KR20190107273A - 소자검사장치 - Google Patents

소자검사장치 Download PDF

Info

Publication number
KR20190107273A
KR20190107273A KR1020190027807A KR20190027807A KR20190107273A KR 20190107273 A KR20190107273 A KR 20190107273A KR 1020190027807 A KR1020190027807 A KR 1020190027807A KR 20190027807 A KR20190027807 A KR 20190027807A KR 20190107273 A KR20190107273 A KR 20190107273A
Authority
KR
South Korea
Prior art keywords
unit
inspected
test
pressing tool
main
Prior art date
Application number
KR1020190027807A
Other languages
English (en)
Korean (ko)
Inventor
유홍준
Original Assignee
(주)제이티
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)제이티 filed Critical (주)제이티
Publication of KR20190107273A publication Critical patent/KR20190107273A/ko

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
KR1020190027807A 2018-03-11 2019-03-11 소자검사장치 KR20190107273A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR1020180028348 2018-03-11
KR20180028348 2018-03-11
KR1020180040666 2018-04-06
KR20180040666 2018-04-06

Publications (1)

Publication Number Publication Date
KR20190107273A true KR20190107273A (ko) 2019-09-19

Family

ID=67906797

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020190027807A KR20190107273A (ko) 2018-03-11 2019-03-11 소자검사장치

Country Status (3)

Country Link
KR (1) KR20190107273A (zh)
CN (1) CN111868536A (zh)
WO (1) WO2019177326A1 (zh)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100560729B1 (ko) * 2005-03-22 2006-03-14 미래산업 주식회사 반도체 소자 테스트용 핸들러
KR101216359B1 (ko) * 2011-03-25 2012-12-28 (주)제이티 소자검사장치
CN103293458B (zh) * 2012-02-29 2017-03-01 宰体有限公司 元件检测装置
KR101919087B1 (ko) * 2012-10-05 2018-11-19 (주)테크윙 반도체소자 테스트용 테스트핸들러
KR20140119243A (ko) * 2013-03-27 2014-10-10 (주)제이티 소자검사장치
KR102401058B1 (ko) * 2015-05-12 2022-05-23 (주)제이티 소자핸들러
KR20170095655A (ko) * 2016-02-15 2017-08-23 (주)제이티 소자검사장치 및 그에 사용되는 소자가압툴

Also Published As

Publication number Publication date
WO2019177326A1 (ko) 2019-09-19
CN111868536A (zh) 2020-10-30

Similar Documents

Publication Publication Date Title
KR100349942B1 (ko) 램버스 핸들러
KR101133188B1 (ko) 소자소팅장치 및 그 방법
KR101177746B1 (ko) 소자검사장치
KR102401058B1 (ko) 소자핸들러
KR20230165173A (ko) 소자소팅장치
KR101216359B1 (ko) 소자검사장치
KR101973687B1 (ko) 소자검사장치
KR100401014B1 (ko) 테스트 핸들러
KR20090029944A (ko) 테스트 핸들러
KR101094200B1 (ko) 메모리 모듈 테스트를 위한 메모리 모듈 테스터 장치 및 테스트 방법
KR101017698B1 (ko) 소자소팅장치
KR101291583B1 (ko) 소자검사장치 및 그에 사용되는 소자가압장치
KR20210006310A (ko) 소자검사장치
KR20190107273A (ko) 소자검사장치
KR20100006989A (ko) 비전검사장비의 픽커 유니트
KR101177319B1 (ko) 소자소팅장치
KR20060127633A (ko) 반도체 패키지 자동 외관 검사 장치
KR100976401B1 (ko) 반도체 소자 이송장치
KR20060008844A (ko) 모듈 아이씨(ｉｃ)의 외관검사 방법 및 그 장치
KR20140119243A (ko) 소자검사장치
KR101312004B1 (ko) 고온의 반도체 소자의 고속 테스트용 핸들러
CN100416286C (zh) 电子部件试验装置
KR102329230B1 (ko) 메모리 모듈 실장 테스트 장치
KR100560727B1 (ko) 모듈 아이씨 테스트 핸들러의 작동방법
KR100865155B1 (ko) 반도체 디바이스 핸들러 시스템

Legal Events

Date Code Title Description
A201 Request for examination