KR20180084892A - 소비 장치의 안전한 제어 - Google Patents

소비 장치의 안전한 제어 Download PDF

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Publication number
KR20180084892A
KR20180084892A KR1020187016682A KR20187016682A KR20180084892A KR 20180084892 A KR20180084892 A KR 20180084892A KR 1020187016682 A KR1020187016682 A KR 1020187016682A KR 20187016682 A KR20187016682 A KR 20187016682A KR 20180084892 A KR20180084892 A KR 20180084892A
Authority
KR
South Korea
Prior art keywords
consumer devices
safe control
safe
consumer
control
Prior art date
Application number
KR1020187016682A
Other languages
English (en)
Other versions
KR102587391B1 (ko
Inventor
파울 반게
토마스 마이어
Original Assignee
젯트에프 프리드리히스하펜 아게
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 젯트에프 프리드리히스하펜 아게 filed Critical 젯트에프 프리드리히스하펜 아게
Publication of KR20180084892A publication Critical patent/KR20180084892A/ko
Application granted granted Critical
Publication of KR102587391B1 publication Critical patent/KR102587391B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F7/00—Magnets
    • H01F7/06—Electromagnets; Actuators including electromagnets
    • H01F7/064—Circuit arrangements for actuating electromagnets
    • G01R31/025—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F7/00—Magnets
    • H01F7/06—Electromagnets; Actuators including electromagnets
    • H01F7/08—Electromagnets; Actuators including electromagnets with armatures
    • H01F7/18—Circuit arrangements for obtaining desired operating characteristics, e.g. for slow operation, for sequential energisation of windings, for high-speed energisation of windings
    • H01F7/1844—Monitoring or fail-safe circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
    • H03K17/0812—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit
    • H03K17/08122—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16H—GEARING
    • F16H61/00—Control functions within control units of change-speed- or reversing-gearings for conveying rotary motion ; Control of exclusively fluid gearing, friction gearing, gearings with endless flexible members or other particular types of gearing
    • F16H61/12—Detecting malfunction or potential malfunction, e.g. fail safe; Circumventing or fixing failures
    • F16H2061/1256—Detecting malfunction or potential malfunction, e.g. fail safe; Circumventing or fixing failures characterised by the parts or units where malfunctioning was assumed or detected
    • F16H2061/126—Detecting malfunction or potential malfunction, e.g. fail safe; Circumventing or fixing failures characterised by the parts or units where malfunctioning was assumed or detected the failing part is the controller
    • F16H2061/1268—Electric parts of the controller, e.g. a defect solenoid, wiring or microprocessor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Electronic Switches (AREA)
  • Flow Control (AREA)
KR1020187016682A 2015-11-20 2016-11-10 소비 장치의 안전한 제어 KR102587391B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102015222990.4A DE102015222990A1 (de) 2015-11-20 2015-11-20 Sichere Steuerung eines Verbrauchers
DE102015222990.4 2015-11-20
PCT/EP2016/077303 WO2017084962A1 (de) 2015-11-20 2016-11-10 Sichere steuerung eines verbrauchers

Publications (2)

Publication Number Publication Date
KR20180084892A true KR20180084892A (ko) 2018-07-25
KR102587391B1 KR102587391B1 (ko) 2023-10-10

Family

ID=57286494

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020187016682A KR102587391B1 (ko) 2015-11-20 2016-11-10 소비 장치의 안전한 제어

Country Status (6)

Country Link
US (1) US10382029B2 (ko)
JP (1) JP2018536353A (ko)
KR (1) KR102587391B1 (ko)
CN (1) CN108352239B (ko)
DE (1) DE102015222990A1 (ko)
WO (1) WO2017084962A1 (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6826499B2 (ja) 2017-06-30 2021-02-03 ルネサスエレクトロニクス株式会社 半導体装置およびパワーモジュール
US10672549B2 (en) * 2017-07-19 2020-06-02 Hamilton Sunstrand Corporation Solenoid diagnostics digital interface
EP3696558A1 (de) * 2019-02-15 2020-08-19 Siemens Aktiengesellschaft Vorrichtung und verfahren zur automatischen prüfung eines schaltorgans
DE102019113139A1 (de) * 2019-05-17 2020-11-19 Knorr-Bremse Systeme für Nutzfahrzeuge GmbH Vorrichtung und Verfahren zur Stromsteuerung eines Aktuators
JP7348223B2 (ja) * 2021-03-24 2023-09-20 矢崎総業株式会社 負荷制御装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09331669A (ja) * 1996-06-10 1997-12-22 Fuji Electric Co Ltd 電圧駆動形半導体素子の駆動回路
JP2010236671A (ja) * 2009-03-31 2010-10-21 Aisin Aw Co Ltd 自動変速機の制御装置
JP2013211711A (ja) 2012-03-30 2013-10-10 Denso Corp 誘導性負荷駆動装置

Family Cites Families (17)

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Publication number Priority date Publication date Assignee Title
EP0352659B1 (de) * 1988-07-27 1994-12-07 Siemens Aktiengesellschaft Schaltungsanordnung zum Erfassen des Kurzschlusses einer mit einem FET in Reihe liegenden Last
JP3219081B2 (ja) * 1992-11-26 2001-10-15 富士電機株式会社 インバータの故障診断方法
JP2002168927A (ja) * 2000-11-30 2002-06-14 Toshiba Corp 電流測定回路
DE10127233C1 (de) * 2001-05-22 2002-11-28 Pilz Gmbh & Co Sicherheitsschaltmodul und Verfahren zur Prüfung des Abschaltvermögens eines Schaltelements in einem Sicherheitsschaltmodul
JP2010206247A (ja) * 2009-02-27 2010-09-16 Toyota Motor Corp 誘導負荷制御装置
JP2010256210A (ja) * 2009-04-27 2010-11-11 Furukawa Battery Co Ltd:The 制御弁式鉛蓄電池の短絡検査方法および制御弁式鉛蓄電池の短絡検査装置
DE102010013322B4 (de) * 2010-03-30 2011-11-17 Austriamicrosystems Ag Detektionsschaltung und Verfahren zum Betreiben einer Detektionsschaltung
JP2013045897A (ja) * 2011-08-24 2013-03-04 Aisin Seiki Co Ltd ソレノイドの電流制御装置
CN103187708B (zh) * 2011-12-31 2015-09-30 联创汽车电子有限公司 电动助力转向系统电机运行实时自诊断的方法
DE102012203939A1 (de) * 2012-03-14 2013-09-19 Zf Friedrichshafen Ag Verfahren zur Ventilüberwachung und Getriebesteuerung zur Durchführung des Verfahrens
DE102012212123B4 (de) * 2012-07-11 2016-05-19 Continental Automotive Gmbh Vorrichtung zur Diagnose einer Schaltungsanordnung
US9859274B2 (en) * 2012-07-11 2018-01-02 Infineon Technologies Dresden Gmbh Integrated circuit with at least two switches
DE102013200637A1 (de) * 2013-01-17 2014-07-31 Robert Bosch Gmbh Verfahren zur Erkennung eines elektrischen Fehlers in einer Generatoranordnung und Mittel zu dessen Implementierung
JP5983514B2 (ja) * 2013-04-17 2016-08-31 株式会社デンソー 誘導性負荷駆動装置
DE102014202460B3 (de) * 2013-10-14 2015-02-05 Continental Automotive Gmbh Verfahren zum Erkennen eines Leitungskurzschlusses oder einer Leitungsunterbrechung bei einer geschalteten induktiven Last
EP2884662B1 (de) * 2013-12-13 2019-06-26 Power Integrations Switzerland GmbH Vorrichtung und Verfahren zur Detektion eines Kurzschluss- oder Überstromzustands in einem Leistungshalbleiterschalter
CN104333208B (zh) * 2014-10-27 2017-02-15 中南大学 一种三段桥式变流电路开路故障处理装置及故障诊断方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09331669A (ja) * 1996-06-10 1997-12-22 Fuji Electric Co Ltd 電圧駆動形半導体素子の駆動回路
JP2010236671A (ja) * 2009-03-31 2010-10-21 Aisin Aw Co Ltd 自動変速機の制御装置
JP2013211711A (ja) 2012-03-30 2013-10-10 Denso Corp 誘導性負荷駆動装置

Also Published As

Publication number Publication date
US10382029B2 (en) 2019-08-13
DE102015222990A1 (de) 2017-05-24
WO2017084962A1 (de) 2017-05-26
US20180323776A1 (en) 2018-11-08
CN108352239B (zh) 2020-06-12
KR102587391B1 (ko) 2023-10-10
JP2018536353A (ja) 2018-12-06
CN108352239A (zh) 2018-07-31

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E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant