KR20060016259A - Chip on glass typed organic electroluminescent cell - Google Patents

Abstract

The present invention relates to a seedage-type organic electroluminescent cell that forms dummy lines for pixel defect detection at different positions from the pads. The organic electroluminescent cell includes a plurality of pixels, data line pads, dummy data lines, dummy data line connectors, and scan line pads formed at regions where indium tin oxide layers corresponding to anodes and metal electrode layers corresponding to cathodes cross each other. And dummy scan lines and dummy scan line connections. The data line pads are respectively coupled to one end of the indium tin oxide layers. The dummy data lines are respectively coupled to the other ends of the indium tin oxide layers, and the dummy data line connection unit connects the dummy data lines. The scan line pads are respectively coupled to one end of the metal electrode layers. The dummy scan lines are respectively coupled to the other ends of the metal electrode layers, and the scan line connection unit connects the dummy scan lines. The sea-gauge organic electroluminescent cell detects pixel defects by forming dummy lines for detecting pixel defects at different positions from the pads, thereby reducing the number of pins for pixel defect detection and using a scribing blade. Dummy lines and connections can be cut.

Glow cell, dummy, pad, pixel

Description

CIO type organic electroluminescent cell {CHIP ON GLASS TYPED ORGANIC ELECTROLUMINESCENT CELL}

1A is a plan view showing a substrate having conventional light emitting cells.

FIG. 1B is an enlarged plan view of portion A of FIG. 1A.

FIG. 2A is a plan view illustrating a substrate including seedage-type organic electroluminescent cells according to a preferred embodiment of the present invention.

FIG. 2B is an enlarged plan view of a portion B of FIG. 2A.

2C is a plan view illustrating the cell unit of FIG. 2B.

3 is a plan view illustrating a seed-edge organic electroluminescent cell according to another exemplary embodiment of the present invention.

The present invention relates to a seedage type organic electroluminescent cell, and more particularly, to a seedage type organic electroluminescent cell in which dummy lines for pixel defect detection are formed at different positions from pads.

An organic electroluminescent cell means a cell that generates light of a predetermined wavelength. The light emitting cell comprises a Chip On Film typed Organic Electroluminescent cell (COF typed Organic Electroluminescent cell) and a Seagage type Organic Electroluminescent cell (Chip On Glass typed Oraganic Electroluminescent cell, COG typed Organic Electroluminesent cell) Include.

In the CMOS type organic electroluminescent cell, an integrated circuit chip having a driving circuit for driving the cell is connected to the cell outside of the cell. On the other hand, in the seed-type organic electroluminescent cell, the integrated circuit chip is connected to the cell on the cell. Therefore, the CFP type organic electroluminescent cell is bulkier than the CIO type organic electroluminescent cell and requires a lot of cost for fabrication, and thus, a CIO type organic electroluminescent cell has appeared.

FIG. 1A is a plan view illustrating a substrate having conventional sea geotype organic electroluminescent cells. FIG.

Referring to FIG. 1A, the substrate includes a plurality of light emitting cells, and each of the light emitting cells includes indium tin oxide layers, metal electrode layers, data line pads, and scan line pads. Detailed description thereof will be described below with reference to the accompanying drawings.

FIG. 1B is an enlarged plan view of portion A of FIG. 1A.

Referring to FIG. 1B, the organic electroluminescent cell includes a cell unit 10, data line pads 30, first scan line pads 50, and second scan line pads 70.

The cell unit 10 includes a plurality of indium tin oxide layers and metal electrode layers, and has a plurality of pixels in a region where the indium tin oxide layers and the metal electrode layers intersect.

The data line pads 30 are respectively coupled to the indium tin oxide layers, and provide the indium tin oxide layers with a predetermined voltage applied through predetermined pins of the fail detection device when detecting pixel defects.

First scan line pads 50 are respectively coupled to some of the metal electrode layers of the metal electrode layers, and provide a predetermined voltage applied to the some metal electrode layers through predetermined pins of the failure detection apparatus.

The second scan line pads 70 are respectively coupled to the remaining metal electrode layers of the metal electrode layers, and provide the remaining metal electrode layers with a predetermined voltage applied through predetermined pins of the failure detection apparatus.

Hereinafter, the CFO type organic electroluminescent cell and the CIO type organic electroluminescent cell will be compared.

In detecting pixel defects, defects of pixels were detected by using connections connecting pads in the CFC type organic electroluminescent cell. Subsequently, end portions of the pads were cut using a scribing blade to connect the integrated circuit chip and the pads. This was possible because the connecting portions are formed outside of the cell in the CS type organic electroluminescent cell.

On the other hand, in the seed-type organic electroluminescent cell, connecting parts connecting pads could not be formed on the cell for pixel defect detection. Because, when the pixel defects are detected by forming the connecting portions connecting the pads, the end portions of the pads must be cut by using a scribing blade to connect the integrated circuit chip and the pads after the pixel defect is detected. . However, in the scribing process using the scribing blade, the substrate should be cut in the horizontal and vertical directions, and thus, the structural characteristics of the seed paper-type organic electroluminescent cell could not be cut. This is because when the end portions of the pads are cut in the seed-type organic electroluminescent cell, the scan lines are also cut together. As a result, the connections could not be formed between the data line pads 30 and the scan line pads 50 and 70.

Therefore, in the sea-galow organic electroluminescent cell, pins of the failure detection device had to contact each other on the pads 30, 50 and 70 when the pixel failure was detected. As a result, the waste of pins was severe. Therefore, there is a need for an organic electroluminescent cell that can reduce waste of fins.

It is an object of the present invention to provide a seedage-type organic electroluminescent cell which can reduce the number of pins for pixel defect detection.

In order to achieve the object as described above, the sea-gauge organic electroluminescent cell according to a preferred embodiment of the present invention is a plurality of indium tin oxide layers corresponding to the anode and a plurality of regions formed in the intersection of the metal electrode layers corresponding to the cathode A pixel, data line pads, dummy data lines, dummy data line connectors, scan line pads, dummy scan lines and dummy scan line connectors. The data line pads are respectively coupled to one end of the indium tin oxide layers. The dummy data lines are respectively coupled to the other ends of the indium tin oxide layers, and the dummy data line connection unit connects the dummy data lines. The scan line pads are respectively coupled to one end of the metal electrode layers. The dummy scan lines are respectively coupled to the other ends of the metal electrode layers, and the scan line connection unit connects the dummy scan lines.

Since the sea-galow organic electroluminescent cell according to the present invention detects pixel defects by forming dummy lines for pixel defect detection at different positions from the pads, the number of pins for pixel defect detection can be reduced and the scribing blade The dummy lines and the connecting portions may be cut by using.

Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment of the sea-gauge organic electroluminescent cell according to the present invention.

FIG. 2A is a plan view illustrating a substrate including seedage-type organic electroluminescent cells according to a preferred embodiment of the present invention.

Referring to FIG. 2A, the substrate includes a plurality of organic electroluminescent cells. Each cell includes data line pads, dummy data lines, dummy data line connectors, scan line pads, dummy scan lines, and dummy scan line connectors. Detailed description thereof will be described below with reference to the accompanying drawings.

FIG. 2B is an enlarged plan view of a portion B of FIG. 2A.

Referring to FIG. 2B, the sea-gauge organic electroluminescent cell of the present invention includes a cell unit 100, data line pads 120, dummy data lines 140, dummy data line connectors 160, and scan line pads. 180, dummy scan lines 200 and dummy scan line connectors 220.

The cell unit 100 includes indium tin oxide layers (hereinafter, referred to as “ITO layers”) and metal electrode layers, and has pixels formed in regions where they intersect. Each of the pixels includes the ITO layer, an organic layer deposited thereon, and the metal electrode layer deposited on the organic layer. The organic layer may be a hole injection layer (HIL), a hole transporting layer (HTL), an emission layer (ETL), an electron transporting layer (ETL), and an electron injection, which are sequentially deposited. Layer (Electron Injection Layer, EIL). Alternatively, the organic material layer includes only a hole transport layer, a light emitting layer, and an electron transport layer.

When a forward voltage is applied, each of the pixels generates light of a predetermined wavelength. In detail, when a predetermined positive voltage is applied to the ITO layer and a predetermined negative voltage is applied to the metal electrode layer, the ITO layer provides holes to the hole injection layer and the electron injection layer provides electrons. It serves as an injection layer. The hole injection layer then smoothly injects the provided holes into the hole transport layer, and the electron injection layer smoothly injects the provided electrons into the electron transport layer. Subsequently, the hole transport layer transports the injected holes to the light emitting layer, and the electron transport layer transports the injected electrons to the light emitting layer. Subsequently, the transported holes and electrons recombine in the emission layer to generate light of a specific wavelength.

Each of the data line pads 120 is coupled to one end of the ITO layers, and corresponds to an anode of an integrated circuit chip having a driving circuit for driving the pixels after pixel defect detection. Connected with the chip.

The dummy data lines 140 are respectively coupled to the other ends of the ITO layers, and provide predetermined voltages applied to the ITO layers from the failure detection device through the dummy data line connection unit 160 when the pixel failure is detected. In detail, a predetermined voltage is applied to one of the dummy data lines 140 from the failure detection device, and the applied voltage is provided to the remaining dummy data lines 140 through the dummy data line connection unit 160. do. In addition, the dummy data lines 140 are conductors such as metal or indium tin oxide layers.

The dummy data lines 140 are cut together in the termination process of the substrate by the scribing blade after the end portions thereof detect the pixel defect.

The dummy data line connector 160 provides a voltage applied from one of the dummy data lines 140 to the remaining dummy data lines 140. In addition, the dummy data line connector 160 is a conductor and is shorted.

Scan line pads 180 are respectively coupled to one end of the metal electrode layers, and are connected to a cathode integrated circuit chip corresponding to a cathode of the integrated circuit chip after the pixel defect is detected.

The dummy scan lines 200 are respectively coupled to the other ends of the metal electrode layers, and provide predetermined voltages applied to the metal electrode layers from the failure detection apparatus through the dummy scan line connection unit 220. In detail, a predetermined voltage is applied to one of the dummy scan lines 200 from the failure detection device, and the applied voltage is provided to the remaining dummy scan lines 200 through the dummy scan line connection unit 220. do. In addition, the dummy scan lines 200 are conductors such as metal.

The dummy scan lines 200 are cut together in the process of separating the substrate by the scribing blade after the end portion thereof detects the pixel defect.

The dummy scan line connector 220 provides a voltage applied from one of the dummy scan lines 200 to the remaining dummy scan lines 220. In addition, the dummy scan line connection part 220 is a conductor and is short-circuited.

Unlike the prior art, the sea-gauge organic electroluminescent cell of the present invention has different pads 120 and 180 connected to an integrated circuit chip, dummy lines 140 and 200 and dummy line connectors 160 and 220 for pixel defect detection. ) Are formed at different positions to detect defects of pixels. In this case, unlike the prior art, pins for detecting pixel defects are contacted with one of the dummy data lines 140 and one of the dummy scan lines 200, unlike the prior art. That is, two pins are required for pixel defect detection, and the number of pins for pixel defect detection is reduced compared to the prior art.

2C is a plan view illustrating the cell unit of FIG. 2B.

Referring to FIG. 2C, the cell unit 100 includes the ITO layers 300 and the metal electrode layers 320, and has the pixels formed in an area where the ITO layers 300 and the metal electrode layers 320 intersect. .

Hereinafter, a pixel defect detection process will be described in detail.

First, the lighting inspection process of the pixels will be described in detail.

The first pin of the failure detection device is in contact with one of the dummy data lines 140 to apply a predetermined amount of voltage, and the second pin of the failure detection device is in contact with one of the dummy scan lines 200. And a predetermined negative voltage is applied. Subsequently, the applied positive voltage is provided to the remaining dummy data lines 140 through the dummy data line connection unit 160, and the applied negative voltage is applied to the remaining dummy scan lines through the dummy scan line connection unit 220. Field 200 is provided. Subsequently, the positive voltage is provided to the ITO layers 300 through the dummy data lines 140, and the negative voltage is provided to the metal electrode layers 320 through the dummy scan lines 200. As a result, the pixels formed in the region where the ITO layers 300 and the metal electrode layers 320 intersect are turned on. The failure detection device detects whether the pixels are poor in lighting through the lit pixels.

Next, the leakage current detection process will be described in detail.

The first pin of the fail detection device is in contact with one of the dummy data lines 140 to apply a predetermined negative voltage, and the second pin of the fail detection device is in contact with one of the dummy scan lines 200. And a predetermined amount of voltage is applied. Subsequently, the applied negative voltage is provided to the remaining dummy data lines 140 through the dummy data line connection 160, and the applied positive voltage is applied to the remaining dummy scan through the dummy scan line connection 220. Lines 200 are provided. Subsequently, the negative voltage is provided to the ITO layers 300 through the dummy data lines 140, and the positive voltage is provided to the metal electrode layers 320 through the dummy scan lines 200. In this case, if the pixels are not bad, a reverse voltage is applied to the pixels so that the leakage current does not flow through the pixels. In reality, however, a minute current flows. On the other hand, when the pixels are bad, for example when some of the pixels are shorted, a leakage current flows through the bad pixels. In this case, the failure detecting apparatus measures the leakage current flowing through the pixels to determine that a failure occurs in the pixels.

When the pixel failure is detected, pins of the failure detection device contact the connection parts 160 and 220, and predetermined voltages are connected to the dummy data lines 140 and the dummy scan lines 200 through the connection parts 160 and 220. Can be applied to. In this case, since the pins do not contact the pads 120 and 180, damage to the pads 120 and 180 is prevented.

3 is a plan view illustrating a seed-edge organic electroluminescent cell according to another exemplary embodiment of the present invention.

Referring to FIG. 3, the organic electroluminescent cell of the present invention includes a cell unit 100, data line pads 120, dummy data lines 140, a dummy data line connection unit 160, and a data line electrode unit 170. The scan line pads 180 may include dummy scan lines 200, dummy scan line connectors 220, and scan line electrode units 230.

Since the other components except for the electrode parts 170 and 230 perform the same function as the elements of FIG. 2B, the same reference numerals will be used and the description thereof will be omitted.

The data line electrode unit 170 is coupled to the dummy data line connection unit 160, and the dummy data line connection unit 160 and the dummy data line receive a predetermined voltage applied by contacting the first pin of the failure detection apparatus when the pixel defect is detected. Through the layers 140 to the ITO layers. Here, the data line electrode unit 170 is a conductor such as metal.

The scan line electrode unit 230 is coupled to the dummy scan line connection unit 220, and the dummy scan line connection unit 220 and the dummy scan lines 200 receive a predetermined voltage applied by contacting the second pin of the failure detection apparatus. To the metal electrode layers). Here, the scan line electrode unit 230 is a conductor such as metal.

When the pixel defect is detected, unlike the prior art, the pins of the defect detection apparatus do not directly contact the pads 120 and 180, but contact the electrode portions 170 and 230, thereby preventing damage to the pads 120 and 180. .

In addition, since the applied voltages are provided to the dummy data lines 140 and the dummy scan lines 200 through the electrode parts 170 and 230, the same voltage is applied to the dummy data lines 140 and the dummy scan is performed. The same voltage is applied to the lines 200. Therefore, the defect detection apparatus can detect pixel defects more accurately than the prior art.

Preferred embodiments of the invention described above are disclosed for purposes of illustration, and those skilled in the art having ordinary knowledge of the present invention will be capable of various modifications, changes, additions within the spirit and scope of the present invention, such modifications, changes And additions should be considered to be within the scope of the following claims.

As described above, the sea geotype organic electroluminescent cell according to the present invention detects pixel defects by forming dummy lines for detecting pixel defects at different positions from the pads, thereby reducing the number of pins for pixel defect detection. And cutting the dummy lines and connections using a scribing blade.

Claims (3)

In a seedage type organic electroluminescent cell having a plurality of pixels formed in a region where an indium tin oxide layer corresponding to an anode and a metal electrode layer corresponding to a cathode intersect, A plurality of data line pads respectively coupled to one end of the indium tin oxide layers; A plurality of dummy data lines respectively coupled to the other ends of the indium tin oxide layers; A dummy data line connection unit connecting the dummy data lines; A plurality of scan line pads respectively coupled to one end of the metal electrode layers; A plurality of dummy scan lines respectively coupled to the other ends of the metal electrode layers; And And a dummy scan line connection unit connecting the dummy scan lines. The data of claim 1, wherein the data is coupled to the dummy data line connection part and provides a predetermined voltage to the indium tin oxide layers through the dummy data line connection part and the dummy data lines. Line electrode units; And And a scan line electrode part coupled to the dummy scan line connection part and providing a predetermined voltage applied to the dummy scan line connection part to the metal electrode layers through the dummy scan line connection part and the dummy scan lines. CIO type organic electroluminescent cell. The CIO type organic electroluminescent cell according to claim 1, wherein each of the connection parts is a conductor and is short-circuited.

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