KR20090013366A - Conditioning disc for polishing pad - Google Patents
Conditioning disc for polishing pad Download PDFInfo
- Publication number
- KR20090013366A KR20090013366A KR1020070077425A KR20070077425A KR20090013366A KR 20090013366 A KR20090013366 A KR 20090013366A KR 1020070077425 A KR1020070077425 A KR 1020070077425A KR 20070077425 A KR20070077425 A KR 20070077425A KR 20090013366 A KR20090013366 A KR 20090013366A
- Authority
- KR
- South Korea
- Prior art keywords
- disk
- conditioning
- polishing
- polishing pad
- cutting
- Prior art date
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/04—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic
- B24D3/14—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic ceramic, i.e. vitrified bondings
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/06—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with inserted abrasive blocks, e.g. segmental
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D2203/00—Tool surfaces formed with a pattern
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Ceramic Engineering (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
The polishing pad conditioning disc according to the present invention is a polishing pad conditioning disc comprising a disc body and a plurality of cutting protrusions protruding from one surface of the disc body, wherein the cutting protrusions are polygonal pyramid-shaped. At this time, the polishing disk conditioning disk is made of sintered nano powder of ceramic, diamond and boron nitride compound. In addition, a plurality of foreign matter discharge grooves are radially formed on one surface of the disc body in which the cutting protrusion protrudes, and each unit foreign matter discharge groove is formed in a spiral shape.
Therefore, it is possible to increase the polishing efficiency during the conditioning work, to prevent the fall of the protrusions generated, and to prevent scratches due to foreign matter remaining on the cutting protrusions and polishing pads dropped during the conditioning work.
Description
The present invention relates to a conditioning disk for a polishing pad, and in particular, it is possible to fundamentally prevent the falling of the cutting protrusion generated during the conditioning operation, and to prevent scratches caused by the dropped abrasive particles and foreign matter remaining on the polishing pad. A conditioning disk for a polishing pad.
In general, chemical mechanical polishing (CMP) is a polishing method developed to compensate for the disadvantages of mechanical polishing in which a modified layer is formed and the disadvantages of chemical polishing in which high shape precision cannot be obtained. In addition to the plasma enhanced chemical vapor deposition (PECVD) and reactive ion etching (RIE), it is essential to fabricate submicron scale chips.
Such chemical mechanical polishing is maintained in that it is possible to obtain a high shape precision without forming a deterioration layer as described above, but during the operation, foreign matter such as abrasive particles, tributes and pad debris is generated on the surface of the polishing pad. Blocking the pores of the pad has a disadvantage that planarization of the wafer is impossible. In order to prevent this, the chemical mechanical polishing apparatus maintains the porosity of the polishing pad by conditioning the upper surface of the polishing pad, maintains the flatness by suppressing the non-uniform deformation, and slurry the numerous pores of the polishing pad. A conditioner including a conditioning disc is provided to smoothly supply the gas.
As the above-described conditioning disk, it was common to use a diamond pad conditioning disk having diamond particles attached to one surface thereof in contact with the polishing disk to enable micro cutting of the polishing pad to be conditioned. As a method of attaching diamond to the diamond pad conditioning disk, there are methods such as brazing, electroplating, and sintering.
Meanwhile, conventionally, an oxide line mainly using chemical vapor deposition (CVD) was mainly used, and in the case of the oxide, the corrosion problem was not very important because the polishing slurry was used at an pH of 5.5 or higher. However, in the process of developing and changing semiconductor technology, metal lines (P, W, Al, Cu, etc.) using PVD (Physical Vapor Deposition) are increasing.In this case, work is being performed on strong acids with pH less than 2.0. Due to the corrosion of metals, diamond dropping caused a problem of semiconductor defects. In fact, unlike oxide lines, diamond pad conditioning disks have to be replaced for only 5 to 7.5 hours. .
Accordingly, an object of the present invention is to provide a conditioning disk for a polishing pad capable of increasing resistance to falling off of a cutting protrusion generated during conditioning.
Another object of the present invention is to improve the polishing performance of the cutting projections by making the cutting projection shape a polygonal pyramid shape.
In addition, another object of the present invention is to provide a conditioning disk for a polishing pad that can prevent scratches caused by debris of the cutting protrusion particles and the foreign matter remaining in the polishing pad during the conditioning operation.
In the polishing pad conditioning disk according to the present invention for achieving the above object, in the polishing pad conditioning disk comprising a disk body and a plurality of cutting protrusions protruding on one surface of the disk body, the cutting protrusion is a polygonal pyramid shape It is characterized by that.
On the other hand, the material of the disk is characterized in that made of ceramic, diamond and boron nitride compound (CBN). At this time, the conditioning disk for the polishing pad is made by sintering the nano powder of ceramic, diamond and boron nitride compound.
In addition, a plurality of foreign matter discharge grooves are radially formed on one surface of the disc body in which the cutting protrusion protrudes, and each unit foreign matter discharge groove is formed in a spiral shape.
The conditioning disk for a polishing pad according to the present invention has a cutting protrusion in the shape of a polygonal pyramid, so that the polishing action is actively performed at the corners of the polygonal pyramid, thereby increasing the polishing efficiency.
In addition, by sintering the nano-powder of the ceramic, diamond and boron nitride compound (CBN) it is possible to increase the resistance to the falling off of the projection during conditioning.
Furthermore, foreign matter discharge grooves are provided in the body of the conditioning disk for the polishing pad, thereby preventing the scratches due to them by discharging foreign particles remaining on the polishing pad and the cutting protrusion particles dropped out during the conditioning operation.
With reference to the accompanying drawings will be described embodiments of the present invention;
1 is a perspective view showing an embodiment of a polishing pad conditioning disk according to the present invention, Figure 2 is an enlarged view of part "A" of Figure 1, Figure 3 is a polishing pad conditioning according to the present invention A plan view of one embodiment of a disk.
As shown in Figures 1 to 3, one embodiment of the polishing
Each part of the
First, the
On the other hand, a plurality of foreign
At this time, the foreign
4 is a plan view showing another embodiment of the conditioning disk for polishing pad according to the present invention.
As shown in FIG. 4, another embodiment of the polishing
In this case, a
On the other hand, the polishing
The type of ceramic used herein is preferably a mixture of one or more selected from aluminum oxide (Al 2 O 3 ), zirconia (ZrO 2 ), tungsten carbide (WC) and silicon carbide (SiC).
Looking at the manufacturing method of the above-mentioned polishing
First, nano-powders of ceramic, diamond and boron nitride compound are mixed at the above-mentioned ratios, that is, 66-74 wt% ceramic, 12-28 wt% diamond, and 12-28 wt% boron nitride compound, and a predetermined pressure is applied thereto. The disk-shaped disk
Then, when the molding is completed, it is completed by heating to a temperature close to the melting point of the mixture by sintering so that the nanopowders are bonded or some are deposited and connected to each other.
As described above, the polishing
5 is a side cross-sectional view of the
6 is a side cross-sectional view of a cutting protrusion of a conditioning disk according to another embodiment of the present invention. In this embodiment, the
7 is a perspective view of a conditioning disk for a polishing pad according to another embodiment of the present invention. As shown, a
Although the shape and manufacturing method of the polishing pad conditioning disk according to the preferred embodiment of the present invention have been illustrated according to the above description and drawings, this is merely an example, and various modifications may be made without departing from the spirit of the present invention. It will be understood by those skilled in the art that variations and modifications are possible.
1 is a perspective view showing an embodiment of a polishing disk conditioning disk according to the present invention.
FIG. 2 is an enlarged view of a portion “A” of FIG. 1.
Figure 3 is a plan view showing one embodiment of a polishing disk conditioning disk according to the present invention.
4 is a plan view showing another embodiment of the conditioning disk for polishing pad according to the present invention.
5 is a side cross-sectional view of the cutting
6 is a side cross-sectional view of a cutting protrusion of a conditioning disk according to another embodiment of the present invention.
7 is a perspective view of a conditioning disk for a polishing pad according to another embodiment of the present invention.
* Description of the symbols for the main parts of the drawings *
100: conditioning pad for polishing pad 110: disk body
120: cutting protrusion 122: coating layer
128: protrusion 130: foreign substance discharge groove
140: pattern region 150: pattern region
Claims (11)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070077425A KR20090013366A (en) | 2007-08-01 | 2007-08-01 | Conditioning disc for polishing pad |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070077425A KR20090013366A (en) | 2007-08-01 | 2007-08-01 | Conditioning disc for polishing pad |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20090013366A true KR20090013366A (en) | 2009-02-05 |
Family
ID=40683817
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070077425A KR20090013366A (en) | 2007-08-01 | 2007-08-01 | Conditioning disc for polishing pad |
Country Status (1)
Country | Link |
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KR (1) | KR20090013366A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011028700A2 (en) * | 2009-09-01 | 2011-03-10 | Saint-Gobain Abrasives, Inc. | Chemical mechanical polishing conditioner |
KR101236163B1 (en) * | 2012-07-23 | 2013-02-22 | 주식회사 제우스 | Pad conditioning disk and pad conditioner and pad conditioning method |
CN104029125A (en) * | 2013-03-08 | 2014-09-10 | 鑫晶钻科技股份有限公司 | Sapphire polishing pad dresser and manufacturing method thereof |
US8905823B2 (en) | 2009-06-02 | 2014-12-09 | Saint-Gobain Abrasives, Inc. | Corrosion-resistant CMP conditioning tools and methods for making and using same |
US9022840B2 (en) | 2009-03-24 | 2015-05-05 | Saint-Gobain Abrasives, Inc. | Abrasive tool for use as a chemical mechanical planarization pad conditioner |
EP3313614A4 (en) * | 2015-06-25 | 2019-05-15 | 3M Innovative Properties Company | Vitreous bond abrasive articles and methods of making the same |
-
2007
- 2007-08-01 KR KR1020070077425A patent/KR20090013366A/en not_active Application Discontinuation
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9022840B2 (en) | 2009-03-24 | 2015-05-05 | Saint-Gobain Abrasives, Inc. | Abrasive tool for use as a chemical mechanical planarization pad conditioner |
US8905823B2 (en) | 2009-06-02 | 2014-12-09 | Saint-Gobain Abrasives, Inc. | Corrosion-resistant CMP conditioning tools and methods for making and using same |
WO2011028700A2 (en) * | 2009-09-01 | 2011-03-10 | Saint-Gobain Abrasives, Inc. | Chemical mechanical polishing conditioner |
WO2011028700A3 (en) * | 2009-09-01 | 2011-05-26 | Saint-Gobain Abrasives, Inc. | Chemical mechanical polishing conditioner |
CN102612734A (en) * | 2009-09-01 | 2012-07-25 | 圣戈班磨料磨具有限公司 | Chemical mechanical polishing conditioner |
US8951099B2 (en) | 2009-09-01 | 2015-02-10 | Saint-Gobain Abrasives, Inc. | Chemical mechanical polishing conditioner |
KR101236163B1 (en) * | 2012-07-23 | 2013-02-22 | 주식회사 제우스 | Pad conditioning disk and pad conditioner and pad conditioning method |
CN104029125A (en) * | 2013-03-08 | 2014-09-10 | 鑫晶钻科技股份有限公司 | Sapphire polishing pad dresser and manufacturing method thereof |
EP3313614A4 (en) * | 2015-06-25 | 2019-05-15 | 3M Innovative Properties Company | Vitreous bond abrasive articles and methods of making the same |
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