KR20200125594A - 질량 분광법을 사용하여 2종 이상의 피분석물을 정량하기 위한 방법 및 시스템 - Google Patents

질량 분광법을 사용하여 2종 이상의 피분석물을 정량하기 위한 방법 및 시스템 Download PDF

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KR20200125594A
KR20200125594A KR1020207022877A KR20207022877A KR20200125594A KR 20200125594 A KR20200125594 A KR 20200125594A KR 1020207022877 A KR1020207022877 A KR 1020207022877A KR 20207022877 A KR20207022877 A KR 20207022877A KR 20200125594 A KR20200125594 A KR 20200125594A
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analyte
collision
ions
intensity curve
mass spectrometer
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Korean (ko)
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사마드 바자르간
하미드 바디에이
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퍼킨엘머 헬스 사이언스 캐나다 인코포레이티드
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0077Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction specific reactions other than fragmentation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
KR1020207022877A 2018-01-08 2019-01-07 질량 분광법을 사용하여 2종 이상의 피분석물을 정량하기 위한 방법 및 시스템 Withdrawn KR20200125594A (ko)

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US201862614888P 2018-01-08 2018-01-08
US62/614,888 2018-01-08
PCT/IB2019/050110 WO2019135205A1 (en) 2018-01-08 2019-01-07 Methods and systems for quantifying two or more analytes using mass spectrometry

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KR20200125594A true KR20200125594A (ko) 2020-11-04

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KR1020207022877A Withdrawn KR20200125594A (ko) 2018-01-08 2019-01-07 질량 분광법을 사용하여 2종 이상의 피분석물을 정량하기 위한 방법 및 시스템

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US (2) US11133161B2 (cg-RX-API-DMAC7.html)
EP (1) EP3737936A4 (cg-RX-API-DMAC7.html)
JP (1) JP2021511487A (cg-RX-API-DMAC7.html)
KR (1) KR20200125594A (cg-RX-API-DMAC7.html)
CN (1) CN111819436A (cg-RX-API-DMAC7.html)
CA (1) CA3088913A1 (cg-RX-API-DMAC7.html)
WO (1) WO2019135205A1 (cg-RX-API-DMAC7.html)

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WO2019135205A1 (en) * 2018-01-08 2019-07-11 Perkinelmer Health Sciences Canada, Inc Methods and systems for quantifying two or more analytes using mass spectrometry
CN113237942B (zh) * 2021-05-07 2023-09-26 上海科技大学 在微量细胞中检测多种微量元素的方法及应用
EP4339996A1 (en) * 2022-09-15 2024-03-20 Analytik Jena GmbH+Co. KG System for analyzing a sample
US20250123603A1 (en) * 2023-10-16 2025-04-17 Thermo Finnigan Llc Method using reinforcement learning to control a mass spectrometer

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JPS5943062U (ja) * 1982-09-14 1984-03-21 株式会社東芝 粒子分析器
JP2895860B2 (ja) * 1989-05-26 1999-05-24 日本電信電話株式会社 質量分析方法
US6713757B2 (en) * 2001-03-02 2004-03-30 Mds Inc. Controlling the temporal response of mass spectrometers for mass spectrometry
US7479630B2 (en) * 2004-03-25 2009-01-20 Bandura Dmitry R Method and apparatus for flow cytometry linked with elemental analysis
WO2004029614A1 (en) * 2002-09-25 2004-04-08 Ionalytics Corporation Faims apparatus and method for separating ions
GB0404285D0 (en) * 2004-02-26 2004-03-31 Shimadzu Res Lab Europe Ltd A tandem ion-trap time-of flight mass spectrometer
JP4907196B2 (ja) * 2005-05-12 2012-03-28 株式会社日立ハイテクノロジーズ 質量分析用データ処理装置
DE102009050041B4 (de) * 2009-09-17 2014-12-18 Bruker Daltonik Gmbh Hochauflösende Ionenmobiltätsspektrometrie
JP5234019B2 (ja) * 2010-01-29 2013-07-10 株式会社島津製作所 質量分析装置
SG183179A1 (en) * 2010-02-26 2012-09-27 Perkinelmer Health Sci Inc Plasma mass spectrometry with ion suppression
GB201106689D0 (en) * 2011-04-20 2011-06-01 Micromass Ltd Function switching with fast asynchronous acquisition
AU2015218336B2 (en) * 2014-02-14 2019-08-15 Perkinelmer U.S. Llc Systems and methods for automated optimization of a multi-mode inductively coupled plasma mass spectrometer
EP3422005B1 (en) * 2017-06-27 2020-05-13 Medizinische Universität Graz Determining enrichments of tracers of glucose by mass spectrometry
WO2019135205A1 (en) * 2018-01-08 2019-07-11 Perkinelmer Health Sciences Canada, Inc Methods and systems for quantifying two or more analytes using mass spectrometry
JP7143737B2 (ja) * 2018-11-21 2022-09-29 株式会社島津製作所 質量分析装置、イオン発生タイミング制御方法およびイオン発生タイミング制御プログラム

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US11133161B2 (en) 2021-09-28
CA3088913A1 (en) 2019-07-11
JP2021511487A (ja) 2021-05-06
EP3737936A1 (en) 2020-11-18
US20210074533A1 (en) 2021-03-11
EP3737936A4 (en) 2021-10-13
WO2019135205A1 (en) 2019-07-11
US20220262612A1 (en) 2022-08-18
CN111819436A (zh) 2020-10-23
US11637005B2 (en) 2023-04-25

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