KR20110077756A - 박막 태양전지용 투명 전극의 텍스처 구조 형성방법 및 투명 전극 - Google Patents
박막 태양전지용 투명 전극의 텍스처 구조 형성방법 및 투명 전극 Download PDFInfo
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- KR20110077756A KR20110077756A KR1020090134412A KR20090134412A KR20110077756A KR 20110077756 A KR20110077756 A KR 20110077756A KR 1020090134412 A KR1020090134412 A KR 1020090134412A KR 20090134412 A KR20090134412 A KR 20090134412A KR 20110077756 A KR20110077756 A KR 20110077756A
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- glass
- thin film
- solar cell
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- electrode
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- 239000011521 glass Substances 0.000 title claims abstract description 81
- 239000010409 thin film Substances 0.000 title claims abstract description 43
- 239000000758 substrate Substances 0.000 title claims abstract description 34
- 238000002360 preparation method Methods 0.000 title 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims abstract description 66
- 238000000034 method Methods 0.000 claims abstract description 48
- 239000011324 bead Substances 0.000 claims abstract description 29
- 239000005388 borosilicate glass Substances 0.000 claims abstract description 6
- 229920006395 saturated elastomer Polymers 0.000 claims abstract description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 5
- 238000005530 etching Methods 0.000 claims description 35
- 239000000243 solution Substances 0.000 claims description 14
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 claims description 4
- 238000002347 injection Methods 0.000 claims description 4
- 239000007924 injection Substances 0.000 claims description 4
- 239000005365 phosphate glass Substances 0.000 claims description 3
- 238000005507 spraying Methods 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 abstract description 15
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 abstract description 4
- 229910000147 aluminium phosphate Inorganic materials 0.000 abstract description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 abstract 2
- 229910000030 sodium bicarbonate Inorganic materials 0.000 abstract 1
- 235000017557 sodium bicarbonate Nutrition 0.000 abstract 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 18
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 15
- 238000004458 analytical method Methods 0.000 description 15
- 229910052710 silicon Inorganic materials 0.000 description 15
- 239000010703 silicon Substances 0.000 description 15
- 239000010408 film Substances 0.000 description 11
- 238000000151 deposition Methods 0.000 description 9
- 239000011787 zinc oxide Substances 0.000 description 9
- 229910006404 SnO 2 Inorganic materials 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 238000001039 wet etching Methods 0.000 description 5
- 238000010306 acid treatment Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 238000001312 dry etching Methods 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000000445 field-emission scanning electron microscopy Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- OHVLMTFVQDZYHP-UHFFFAOYSA-N 1-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)-2-[4-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidin-5-yl]piperazin-1-yl]ethanone Chemical compound N1N=NC=2CN(CCC=21)C(CN1CCN(CC1)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)=O OHVLMTFVQDZYHP-UHFFFAOYSA-N 0.000 description 1
- KZEVSDGEBAJOTK-UHFFFAOYSA-N 1-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)-2-[5-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidin-5-yl]-1,3,4-oxadiazol-2-yl]ethanone Chemical compound N1N=NC=2CN(CCC=21)C(CC=1OC(=NN=1)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)=O KZEVSDGEBAJOTK-UHFFFAOYSA-N 0.000 description 1
- LDXJRKWFNNFDSA-UHFFFAOYSA-N 2-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)-1-[4-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidin-5-yl]piperazin-1-yl]ethanone Chemical compound C1CN(CC2=NNN=C21)CC(=O)N3CCN(CC3)C4=CN=C(N=C4)NCC5=CC(=CC=C5)OC(F)(F)F LDXJRKWFNNFDSA-UHFFFAOYSA-N 0.000 description 1
- JQMFQLVAJGZSQS-UHFFFAOYSA-N 2-[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]piperazin-1-yl]-N-(2-oxo-3H-1,3-benzoxazol-6-yl)acetamide Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)N1CCN(CC1)CC(=O)NC1=CC2=C(NC(O2)=O)C=C1 JQMFQLVAJGZSQS-UHFFFAOYSA-N 0.000 description 1
- YLZOPXRUQYQQID-UHFFFAOYSA-N 3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)-1-[4-[2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidin-5-yl]piperazin-1-yl]propan-1-one Chemical compound N1N=NC=2CN(CCC=21)CCC(=O)N1CCN(CC1)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F YLZOPXRUQYQQID-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 229910005191 Ga 2 O 3 Inorganic materials 0.000 description 1
- AFCARXCZXQIEQB-UHFFFAOYSA-N N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CCNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 AFCARXCZXQIEQB-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000009616 inductively coupled plasma Methods 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 239000012047 saturated solution Substances 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02366—Special surface textures of the substrate or of a layer on the substrate, e.g. textured ITO/glass substrate or superstrate, textured polymer layer on glass substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
Description
glass 두께 | 글라스비드크기 | 불산처리시간 | |
실시예 1 | 2mm | 325mesh(36~47μm) | 20분 |
실시예 2 | 2mm | 325mesh(36~47μm) | 30분 |
실시예 3 | 2mm | 325mesh(36~47μm) | 40분 |
실시예 4 | 2mm | 325mesh(36~47μm) | 50분 |
실시예 5 | 2mm | 400mesh(20~31μm) | 3분 |
실시예 6 | 2mm | 400mesh(20~31μm) | 8분 |
실시예 7 | 2mm | 400mesh(20~31μm) | 15분 |
투과도(%) | Roughness(nm) | FE-SEM(μm) | ||||||
550nm | 1100nm | Ra | Rp | Rv | width | Depth | Angle | |
실시예 1 | 91 | 92 | 274 | 1035 | 1071 | 28 | 1.4 | 161 |
실시예 2 | 91 | 92 | 206 | 794 | 726 | 59 | 1.5 | 167 |
실시예 3 | 91 | 91 | 201 | 777 | 705 | 51 | 1.1 | 165 |
실시예 4 | 91 | 82 | 163 | 618 | 500 | 55 | 1.1 | 164 |
실시예 5 | 36 | 41 | 746 | 3277 | 2756 | 19 | 0.7 | 155 |
실시예 6 | 68 | 69 | 585 | 1532 | 2345 | 16 | 2.5 | 152 |
실시예 7 | 86 | 85 | 333 | 3791 | 1564 | 9 | 1.3 | 139 |
투과도(%) | Roughness(nm) | FE-SEM(μm) | ||||||
550nm | 1100nm | Ra | Rp | Rv | width | Depth | Angle | |
실시예 1 | 91 | 92 | 274 | 1035 | 1071 | 27 | 0.5 | 159 |
실시예 2 | 91 | 92 | 206 | 794 | 726 | 44 | 0.1 | 154 |
실시예 3 | 91 | 91 | 201 | 777 | 705 | 49 | 0.1 | 165 |
실시예 4 | 91 | 82 | 163 | 618 | 500 | 56 | 0.3 | 162 |
실시예 5 | 36 | 41 | 746 | 3277 | 2756 | 13 | 0.9 | 137 |
실시예 6 | 68 | 69 | 585 | 1532 | 2345 | 18 | 0.8 | 150 |
실시예 7 | 86 | 85 | 333 | 3791 | 1564 | 23 | 1.6 | 157 |
단락전류(Jsc:mA/cm2) | 개방전압(Voc:V) | 충진률(FF:%) | 변환효율(%) | |
실시예 1 | 10.2 | 0.88 | 63.5 | 5.6 |
실시예 2 | 10.3 | 0.88 | 64.2 | 5.7 |
실시예 3 | 10.1 | 0.87 | 63.3 | 5.5 |
실시예 4 | 10.2 | 0.88 | 63.4 | 5.6 |
실시예 5 | 10.3 | 0.86 | 66.9 | 6.0 |
실시예 6 | 10.4 | 0.86 | 67.5 | 6.0 |
실시예 7 | 10.7 | 0.86 | 66.9 | 6.2 |
비교예 1 | 9.7 | 0.89 | 65.5 | 5.7 |
Claims (7)
- 불산 용액에 유리 비드를 포화시킨 용액을 유리 기판의 표면에 소정의 압력으로 분사하는 단계:유리 비드가 분사된 투명기판을 불산으로 에칭하는 단계를 포함하는 것을 특징으로 하는 박막태양전지용 투명전극의 텍스처 구조 형성방법.
- 제 1항에 있어서, 상기 유리 기판은 붕규산 유리(borosilicate glass), 석영 유리, 소다 유리, 또는 인산 유리인 것을 특징으로 하는 박막태양전지용 투명전극의 텍스처 구조 형성방법.
- 제 1항에 있어서, 상기 비드는 불산에 의해 에칭가능한 붕규산 유리(borosilicate glass), 석영 유리, 소다 유리, 또는 인산 유리로 구성되는 비드인 것을 특징으로 하는 박막태양전지용 투명전극의 텍스처 구조 형성방법.
- 제 1항에 있어서, 상기 비드는 평균직경이 10 마이크로미터 내지 45 마이크로미터 의 범위 내인 것을 특징으로 하는 박막태양전지용 투명전극의 텍스처 구조 형성방법.
- 제 1항에 있어서, 상기 불산은 농도가 50% [w/w]이하이고, 상기 비드가 담지된 용액의 분사 압력은 0.5kg/f 내지 3.0kg/f 인 것을 특징으로 하는 박막태양전지용 투명전극의 텍스처 구조 형성방법.
- 제 1항 내지 제 5항 중 어느 하나의 항이 방법에 의해서 형성된 텍스처 전극을 포함하는 박막태양전지용 전극.
- 제 6항의 전극을 포함하는 박막 태양전지.
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KR101499123B1 (ko) * | 2014-07-04 | 2015-03-06 | 고려대학교 산학협력단 | 태양전지용 유리기판 텍스처링 방법 |
CN105304766A (zh) * | 2015-11-18 | 2016-02-03 | 新奥光伏能源有限公司 | 一种太阳能电池电极制备模具及其制备方法 |
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KR100855682B1 (ko) | 2007-04-16 | 2008-09-03 | 고려대학교 산학협력단 | 태양전지의 실리콘 표면 텍스쳐링 방법 |
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KR101499123B1 (ko) * | 2014-07-04 | 2015-03-06 | 고려대학교 산학협력단 | 태양전지용 유리기판 텍스처링 방법 |
CN105304766A (zh) * | 2015-11-18 | 2016-02-03 | 新奥光伏能源有限公司 | 一种太阳能电池电极制备模具及其制备方法 |
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