KR20210057698A - 3차원 계측 장치 및 3차원 계측 방법 - Google Patents

3차원 계측 장치 및 3차원 계측 방법 Download PDF

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Publication number
KR20210057698A
KR20210057698A KR1020200151162A KR20200151162A KR20210057698A KR 20210057698 A KR20210057698 A KR 20210057698A KR 1020200151162 A KR1020200151162 A KR 1020200151162A KR 20200151162 A KR20200151162 A KR 20200151162A KR 20210057698 A KR20210057698 A KR 20210057698A
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KR
South Korea
Prior art keywords
imaging
image data
pattern
dimensional shape
imaging device
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KR1020200151162A
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English (en)
Korean (ko)
Inventor
다이스케 센가
Original Assignee
쥬키 가부시키가이샤
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Application filed by 쥬키 가부시키가이샤 filed Critical 쥬키 가부시키가이샤
Publication of KR20210057698A publication Critical patent/KR20210057698A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020200151162A 2019-11-12 2020-11-12 3차원 계측 장치 및 3차원 계측 방법 KR20210057698A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2019-204927 2019-11-12
JP2019204927A JP2021076531A (ja) 2019-11-12 2019-11-12 ３次元計測装置及び３次元計測方法

Publications (1)

Publication Number Publication Date
KR20210057698A true KR20210057698A (ko) 2021-05-21

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ID=75898459

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020200151162A KR20210057698A (ko) 2019-11-12 2020-11-12 3차원 계측 장치 및 3차원 계측 방법

Country Status (3)

Country Link
JP (1) JP2021076531A (zh)
KR (1) KR20210057698A (zh)
CN (1) CN112857259A (zh)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003202296A (ja) 2002-01-07 2003-07-18 Canon Inc 画像入力装置、三次元測定装置および三次元画像処理システム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202010018585U1 (de) * 2009-05-27 2017-11-28 Koh Young Technology Inc. Vorrichtung zur Messung einer dreidimensionalen Form
JP5728699B2 (ja) * 2010-03-01 2015-06-03 学校法人福岡工業大学 表面検査装置、表面検査方法および表面検査プログラム
JP5818341B2 (ja) * 2010-12-13 2015-11-18 国立大学法人 和歌山大学 形状計測装置および形状計測方法
JP5709009B2 (ja) * 2011-11-17 2015-04-30 Ckd株式会社 三次元計測装置
JP6320051B2 (ja) * 2014-01-17 2018-05-09 キヤノン株式会社 三次元形状計測装置、三次元形状計測方法
JP6357949B2 (ja) * 2014-07-29 2018-07-18 セイコーエプソン株式会社 制御システム、ロボットシステム、及び制御方法
KR101659302B1 (ko) * 2015-04-10 2016-09-23 주식회사 고영테크놀러지 3차원 형상 측정장치
JP6823985B2 (ja) * 2016-09-28 2021-02-03 Juki株式会社 ３次元形状計測方法及び３次元形状計測装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003202296A (ja) 2002-01-07 2003-07-18 Canon Inc 画像入力装置、三次元測定装置および三次元画像処理システム

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Publication number Publication date
JP2021076531A (ja) 2021-05-20
CN112857259A (zh) 2021-05-28

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