KR20090065989A - Mold die and manufacturing method of semiconductor package using the same - Google Patents
Mold die and manufacturing method of semiconductor package using the same Download PDFInfo
- Publication number
- KR20090065989A KR20090065989A KR1020070133565A KR20070133565A KR20090065989A KR 20090065989 A KR20090065989 A KR 20090065989A KR 1020070133565 A KR1020070133565 A KR 1020070133565A KR 20070133565 A KR20070133565 A KR 20070133565A KR 20090065989 A KR20090065989 A KR 20090065989A
- Authority
- KR
- South Korea
- Prior art keywords
- encapsulant
- expansion
- printed circuit
- circuit board
- cavity
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 82
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 30
- 238000000034 method Methods 0.000 claims abstract description 25
- 239000008393 encapsulating agent Substances 0.000 claims description 131
- 238000000465 moulding Methods 0.000 claims description 27
- 238000005538 encapsulation Methods 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 14
- 230000015572 biosynthetic process Effects 0.000 claims description 7
- 238000007789 sealing Methods 0.000 claims description 7
- 229920006336 epoxy molding compound Polymers 0.000 description 4
- 239000002390 adhesive tape Substances 0.000 description 3
- 238000005452 bending Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67121—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
BACKGROUND OF THE
Recently, as most electronic products including various portable information communication devices such as personal computers, mobile phones, personal information terminals, etc. are miniaturized, light weighted, and highly functionalized, data processing capacity is increasing. According to such a trend, even in the case of a semiconductor package, a chip scale package that matches the size of a package to the size of a semiconductor chip is gaining much attention.
Such chip scale packages are classified into various types according to their manufacturing methods. One of several manufacturing methods is a method of performing manufacturing processes in a state in which a semiconductor chip is bonded to a thin printed circuit board. In this case, until the semiconductor package is separated into final semiconductor packages for improvement in productivity, the semiconductor package is grouped and encapsulated into blocks including several package regions and finally separated into individual semiconductor packages. In addition, when the encapsulant is used on the front surface of the printed circuit board, the warpage may be severe, so the work is performed by separating into several blocks.
However, a thin printed circuit board generally used in the manufacture of chip scale packages has a relatively thin thickness compared to the printed circuit board used in the manufacture of conventional semiconductor packages. For example, the thickness of a printed circuit board used for manufacturing a typical chip scale package is about 0.20 mm to 0.50 mm, but a thin printed circuit board has a thickness of about 0.15 mm or less. Such thin printed circuit boards have very thin thicknesses, and as a result, they flex well and present a great deal of difficulty in manufacturing semiconductor packages.
1 is a view of a printed circuit board and a carrier for manufacturing a semiconductor package according to the prior art.
Referring to FIG. 1, a semiconductor package manufacturing process is performed in a state in which a
2 to 4 are top, bottom, and cross-sectional views of a printed circuit board of an encapsulant forming step for manufacturing a semiconductor package according to the prior art.
2 to 4, an encapsulant 40 is formed on the
Therefore, when the semiconductor package manufacturing process is performed with a thin printed
The technical problem to be solved by the present invention is to provide a semiconductor package molding die that can form an encapsulant without a separate support structure in order to solve the above problems in manufacturing a semiconductor package.
In addition, another technical problem to be solved by the present invention is to provide a semiconductor package manufacturing method using the semiconductor package molding die.
In order to achieve the above technical problem, the present invention provides a semiconductor package molding die as follows.
The semiconductor package molding die according to the present invention is a molding die that encapsulates a predetermined number of semiconductor chips into blocks on a printed circuit board to which a plurality of semiconductor chips are attached, and encapsulates the predetermined number of semiconductor chips into blocks. An expansion cavity is formed which is connected to one cavity adjacent to the space between the plurality of cavities and two adjacent cavities. Preferably, the depth of the expansion cavity is smaller than the depth of the cavity. The expansion cavity may include a first expansion cavity connected to one adjacent cavity and a second expansion cavity connected to another adjacent cavity.
The first expansion cavity and the second expansion cavity extend more than a centerline between a connected cavity and two cavities adjacent to the intermediate region such that the first and second expansion cavities are located on the centerline and on some horizontal line of the centerline. You can have parts that exist together.
The molding die includes a lower molding die in contact with a lower surface of the printed circuit board to which the plurality of semiconductor chips are attached, and the lower molding die includes an auxiliary cavity for sealing a lower surface of the printed circuit board corresponding to the intermediate region. It may include. The auxiliary cavity may encapsulate the lower surface of the printed circuit board corresponding to the expansion cavity.
In order to achieve the above another technical problem, the present invention provides a method for manufacturing a semiconductor package as follows.
A method of manufacturing a semiconductor package according to the present invention includes preparing a printed circuit board including a plurality of block regions to which a predetermined number of semiconductor chips are attached, and an intermediate region that is a space between two adjacent block regions. Attaching a semiconductor chip to the semiconductor substrate; forming an encapsulant for sealing the predetermined number of semiconductor chips in the block region; and separating the printed circuit board on which the encapsulant is formed into a semiconductor package including individual semiconductor chips. The forming of the encapsulant may include forming an expansion encapsulant formed in the intermediate region and connected to one encapsulant formed in an adjacent block region.
The formation thickness of the expansion encapsulant may have a value smaller than the formation thickness of the encapsulation material. The expansion encapsulant may include a first expansion encapsulation material connected to one adjacent encapsulation material and a second expansion encapsulation material connected to another adjacent encapsulation material.
The forming of the encapsulant may include forming an auxiliary encapsulant together on a lower surface corresponding to the intermediate region of the printed circuit board. In particular, the auxiliary encapsulant may encapsulate the lower surface of the printed circuit board corresponding to the expansion encapsulant.
The first expansion encapsulant and the second expansion encapsulant may extend from a connected encapsulant to a centerline between two encapsulants adjacent to the intermediate region.
In the separating of the semiconductor package, the expansion encapsulant may be separated from the semiconductor package so as to be used only for breaking or bending the printed circuit board.
The semiconductor package molding die and the semiconductor package manufacturing method according to the present invention can prevent the printed circuit board from being broken due to the weight of the encapsulant in the process of manufacturing the semiconductor package. In particular, since the breakage can be prevented without a separate support structure such as a carrier, a process step such as carrier alignment and attachment is unnecessary, and a step of removing the adhesive tape from the carrier after carrier separation is also unnecessary. This simplifies the process, increasing productivity and reducing manufacturing costs.
In addition, by using an additional encapsulant on both the upper and lower surfaces of the printed circuit board, the bending of the printed circuit board due to the encapsulant may also be prevented.
Hereinafter will be described in detail to enable those skilled in the art to easily understand and reproduce the present invention through the preferred embodiments. However, embodiments of the present invention illustrated below may be modified in various other forms within the scope of the same invention, and the scope of the present invention is not limited to the embodiments described below and the accompanying drawings. In the following description, when a component is described as being on top of another component, it may be directly on top of another component, and a third component may be interposed therebetween. In addition, in the drawings, the thickness or size of each component is exaggerated for convenience and clarity of description, and parts irrelevant to the description are omitted. Like numbers refer to like elements in the figures. On the other hand, the terms used are used only for the purpose of illustrating the present invention and are not used to limit the scope of the invention described in the meaning or claims.
5 is a schematic view showing a top surface of a printed circuit board at the stage of forming an encapsulant according to an embodiment of the present invention.
Referring to FIG. 5, the
An
A plurality of
The
Therefore, the
6 is a schematic view showing a bottom surface of a printed circuit board at the stage of forming an encapsulant according to an embodiment of the present invention.
Referring to FIG. 6, an
Therefore, when the
The
7 is a schematic view showing a bottom surface of a printed circuit board at the stage of forming an encapsulant according to a modification of the embodiment of the present invention.
Referring to FIG. 7, unlike the example shown in FIG. 6, the
8 is a schematic view showing a cross section of a printed circuit board at the stage of forming an encapsulant according to an embodiment of the present invention. Specifically, it is sectional drawing cut along the line VIII-VIII of FIG.
Referring to FIG. 8, a plurality of
While forming the
The
In the subsequent process, the
9 is a schematic view showing an upper molding die for forming an encapsulant and an expansion encapsulant according to an embodiment of the present invention.
Referring to FIG. 9, the upper forming
A plurality of
The
10 is a schematic view showing a cross section of an upper molding die for forming an encapsulant and an expansion encapsulant according to an embodiment of the present invention. Specifically, it is sectional drawing cut along the X-X line of FIG.
Referring to FIG. 10, the depth of the
11 is a schematic view of a lower molding die for forming an auxiliary encapsulant according to an embodiment of the present invention.
Referring to FIG. 11, the lower forming
The
12 is a schematic view showing a cross section of a lower molding die for forming an encapsulant and an expansion encapsulant according to an embodiment of the present invention. Specifically, it is sectional drawing cut along the XII-XII line of FIG.
1 is a view of a printed circuit board and a carrier for manufacturing a semiconductor package according to the prior art.
2 to 4 are top, bottom, and cross-sectional views of a printed circuit board of an encapsulant forming step for manufacturing a semiconductor package according to the prior art.
5 and 6 are schematic views showing the top and bottom surfaces of a printed circuit board at the stage of forming an encapsulant according to an embodiment of the present invention.
7 is a schematic view showing a bottom surface of a printed circuit board at the stage of forming an encapsulant according to a modification of the embodiment of the present invention.
8 is a schematic view showing a cross section of a printed circuit board at the stage of forming an encapsulant according to an embodiment of the present invention.
9 and 10 are a schematic view and a cross-sectional view showing an upper molding die for forming an encapsulant and an expansion encapsulant according to an embodiment of the present invention.
11 and 12 are a schematic view and a cross-sectional view of a lower molding die for forming an auxiliary encapsulant according to an embodiment of the present invention.
<Description of main parts of drawing>
100: printed circuit board, 110: block area, 120: package area, 150: middle area, 300: semiconductor chip, 400: encapsulation material, 450: expansion encapsulation material, 455: auxiliary encapsulation material, 500: upper forming mold, 510 : Cavity, 520: expansion cavity, 550: lower molding mold, 560: auxiliary cavity
Claims (13)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070133565A KR100934104B1 (en) | 2007-12-18 | 2007-12-18 | Semiconductor package molding die and semiconductor package manufacturing method using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070133565A KR100934104B1 (en) | 2007-12-18 | 2007-12-18 | Semiconductor package molding die and semiconductor package manufacturing method using the same |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090065989A true KR20090065989A (en) | 2009-06-23 |
KR100934104B1 KR100934104B1 (en) | 2009-12-29 |
Family
ID=40994158
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070133565A KR100934104B1 (en) | 2007-12-18 | 2007-12-18 | Semiconductor package molding die and semiconductor package manufacturing method using the same |
Country Status (1)
Country | Link |
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KR (1) | KR100934104B1 (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI235440B (en) | 2004-03-31 | 2005-07-01 | Advanced Semiconductor Eng | Method for making leadless semiconductor package |
US20050258552A1 (en) | 2004-05-18 | 2005-11-24 | Kim Sung J | Semiconductor molding method and structure |
JP2007109831A (en) * | 2005-10-13 | 2007-04-26 | Towa Corp | Resin sealing molding method for electronic component |
-
2007
- 2007-12-18 KR KR1020070133565A patent/KR100934104B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100934104B1 (en) | 2009-12-29 |
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