KR20080002049A - Inspection appratus of display device, inspection method and method for manufacturing display device using the same - Google Patents

Abstract

An inspection apparatus for a display device, an inspection method thereof, and a method for manufacturing the display device by using the same are provided to install an MUX(Multiplexer) structure in the outside of each cell within a mother substrate and receive signals through each MUX in common, thereby preventing static electricity flowed into a pad portion and reducing the production cost of the inspection apparatus. An inspection apparatus for a display device comprises a mother substrate(100), plural inspection patterns(110), and a contact portion. Plural unit cells(200) are spaced to each other on the mother substrate. The plural inspection patterns are formed in a predetermined external portion of each unit cell on the mother substrate. The plural inspection patterns are the MUX connected with plural signal lines(111) from the each unit cell.

Description

Inspection equipment of display device, inspection method thereof and manufacturing method of display device using same {Inspection Appratus of Display Device, Inspection Method and Method for Manufacturing Display Device Using the Same}

1 is a plan view showing an organic light emitting device including a general test pattern

2 is a schematic view showing the inspection equipment of the display device of the present invention;

3 is an enlarged view illustrating a pad part and a test pattern thereof of the unit cell of FIG. 2;

* Description of the symbols for the main parts of the drawings

100: mosquito board 110: test mux

111: inspection wiring 200: unit cell

220: seal pattern 300: contact inspection unit

310: first inspection wiring 311: second inspection wiring

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device, in particular, by forming a pattern for lighting inspection in a MUX structure on a mother substrate outside the cell forming unit, thereby making inspection easy, an inspection method using the same, and an inspection method using the same. It relates to a method of manufacturing an organic light emitting device.

The organic light emitting device, which is one of the flat panel displays, has a better viewing angle, contrast, and the like than the liquid crystal display, and is lightweight and thinner because it does not require a backlight, and is advantageous in terms of power consumption. .

In addition, since DC low voltage driving is possible, the response speed is fast, and all solid, it is resistant to external shock and has a wide range of use temperature, and in particular, has a low cost in terms of manufacturing cost. In particular, unlike the liquid crystal display and the plasma display panel (PDP), the deposition and encapsulation equipment are all in the manufacturing process of the organic light emitting device, and thus the process is very simple.

In addition, when the organic light emitting diode is driven by an active matrix method having a thin film transistor as a switching element for each pixel, the same luminance is displayed even when a low current is applied, and thus, low power consumption, high definition, and large size can be obtained.

Such an organic light emitting device displays a video image by exciting a fluorescent material using carriers such as electrons and holes.

On the other hand, a passive matrix type (Passive matrix type) that does not have a separate thin film transistor is mainly used as a driving method of the organic light emitting device.

However, since the passive matrix method has many limitations such as resolution, power consumption, and lifespan, active matrix organic light emitting devices for the manufacture of next-generation displays requiring high resolution and large screens have been researched and developed.

On the other hand, the organic light emitting device is divided into a lower emission method or an upper emission method according to where the light emitting layer is located on the upper and lower substrates, and in the case of the upper emission method when the active matrix type is implemented, the thin film transistor array is disposed on the lower substrate When the light emitting layer is positioned on the upper substrate, this is referred to as a dual plate type organic electroluminescence device (DOD).

Hereinafter, a general organic light emitting device will be described with reference to the accompanying drawings.

1 is a plan view illustrating an organic light emitting device including a general test pattern.

As shown in FIG. 1, a general organic light emitting diode 10 is defined by a display area 15 and a pad part (except a part 15) positioned at one side, and the pad part includes a driving part 11 for driving and both left and right sides. A plurality of inspection patterns 12a and 12b for lighting inspection are formed on the substrate.

By the way, the plurality of inspection patterns 12a and 12b remain in the pad unit 15 even after the lighting inspection is completed, and a path through which static electricity flows in a portion where the plurality of inspection patterns 12a and 12b are formed in the process. Therefore, damage by static electricity has been a problem.

The conventional organic light emitting device as described above has the following problems.

In particular, in a small model, after forming a plurality of cells on the mother substrate, they are cut in a cutting process, and there is a pattern for lighting inspection on the pad part side in each of the cells, so that static electricity flows in the process. To become a path.

The present invention has been made to solve the above problems, by forming a pattern for the lighting test in the MUX structure on the mother substrate outside the cell forming portion, the inspection equipment of the display device to facilitate the inspection, the inspection method using the same And to provide a method of manufacturing an organic light emitting device using the same and an inspection method using the same, an object thereof.

Inspection apparatus of the display device of the present invention for achieving the above object is a mother substrate defined by a plurality of unit cells spaced apart from each other; and a plurality of inspection patterns formed on the outer predetermined portion of each unit cell on the mother substrate ; And a contact portion formed outside the mother substrate connected to the plurality of inspection patterns.

The plurality of inspection patterns are MUXs connected to the plurality of signal lines from the unit cell.

When a plurality of unit cells are arranged in m rows and n columns on the mother substrate, the first inspection wiring branched from the contact portion to the m rows is commonly connected to the unit cells located in each row. The test circuit further includes second test wires for transmitting a test signal.

The contact unit generates a signal for inspection and transfers it to each of the plurality of inspection patterns.

In addition, a method of inspecting a display device for achieving the same purpose includes a mother substrate in which a plurality of unit cells are spaced apart from each other, a plurality of inspection patterns and a plurality of inspection patterns formed on a predetermined portion of an outer portion of each unit cell on the mother substrate. Another feature is that a plurality of inspection patterns on the mother substrate commonly apply a lighting signal to perform inspection by using inspection equipment including a contact portion formed outside the mother substrate connected to two inspection patterns. have.

In addition, the manufacturing method of the display device of the present invention for achieving the same object comprises the steps of preparing a mother substrate defined by a plurality of unit cells spaced apart from each other; and a plurality formed on the outer predetermined portion of each unit cell on the mother substrate Preparing an inspection apparatus including a plurality of inspection patterns and a contact portion formed on an outer side of the mother substrate connected to the plurality of inspection patterns; and a plurality of inspection patterns on the mother substrate apply a lighting signal in common. Performing the inspection; And cutting into the plurality of unit cells.

The method may further include connecting a plurality of signal lines between the plurality of inspection patterns and the unit cells.

After performing the inspection, the method may further include forming an alignment layer on the mother substrate including the plurality of cells to cover the signal line connected to the inspection pattern.

Hereinafter, an inspection apparatus, an inspection method using the same, and a manufacturing method of the display apparatus using the same according to the present invention will be described in detail with reference to the accompanying drawings.

The example illustrated below has been described using inspection equipment of an organic light emitting diode as an example, but such inspection equipment and inspection methods may be used to form various display devices.

FIG. 2 is a schematic diagram illustrating test equipment of a display device according to an exemplary embodiment of the present invention, and FIG. 3 is an enlarged view illustrating a pad part of the unit cell of FIG. 2 and a test pattern thereof.

As shown in FIG. 2, the inspection apparatus of the display device according to the present invention includes a mother substrate 100 in which a plurality of unit cells 200 are spaced apart from each other, and an outer boundary of each unit cell 200 on the mother substrate 100. It includes a plurality of MUX (110) formed in the site and the contact portion 300 formed on the outside of the mother substrate 100 is connected to the MUX (110).

Here, the MUX 110 is used as a test pattern and is connected to the unit cell unit 200 by a plurality of signal lines 111.

For example, when a plurality of unit cells 200 are arranged in m rows and n columns in the mother substrate 100, the m rows are formed from the contact portion 300 outside the mother substrate 100. Each of the MUX 110 includes a first inspection wiring 310 branched to the second inspection wiring 310, and second inspection wirings 311 connected in common to the unit cells positioned in the respective rows to transfer a test signal. The contact part 300 is connected.

Here, the first and second test wirings 310 and 311 use a metal having low resistance, such as copper wiring, to transmit a test signal for a stable signal regardless of the near or far side of the contact portion 300.

In addition, the contact unit 300 generates a signal for inspection and transfers it to each MUX 110 in common.

As shown in FIG. 3, since the MUX 110 is formed outside the cell 200, when the outer line of the cell 200 is cut, the MUX 110 is cut off, and thus, after the cutting process, the MUX in a floating state. Only the signal line 111 that was connected to the 110 remains, so there is no inflow path of static electricity.

Here, the signal line 111 connected to the MUX 110 is located only on the pad side, which is a part of the non-display area of the cell 200. In the illustrated drawing, a part of the seal pattern 22 joining the upper and lower substrates of the cell is shown. Indicates that the signal line 111 has passed.

The inspection equipment of the display device of the present invention, after the inspection is completed, the signal inspection MUX is removed along with the surface cut and cut in the cutting process that is performed for each unit cell, so that it is electrostatically stable and is common for each cell. In order to apply the same value, six signals may be applied together. The MUX may be applied together. The same signal may be applied by connecting each MUX to the common line of the second test wiring 311 on the cell 200. To be possible.

The inspection method of the organic light emitting device using FIG. 2 and FIG. 3 is as follows.

That is, a plurality of unit cells 200 are defined to be spaced apart from each other, the mother substrate 100, a plurality of MUX (110) and the plurality of MUX (formed at the outer predetermined portion of each unit cell on the mother substrate 100) By using the inspection equipment including a contact portion 300 formed on the outside of the mother substrate 100 connected to the 110, the inspection by applying a lighting signal to the MUX 110 on the mother substrate 100 in common. Perform.

Moreover, the manufacturing method of the organic light emitting element of this invention is comprised as follows.

First, a plurality of unit cells 200 prepare a mother substrate 100 defined by being spaced apart from each other.

Subsequently, the inspection equipment including a plurality of MUX 110 formed on a predetermined portion of the outer side of each unit cell on the mother substrate 100 and a contact portion formed outside the mother substrate 100 connected to the MUX 110. Prepare.

Subsequently, the MUX 110 on the mother substrate 100 commonly applies a lighting signal to perform inspection.

After the inspection, the alignment layer (not shown) is covered on the mother substrate 100 including the plurality of cells 200 to cover the signal line 111 connected to the MUX 110 to prevent damage by static electricity. do.

Subsequently, cutting is performed in units of the plurality of unit cells 200.

For example, when the display device to be formed is an organic light emitting device, only the contact part may be manufactured in the form of a flexible printed circuit (FPC) when applying a lighting signal after forming the organic light emitting layer. After connection, the test signal is applied at the same time, and all the cells can be checked for abnormality.

The inspection equipment of the display device, the inspection method thereof, and the manufacturing method of the display device using the same have the following effects.

For example, when the display device to be formed is an organic light emitting device, only the contact part may be manufactured in the form of a flexible printed circuit (FPC) when applying a lighting signal after forming the organic light emitting layer. After connection, test signal can be applied at the same time, and all cells can be checked for abnormality.

When the inspection is performed by providing a test pattern for the lighting test on the substrate, the test pattern may remain in the process continuously and may act as a source of static electricity, causing damage to the cell. However, since the inspection equipment of the display device of the present invention deletes the on / off pad portion pattern on the cell substrate for the lighting inspection, it is possible to prevent static electricity from entering the pad portion, and it is more expensive to manufacture the inspector than the jig type inspection equipment. Can be reduced.

The inspection apparatus of the display device of the present invention is provided with a mux (MUX) on the outer portion of the cell in the mother substrate, the signal is commonly applied to each cell through the mux.

In this case, the mux and the cell are connected through a signal line, and the contact portion for generating and transmitting a test signal may be connected with a corresponding mux of each cell in a common line form corresponding to each column, and thus applying lighting of the cell by applying a common signal. Wherein, the mux is removed after cutting, the remaining signal line is then covered by the alignment layer, it can be stabilized in static electricity.

In addition, by wiring with copper, it is possible to directly inspect on the lower side of the thin film transistor instead of the inspection in the inspection equipment of the inspection progress type.

Claims (9)

A mother substrate in which a plurality of unit cells are spaced apart from each other; A plurality of inspection patterns formed on a predetermined portion outside of each unit cell on the mother substrate; And And a contact part formed outside the mother substrate connected to the plurality of inspection patterns. The method of claim 1, And the plurality of inspection patterns are MUXs connected to the plurality of signal lines from the unit cell. The method of claim 1, When a plurality of unit cells are arranged in m rows and n columns on the mother substrate, the first inspection wiring branched from the contact portion to the m rows is commonly connected to the unit cells located in each row. The inspection apparatus of the display device further comprises a second inspection wiring for transmitting a test signal. The method of claim 3, wherein And the first and second test wires are copper wires. The method of claim 1, And the contact unit generates a signal for inspection and transmits the signal to the plurality of inspection patterns. A mother substrate defined by a plurality of unit cells spaced apart from each other, a plurality of inspection patterns formed on a predetermined portion of an outer portion of each unit cell on the mother substrate, and a contact portion formed outside the mother substrate connected to the plurality of inspection patterns Using inspection equipment, including And a plurality of inspection patterns on the mother substrate commonly apply a lighting signal to perform inspection. Preparing a mother substrate in which a plurality of unit cells are spaced apart from each other; Preparing an inspection apparatus including a plurality of inspection patterns formed at an outer predetermined portion of each unit cell on the mother substrate and a contact portion formed outside the mother substrate connected to the plurality of inspection patterns; Performing a test by applying a lighting signal to a plurality of test patterns on the mother substrate in common; And cutting the unit cells in units of the plurality of unit cells. The method of claim 7, wherein And connecting a plurality of signal lines between the plurality of inspection patterns and the unit cells. The method of claim 7, wherein And after performing the inspection, forming an alignment layer on the mother substrate including the plurality of cells to cover the signal line connected to the inspection pattern.

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