tester T by pressurizing it. If the electronic component is inserted into the test slit to electrically connect the electronic component and the tester T, the configuration of the connector 170 may be omitted.

The anti-vibration frame 180 is provided separately from the wall frame 120 to block vibration coming through the wall frame 120 from being input to the connector 170, and the connector 170 is the anti-vibration frame 180. It is installed to be fixed. So, the anti-vibration frame 180 is provided as many as the number of connectors 170. And the tester (T) is coupled to the anti-vibration frame (180). A tester T is coupled to the inside of the anti-vibration frame 180 .

The blocking dampers 190 block the shock vibration coming through the bottom surface from moving to the coupler 170 through the anti-vibration frames 180 by allowing the anti-vibration frames 180 to be elastically supported on the bottom surface. These blocking dampers 190 are all provided for each anti-vibration frame 180 .

The structure of the above anti-vibration frame 180 and the blocking damper 190 may refer to the structure of the code 180 and VA of Publication No. 10-2019-0124132 filed by the applicant of the present invention. Due to this structure, the tester T can be arranged in multiple stages in the vertical direction while plural testers T are arranged in the front-back direction, so that the processing capacity of the tester T can be maximized. Of course, when the testers T are arranged in multiple stages in the vertical direction, the wall frame 120 should have a structure forming a space so that the testers T are arranged in multiple stages in the vertical direction, respectively, on the left and right sides.

On the other hand, the loading stacker 131 and the unloading stacker 132 protrude forward of the wall frame 120 and are coupled to the wall frame 120 so as to be disposed outside the wall frame 120. And the loading conveyor 141, the unloading conveyor 142, the relay table 151, the relay mover 152, the moving hand 160, the coupler 170, the anti-vibration frame 180 and the blocking damper 190 are disposed inside the wall frame 120. Accordingly, customer trays can be loaded into the loading stacker 131 or unloaded from the unloading stacker 132 regardless of whether the handler 100 is operating, so the handler 100 does not require idle time. In particular, even when an automation device such as OHT or AGV automatically supplies customer trays to the loading stacker 131 or automatically retrieves customer trays from the unloading stacker 132, interference between the automation device and the wall frame 120 can be prevented.

For reference, when the customer tray is brought into the handler 100 by an automated device or implemented to unload the customer tray from the handler 100, the loading stacker 131 and the unloading stacker 132 are provided in a single layer. It is preferable.

Continuously, the operation of the handler 100 according to an embodiment of the present invention described above will be described.

When a customer tray loaded with electronic parts to be tested manually or by an automated device is loaded into the loading stacker 131, the customer tray is transferred to the supply position SP by the loading conveyor 141.

When the moving hand 160 moves the electronic components to be tested from the customer tray at the supply position SP to the relay table 151, the relay mover 152 moves the relay table 151 to the side of the tester T required. In this state, the test hand 110 grips the electronic component of the relay table 151 and supplies it to the tester T, and then the connector 170 electrically connects the electronic component to the tester T.

When the test on the electronic component is finished, the test hand 110 collects the electronic component from the tester T and moves it to the relay table 151, and the relay table 151 moves forward. In addition, the moving hand 160 operates to move electronic parts with good test results among the electronic parts that have been tested to the customer tray in the retrieval position (WP) (for reference, electronic parts with defective test results are ultimately moved to the reject stacker side with code RS).

When the customer tray at the recovery position WP is filled with electronic components that have been tested, the corresponding customer tray is transferred to the front unloading stacker 132 by the unloading transfer machine 142. And the customer tray of the unloading stacker 132 is carried out from the handler 100 manually or by automated equipment.

For reference, the customer tray emptied at the supply position SP may be transferred to the recovery position WP by the transfer TP or located behind the empty stacker ES or reject stacker RS. In addition, the empty customer tray in the empty stacker (ES) can be transferred to the rear of the reject stacker (RS) or to the recovery position (WP) by the tray transfer machine (TT) and the transfer (TP) at the rear of the empty stacker (ES).

<Additional details>

1. In addition to the embodiment shown in FIGS. 1 and 2, as shown in FIG. 4, the picker module 111, the left and right mover 112, and the elevator 114 are two or more on the left and right of the forward and backward mover 113. Can be provided in number. In this case, the configuration of the relay table 151 and the relay mobile device 152 is essential.

2. As shown in FIG. 5, the anti-vibration frames 180 to which the testers T are coupled may be arranged in two or more upper and lower stages, and accordingly, the testers T may also be arranged in multiple stages of two or more upper and lower stages. However, even in this case, the stackers 131, 132, ES, and RS protruding forward of the wall frame 120 are unconditionally provided with only one layer to enable supply and collection of customer trays by automated equipment. Of course, such a multi-stage arrangement of the tester T can be applied as much as possible even when a general test frame is applied instead of the anti-vibration frame 180.

For reference, the height of the wall frame 120 is preferably such that the tester (T) can expand its processing capacity in the vertical direction by having a height that can be provided in two or more upper and lower stages.

3. Considering the stacker group (SG) composed of the loading stacker 131, the unloading stacker 132, the empty stacker (ES), and the reject stacker (R Stacker), as shown in FIG. Therefore, when supplying or collecting customer trays to or from the stacker group (SG) by automated equipment, interference between the automated equipment and the stacker group (SG) is minimized to increase the accessibility of the automated equipment.

4. In addition, as shown in FIGS. 2 and 4, the anti-vibration frames 180 to which the tester is coupled are provided inside the wall frame 120 and are spaced apart from the inner wall of the wall frame 120. Therefore, the tester (T) can be independent of the impact transmitted through the wall frame (120).

5. Meanwhile, FIG. 6 shows an example of the stackers 131 and 132 (ES and RS).

The stackers 131, 132, ES, and RS include eight alignment members 1, R, and O and two rotators 2. More specifically, the eight alignment members (1, R, O) are divided into four alignment rods (1) long in the rear vertical direction, two rotating rods (R) long in the front vertical direction, and two openings (O).

The four aligning rods 1 form a pair of two to align the corners on both rear sides of the customer tray accommodated in the stacker SK, while guiding the movement of the descending or ascending customer trays.

Two rotating rods (R) are rotatably installed on the installation shaft (IS), and align the left and right sides of the front end of the customer tray accommodated in the stacker (SK).

The two openings (O) are divided and coupled to two rotating rods (R), and rotate in conjunction with the rotation of the two rotating rods (R).

Accordingly, the stacker SK may be forwardly opened or closed according to the rotational state of the two openings O.

If such a stacker (SK) is applied, supply and collection of customer trays by AGV can be performed more easily.

As described above, the detailed description of the present invention has been made by the embodiments with reference to the accompanying drawings, but since the above-described embodiments have only been described as preferred examples of the present invention, it should not be understood that the present invention is limited only to the above embodiments, and the scope of the present invention should be understood as the following claims and their equivalent concepts.

100: handling device for testing electronic components (handler)
110: test hand
111: picker module 112: left and right mover
113: back and forth mover 114: elevator
120: wall frame
131: Loading Stacker
132: unloading stacker
141: loading transfer machine
142: unloading transfer machine
151: relay table
152: relay mobile
160: moving hand
170: connector
180: anti-vibration frame
190: blocking damper

Claims (6)

a test hand supplying electronic components to be tested to testers and recovering electronic components that have been tested from the tester;
a wall frame forming a space in which testers can be disposed in left and right directions with the test hand interposed therebetween;
at least one loading stacker provided in front of the test hand to send electronic components to be tested to the test hand, and on which customer trays on which the electronic components to be tested are seated can be loaded;
At least one unloading stacker provided in front of the test hand to receive the tested electronic components coming from the test hand, on which customer trays on which the tested electronic components are seated can be stacked;
A loading conveyor provided between the test hand and the at least one loading stacker and transferring a customer tray on which electronic components to be tested are seated from the loading stacker to a supply position inside the wall frame; and
An unloading conveyor provided between the test hand and the at least one unloading stacker and transferring the customer tray on which the tested electronic components are seated from the recovery position inside the wall frame to the unloading stacker; including,
The test hand is
Picker modules that can hold or release electronic components and are provided on left and right sides so that electronic components can be supplied to or retrieved from the tester;
Left and right movers for moving the picker modules in the left and right directions;
forward and backward movers for moving the picker modules forward and backward; and
Elevators for elevating the picker modules; Including,
The loading stacker and the unloading stacker protrude forward from the wall frame and are disposed outside the wall frame, and the test hand, the loading conveyor and the unloading conveyor are disposed inside the wall frame.
Handling device for testing electronic components. According to claim 1,
a relay table for relaying the movement of electronic components between the loading stacker and unloading stacker and the test hand, on which electronic components can be seated; and
a moving hand for moving electronic components to be tested from the customer tray at the supply position to the relay table, or for moving electronic components to be tested from the relay table to the customer tray at the collection position; Including more,
The test hand supplies electronic components to be tested from the relay table to the tester or places the tested electronic components recovered from the tester on the relay table;
The relay table and the moving hand are disposed inside the wall frame
Handling device for testing electronic components. According to claim 2,
relay movers for moving the relay tables in forward and backward directions, respectively; further comprising
Handling device for testing electronic components. According to claim 1,
The loading stacker and the unloading stacker are coupled to the wall frame so as to protrude forward of the wall frame, thereby automatically supplying customer trays to the loading stacker or automatically recovering customer trays from the unloading stacker. Interference between the wall frame and an automation device is prevented
Handling device for testing electronic components. According to claim 1,
The wall frame forms a space so that testers are arranged in multiple stages in the vertical direction on both left and right sides, respectively.
Handling device for testing electronic components. connectors provided to correspond to the testers to electrically connect the electronic component to be tested supplied from the test hand to the tester to the tester;
anti-vibration frames in which the connectors are respectively installed; and
Blocking dampers blocking vibration of the wall frame from moving to the coupler through the vibration isolation frames by allowing the vibration isolation frames to be elastically supported on the side of the wall frame; further comprising
Handling device for testing electronic components.

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