KR20060123589A - 마이크로리소그래피 투영 노광 장치용 조명 시스템 - Google Patents
마이크로리소그래피 투영 노광 장치용 조명 시스템 Download PDFInfo
- Publication number
- KR20060123589A KR20060123589A KR1020067017080A KR20067017080A KR20060123589A KR 20060123589 A KR20060123589 A KR 20060123589A KR 1020067017080 A KR1020067017080 A KR 1020067017080A KR 20067017080 A KR20067017080 A KR 20067017080A KR 20060123589 A KR20060123589 A KR 20060123589A
- Authority
- KR
- South Korea
- Prior art keywords
- polarization
- illumination system
- compensator
- change
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70566—Polarisation control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Polarising Elements (AREA)
- Microscoopes, Condenser (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004010569A DE102004010569A1 (de) | 2004-02-26 | 2004-02-26 | Beleuchtungssystem für eine Mikrolithographie-Projektionsbelichtungsanlage |
| DE102004010569.3 | 2004-02-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20060123589A true KR20060123589A (ko) | 2006-12-01 |
Family
ID=34853935
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020067017080A Withdrawn KR20060123589A (ko) | 2004-02-26 | 2005-02-24 | 마이크로리소그래피 투영 노광 장치용 조명 시스템 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20070263199A1 (https=) |
| EP (1) | EP1721219A2 (https=) |
| JP (1) | JP2007524247A (https=) |
| KR (1) | KR20060123589A (https=) |
| DE (1) | DE102004010569A1 (https=) |
| WO (1) | WO2005083517A2 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2157480B1 (en) | 2003-04-09 | 2015-05-27 | Nikon Corporation | Exposure method and apparatus, and device manufacturing method |
| TWI360158B (en) | 2003-10-28 | 2012-03-11 | Nikon Corp | Projection exposure device,exposure method and dev |
| TWI385414B (zh) | 2003-11-20 | 2013-02-11 | 尼康股份有限公司 | 光學照明裝置、照明方法、曝光裝置、曝光方法以及元件製造方法 |
| TWI395068B (zh) | 2004-01-27 | 2013-05-01 | 尼康股份有限公司 | 光學系統、曝光裝置以及曝光方法 |
| TWI609410B (zh) | 2004-02-06 | 2017-12-21 | 尼康股份有限公司 | 光學照明裝置、曝光裝置、曝光方法以及元件製造方法 |
| WO2008119794A1 (en) * | 2007-04-03 | 2008-10-09 | Carl Zeiss Smt Ag | Optical system, in particular illumination device or projection objective of a microlithographic projection exposure apparatus |
| DE102007043958B4 (de) * | 2007-09-14 | 2011-08-25 | Carl Zeiss SMT GmbH, 73447 | Beleuchtungseinrichtung einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102007055567A1 (de) * | 2007-11-20 | 2009-05-28 | Carl Zeiss Smt Ag | Optisches System |
| WO2013029178A1 (en) * | 2011-09-02 | 2013-03-07 | UNIVERSITé LAVAL | Polarization-maintaining module for making optical systems polarization-independent |
| DE102012200370A1 (de) | 2012-01-12 | 2013-08-01 | Carl Zeiss Smt Gmbh | Verfahren zum Herstellen eines polarisationsbeeinflussenden optischen Elements, sowie polarisationsbeeinflussendes optisches Element |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3246615B2 (ja) * | 1992-07-27 | 2002-01-15 | 株式会社ニコン | 照明光学装置、露光装置、及び露光方法 |
| DE19520563A1 (de) * | 1995-06-06 | 1996-12-12 | Zeiss Carl Fa | Beleuchtungseinrichtung für ein Projektions-Mikrolithographie-Gerät |
| DE19535392A1 (de) * | 1995-09-23 | 1997-03-27 | Zeiss Carl Fa | Radial polarisationsdrehende optische Anordnung und Mikrolithographie-Projektionsbelichtungsanlage damit |
| DE19807120A1 (de) * | 1998-02-20 | 1999-08-26 | Zeiss Carl Fa | Optisches System mit Polarisationskompensator |
| JP3985346B2 (ja) * | 1998-06-12 | 2007-10-03 | 株式会社ニコン | 投影露光装置、投影露光装置の調整方法、及び投影露光方法 |
| DE19829612A1 (de) * | 1998-07-02 | 2000-01-05 | Zeiss Carl Fa | Beleuchtungssystem der Mikrolithographie mit Depolarisator |
| JP3927753B2 (ja) * | 2000-03-31 | 2007-06-13 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
| DE60124524T2 (de) * | 2000-04-25 | 2007-03-08 | Asml Holding, N.V. | Optisches reduktionssystem mit kontrolle der belichtungspolarisation |
| DE10124474A1 (de) * | 2001-05-19 | 2002-11-21 | Zeiss Carl | Mikrolithographisches Belichtungsverfahren sowie Projektionsobjektiv zur Durchführung des Verfahrens |
| DE10124803A1 (de) * | 2001-05-22 | 2002-11-28 | Zeiss Carl | Polarisator und Mikrolithographie-Projektionsanlage mit Polarisator |
| DE10206061A1 (de) * | 2002-02-08 | 2003-09-04 | Carl Zeiss Semiconductor Mfg S | Polarisationsoptimiertes Beleuchtungssystem |
| WO2003077011A1 (en) * | 2002-03-14 | 2003-09-18 | Carl Zeiss Smt Ag | Optical system with birefringent optical elements |
| JP4552428B2 (ja) * | 2003-12-02 | 2010-09-29 | 株式会社ニコン | 照明光学装置、投影露光装置、露光方法及びデバイス製造方法 |
-
2004
- 2004-02-26 DE DE102004010569A patent/DE102004010569A1/de not_active Withdrawn
-
2005
- 2005-02-24 JP JP2007500157A patent/JP2007524247A/ja active Pending
- 2005-02-24 KR KR1020067017080A patent/KR20060123589A/ko not_active Withdrawn
- 2005-02-24 WO PCT/EP2005/001948 patent/WO2005083517A2/de not_active Ceased
- 2005-02-24 US US10/590,700 patent/US20070263199A1/en not_active Abandoned
- 2005-02-24 EP EP05715516A patent/EP1721219A2/de not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| DE102004010569A1 (de) | 2005-09-15 |
| WO2005083517A3 (de) | 2006-04-13 |
| US20070263199A1 (en) | 2007-11-15 |
| WO2005083517A2 (de) | 2005-09-09 |
| JP2007524247A (ja) | 2007-08-23 |
| EP1721219A2 (de) | 2006-11-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |