KR20160149883A - An apparatus for inspecting a lens defect - Google Patents

An apparatus for inspecting a lens defect Download PDF

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Publication number
KR20160149883A
KR20160149883A KR1020150087668A KR20150087668A KR20160149883A KR 20160149883 A KR20160149883 A KR 20160149883A KR 1020150087668 A KR1020150087668 A KR 1020150087668A KR 20150087668 A KR20150087668 A KR 20150087668A KR 20160149883 A KR20160149883 A KR 20160149883A
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KR
South Korea
Prior art keywords
lens
unit
defect
inspection object
light source
Prior art date
Application number
KR1020150087668A
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Korean (ko)
Inventor
김영일
송승호
양재식
Original Assignee
티클로버(주)
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Priority to KR1020150087668A priority Critical patent/KR20160149883A/en
Publication of KR20160149883A publication Critical patent/KR20160149883A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/068—Optics, miscellaneous

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  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Geometry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention relates to a lens defect inspection apparatus in which a light source in the form of a ring is disposed behind a subject to be inspected. The lens defect inspection apparatus according to the present invention comprises: a lens unit to be inspected which is an object for identifying the presence or absence of a defect; A ring-shaped illumination unit which is provided at a rear side of the inspection object lens unit by a first distance and which emits light toward the inspection object lens unit; And a camera unit installed in front of the inspection object lens unit for acquiring image information of a light source passed through the inspection object lens unit.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a lens defect inspection apparatus,

The present invention relates to a lens defect inspection apparatus, and more particularly to a lens defect inspection apparatus in which a ring-shaped light source is provided behind a subject to be inspected.

In general, an apparatus or a method for inspecting defects of a lens is performed by passing illuminating light through a lens to an inspection chart and evaluating an image of a chart for inspection projected on the screen.

In a conventional lens inspection apparatus, a light source is provided in front of a lens to be inspected, reflected light reflected after the light irradiated from the light source passes through the lens to be inspected is photographed, and the defect of the lens is inspected through the photographed image.

An example of such an inspection apparatus and an inspection method is disclosed in Korean Patent No. 10-1437902, which is Patent Document 01. Specifically, according to the patent document, a first illumination unit for irradiating red, green, blue, white, and ultraviolet rays directly to the upper portion of the lens of the LED package, and a second illumination unit for emitting red, green, blue, white, A second illuminating unit for illuminating the oblique light is provided on the lens of the LED package so that the inspection area of the lens not irradiated with the red, green, blue, white, White, and ultraviolet ray inclined light, thereby enlarging the inspection area width on the outer surface of the lens so that defects in a wide area can be inspected. To summarize such an inspection apparatus, a configuration is disclosed in which a light source is provided in front of an LED package, and light reflected by a lens of the LED package is photographed by a camera to determine whether the defect is defective.

However, in such a conventional lens defect inspection apparatus, since a light source is located in front of a lens, in order to clearly display defects through reflected light, a high light amount is required, so power consumption is large and defects are observed only at a certain angle. It is difficult to inspect defects in the first half and defects existing in some blind spot regions are difficult to be detected.

Korean Patent No. 10-1437902: Lens Appearance Apparatus of LED Package Korean Patent No. 10-0924117: Lens Inspection Device

The present invention has been made in order to solve the above problems, and it is an object of the present invention to provide a ring-shaped light source behind a lens portion to be inspected, which can easily identify defects even with a small amount of light, And an object thereof is to provide an apparatus for inspecting a lens defect.

The apparatus for inspecting a lens defect according to the present invention includes a lens unit to be inspected, which is an object for identifying the presence or absence of a defect; A ring-shaped illumination unit which is provided at a rear side of the inspection object lens unit by a first distance and which emits light toward the inspection object lens unit; And a camera unit installed in front of the inspection object lens unit for acquiring image information of a light source passed through the inspection object lens unit.

The ring-shaped illumination portion may be irradiated over the entire ring opposing the inspection target lens portion and may have a diameter twice or more of the first distance, and may preferably be a white LED ring illumination.

Meanwhile, the inspection object lens unit may be a lens array having n lenses in both the horizontal and vertical directions.

In addition, the apparatus for inspecting a lens defect according to the present invention may comprise: a controller for matching image information of the light source obtained from the camera unit with a first lens to an n * n lens; And a display unit for outputting image information matched by the control unit.

In another aspect, the camera unit may have a resolution of one of 3MP (megapixel), 4MP, and 5MP, and preferably has a resolution of 5MP, that is, 2592 x 1944 pixels.

Further, the lens inspection apparatus according to the present invention may further include a polarizing filter disposed between the inspection object lens unit and the camera for removing surface reflected light, which overlaps the scattered light due to the defect and hinders the detection of the defect .

The apparatus for inspecting a lens defect of the present invention is advantageous in that it is easy to identify defects even with a light source of a small light amount, power consumption of the apparatus is not high, and a difference in discrimination power of defects according to angles is not large.

Those skilled in the art will recognize that the effects of the present invention can be broadly accepted without departing from the foregoing description.

1 is a block diagram showing an embodiment of a lens defect inspection apparatus according to the present invention.
2 is a side view of the lens defect inspection apparatus of FIG.
FIG. 3 is a video image of image information of a light source that has passed through an individual lens (for example, a first lens) of the inspection target lens unit through the lens defect inspection apparatus of FIG.
4 is a video image for comparison in a state where a light source is installed in front of a lens portion to be inspected for the same individual lens of the image image of Fig.
FIG. 5 is a video image of image information of a light source that has passed through another lens (for example, a second lens) of the inspection object lens unit photographed by the lens defect inspection apparatus of FIG.
FIG. 6 is a video image of the lens to be inspected in FIG. 5 in a state in which the light source is disposed in front of the lens to be inspected.

Hereinafter, a lens defect inspection apparatus according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. The present invention is capable of various modifications and various forms, and specific embodiments are illustrated in the drawings and described in detail in the text. It is to be understood, however, that the invention is not intended to be limited to the particular forms disclosed, but on the contrary, is intended to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention. Like reference numerals are used for like elements in describing each drawing. In the accompanying drawings, the dimensions of the structures are enlarged to illustrate the present invention in order to clarify the present invention.

The terms first, second, etc. may be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be referred to as a second component, and similarly, the second component may also be referred to as a first component.

The terminology used in this application is used only to describe a specific embodiment and is not intended to limit the invention. The singular expressions include plural expressions unless the context clearly dictates otherwise. In the present application, the terms "comprises", "comprising", or "having" are used to specify that a feature, a number, a step, an operation, an element, a component, Steps, operations, elements, parts, or combinations thereof, whether or not explicitly described or implied by the accompanying claims.

Unless otherwise defined, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Terms such as those defined in commonly used dictionaries are to be interpreted as having a meaning consistent with the meaning in the context of the relevant art and are to be interpreted as ideal or overly formal in meaning unless explicitly defined in the present application Do not.

1 and 2, a lens defect inspection apparatus 1 according to the present invention includes an illumination unit 20, a polarizing filter 40, and a camera unit 30.

If the position where the camera unit 30 is installed on the basis of the lens unit 10 to be inspected is referred to as the front, the illumination unit 20 is disposed behind the lens unit 10 to be inspected by a first distance So as to irradiate light toward the inspection object lens unit 10. [ Here, the first distance may be set differently according to the relationship between the inspection object lens unit 10, the illumination unit 20, and the camera unit 30, and may be, for example, several centimeters or tens of centimeters, cm. < / RTI >

The object lens unit 10 to be inspected may be a lens array having n lenses in both the horizontal and vertical directions to detect the presence or absence of defects.

The illumination unit 20 is applied with ring illumination that provides a ring-shaped light source. As a light source for inspecting a lens, a ring-shaped light source rather than a point light source is preferable. In the case of a point light source, it is difficult to identify a defect because it can not provide a sufficient amount of light, and it is not efficient.

For example, the illumination unit 20 may include a plurality of LEDs mounted on a ring-shaped substrate. Preferably, a plurality of white LEDs may be arranged on the circumference of the ring, May be overlapped.

Specifically, the illumination unit 20 may be provided with a substrate extending in a circumferential direction in the body, mounting LEDs spaced along the circumferential direction on the substrate, The light emitting cover can be mounted so that the surface emission is performed. For example, the illumination portion 20 of the present invention may have a diameter at least twice the separation distance. As illustrated above, when the first separation distance is 5 cm, the illumination portion 20 has a diameter of 10 to 11 cm Lt; / RTI >

The camera unit 30 is for acquiring image information by photographing the light of the illumination unit 20 which has passed through the inspection object lens unit 10. The camera unit 30 has a resolution of one of 3MP (megapixel), 4MP, and 5MP And preferably has a resolution of 5MP, that is, 2592 x 1944 pixels.

If there is a defect in the lens 10 to be inspected, scattered light is generated due to the defect, and if the scattered light is captured in the image taken by the camera unit 30, it can be determined that there is a defect in the lens.

Although not shown, the camera unit 30 may be connected to a control unit for correcting an image or automatically determining whether a defect exists, and a display unit for outputting a video image photographed by the camera unit 30 may be separately provided .

In this case, the controller sequentially counts the image information of the light source obtained from the camera unit 30, the individual lenses of the lens unit 10 to be inspected, that is, the lens array, . For example, if the lens array is composed of 100 lenses at 10 x 10, the image information obtained at the camera section 30 can be matched for the first lens to the 100th lens.

A polarizing filter 40 is provided between the lens section 10 and the camera section 30.

When the light irradiated from the illuminating unit 20 passes through the inspection target lens unit 10 and then is photographed by the camera unit 30, the surface reflected light of the inspection target lens unit 10 is generated. The scattered light caused by the scattered light can be overlapped. In this case, it is impossible to judge whether there is an accurate defect.

Therefore, the polarizing filter 40 is installed to remove the surface reflected light, and the polarizing filter 40 removes the reflected light from the surface through the polarization reversal phenomenon of light reflection and refraction.

Since the image is acquired by the camera unit 30 in a state in which the surface reflected light is removed by the polarizing filter 40, the scattered light due to the defect is clearly captured in the presence of a defect so that the defect inspection of the lens can be accurately performed have.

3 to 6 show image images in which image information of a light source passing through a single lens constituting the inspection object lens unit 10 is photographed.

3 and 5 are diagrams for explaining the case where the light source is provided behind the inspection object lens unit 10 and the individual lenses for inspection (i.e., (Referred to as individual lenses different from each other when the object lens section 10 is a lens array).

4 and 6 are photographed images of individual lenses identical to the individual lenses photographed in Figs. 3 and 5, respectively. For comparison with the image images of Figs. 3 and 5, 10, that is, the light source is positioned between the inspection object lens unit 10 and the camera unit 30. [0154] FIG.

For convenience of comparison, FIGS. 3 and 4 of the image images of FIGS. 3 to 6 will be referred to as photographing the first lens, and FIGS. 5 and 6 will be referred to as photographing the second lens. As described above, it goes without saying that the first lens and the second lens are elements forming the lens section 10, i.e., the lens array to be inspected.

3 and 4, it is possible to confirm the difference of the image image according to the mounting position of the light source with respect to the same first lens.

As can be seen from the image of FIG. 3, there is an image of a circular ring-shaped light source, in which a large number of scattered lights due to defects are visible. Particularly, a linear defect scattering light can be seen on the left hemisphere, and it can be clearly confirmed that the first lens is defective through the image.

In the case of FIG. 4 in which the position of the light source is different from that of the first lens, the reflected light of a plurality of blue light sources is displayed inside the circular light source image, so that it is not easy to confirm the image due to the defect. In the image of FIG. 4, the scattered light due to the linear defect is displayed at the 9 o'clock position on the left side. However, when compared with the image of FIG. 3, it can be seen that there is a difference in line thickness and sharpness.

The images of Figs. 5 and 6 can be similarly understood.

Referring to the image of FIG. 5, scattered light due to relatively large defects is captured in the lower right portion in particular. As shown in FIG. 4, a plurality of blue band-shaped reflected lights are photographed inside the circular light source image, and it is difficult to find the image of the scattered light due to the defect as shown in FIG. Observed closely, the image of the scattered light due to the defect as shown in FIG. 5 can be obtained at the upper right portion.

In summary, an apparatus for inspecting a lens defect according to the present invention includes: a lens unit to be inspected, which is an object for identifying the presence or absence of a defect; A ring-shaped illumination unit which is provided at a rear side of the inspection object lens unit by a first distance and which emits light toward the inspection object lens unit; And a camera unit installed in front of the inspection object lens unit for acquiring image information of a light source passed through the inspection object lens unit.

As described above, in the lens defect inspection apparatus 1 of the present invention, the ring-shaped light source is provided behind the inspection object lens unit 10, so that the image of the scattered light due to the defect can be more clearly taken In particular, it is easier to identify the defect by removing the reflected light from the surface of the lens through the polarizing filter 40.

When the illumination unit 20 is provided to form a single light source even if the illumination unit 20 is disposed on the rear surface of the lens unit 10 to be inspected, Only the light source caused by the light source is highlighted and the defect can not be identified.

The description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features presented herein.

One; Lens defect inspection system
10; The lens part to be inspected
20; Illumination unit
30; Camera part
40; Polarizing filter

Claims (6)

An inspection object lens unit serving as an object for identifying the presence or absence of a defect;
A ring-shaped illumination unit which is provided at a rear side of the inspection object lens unit by a first distance and which emits light toward the inspection object lens unit; And
A camera unit for acquiring image information of a light source passed through the inspection object lens unit,
And a control unit
Lens defect inspection device.
The method according to claim 1,
Characterized in that the ring-shaped illumination portion is irradiated over the entire ring opposing the inspection object lens portion and has a diameter twice or more of the first distance.
Lens defect inspection device.
3. The method of claim 2,
Characterized in that the ring-shaped illumination portion is a white LED,
Lens defect inspection device.
The method according to claim 1,
Characterized in that the inspection object lens unit is a lens array having n lenses each in the horizontal and vertical directions,
Lens defect inspection device.
5. The method of claim 4,
A controller for matching the image information of the light source obtained from the camera unit with the first lens to the n-th lens; And
And a display unit for outputting the image information matched by the control unit.
Lens defect inspection device.
7. The method according to any one of claims 1 to 6,
Further comprising a polarizing filter disposed between the inspection object lens unit and the camera for superimposing the scattered light due to the defect and removing surface reflected light that interferes with the detection of the defect.
Lens defect inspection device.
KR1020150087668A 2015-06-19 2015-06-19 An apparatus for inspecting a lens defect KR20160149883A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20210063863A1 (en) * 2019-09-02 2021-03-04 Suss Microtec Lithography Gmbh Method and test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit
CN113984790A (en) * 2021-09-28 2022-01-28 歌尔光学科技有限公司 Lens quality detection method and device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100924117B1 (en) 2009-07-15 2009-10-29 김대봉 Lens inspection apparatus
KR101437902B1 (en) 2013-02-07 2014-09-17 (주)아이엠에스나노텍 Apparatus for detecting surface lens of led package

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100924117B1 (en) 2009-07-15 2009-10-29 김대봉 Lens inspection apparatus
KR101437902B1 (en) 2013-02-07 2014-09-17 (주)아이엠에스나노텍 Apparatus for detecting surface lens of led package

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20210063863A1 (en) * 2019-09-02 2021-03-04 Suss Microtec Lithography Gmbh Method and test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit
US11630026B2 (en) * 2019-09-02 2023-04-18 Suss Microoptics Sa Method and test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit
CN113984790A (en) * 2021-09-28 2022-01-28 歌尔光学科技有限公司 Lens quality detection method and device

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