CN111819436A - 用于使用质谱法量化两种或更多种分析物的方法和系统 - Google Patents

用于使用质谱法量化两种或更多种分析物的方法和系统 Download PDF

Info

Publication number
CN111819436A
CN111819436A CN201980017985.XA CN201980017985A CN111819436A CN 111819436 A CN111819436 A CN 111819436A CN 201980017985 A CN201980017985 A CN 201980017985A CN 111819436 A CN111819436 A CN 111819436A
Authority
CN
China
Prior art keywords
analyte
ions
intensity curve
ion cloud
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201980017985.XA
Other languages
English (en)
Chinese (zh)
Inventor
S.巴扎甘
H.巴蒂艾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Health Sciences Canada Inc
Original Assignee
PerkinElmer Health Sciences Canada Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Health Sciences Canada Inc filed Critical PerkinElmer Health Sciences Canada Inc
Publication of CN111819436A publication Critical patent/CN111819436A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0077Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction specific reactions other than fragmentation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN201980017985.XA 2018-01-08 2019-01-07 用于使用质谱法量化两种或更多种分析物的方法和系统 Pending CN111819436A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862614888P 2018-01-08 2018-01-08
US62/614,888 2018-01-08
PCT/IB2019/050110 WO2019135205A1 (en) 2018-01-08 2019-01-07 Methods and systems for quantifying two or more analytes using mass spectrometry

Publications (1)

Publication Number Publication Date
CN111819436A true CN111819436A (zh) 2020-10-23

Family

ID=67143865

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980017985.XA Pending CN111819436A (zh) 2018-01-08 2019-01-07 用于使用质谱法量化两种或更多种分析物的方法和系统

Country Status (7)

Country Link
US (2) US11133161B2 (cg-RX-API-DMAC7.html)
EP (1) EP3737936A4 (cg-RX-API-DMAC7.html)
JP (1) JP2021511487A (cg-RX-API-DMAC7.html)
KR (1) KR20200125594A (cg-RX-API-DMAC7.html)
CN (1) CN111819436A (cg-RX-API-DMAC7.html)
CA (1) CA3088913A1 (cg-RX-API-DMAC7.html)
WO (1) WO2019135205A1 (cg-RX-API-DMAC7.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113237942A (zh) * 2021-05-07 2021-08-10 上海科技大学 在微量细胞中检测多种微量元素的方法及应用
US20240094097A1 (en) * 2022-09-15 2024-03-21 Analytik Jena Gmbh+Co. Kg System for analyzing a sample

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019135205A1 (en) * 2018-01-08 2019-07-11 Perkinelmer Health Sciences Canada, Inc Methods and systems for quantifying two or more analytes using mass spectrometry
US20250123603A1 (en) * 2023-10-16 2025-04-17 Thermo Finnigan Llc Method using reinforcement learning to control a mass spectrometer

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5943062U (ja) * 1982-09-14 1984-03-21 株式会社東芝 粒子分析器
JP2895860B2 (ja) * 1989-05-26 1999-05-24 日本電信電話株式会社 質量分析方法
US6713757B2 (en) * 2001-03-02 2004-03-30 Mds Inc. Controlling the temporal response of mass spectrometers for mass spectrometry
US7479630B2 (en) * 2004-03-25 2009-01-20 Bandura Dmitry R Method and apparatus for flow cytometry linked with elemental analysis
WO2004029614A1 (en) * 2002-09-25 2004-04-08 Ionalytics Corporation Faims apparatus and method for separating ions
GB0404285D0 (en) * 2004-02-26 2004-03-31 Shimadzu Res Lab Europe Ltd A tandem ion-trap time-of flight mass spectrometer
JP4907196B2 (ja) * 2005-05-12 2012-03-28 株式会社日立ハイテクノロジーズ 質量分析用データ処理装置
DE102009050041B4 (de) * 2009-09-17 2014-12-18 Bruker Daltonik Gmbh Hochauflösende Ionenmobiltätsspektrometrie
JP5234019B2 (ja) * 2010-01-29 2013-07-10 株式会社島津製作所 質量分析装置
SG183179A1 (en) * 2010-02-26 2012-09-27 Perkinelmer Health Sci Inc Plasma mass spectrometry with ion suppression
GB201106689D0 (en) * 2011-04-20 2011-06-01 Micromass Ltd Function switching with fast asynchronous acquisition
AU2015218336B2 (en) * 2014-02-14 2019-08-15 Perkinelmer U.S. Llc Systems and methods for automated optimization of a multi-mode inductively coupled plasma mass spectrometer
EP3422005B1 (en) * 2017-06-27 2020-05-13 Medizinische Universität Graz Determining enrichments of tracers of glucose by mass spectrometry
WO2019135205A1 (en) * 2018-01-08 2019-07-11 Perkinelmer Health Sciences Canada, Inc Methods and systems for quantifying two or more analytes using mass spectrometry
JP7143737B2 (ja) * 2018-11-21 2022-09-29 株式会社島津製作所 質量分析装置、イオン発生タイミング制御方法およびイオン発生タイミング制御プログラム

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113237942A (zh) * 2021-05-07 2021-08-10 上海科技大学 在微量细胞中检测多种微量元素的方法及应用
CN113237942B (zh) * 2021-05-07 2023-09-26 上海科技大学 在微量细胞中检测多种微量元素的方法及应用
US20240094097A1 (en) * 2022-09-15 2024-03-21 Analytik Jena Gmbh+Co. Kg System for analyzing a sample

Also Published As

Publication number Publication date
US11133161B2 (en) 2021-09-28
CA3088913A1 (en) 2019-07-11
JP2021511487A (ja) 2021-05-06
EP3737936A1 (en) 2020-11-18
US20210074533A1 (en) 2021-03-11
EP3737936A4 (en) 2021-10-13
KR20200125594A (ko) 2020-11-04
WO2019135205A1 (en) 2019-07-11
US20220262612A1 (en) 2022-08-18
US11637005B2 (en) 2023-04-25

Similar Documents

Publication Publication Date Title
US11637005B2 (en) Methods and systems for quantifying two or more analytes using mass spectrometry
Borovinskaya et al. A prototype of a new inductively coupled plasma time-of-flight mass spectrometer providing temporally resolved, multi-element detection of short signals generated by single particles and droplets
Naasz et al. Multi-element analysis of single nanoparticles by ICP-MS using quadrupole and time-of-flight technologies
CN110277299B (zh) 电感耦合等离子体质谱分析的串联碰撞/反应池
JP7561917B2 (ja) 信号対雑音比および信号対バックグラウンド比が改善された誘導結合プラズマ質量分析(icp-ms)
Shigeta et al. Application of a micro-droplet generator for an ICP-sector field mass spectrometer–optimization and analytical characterization
Fuerstenau et al. Molecular weight determination of megadalton DNA electrospray ions using charge detection time‐of‐flight mass spectrometry
Harycki et al. Characterization of a high-sensitivity ICP-TOFMS instrument for microdroplet, nanoparticle, and microplastic analyses
Chun et al. Dual-elemental analysis of single particles using quadrupole-based inductively coupled plasma-mass spectrometry
DE102017205545B4 (de) Probezerstäuber mit einstellbarer leitung und verwandte verfahren
Balcerzak An overview of analytical applications of time of flight-mass spectrometric (TOF-MS) analyzers and an inductively coupled plasma-TOF-MS technique
Lomax-Vogt et al. Challenges in measuring nanoparticles and microparticles by single particle ICP-QMS and ICP-TOFMS: size-dependent transport efficiency and limited linear dynamic range
Rush et al. Collisional dampening for improved quantification in single particle inductively coupled plasma mass spectrometry
CA3170110A1 (en) Ion interfaces and systems and methods using them
Fernández-Trujillo et al. A rapid and simple approach for the characterization and quantification of gold nanoparticles in cell culture medium by single particle-ICP-MS
DE102024115265A1 (de) Massenspektrometer und Verfahren
Dennis et al. Constant-momentum acceleration time-of-flight mass spectrometry with energy focusing
JP7117371B2 (ja) ガス混合物を使用してイオンを選択するシステムおよび方法
Harycki Development of microdroplet calibration for the accurate quantification of particles by single-particle ICP-TOFMS
Borovinskaya A new inductively coupled plasma time-of-flight mass spectrometer: fundamentals and applications
CN120048721B (zh) 新型等离子体检测分析装置
Schmidt Detection and Characterisation of Nanoparticles Using Inductively Coupled Plasma Mass Spectrometry
Prüfert et al. Liquid phase IR-MALDI and differential mobility analysis of nano-and sub-micron particles
Karkee Exploring single-particle ICP-TOFMS for fingerprinting, classification and prospecting of natural and engineered mineral particles
Kocic Expanding the Scope of Single-Particle ICPMS with Microdroplet-Based Sample Introduction

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20201023

WD01 Invention patent application deemed withdrawn after publication