KR20160031812A - Apparatus for Investigating LED Package with X-ray - Google Patents

Abstract

The present invention relates to an X-ray inspection device for an LED package and, more specifically, relates to the X-ray inspection device for the LED package capable of continuous inspection of at least one LED package mounted on a rotation table. The X-ray inspection device for the LED package, which is to detect an inner and an outer defect in an electronic component, comprises: a supply unit (11) supplying a subject to be inspected in order; an index rotation table (14) transferring the subject supplied from the supply unit (11) to a predetermined position; one or more detectors (15) detecting an image of the subject using one or more X-ray tubes (13) arranged to radiate an X-ray to a predetermined position, and the X-ray radiated from one or more X-ray tubes (13); a discharge unit (16) from which the subject which is inspected in the index rotation table (14); and at least two inspection trays including a control unit (C) controlling a movement of the subject and a movement of the index rotation table (14), and arranged at a predetermined position of the index rotation table (14) based on the position of the one or more X-ray tubes (13) and the position of one or more detectors (15).

Description

[0001] Apparatus for Investigating LED Package with X-ray [

The present invention relates to an X-ray inspection apparatus for an LED package, and more particularly, to an X-ray inspection apparatus for an LED package capable of continuous inspection of at least one LED package to be mounted on a rotary table.

X-ray inspection, which is one of the nondestructive tests, is applied to defect management or quality control of products in the fields of architecture, civil engineering, automobile parts, electronic parts, agricultural products, electronic or medical. For example, nondestructive testing can be applied to the production line of printed circuit boards during component mounting and can be used to inspect the solder condition of components in real time. In the X-ray inspection process, a plurality of inspection objects may be continuously inspected according to the inspection object, or each inspection object may be inspected sequentially. Methods of x-ray inspection of various electronic components or devices are known in the art. However, depending on the structure of the electronic components, it is sometimes difficult to check the x-rays. Another method for inspection of electronic components is optical inspection.

Patent Document No. 10-2003-0089293 discloses a transfer device for placing an object to be inspected on an upper portion thereof and transferring the object to a predetermined position; Light generating means provided at a lower portion of the conveying device for emitting light having a predetermined wavelength to an object to be inspected; An optical amplifying means provided on the opposite side of the light generating means for converting and amplifying visible light transmitted through the object to be inspected; An optical unit for optically illuminating the object to be inspected to generate an image; And a camera for receiving an image by an optical unit or an image obtained through the optical amplifying unit to acquire information, and a visual inspection is integrated.

Japanese Patent Application Laid-Open No. 10-2013-0008694 discloses a vision inspection apparatus for an LED component for photographing an LED component with a camera to determine whether the LED component is good or defective and includes a stage unit for fixing or transferring the LED component to an inspection position; A central camera unit located at an upper portion of the stage unit to provide illumination to the LED component; a central camera unit positioned at the center of the illumination unit to obtain a two-dimensional shape of the LED component; A side camera unit disposed on a side of the central camera unit; A lattice pattern irradiating unit disposed on a side surface of the central camera unit, a lattice vision processing unit for measuring a height of the LED component from an image photographed by the central camera unit, and an actual height measuring unit for measuring an actual height of the LED component And a defective judgment unit for judging a defective part from the measurement result from the lattice vision processing unit and the actual height measurement unit, and a control device.

The vision or camera inspection method of an electronic component or a device has a disadvantage that it is difficult to detect defects in the internal structure and the reliability of the inspection itself is low when an accurate image is not obtained. For example, wiring defects inside the LED package are not detected by vision or optical inspection.

Therefore, there is a need for an inspection method for an electronic component or an LED package that enables inspection of the inside or the obscured portion.

The present invention is intended to provide a new inspection apparatus or method which is not presented in the prior art and has the following purpose.

Prior Art 1: Patent Publication No. 10-2003-0089293 (Mir Technology, Inc., published on November 21, 2003) Printed Circuit Board Inspection Device Incorporating X-ray and Visual Inspection Prior Art 2: Patent Publication No. 10-2013-0008694 (Mir Technology, Inc., published on Jan. 23, 2013) 3D vision inspection apparatus and vision inspection method of LED parts Prior Art 3: Patent Publication No. 10-2013-0143380 (HITACHI CORPORATION, published on December 31, 2013) High-speed inspection system of LED using FFP

SUMMARY OF THE INVENTION It is an object of the present invention to provide an X-ray inspection apparatus for an LED package, which is capable of inspecting defects both inside and outside of an electronic part including an LED package.

According to a preferred embodiment of the present invention, an x-ray inspection apparatus for detecting internal and external defects of an electronic component includes: a supply unit for sequentially supplying an object to be inspected; An index rotation table for transferring the object to be inspected supplied from the supply unit to a predetermined position; One or more x-ray tubes arranged to allow irradiation of x-rays to the predetermined position and one or more detectors for detecting an image of the object to be inspected from x-rays irradiated from the one or more x-ray tubes; A discharge unit for discharging the inspected object inspected in the index rotation table; And a control unit for controlling movement of the indexing rotary table and movement of the object to be inspected, wherein the control unit controls the movement of the object to be inspected based on the position on the one or more x- ray tubes and the one or more detectors at a predetermined position of the index rotary table And has at least two inspection trays disposed therein.

According to another preferred embodiment of the present invention, the supply unit places the LED package on the inspection table by the pickup arm.

According to another preferred embodiment of the present invention, the control unit records and stores inspection information on the object to be inspected in the course of rotation of the index rotation table.

According to another preferred embodiment of the present invention, an X-ray inspection method for detecting internal and external defects of an electronic component includes: transferring a plurality of electronic components through a transfer path; Loading the first electronic component of the transferred electronic component into a first inspection tray of an index rotary table in a pickup manner; Transferring the inspection tray to an inspection position of the x-ray tube;

Loading a second electronic component in a second inspection tray of the index rotary table; Transferring the second inspection tray to the inspection position of the x-ray tube while rotating the first electronic component that has been inspected; And performing X-ray inspection on the second electronic component while discharging the first electronic component. In the step of transferring the first electronic component for discharging, inspection information on the first electronic component Recorded and stored.

According to another preferred embodiment of the present invention, the electronic component is an LED package.

The inspection apparatus according to the present invention makes it possible to inspect internal defects of an electronic component including an optical inspection or an LED package incapable of vision inspection. Further, the inspection apparatus according to the present invention has an advantage that inspection efficiency is improved by transferring an object to be inspected on a rotary table and at the same time, determining whether or not a defect is detected and stored.

1 is a block diagram showing an embodiment of a testing apparatus according to the present invention.
2 shows an embodiment of the structure of an inspection apparatus according to the present invention.
3 shows an embodiment of an X-ray tube and a control unit which can be applied to an inspection apparatus according to the present invention.
4A and 4B show an embodiment of the inspection method according to the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the embodiments shown in the accompanying drawings, but the present invention is not limited thereto. In the following description, components having the same reference numerals in different drawings have similar functions, so that they will not be described repeatedly unless necessary for an understanding of the invention, and the known components will be briefly described or omitted. However, It should not be understood as being excluded from the embodiment of Fig.

1 is a block diagram showing an embodiment of a testing apparatus according to the present invention.

Referring to FIG. 1, an X-ray inspection apparatus includes a supply unit 11 for sequentially supplying an object to be inspected; An index rotation table 14 for transferring the object to be inspected supplied from the supply unit 11 to a predetermined position; A detector 15 for detecting an image of the subject to be inspected from X-rays irradiated from the X-ray tube 13 and the X-ray tube 13 arranged so as to irradiate the X-ray to the predetermined position; An exhaust unit (16) for discharging the inspected object inspected in the index rotating table (14); And a control unit (C) for controlling the movement of the object to be inspected and the movement of the indexing rotary table (14), wherein the X-ray tube (13) and the detector ) Of the inspection trays.

The inspection apparatus according to the present invention can detect an internal or external defect of an electronic component or an electronic device such as an LED package, for example. The electronic component can be transferred to the inspection position by an appropriate transfer device and the x-rays irradiated from the x-ray tube can be transmitted through the electronic component. The transmitted x-rays are detected by a detector to obtain an x-ray image, and internal and external defects of the electronic component can be detected from the obtained image to determine whether the electronic component is defective or not. The inspection apparatus according to the present invention allows detection of all types of defects regardless of the type, shape or position of the defects present in the electronic component.

The object to be inspected LP such as a plurality of electronic parts can be aligned in the supply unit 11 and the supply unit 11 can be connected to the external transfer device. The feed unit 11 may be, for example, a ball feeder having a feed path formed therein, and may have at least one path to the indexing table 14. The subject to be inspected LP can be conveyed in order along one conveyance path and the conveyance of the subject to be inspected can be controlled by the control unit C. [ An appropriate detection sensor is installed at the end of the conveyance path to check whether the subject to be inspected (LP) has reached the predetermined position.

When the subject to be inspected LP reaches a predetermined position on the conveying path, it can be put in a standby state and can be picked up by the pick-up unit and transferred to the indexing table 14. Up unit may have a suitable structure for picking up an object to be inspected and placing it on an inspection tray disposed in the index rotary table 14. [ The subject to be inspected LP disposed on the index rotating table 14 can be moved to the inspection position.

The inspection position refers to a position where the X-rays irradiated from the X-ray tube 13 can be transmitted and the X-rays transmitted by the detector 15 can be simultaneously detected. In the inspection apparatus according to the present invention, the X-ray tube 13, the index rotary table 14 and the detector 15 can be disposed inside the sealed test chamber R from outside. And the index rotating table 14 may be disposed between the x-ray tube 13 and the detector 15. [ The X-ray X irradiated from the X-ray tube 13 can be detected by the detector 15 across the indexing rotary table 14 through the subject LP to be inspected.

The indexing rotary table 14 may include a plurality of inspection trays disposed along the circumferential portion, and a position sensor may be installed in each inspection tray. Each inspection tray may have an index and the index rotary table 14 may be configured to be rotatable by a drive device, for example a motor. The inspection tray on which the subject to be inspected LP is loaded can be moved to the inspection position by the rotation of the indexing rotary table 14. The placement position of the inspection tray in the index rotary table 14 can be basically determined by two factors of excitation. One factor is that each inspection tray is placed so that no other inspection trays are located in the irradiation range of the x-rays during the inspection of the inspection target (LP). And the other one is to have the other tray in the discharge position when one inspection tray is in the inspection position. In addition, another factor is that if the inspection tray is in the inspection position, the other tray is in the supply position. According to such factors, at least two inspection trays can be arranged in the index rotation table 14. [ Then, each of the inspection trays is moved to the inspection area, and an image of the inspection subject LP can be obtained by the X-ray tube 13 and the detector 14. The movement of the subject to be inspected LP and the inspection process proceeded by the x-ray tube 13 and the detector 14 can be controlled by the control unit C. Then, the inspected object LP which has been inspected can be moved to the discharge position, and then the new inspected object LP can be moved to the inspection position.

The inspected object LP which has been inspected at the discharge position can be conveyed to the discharge unit 16 through the conveying path P. [ According to the present invention, inspection information on the inspected object LP that has been inspected can be recorded and stored in the control unit C during the conveyance of the inspected object. When an x-ray image is obtained in the inspection process by the x-ray inspection apparatus, it is automatically judged whether it is defective by the naked eye or the contrast image, and the related information is recorded and stored. And the time spent recording and storing relevant information can affect the overall inspection efficiency. Therefore, it is required to reduce the time required for recording and storing related information. According to the present invention, inspection information for an inspected object LP that has been inspected in the course of transferring a new inspected object LP can be recorded and stored, thereby determining whether it is defective or not.

When the subject to be inspected LP is transported to the discharging position, it can be moved along the transport path to the discharging unit 16 and classified according to whether the discharging unit 16 is defective or not. And may be moved to a location determined by the appropriate transport device.

The inspection apparatus according to the present invention may have a transfer, inspection or discharge structure of various structures.

2 shows an embodiment of the structure of an inspection apparatus according to the present invention.

2, the supply unit 11 may include a supply base 111, a ball bucket 112 installed in the supply base 111, and an alignment path 113 connected to the ball bucket 112. The ball bucket 112 may be formed in a conical shape and a conveyance path may be formed on the inner surface. And the transfer path may be connected to the alignment path 113. The alignment path 113 may have a width corresponding to a width of a subject to be inspected and the subject to be inspected may be moved in order along the alignment path. A stopper 114 and a position sensor can be installed at the end of the alignment path 113 and can be detected by the detection sensor when the subject to be inspected reaches the stopper 114. [ And can be transferred to the indexing rotary table 14 by the pick-up arm 21.

The indexing rotary table 14 includes a table base 141, a rotary stage 142 provided above the table base 141 and at least two inspection trays 143 arranged on the rotary stage 142.

The rotation stage 142 can be arranged to have a constant height from the table base 141 and the inspection tray 143 can be arranged at a constant height from the rotation stage 142 as necessary. The rotation stage 142 and the inspection tray 143 are installed at a predetermined height from the table base 141 so that the X-ray irradiated from the X-ray tube 13 can transmit an arbitrary predetermined portion of the object to be inspected do. And allows the detector 15 to obtain an image of an arbitrary portion of the object to be inspected.

The inspection tray 143 may be disposed in a circumferential direction along the rotation stage 142 and at least two inspection trays 143 may be arranged along one diameter line in the rotation stage 142 to one inspection tray 143 Can be located. The other inspection trays 143 may be disposed so as to have the largest circumferential angle in the same direction along one diameter. By arranging the inspection tray 143 in this manner, it is possible to inspect the object to be inspected without interfering with each other during the inspection process.

The x-ray tube 13 may include an x-ray generating tube 131 and a position adjusting unit 132. The x-ray generating tube 131 can be arranged to be movable in the radial direction or in the circumferential direction by the position adjusting unit 132. [ The position of the detector 15 can be moved in association with the position of the x-ray tube 13. For example, the x-ray tube 13 and the detector 15 may be installed in a single moving guide of the circumference and may be installed in a linear guide which traverses the indexing table 14. The X-ray tube 13 and the detector 15 can be moved in association with each other.

The discharge unit 16 may be provided with a conveyance path P connected to the inspection tray 143 and the inspected object to be inspected along the conveyance path P may be moved to the discharge unit 16. [

The discharge unit 16 may include a discharge base 161, a transfer rail 162 installed in the discharge base 161 and at least two discharge containers 163 for receiving the objects to be inspected. The inspected object that has been inspected along the conveying path P can be moved by the conveying rail 162 and the conveying rail 162 can have a circular shape. And can be discharged to a predetermined discharge container 163 in accordance with whether it is normal or defective at a predetermined position. Thereafter, the objects to be inspected contained in the respective discharge containers 163 can be transferred to the predetermined positions.

In the course of the inspection, the x-ray tube 13, the indexing rotary table 14 and the detector 15 can be sealed from the outside. The X-ray tube 13 can be separately sealed as necessary.

FIG. 3 shows an embodiment of an X-ray tube 13 and a control unit C which can be applied to an inspection apparatus according to the present invention.

3 (a), the x-ray tube 13 may include a closed casing 31, a tube unit 32 disposed inside the closed casing 31, and a vacuum pump 33. A through hole 322 for passage of the X-ray may be provided in the sealed case 32, and for example, the through hole 322 may be a transparent window. The inside of the closed case 31 can be made vacuum by the vacuum pump 33.

3 (B), the control unit C includes a fixing bracket 351 for fixing to the examination room, input means 152 such as a keyboard for inputting control commands or inspection related information, 153). The control unit C may be installed outside the examination room and may include various software related to the operation of the examination apparatus.

The inspection apparatus can be operated according to a program embedded in the control unit C to inspect the object to be inspected and the inspection result can be recorded and stored in the control unit C. [

4A and 4B show an embodiment of the inspection method according to the present invention.

4A and 4B. The inspection method according to the present invention includes: a step (P41) of transferring a plurality of electronic components through a transfer path; (P42) picking up a first electronic component of the transferred electronic component in a first inspection tray of an index rotary table; Transferring the inspection tray to an inspection position of the x-ray tube (P43); Loading a second electronic component in a second inspection tray of the index rotary table; Transferring the second inspection tray to the inspection position of the x-ray tube while rotating the first electronic component that has been inspected; And performing X-ray inspection on the second electronic component while discharging the first electronic component. In the step of transferring the first electronic component for discharging, inspection information on the first electronic component Recorded and stored.

The inspection method according to the present invention can be applied to inspection of an electronic component or electronic device such as an LED package, for example. A plurality of LED packages may be advanced (P41) from a supply device 11 such as a ball feeder and loaded on an inspection tray of the indexing rotary table 14 by a pick-up arm 21 such as a robot arm (P42). And the indexing rotary table 14 is moved so that another LED lid support can be loaded in another inspection tray. The LED package can be moved to the inspection position while the index rotary table 14 is rotated. The cross section of the LED package can be obtained by the X-ray tube 13 and the detector 15 in the inspection region (P43). And a cross-sectional image may be transmitted to the control unit and displayed. Then, the index rotary table 14 can be rotated, and the inspected object to be inspected can be transferred to the discharge position. It is determined whether or not the LED package having the cross-sectional image is defective in the transferring process, so that the related information can be inputted. At the discharge position, the inspected LED package can be discharged, and at the same time, a new LED package can be loaded in the inspection tray. The simultaneous discharging and loading is intended to reduce the time required for the test chamber to be sealed from the outside and to be sealed during the inspection process. Thereafter, the inspection of the new LED package may proceed.

The inspection method according to the present invention can be performed by various methods, and the present invention is not limited to the embodiments shown.

The inspection apparatus according to the present invention makes it possible to inspect internal defects of an electronic component including an optical inspection or an LED package incapable of vision inspection. Further, the inspection apparatus according to the present invention has an advantage that inspection efficiency is improved by transferring an object to be inspected on a rotary table and at the same time, determining whether or not a defect is detected and stored.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention . The invention is not limited by these variations and modifications, but is limited only by the claims appended hereto.

C: control unit 11: supply unit
13: X-ray tube 14: Index rotary table
15: Detector 16: Exhaust unit
21: Pick-up arm 31: Sealed case
32: tube unit 33: vacuum pump
111: supply base 112: ball bucket
113: alignment path 114: stopper
131: X-ray generating tube 132: Position adjusting unit
141: table base 142: rotating stage
143: inspection tray 152: input means
153: Display 161: Discharge base
162: transfer rail 163: discharge container
322: Through hole 351: Fixing bracket

Claims (5)

1. An X-ray inspection apparatus for detecting internal and external defects of an electronic component,
A supply unit (11) for sequentially supplying the objects to be inspected;
An index rotation table 14 for transferring the object to be inspected supplied from the supply unit 11 to a predetermined position;
One or more x-ray tubes (13) arranged to allow irradiation of the x-rays to the predetermined position and one or more x-ray tubes (13) for detecting the image of the subject to be inspected from the x-rays irradiated from the one or more x- A detector 15;
An exhaust unit (16) for discharging the inspected object inspected in the index rotating table (14); And
And a control unit (C) for controlling the movement of the index rotating table (14) and the movement of the subject to be inspected,
And at least two inspection trays disposed on the basis of the position on the one or more x-ray tubes (13) and the one or more detectors (15) at predetermined positions of the index rotary table (14) X-ray inspection device of LED package. The apparatus according to claim 1, wherein the supply unit (11) places the LED package on the inspection table by a pick-up arm. The apparatus according to claim 1, wherein the control unit (C) records and stores inspection information on the object to be inspected in the course of rotation of the index rotation table (14). 1. An X-ray inspection method for detecting internal and external defects of an electronic component,
Transporting a plurality of electronic components through a transport path;
Loading the first electronic component of the transferred electronic component into a first inspection tray of an index rotary table in a pickup manner;
Transferring the inspection tray to an inspection position of the x-ray tube;
Loading a second electronic component in a second inspection tray of the index rotary table;
Transferring the second inspection tray to the inspection position of the x-ray tube while rotating the first electronic component that has been inspected; And
And performing X-ray inspection on the second electronic component while discharging the first electronic component,
Wherein inspection information for the first electronic component is recorded and stored in the step of transferring the first electronic component for discharging. The inspection method according to claim 4, wherein the electronic component is an LED package.

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