KR20120019083A - Device for checking crack of external electrode fluorescent lamp - Google Patents

Device for checking crack of external electrode fluorescent lamp Download PDF

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Publication number
KR20120019083A
KR20120019083A KR1020100082221A KR20100082221A KR20120019083A KR 20120019083 A KR20120019083 A KR 20120019083A KR 1020100082221 A KR1020100082221 A KR 1020100082221A KR 20100082221 A KR20100082221 A KR 20100082221A KR 20120019083 A KR20120019083 A KR 20120019083A
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KR
South Korea
Prior art keywords
fluorescent lamp
external electrode
electrode fluorescent
crack
inspection
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KR1020100082221A
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Korean (ko)
Inventor
이준형
최승태
Original Assignee
주식회사 유비젼
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Priority to KR1020100082221A priority Critical patent/KR20120019083A/en
Publication of KR20120019083A publication Critical patent/KR20120019083A/en

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/1336—Illuminating devices
    • G02F1/133602—Direct backlight
    • G02F1/133604—Direct backlight with lamps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J61/00—Gas-discharge or vapour-discharge lamps
    • H01J61/02—Details
    • H01J61/30—Vessels; Containers
    • H01J61/33—Special shape of cross-section, e.g. for producing cool spot
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J61/00—Gas-discharge or vapour-discharge lamps
    • H01J61/02—Details
    • H01J61/30—Vessels; Containers
    • H01J61/35—Vessels; Containers provided with coatings on the walls thereof; Selection of materials for the coatings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J65/00—Lamps without any electrode inside the vessel; Lamps with at least one main electrode outside the vessel
    • H01J65/04—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels
    • H01J65/042—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels by an external electromagnetic field
    • H01J65/046—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels by an external electromagnetic field the field being produced by using capacitive means around the vessel
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/24—Manufacture or joining of vessels, leading-in conductors or bases
    • H01J9/26—Sealing together parts of vessels
    • H01J9/265—Sealing together parts of vessels specially adapted for gas-discharge tubes or lamps
    • H01J9/266—Sealing together parts of vessels specially adapted for gas-discharge tubes or lamps specially adapted for gas-discharge lamps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42—Measurement or testing during manufacture

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electromagnetism (AREA)
  • Plasma & Fusion (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention relates to a device capable of automatically checking whether an external electrode fluorescent lamp is defective. More specifically, both ends of the external electrode fluorescent lamp are photographed with a camera provided with a strain viewer filter. Afterwards, the photographed image is transmitted to the monitor to check stress defects caused by cracks inside the fusion surface and minute temperature control changes in the manufacturing process, and the image obtained through a device using dark field lighting. The present invention relates to a device for crack inspection of an external electrode fluorescent lamp capable of inspecting progressive cracks and fine cracks.

Description

Device for checking crack of external electrode fluorescent lamp

The present invention relates to a device capable of automatically checking whether an external electrode fluorescent lamp is defective. More specifically, both ends of the external electrode fluorescent lamp are photographed with a camera provided with a strain viewer filter. Afterwards, the photographed image is transmitted to the monitor to check stress defects caused by cracks inside the fusion surface and minute temperature control changes in the manufacturing process, and the image obtained through a device using dark field lighting. The present invention relates to a device for crack inspection of an external electrode fluorescent lamp capable of inspecting progressive cracks and fine cracks.

In general, a fluorescent lamp used for a backlight of a liquid crystal display device includes a Cold Cathode Fluorescent Lamp (CCFL) in which the electrode is located inside the glass tube and an external electrode fluorescent lamp in which the electrode is located outside the glass tube. (External Electrode Fluorescent Lamp, EEFL).

The external electrode fluorescent lamp (EEFL) is injected into a glass tube by injecting a mixed gas containing a small amount of mercury into a filling gas composed of neon and argon, and then sealing the external electrode by installing an external electrode on both ends of the glass tube. By using capacitive coupling, particles are accumulated at both ends of the glass tube, so that an alternating current discharge is used in which a plasma current flows crosswise in the discharge tube.

Therefore, the external electrode fluorescent lamp (EEFL) has a long life naturally because the electrode is not in direct contact with the plasma, and the production of the lamp is simple because there is no electrode inside, which can be modified in various forms. Do. In addition, since a plurality of lamps can be connected and driven in parallel, power consumption is low and the brightness is uniform. In other words, unlike cold cathode fluorescent lamps, external electrode fluorescent lamps (EEFL) have the advantage of being able to be connected in parallel to reduce the number of inverters. It will be simple and suitable for solving problems such as low cost and long life, which are problems of the liquid crystal display device.

On the other hand, when the outline of the provision process of the external electrode fluorescent lamp (EEFL), a glass tube coated with a fluorescent material is heated with a torch to pull the heated spot to both sides to shrink and seal the diameter, and the other side by the same method. The inside of the glass tube was vacuumed by mercury and gas injection pipes on one side with the exhaust pipe while shrinking the diameter, and then mercury (Hg), neon (Ne) gas, and argon (Ar) gas were injected, and the diameter was minimized. After sealing while heating, it is a system to manufacture by coating a conductor on both outer sides.

The external electrode fluorescent lamp (EEFL), which implements the above-described method, fails to fully function when there are minute defects, cracks, or scratches on its body, or mass-produces a problem that the lifespan is significantly reduced. A separate inspection process is essential.

Thus, in the past, the worker was able to determine whether the lamp was defective, such as cracks or scratches, and shipped it as a finished product only when it was good.However, the size of the main part of the lamp is extremely small and minute, so it is accurate to determine the defect only by the operator's start. In addition, it is almost impossible to visually identify cracks generated on the inner surface of the fusion surface, and it is pointed out that the time required for inspection work and the manpower increase due to this are uneconomical.

In addition, in recent years, a method of checking for defects through a magnifying glass, a microscope, or a general camera is commonly used. However, in order to observe a large number of lamps individually, the inconvenience of having to put them on a work table as well as placing a lamp on a work table individually The lamp is frequently damaged in the process, and this must also be determined directly by the operator's naked eye, which not only reduces work efficiency, but also makes it impossible to detect cracks inside the lamp easily with a magnifying glass or microscope. In addition, there is a problem in that the crack inside the fusion surface cannot be effectively determined only by the information on the contrast even when the image is obtained by using a general camera.

In addition, the progressive crack and the minute crack of the external electrode fluorescent lamp (EEFL) is limited to inspect with an image using a general camera and dark field illumination.

The present invention is to solve the above problems, in order to accurately and quickly check the defect of the external electrode fluorescent lamp (EEFL) to check the image taken with a general camera, rather than a strain viewer filter installed It is an object of the present invention to provide a device for crack inspection of an external electrode fluorescent lamp for inspecting cracks and advanced cracks and fine cracks generated inside the fusion surface of the external electrode fluorescent lamp (EEFL) as an image photographed using a camera.

The present invention provides a device for inspecting an external electrode fluorescent lamp (EEFL), the external electrode fluorescent, characterized in that the camera is provided with a strain viewer filter for inspecting the crack inside the fusion surface of the external electrode fluorescent lamp (EEFL) Provides a device for crack inspection of lamps.

The strain viewer filter provides a device for crack inspection of an external electrode fluorescent lamp, characterized in that the polarizing lens, PE film, polarizing filter is configured between the camera 20 lens and the LED light.

The present invention provides a device for crack inspection of an external electrode fluorescent lamp further comprising a device to which dark field illumination is applied to examine progressive cracks and minute cracks of the external electrode fluorescent lamp (EEFL).

The device using the dark field lighting, the bottom of the black reflector is installed at the bottom of the reflection mirror to improve the efficiency of the reflection, the LED white light to illuminate the white phosphor of the sample is applied to the light It provides a device for crack inspection of the external electrode fluorescent lamp, characterized in that configured to go on the glass tube.

The present invention is to check whether the external electrode fluorescent lamp (EEFL) is defective, by using a camera equipped with a strain viewer filter to take an image of the external electrode fluorescent lamp (EEFL) and transmit it to the monitor to examine the external defects Apart from the level of inspection, the cracks inside the fusion surface can be inspected precisely, and the image obtained through the application of dark field illumination is used to inspect the progressive cracks and minute cracks of the external electrode fluorescent lamp (EEFL). It can be effective.

1 is a view showing an inspection apparatus of an external electrode fluorescent lamp using a conventional general camera.
2 is a view showing an inspection apparatus of an external electrode fluorescent lamp using a camera provided with a strain viewer filter of the present invention.
3 is a view showing an inspection apparatus to which the dark field illumination of the present invention is applied.

The present invention relates to a device capable of automatically checking whether an external electrode fluorescent lamp is defective. More specifically, both ends of the external electrode fluorescent lamp are photographed with a camera provided with a strain viewer filter. Afterwards, the photographed image is transmitted to the monitor to check stress defects caused by cracks inside the fusion surface and minute temperature control changes in the manufacturing process, and the image obtained through a device using dark field lighting. The present invention relates to a device for crack inspection of an external electrode fluorescent lamp capable of inspecting progressive cracks and fine cracks.

On the other hand, the present invention is a supplement to the 'external electrode fluorescent lamp inspection apparatus' of the registration number 10-0919295 registered by the same applicant, in particular it is configured to implement a more accurate inspection by improving the photographing unit of the inspection apparatus.

Hereinafter, the detailed description of the inspection apparatus will be omitted, and the apparatus for crack inspection of the external electrode fluorescent lamp of the present invention will be described in detail with reference to the accompanying drawings.

1 is a view showing the inspection device of the external electrode fluorescent lamp (EEFL) using a conventional general camera, Figure 2 is a view showing the inspection device of the external electrode fluorescent lamp (EEFL) using a camera having a strain viewer filter of the present invention. 3 is a view showing an inspection apparatus to which the dark field illumination of the present invention is applied.

In the conventional external electrode fluorescent lamp (EEFL) 10 inspection apparatus, as shown in Figure 1, to obtain an image using a general camera.

After transmitting the image obtained by the general camera 20 to the inspection monitor is configured to inspect the crack inside the fusion surface using the difference in contrast.

2 is a device for crack inspection of an external electrode fluorescent lamp (EEFL) using a camera provided with a strain viewer filter according to the present invention.

Typically, the strain viewer 30 has been used as a tool for inspecting stress patterns for glass or plastic end products, which expresses the degree of refraction of light passing through the medium in a color spectrum to visually express the degree of stress. It is a tool that can be checked with. The biggest advantage of the strain viewer 30 is that if a crack occurs inside the fusion surface of the fluorescent lamp, the vision test using a general transmissive test method does not show the symptoms well in the camera 20 image. According to the method, since the crack generated inside the fusion surface of the fluorescent lamp changes the refractive index of the light passing through the light source installed below, the camera 20 appears as a complex color image pattern than the general color, so when the crack occurs. By analyzing the color image pattern in the steady state and can recognize the crack.

The camera 20 having the strain viewer 30 installed therein comprises a polarization lens 40, a PE film 50, and a polarization filter 60 between the general camera and the LED light 70. Consists of installing it.

In addition, the strain viewer 30 filter is mounted to the front end of the camera 20 to detect the crack by using a feature that changes the color distribution of the color image when the inner crack occurs, and thus the inspection screen of the product It describes by way of example.

Figure pat00001

<Image recorded with a camera with strain viewer filter>

On the other hand, it is also possible to inspect the stress failure of the external electrode fluorescent lamp (EEFL) 10 which is not visible by normal microscope observation with the camera 20 inspection apparatus using the strain viewer 30 filter.

Hereinafter, an inspection screen of the product will be described.

Figure pat00002

       [Normal] [bad] [bad]

3 is a view showing an inspection apparatus to which the dark field illumination of the present invention is applied.

Progressive cracks and fine cracks of the external electrode fluorescent lamp (EEFL) 10 are used to detect the cracks through the interference of light in the site where the cracks occur, rather than appearing through the microscope of the inspector.

The following shows an example of a conventional inspection screen using general lighting and dark field lighting.

Figure pat00003

<Image using general lighting>

Figure pat00004

<Image using dark field lighting>

In the inspection method using general lighting as described above, the progressive crack and the minute crack are not detected.

In addition, the inspection device using the dark field illumination is a blind spot that does not appear in the image of the camera 20 when the crack is located in the upper and lower bright areas.

Apparatus applying the dark field illumination of the present invention is configured with a black bottom reflector 80 at the bottom, using a reflection mirror (not shown) to improve the reflection efficiency, and the inspection image after the LED white light shines It consists of shooting.

The LED white light shining on the external electrode fluorescent lamp (EEFL) 10 illuminates a portion on which a white phosphor of a sample is applied so that light can travel through a glass tube, and after taking an image, it is transmitted to a monitor and has a crack failure. To be able to check.

The following shows an example of an inspection screen of a device to which darkfield lighting is applied.

Figure pat00005

<Image using dark field lighting>

As described above, it is possible to inspect the progressive crack and the minute crack with the image to which the dark field illumination is applied.

The present invention is a device for inspecting the external electrode fluorescent lamp (EEFL) 10, the camera is provided with a strain viewer 30 filter for inspecting the crack inside the fusion surface of the external electrode fluorescent lamp (EEFL) (10) Provided is a device for crack inspection of an external electrode fluorescent lamp, characterized in that (20) is configured.

The strain viewer 30 filter is a crack of the external electrode fluorescent lamp, characterized in that the polarizing lens 40, PE film 50, the polarizing filter 60 is configured between the camera 20 lens and the LED light 70. Provide a device for inspection.

In addition, the present invention provides a device for crack inspection of an external electrode fluorescent lamp further includes a device that applies dark field illumination to inspect the progressive crack and fine crack of the external electrode fluorescent lamp (EEFL) (10).

In addition, the device applying the dark field illumination, the lower reflector 80 of the black is installed at the bottom and using a reflection mirror to improve the reflection efficiency, the LED white light on the portion where the white phosphor of the sample is applied The present invention provides a device for crack inspection of an external electrode fluorescent lamp, characterized in that the light is illuminated so as to travel through the glass tube.

As described above, the present invention is to check whether the external electrode fluorescent lamp (EEFL) is defective, and transmits to the monitor after taking an image of the external electrode fluorescent lamp (EEFL) using a camera equipped with a strain viewer filter By inspecting the external defects, the cracks on the inside of the fusion surface can be precisely inspected from the level where the external defects were inspected, and the progressive crack of the external electrode fluorescent lamp (EEFL) is an image obtained through a device using dark field illumination. There is an effect that can inspect the fine cracks.

The foregoing description of the present invention is intended for illustration, and it will be understood by those skilled in the art that the present invention may be easily modified in other specific forms without changing the technical spirit or essential features of the present invention. will be.

It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive. For example, each component described as a single type may be implemented in a distributed manner, and similarly, components described as distributed may be implemented in a combined form.

The scope of the present invention is shown by the following claims rather than the detailed description, and all changes or modifications derived from the meaning and scope of the claims and their equivalents should be construed as being included in the scope of the present invention.

10: external electrode fluorescent lamp
20: camera
30: strain viewer
40: polarized lens
50: PE film
60: polarization filter
70: LED light
80: bottom reflector

Claims (4)

An apparatus for inspecting an external electrode fluorescent lamp (EEFL),
Apparatus for crack inspection of the external electrode fluorescent lamp, characterized in that the camera 20 is installed with a strain viewer (30) filter is installed for the crack inspection inside the fusion surface of the external electrode fluorescent lamp (EEFL) (10). The method of claim 1,
The strain viewer 30 filter is a crack of the external electrode fluorescent lamp, characterized in that the polarizing lens 40, PE film 50, the polarizing filter 60 is configured between the camera 20 lens and the LED light 70. Device for inspection. The method of claim 1,
Apparatus for crack inspection of the external electrode fluorescent lamp further comprises a device for applying the dark field illumination to examine the progressive crack and fine cracks of the external electrode fluorescent lamp (EEFL) (10). The method of claim 3,
Apparatus applying the dark field illumination, the lower reflector 80 of the black is installed at the bottom and using a reflection mirror (not shown) to improve the reflection efficiency, the white phosphor of the sample is coated with LED white light Apparatus for crack inspection of an external electrode fluorescent lamp, characterized in that the light is illuminated to the part so that the light can travel through the glass tube.
KR1020100082221A 2010-08-25 2010-08-25 Device for checking crack of external electrode fluorescent lamp KR20120019083A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240079499A (en) 2022-11-29 2024-06-05 전영욱 Apparatus for preventing glare in a surface inspection system using cameras
KR20240079498A (en) 2022-11-29 2024-06-05 전영욱 Apparatus for preventing glare in a surface inspection system using cameras

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240079499A (en) 2022-11-29 2024-06-05 전영욱 Apparatus for preventing glare in a surface inspection system using cameras
KR20240079498A (en) 2022-11-29 2024-06-05 전영욱 Apparatus for preventing glare in a surface inspection system using cameras

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