KR20130135115A - 마이크로리소그래피용 단위-배율 대형-포맷 반사 굴절 렌즈 - Google Patents
마이크로리소그래피용 단위-배율 대형-포맷 반사 굴절 렌즈 Download PDFInfo
- Publication number
- KR20130135115A KR20130135115A KR1020130061102A KR20130061102A KR20130135115A KR 20130135115 A KR20130135115 A KR 20130135115A KR 1020130061102 A KR1020130061102 A KR 1020130061102A KR 20130061102 A KR20130061102 A KR 20130061102A KR 20130135115 A KR20130135115 A KR 20130135115A
- Authority
- KR
- South Korea
- Prior art keywords
- lens
- prism
- line
- concave
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000001393 microlithography Methods 0.000 title claims abstract description 21
- 230000001681 protective effect Effects 0.000 claims abstract description 18
- 238000001228 spectrum Methods 0.000 claims abstract description 16
- 230000003287 optical effect Effects 0.000 claims description 56
- 238000000034 method Methods 0.000 claims description 28
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 10
- 239000005350 fused silica glass Substances 0.000 claims description 10
- 238000003384 imaging method Methods 0.000 claims description 8
- 230000005499 meniscus Effects 0.000 claims description 7
- LFULEKSKNZEWOE-UHFFFAOYSA-N propanil Chemical compound CCC(=O)NC1=CC=C(Cl)C(Cl)=C1 LFULEKSKNZEWOE-UHFFFAOYSA-N 0.000 claims description 7
- 235000012431 wafers Nutrition 0.000 description 32
- 238000013461 design Methods 0.000 description 24
- 239000000463 material Substances 0.000 description 22
- 230000003595 spectral effect Effects 0.000 description 14
- 238000004519 manufacturing process Methods 0.000 description 11
- 238000000206 photolithography Methods 0.000 description 9
- 230000005540 biological transmission Effects 0.000 description 8
- 239000011521 glass Substances 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 230000008901 benefit Effects 0.000 description 6
- 238000009792 diffusion process Methods 0.000 description 5
- 230000004075 alteration Effects 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 4
- 239000005304 optical glass Substances 0.000 description 4
- 238000005457 optimization Methods 0.000 description 4
- 229910004261 CaF 2 Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 239000012855 volatile organic compound Substances 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 201000009310 astigmatism Diseases 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 210000002268 wool Anatomy 0.000 description 2
- 240000006829 Ficus sundaica Species 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/02—Viewing or reading apparatus
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/04—Prisms
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
- G03B21/14—Details
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/02—Exposure apparatus for contact printing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/42—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Optical Elements Other Than Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261653020P | 2012-05-30 | 2012-05-30 | |
| US61/653,020 | 2012-05-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20130135115A true KR20130135115A (ko) | 2013-12-10 |
Family
ID=49579561
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020130061102A Withdrawn KR20130135115A (ko) | 2012-05-30 | 2013-05-29 | 마이크로리소그래피용 단위-배율 대형-포맷 반사 굴절 렌즈 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8830590B2 (enExample) |
| JP (1) | JP5806257B2 (enExample) |
| KR (1) | KR20130135115A (enExample) |
| DE (1) | DE102013008814A1 (enExample) |
| TW (1) | TWI484220B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20200020812A (ko) * | 2017-06-19 | 2020-02-26 | 서스 마이크로텍 포토닉 시스템즈 인코포레이티드 | 광학계에서의 배율 보상 및 빔 조향 방법 및 장치 |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9341951B2 (en) * | 2012-12-21 | 2016-05-17 | Ultratech, Inc. | Wynn-dyson imaging system with reduced thermal distortion |
| US9488811B2 (en) | 2013-08-20 | 2016-11-08 | Ultratech, Inc. | Wynne-Dyson optical system with variable magnification |
| US9436103B2 (en) * | 2014-05-19 | 2016-09-06 | Ultratech, Inc. | Wynne-Dyson projection lens with reduced susceptibility to UV damage |
| CN106462085B (zh) | 2014-06-23 | 2019-05-17 | Asml荷兰有限公司 | 光刻设备和方法 |
| JP2016080870A (ja) * | 2014-10-17 | 2016-05-16 | 財団法人國家實驗研究院 | 共役共通光路リソグラフィレンズ |
| DE102015104323A1 (de) | 2015-03-23 | 2016-09-29 | Carl Zeiss Smt Gmbh | Zoomsystem mit austauschbaren optischen Elementen |
| JP2016218299A (ja) * | 2015-05-22 | 2016-12-22 | 財団法人國家實驗研究院 | 単一非球面共通光学素子露光機レンズセット |
| US9618734B2 (en) * | 2015-06-17 | 2017-04-11 | National Applied Research Laboratories | Optical components exposer set having non-spherical component |
| JP6665646B2 (ja) * | 2016-04-08 | 2020-03-13 | 日立化成デュポンマイクロシステムズ株式会社 | パターン硬化膜の製造方法、電子部品の製造方法、及び当該パターン硬化膜の製造方法に用いるポジ型感光性樹脂組成物 |
| JP6819773B2 (ja) | 2016-09-06 | 2021-01-27 | 株式会社ニコン | 反射屈折等倍アフォーカル瞳孔リレー及びこれを採用した光学撮影系 |
| WO2021239970A2 (de) * | 2020-05-28 | 2021-12-02 | Schott Ag | Abbildungssystem umfassend strahlführungselement mit hoher solarisationsbeständigkeit im blauen spektralbereich |
| CN114322944B (zh) * | 2021-12-24 | 2023-09-12 | 中国科学院长春光学精密机械与物理研究所 | 同轴折返式导航与光谱一体化光学系统 |
| CN119395866A (zh) * | 2024-12-30 | 2025-02-07 | 青岛芯微半导体科技有限公司 | 一种基于反射对称结构的高像质紫外物镜 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8011A (en) * | 1851-04-01 | Improvement in blasti ng rocks | ||
| US1401345A (en) | 1921-09-02 | 1921-12-27 | Mechau Emil | Motion-picture-projection apparatus |
| US1783998A (en) | 1927-03-09 | 1930-12-09 | Tech D Optique Et De Photograp | Photographic reproduction objective with two diaphragms and its application as in printing positives for black and white cinematography, color cinematography, or cinematography in relief |
| US2742817A (en) | 1953-05-29 | 1956-04-24 | Eastman Kodak Co | Unit magnification catadioptric lens system |
| US4896952A (en) * | 1988-04-22 | 1990-01-30 | International Business Machines Corporation | Thin film beamsplitter optical element for use in an image-forming lens system |
| US5159172A (en) * | 1990-08-07 | 1992-10-27 | International Business Machines Corporation | Optical projection system |
| US5161062A (en) * | 1991-07-11 | 1992-11-03 | General Signal Corporation | Optical projection system including a refractive lens assembly having a gap between constituent lenses |
| JPH08211294A (ja) | 1995-02-02 | 1996-08-20 | Nikon Corp | 投影露光装置 |
| US5969803A (en) | 1998-06-30 | 1999-10-19 | Nikon Corporation | Large NA projection lens for excimer laser lithographic systems |
| EP0989434B1 (en) * | 1998-07-29 | 2006-11-15 | Carl Zeiss SMT AG | Catadioptric optical system and exposure apparatus having the same |
| DE10127227A1 (de) * | 2001-05-22 | 2002-12-05 | Zeiss Carl | Katadioptrisches Reduktionsobjektiv |
| EP1430346A1 (en) * | 2001-09-20 | 2004-06-23 | Carl Zeiss SMT AG | Catadioptric reduction lens |
| TWI249082B (en) * | 2002-08-23 | 2006-02-11 | Nikon Corp | Projection optical system and method for photolithography and exposure apparatus and method using same |
| US6879383B2 (en) | 2002-12-27 | 2005-04-12 | Ultratech, Inc. | Large-field unit-magnification projection system |
| US6813098B2 (en) | 2003-01-02 | 2004-11-02 | Ultratech, Inc. | Variable numerical aperture large-field unit-magnification projection system |
| US6863403B2 (en) | 2003-05-27 | 2005-03-08 | Ultratech, Inc. | Deep ultraviolet unit-magnification projection optical system and projection exposure apparatus |
| JP2005024584A (ja) * | 2003-06-30 | 2005-01-27 | Nikon Corp | 走査型投影露光装置及び露光方法 |
| US20080151364A1 (en) * | 2004-01-14 | 2008-06-26 | Carl Zeiss Smt Ag | Catadioptric projection objective |
| JP2005312182A (ja) | 2004-04-21 | 2005-11-04 | Denso Corp | 回転電機の集中巻き型ステータコイル |
| US7148953B2 (en) | 2004-11-01 | 2006-12-12 | Ultratech, Inc. | Apochromatic unit-magnification projection optical system |
| DE102005024290A1 (de) * | 2005-05-27 | 2006-11-30 | Carl Zeiss Smt Ag | Abbildungssystem, insbesondere für eine mikrolithographische Projektionsbelichtungsanlage |
| EP1912098B1 (en) * | 2006-10-12 | 2012-04-25 | Carl Zeiss SMT GmbH | Unit magnification projection objective |
| US20100283978A1 (en) * | 2009-05-07 | 2010-11-11 | Ultratech,Inc. | LED-based UV illuminators and lithography systems using same |
| US8493670B2 (en) * | 2010-09-10 | 2013-07-23 | Coherent, Inc. | Large-field unit-magnification catadioptric projection system |
-
2013
- 2013-05-20 US US13/897,514 patent/US8830590B2/en not_active Expired - Fee Related
- 2013-05-24 DE DE102013008814A patent/DE102013008814A1/de not_active Ceased
- 2013-05-29 JP JP2013112803A patent/JP5806257B2/ja not_active Expired - Fee Related
- 2013-05-29 TW TW102118925A patent/TWI484220B/zh not_active IP Right Cessation
- 2013-05-29 KR KR1020130061102A patent/KR20130135115A/ko not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20200020812A (ko) * | 2017-06-19 | 2020-02-26 | 서스 마이크로텍 포토닉 시스템즈 인코포레이티드 | 광학계에서의 배율 보상 및 빔 조향 방법 및 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2013250556A (ja) | 2013-12-12 |
| TWI484220B (zh) | 2015-05-11 |
| US8830590B2 (en) | 2014-09-09 |
| DE102013008814A1 (de) | 2013-12-05 |
| TW201348739A (zh) | 2013-12-01 |
| US20130321935A1 (en) | 2013-12-05 |
| JP5806257B2 (ja) | 2015-11-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR20130135115A (ko) | 마이크로리소그래피용 단위-배율 대형-포맷 반사 굴절 렌즈 | |
| US7573655B2 (en) | Unit magnification projection objective | |
| US7006304B2 (en) | Catadioptric reduction lens | |
| US7782538B2 (en) | Projection objective having a high aperture and a planar end surface | |
| KR100876153B1 (ko) | 비구면 요소를 갖는 투영 노출 렌즈 시스템 | |
| JP2013250556A5 (enExample) | ||
| KR101288187B1 (ko) | 반사굴절식 투영 대물렌즈 | |
| JP5106858B2 (ja) | 高開口数と平面状端面とを有する投影対物レンズ | |
| JP4717974B2 (ja) | 反射屈折光学系及び該光学系を備える投影露光装置 | |
| TWI420249B (zh) | 投影曝光裝置、投影曝光方法及投影物 | |
| TW200426536A (en) | Deep ultraviolet unit-magnification projection optical system and projection exposure apparatus | |
| US7450300B2 (en) | High resolution objective lens assembly | |
| KR102205062B1 (ko) | 자외선 손상에 대한 감수성이 감소된 윈-다이슨 투사렌즈 | |
| JP2008519433A (ja) | アポクロマート等倍投影光学系 | |
| US6208473B1 (en) | Catadioptric projection lens | |
| US7957069B2 (en) | Projection optical system | |
| KR20080011301A (ko) | 결상 시스템, 특히 마이크로 리소그래픽 투영 조명 유닛에사용될 수 있는 결상 시스템 | |
| US20080037111A1 (en) | Catadioptric Projection Objective | |
| US20090091728A1 (en) | Compact High Aperture Folded Catadioptric Projection Objective | |
| WO2007071569A1 (en) | Projection objective of a microlithographic projection exposure apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20130529 |
|
| PG1501 | Laying open of application | ||
| PC1203 | Withdrawal of no request for examination | ||
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |