KR20070113539A - Near infrared slit lamp - Google Patents

Abstract

A slit lamp inspection device using near infrared ray is provided to allow a patient and a guardian to see images obtained by a near infrared ray sensor. A slit lamp inspection device using near infrared ray includes a light source(1), a near infrared ray generator(12), a slit lamp lens system(3), a slit lamp control body(6), an adapter(10), a monitor(11), a camera(15), and an ocular lens part(4). The light source irradiates a light by receiving power applied. The near infrared ray generator guides near infrared ray, irradiated from the light source, to eyes of a subject and outputs a light reflected from the eyes of the subject. The slit lamp lens system magnifies and outputs the light applied through the near infrared ray generator. The slit lamp control body includes a jog-shuttle. The jog-shuttle controls positions of the slit lamp lens system. The adapter is connected to the slit lamp lens system and has a both-sided mirror mounted thereon. The monitor and camera are connected to both sides of the adapter respectively, and an image is applied to the monitor and camera through the both-sided mirror. The ocular lens part magnifies the image outputted on the adapter through a plurality of lenses.

Description

Slit lamp inspection device using near infrared light {Near infrared slit lamp}

1 is a schematic view showing a conventional slit lamp inspection apparatus;

2 is a schematic view showing a slit lamp inspection apparatus using the near infrared ray of the present invention,

FIG. 3 is a side view of the slit lamp inspection apparatus using the near infrared ray of FIG. 2.

Explanation of symbols on the main parts of the drawings

1: light source 2: visible light generating unit

3: slit lamp lens system 4: eyepiece

5: jog shuttle 6: slit lamp adjustment body

7: double-sided mirror 10: adapter

11: monitor 12: near infrared generation unit

15: camera

The present invention relates to a slit lamp inspection apparatus using near-infrared light that irradiates near-infrared rays on an object to be examined, detects the near-infrared rays, converts them into image data, and displays them for viewing by a slit lamp.

Ophthalmic slit lamps are usually composed of an illumination system and an observation system, and most of them are used to observe the state of the eye by enlarging the optical cut surface formed by projecting a long and thin beam vertically to the transparent eye tissue.

The eyelid, conjunctiva, cornea, anterior, lens, and vitreous can be inspected by adjusting the angle of each other with respect to the eye to be examined together with the observation microscope while changing the width and length of the illumination beam. When used in conjunction, there is a characteristic that can even check the fundus.

As such, the slit lamp inspection device is an essential equipment in ophthalmology and is used for the basic examination for the diagnosis of eye diseases such as cataract and glaucoma.

Ophthalmic examination as described above is an important test for handling the human eye, and because of the need to enlarge the small eye, the situation is required a high precision and accuracy.

However, when using a conventional slit lamp inspection device, the eye dilator was irradiated with bright light after the eye dilator.

In addition, as described above, when the pupillary dilator is administered for the retinal examination, the normal activity cannot be performed for 5 to 6 hours. Therefore, a patient who sometimes refuses the dilator is not able to perform the proper examination. there was..

1 is a schematic view showing a conventional slit lamp inspection apparatus as described above.

As shown in the drawing, a conventional slit lamp is configured to induce a light source 1 that receives power and emits visible light, and directs the visible light emitted from the light source 1 to be irradiated to the eye of the examinee and outputs reflected light. Visible light generating unit (2), the slit lamp system (3) for expanding and outputting the light applied through the visible light generating unit (2) to the optical cutting plane, and the image output through the slit lamp lens system (3) Eyepiece portion 4 for enlarging the lens through a plurality of lenses, and a slit lamp control body 6 having a light source 1 mounted below and a jog shuttle 5 for adjusting the position of the slit lamp. have.

At this time, a halogen light source is mainly used as the light source 1 for outputting visible light.

However, the conventional slit lamp inspection apparatus configured as described above has some problems as follows.

First, since the conventional slit lamp uses visible light emitted from a halogen light source as an illuminating means for illuminating the subject's eyes, the glare caused by the visible light is severe and difficult to inspect because of the glare. The same phenomenon is noticeable.

There is also a problem that requires a long recovery time of a dozen minutes after the test.

Secondly, during the retinal examination, the eyes are directly illuminated on the retina with the pupil enlarged, so that the eyes of the patient are invisible for a while after the examination because of the bright visible light.

Due to the nature of retinal diseases, visual inspection or refraction may occur after the retinal examination, but because the pupils are enlarged, it may take a day to restore the pupils to normal again.

Third, the examiner can directly view the stereoscopic image of the patient's eye obtained at the time of the conventional ophthalmic slit lamp by using the eyepiece, but the assistant can examine only one eye or one plane image through the monitor. It is only.

The present invention is to solve these problems,

An object of the present invention is to provide a slit lamp inspection apparatus using near-infrared rays to remove the glare generated when the visible light is irradiated to the eye and have a normal vision immediately after the fundus examination, retinal examination.

Another object of the present invention is to provide a slit lamp inspection apparatus using near-infrared rays that can be directly seen by a patient or a guardian using a monitor and an image of an eye obtained from the near-infrared sensor, and is easy to be mounted on an existing slit lamp inspection apparatus.

Another object of the present invention is to provide a slit lamp inspection apparatus using near infrared light that can be easily converted and economical system can be easily realized when the conventional method using ordinary visible light is observed in near infrared microscope.

In order to achieve this object, the slit lamp inspection apparatus using the near-infrared according to the present invention generates a near-infrared and irradiates the near-infrared to the patient's eyes, and transmits the reflected and scattered near-infrared images to the left and right eyepieces. It is composed of a device that allows an inspector to approach an infrared image like a conventional slit lamp by passing through a double-sided mirror that can be detached through an infrared image acquisition and display device to be newly mounted through an optical system.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Near-infrared rays mean the shortest wavelength among infrared rays, whose wavelength range is from 750 nm to 3000 μm. Since this near-infrared ray is beyond the visible range that the human eye can perceive, There are few advantages such as few side effects.

This invention is characterized by using near-infrared light as a light source 1 in order to solve glare.

Figure 2 is a schematic diagram showing a slit lamp inspection apparatus using a near infrared ray of the present invention, Figure 3 shows a side view thereof.

As shown, a light source 1 that receives power and emits light, and a near-infrared generator 12 which induces the near-infrared light emitted from the light source 1 to be irradiated to the eye of the examinee and outputs the reflected light. ).

At this time, the slit lamp generating near-infrared light is configured such that the conventional light source of visible light and the near-infrared light source of the present invention can be selected, and the detachment allows the inspector to operate.

The near-infrared generating unit 12 includes a light source 1 that generates light, a near-infrared filter that blocks visible light from the light generated by the light source, and transmits near-infrared light, and the light generated from the light source. It includes a light collecting plate focused inside.

The slit lamp lens system 3 for expanding and outputting the light applied through the near infrared ray generating unit 12 to the optical cutting plane is connected to the adapter 10 equipped with the double-sided mirror 7 connected to the rear end.

And the monitor 11 and the camera 15 is connected to one side and the other side of the adapter 10 and the image is applied through the double-sided mirror (7), the image output to the adapter 10 a plurality of lenses Through the eyepiece portion (4) to enlarge through the configured to be able to output the image to the examiner.

The left and right near infrared cameras 15 and 15 'of the camera are each implemented as a charge-coupled device (CCD) or CMOS.

The image capturing apparatus is provided on both sides of the adapter 10, and is reflected by the inner double-sided mirror 7, bent downward by 90 degrees, applied through an infrared pass filter, and then applied to the infrared camera.

In addition, the image signal is applied to a small display device installed on the upper part of the same axis to enter the eye of the examiner through both eyepieces, the display device of the monitor 11 can be seen by the patient, guardian, student, etc. from the outside. have.

And the lower part of the slit lamp lens system (3) is composed of a slit lamp control body (6) with a built-in jog shuttle (5) for adjusting the position of the slit lamp, the adjustment body is a length adjustment device is built in the length is adjusted The gap is configured to be adjusted accordingly.

In the present invention configured as described above, when the slit lamp inspection is performed, the light of the light source 1 reaches the eye retina 9 through the near infrared ray generating unit 12 and then the reflected light passes through the slit lamp lens system 3 to the rear stage. Is output.

At this time, the part of the eye can be observed by adjusting the jog shuttle (5) of the slit lamp adjusting body (6), and the image output thereof is applied to the camera (15) through the double-sided mirror (7) in the adapter (10). Images can be recorded and stored, and the light reflected through the double-sided mirror 7 is applied to the monitor 11 on the other side so that an image displayed through the monitor 11 can be displayed to the patient or guardian from the outside. I can see it.

The examiner can perform an inspection such as abnormality of the eye retina 9 by the image applied through the eyepiece portion 4.

As such, the present invention uses a near infrared ray having a wavelength range of 750 nm to 3000 μm, which is the shortest ray of infrared light. Since the near infrared ray is beyond the visible range that the human eye can recognize, the visible ray of the same amount of energy In comparison, there are few side effects such as glare.

As described above, the present invention generates a near-infrared ray and irradiates the near-infrared ray to the patient's eye, and transmits infrared rays to be newly mounted through a conventional slit lamp optical system that delivers the reflected and scattered near-infrared image to the left and right eyepieces. It is applied to a conventional slit lamp through a double-sided mirror that is detachable through an image acquisition and display device, so that an inspector can access and view an infrared image like a conventional slit lamp.

(1) According to the present invention, since near-infrared light is irradiated to the patient's eye in the slit lamp test, which is a basic test during ophthalmic care, eliminating the glare generated when the visible light is irradiated to the eye, and especially immediately after the fundus examination (retinal examination) With normal vision, fundus examination (retinal examination) can be performed without eye pupil dilation.

(2) Also, an image of the eye obtained from the left and right eye NIR sensors can be directly viewed by a patient or a guardian using a monitor. In addition, by mounting such a device to the existing slit lamp, the eye can be inspected by the same operation as the conventional slit lamp test has the advantage that it can be applied immediately without additional training or adaptation to the ophthalmologist.

(3) On the other hand, when observing by conventional methods using general visible light in near-infrared microscope, it is possible to easily switch and to construct a cheaper and more economical system.

(4) In this way, the near-infrared light allows the patient to examine the light without feeling the light, and to live a normal life immediately after the test.

Claims (3)

A light source 1 that receives power and emits light, a near-infrared generator 12 which induces the near-infrared light emitted from the light source 1 to be irradiated to the subject's eye and outputs the reflected light, and the near-infrared generation A slit lamp control body having a slit lamp system 3 for expanding and outputting light applied through the unit 12 to an optical cutting plane, and a jog shuttle 5 for adjusting the slit lamp position of the slit lamp system 3. 6), an adapter 10 connected to the slit lamp lens system 3 and equipped with a double-sided mirror 7, and connected to one side and the other side of the adapter 10, respectively, through an image of the double-sided mirror 7. A slit lamp inspection site using near-infrared light, comprising: a monitor (11) and a camera (15) to be applied, and an eyepiece (4) for enlarging an image output from the adapter (10) through a plurality of lenses. Chi. The light source (1) for generating light beams according to claim 1, wherein the near infrared rays generating unit (12) includes: A near-infrared filter which blocks visible light and transmits near-infrared of the light generated by the light source; A slit lamp inspection device using near-infrared light, characterized in that it consists of a light collecting plate for concentrating light rays generated from the light source 1 to the near-infrared filter. 2. The camera 15 is composed of cameras 15 and 15 'for photographing left and right eyes, and the near-infrared sensor is a charge-coupled device (CCD). A slit lamp inspection device using near infrared light, characterized in that implemented in the CMOS

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