KR20060020623A - 동축 탐침 인터페이스 - Google Patents

동축 탐침 인터페이스 Download PDF

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Publication number
KR20060020623A
KR20060020623A KR1020057021429A KR20057021429A KR20060020623A KR 20060020623 A KR20060020623 A KR 20060020623A KR 1020057021429 A KR1020057021429 A KR 1020057021429A KR 20057021429 A KR20057021429 A KR 20057021429A KR 20060020623 A KR20060020623 A KR 20060020623A
Authority
KR
South Korea
Prior art keywords
coaxial
probe
carrier
coaxial connector
interconnection system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
KR1020057021429A
Other languages
English (en)
Korean (ko)
Inventor
스티븐 펠드만
조셉 엔. 카스티글리온
Original Assignee
쓰리엠 이노베이티브 프로퍼티즈 컴파니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 쓰리엠 이노베이티브 프로퍼티즈 컴파니 filed Critical 쓰리엠 이노베이티브 프로퍼티즈 컴파니
Publication of KR20060020623A publication Critical patent/KR20060020623A/ko
Abandoned legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/942—Comblike retainer for conductor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR1020057021429A 2003-05-13 2004-03-30 동축 탐침 인터페이스 Abandoned KR20060020623A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/436,835 US6824427B1 (en) 2003-05-13 2003-05-13 Coaxial probe interconnection system
US10/436,835 2003-05-13

Publications (1)

Publication Number Publication Date
KR20060020623A true KR20060020623A (ko) 2006-03-06

Family

ID=33417262

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020057021429A Abandoned KR20060020623A (ko) 2003-05-13 2004-03-30 동축 탐침 인터페이스

Country Status (5)

Country Link
US (1) US6824427B1 (cg-RX-API-DMAC7.html)
EP (1) EP1623238A1 (cg-RX-API-DMAC7.html)
JP (1) JP2007503591A (cg-RX-API-DMAC7.html)
KR (1) KR20060020623A (cg-RX-API-DMAC7.html)
WO (1) WO2004102209A1 (cg-RX-API-DMAC7.html)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6951482B1 (en) * 2004-03-16 2005-10-04 Credence Systems Corporation Controlled-impedance coaxial cable interconnect system
US7292059B2 (en) * 2005-03-31 2007-11-06 Credence Systems Corporation Power supply assembly for a semiconductor circuit tester
US7189103B1 (en) * 2005-12-07 2007-03-13 Avocent Corporation Wire comb overlying spark gap
US7731528B2 (en) * 2006-01-31 2010-06-08 3M Innovative Properties Company Electrical termination device
US7553187B2 (en) * 2006-01-31 2009-06-30 3M Innovative Properties Company Electrical connector assembly
US7651355B2 (en) * 2006-06-30 2010-01-26 3M Innovative Properties Company Floating panel mount connection system
US8007308B2 (en) * 2007-10-17 2011-08-30 3M Innovative Properties Company Electrical connector assembly
US7722394B2 (en) 2008-02-21 2010-05-25 3M Innovative Properties Company Electrical termination device
CH702048B1 (de) * 2008-03-14 2011-04-29 Huber+Suhner Ag Mehrfach-Koaxialkabel-Steckverbindung sowie Verfahren zum Montieren einer solchen Mehrfach-Koaxialkabel-Steckverbindung.
ATE542269T1 (de) * 2008-04-08 2012-02-15 Huber+Suhner Ag Mehrfachkoaxialverbinder
US7740508B2 (en) * 2008-09-08 2010-06-22 3M Innovative Properties Company Probe block assembly
USRE47459E1 (en) 2011-10-24 2019-06-25 Ardent Concepts, Inc. Controlled-impedance cable termination using compliant interconnect elements
CN104025393B (zh) 2011-10-24 2016-10-12 安达概念股份有限公司 使用兼容的互连元件的控制阻抗电缆终端
USRE46958E1 (en) 2011-10-24 2018-07-17 Ardent Concepts, Inc. Controlled-impedance cable termination using compliant interconnect elements
US9293874B2 (en) * 2014-06-17 2016-03-22 Tyco Electronics Corporation High speed radio frequency connector
TWM512225U (zh) * 2015-07-01 2015-11-11 Cooler Master Technology Inc 電源供應器連接器及其導電端子
US10938139B2 (en) * 2018-08-21 2021-03-02 Te Connectivity Corporation Electrical connector with retractable contacts
KR102503437B1 (ko) * 2021-04-26 2023-02-24 주식회사 에이플러스알에프 인쇄회로기판 테스트용 커넥터
WO2023023246A1 (en) 2021-08-20 2023-02-23 Vertiv It Systems, Inc. Wire comb
CN116243033A (zh) * 2021-12-07 2023-06-09 中兴通讯股份有限公司 一种电接触探针装置

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3852700A (en) 1969-04-18 1974-12-03 Breston M Grounding base for connector
US4296990A (en) * 1980-02-22 1981-10-27 Virginia Panel Corporation Electrical connector having insulated locking shell for use on panel having metal ground plane
US4606603A (en) * 1983-04-07 1986-08-19 Lockheed Corporation Underwater connector including integral bladder and seal with a set of constricting means
JPS60123666U (ja) * 1984-01-30 1985-08-20 株式会社ヨコオ 回路基板等の検査装置
JPS6177286A (ja) * 1984-09-21 1986-04-19 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 同軸ケーブル用インターフェース装置
US4632485A (en) * 1985-06-06 1986-12-30 Brown Kenneth C Electrical circuit testing apparatus
US4729752A (en) 1985-07-26 1988-03-08 Amp Incorporated Transient suppression device
DE3630548A1 (de) * 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
US4931726A (en) * 1987-06-22 1990-06-05 Hitachi, Ltd. Apparatus for testing semiconductor device
JPH0178029U (cg-RX-API-DMAC7.html) 1987-11-13 1989-05-25
FR2685553A1 (fr) * 1991-12-18 1993-06-25 Radiall Sa Element de connecteur coaxial coude apte a etre fixe a une carte imprimee.
US5227718A (en) * 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly
JP2976321B2 (ja) * 1993-08-03 1999-11-10 東京エレクトロン株式会社 プローブ装置
US6066957A (en) 1997-09-11 2000-05-23 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
WO1999035715A1 (en) * 1998-01-05 1999-07-15 Rika Electronics International, Inc. Coaxial contact assembly apparatus
US6184460B1 (en) 1998-02-27 2001-02-06 Berg Technology, Inc. Modular box shield for forming a coaxial header
US6037787A (en) 1998-03-24 2000-03-14 Teradyne, Inc. High performance probe interface for automatic test equipment
AU1729800A (en) * 1998-11-25 2000-06-13 Rika Electronics International, Inc. Electrical contact system
US6409550B1 (en) 1999-11-15 2002-06-25 Mce/Weinschel Corporation Planar blind-mate connectors
US6491545B1 (en) * 2000-05-05 2002-12-10 Molex Incorporated Modular shielded coaxial cable connector
US6447328B1 (en) 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe
US6551126B1 (en) 2001-03-13 2003-04-22 3M Innovative Properties Company High bandwidth probe assembly

Also Published As

Publication number Publication date
WO2004102209A1 (en) 2004-11-25
US20040229505A1 (en) 2004-11-18
JP2007503591A (ja) 2007-02-22
US6824427B1 (en) 2004-11-30
EP1623238A1 (en) 2006-02-08

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20051111

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20090330

Comment text: Request for Examination of Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20101129

Patent event code: PE09021S01D

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20110420

NORF Unpaid initial registration fee
PC1904 Unpaid initial registration fee