KR20060005297A - Gravity inspection system of liquid crystal display panel - Google Patents

Gravity inspection system of liquid crystal display panel Download PDF

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KR20060005297A
KR20060005297A KR1020050096829A KR20050096829A KR20060005297A KR 20060005297 A KR20060005297 A KR 20060005297A KR 1020050096829 A KR1020050096829 A KR 1020050096829A KR 20050096829 A KR20050096829 A KR 20050096829A KR 20060005297 A KR20060005297 A KR 20060005297A
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panel
liquid crystal
gravity
cassette
chamber
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KR1020050096829A
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Korean (ko)
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KR100729642B1 (en
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김준수
심재필
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케이 이엔지(주)
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2202/00—Materials and properties
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/69—Arrangements or methods for testing or calibrating a device

Abstract

본 발명은 액정디스플레이 판넬(TFT 및 컬러필터 유리기판) 사이에 액정을 넣고 합착하는 셀(Cell)라인 공정에서 정해진 시간내에 일정한 온도를 가해 액정이 중력의 영향으로 한쪽으로 몰리는 판넬의 액정불량유무를 정확하고도 연속적으로 자동 검사하는 그 중력검사장치에 관한 것이다.The present invention is applied to a liquid crystal display panel (TFT and color filter glass substrate) in the cell line process of bonding and attaching a fixed temperature within a predetermined time within a predetermined time to determine whether there is a liquid crystal defect of the panel that the liquid crystal is driven to one side by the influence of gravity The present invention relates to a gravity inspection device that automatically and accurately and continuously tests.

즉, 다수개의 액정 디스플레이 판넬이 적재된 LCD 카세트(K)를 공급하는 판넬 카세트공급장치(100)와, 상기 판넬 카세트(K)를 검사 양호 경사각인 10~15 로 경사진 가운데 항온 히팅처리되는 1, 2층 타입의 항온쳄버장치(200)와, 카세트로딩용 엘리베이터장치(300)와, 검사할 대상체인 액정판넬을 하나씩 취출하여 중력검사대(420)에 안착/대응시킨 후 저면방향에서 백라이트 빛을 비춰 액정중력불량여부를 판정(양품 혹은 불량품) 하는 액정판넬 중력불량검사용쳄버(400)와, 상기 검사된 판넬을 정열하는 판넬정열부(500)와, 상기 판넬을 배출방향으로 반전한 후 언로딩 배출하는 카세트언로딩부(600)로 각각 이루어져서 된 것이다.That is, the panel cassette supply device 100 for supplying the LCD cassette (K) loaded with a plurality of liquid crystal display panels, and the panel cassette (K) is a constant temperature heating process inclined at a good inclination angle of 10 to 15 , The two-layer thermostat chamber device 200, the cassette loading elevator device 300, and the liquid crystal panel to be inspected are taken out one by one to be seated / corresponded to the gravity test table 420, and then the backlight light is emitted from the bottom direction. The liquid crystal panel gravity defect inspection chamber 400 for determining whether the liquid crystal gravity is defective (good or bad), the panel alignment unit 500 for arranging the inspected panel, and the panel is reversed in the discharge direction and then frozen. It is made of a cassette unloading unit 600 to discharge the loading.

항온쳄버, 경사용 컨베이어장치, 히터부, 엘리베이터장치 , 판넬 중력불량검사쳄버, 중력검사대, 판넬취출로봇, 판넬이동케리어, 판넬 정렬대 Constant Temperature Chamber, Inclined Conveyor, Heater Unit, Elevator Device, Panel Gravity Failure Inspection Chamber, Gravity Tester, Panel Extraction Robot, Panel Moving Carrier, Panel Alignment

Description

액정디스플레이 판넬의 중력검사장치{Gravity inspection system of liquid crystal display panel}Gravity inspection system of liquid crystal display panel

도 1은 본 발명의 바람직한 일실시예를 보인 전체 구조도1 is an overall structural view showing a preferred embodiment of the present invention

도 2는 본 발명의 바람직한 일실시예를 보인 항온장치의 구조도Figure 2 is a structural diagram of a thermostat showing a preferred embodiment of the present invention

도 3은 본 발명의 바람직한 일실시예를 보인 엘리베이트의 구조도Figure 3 is a structural diagram of an elevator showing a preferred embodiment of the present invention

도 4는 본 발명의 바람직한 일실시예를 보인 검사쳄버의 구조도Figure 4 is a structural diagram of the inspection chamber showing a preferred embodiment of the present invention

* 도면의 주요부분에 대한 부호설명** Explanation of Codes on Major Parts of Drawings *

K:LCD 카세트 100:판넬 카세트공급장치K: LCD cassette 100: Panel cassette feeder

200:1, 2층 타입 항온쳄버장치 210:경사용 컨베이어장치200: 1, 2-layer thermostatic chamber unit 210: Light conveyor system

220:히터부 230:순환팬 220: heater 230: circulation fan

300:엘리베이터장치 400:액정판넬 중력불량검사쳄버300: Elevator device 400: Liquid crystal panel gravity failure inspection chamber

420:중력검사대 410:판넬취출로봇420: gravity test table 410: panel extraction robot

500:판넬정열부 510:판넬이동케리어500: panel alignment unit 510: panel movement carrier

520:판넬 정렬대 530:판넬 제2 취출로봇520: Panel alignment table 530: Panel second take-out robot

600:카세트언로딩부600: cassette unloading unit

본 발명은 액정디스플레이 판넬(TFT 및 컬러필터 유리기판) 사이에 액정을 넣고 합착하는 셀(Cell)라인 공정에서 정해진 시간내에 일정한 온도를 가해 액정이 중력의 영향으로 한쪽으로 몰리는 판넬의 액정불량유무를 정확하고도 연속적으로 자동 검사하는 그 중력검사장치에 관한 것이다.The present invention is applied to a liquid crystal display panel (TFT and color filter glass substrate) in the cell line process of bonding and attaching a fixed temperature within a predetermined time within a predetermined time to determine whether there is a liquid crystal defect of the panel that the liquid crystal is driven to one side by the influence of gravity The present invention relates to a gravity inspection device that automatically and accurately and continuously tests.

액정판넬의 중력검사장치는 액정디스플레이 판넬(LCD 기판)을 구성하는 TFT과 컬러필터 유리기판 사이에 주입되는 고체와 액체 사이의 중간 특성을 갖는 고점성의 액상 물질인 액정이 액정기판의 대형화 추세 그리고 대량생산체제 위주인 최근 변화된 액정주입방법 등의 원인과 함께 중력의 영향으로 판넬내부전체에 고른 농도분포가 형성되지 못하고 한쪽으로 몰리는 농도쏠림 액정불량(중력불량)현상이 최근 많이 발생하고 있다. Gravity tester of liquid crystal panel is a liquid crystal display panel (LCD substrate) and the liquid crystal substrate having a high viscosity liquid substance having intermediate characteristics between the solid and liquid injected between the TFT and the color filter glass substrate, the size of the liquid crystal substrate In addition to the causes of the recently changed liquid crystal injection method, which mainly focuses on the production system, due to the influence of gravity, evenly distributed concentration liquid crystal defects (gravity defects) are gathered to one side.

즉, 과거의 액정디스플레이 판넬은 대부분 그 크기가 대체로 적은 중, 소형이었을 뿐 아니라 액정주입방법이 기압차에 의한 모세관현상을 이용한 액정주입방법을 대부분 이용하여 왔음에 따라 중력에 의한 액정쏠림 현상으로 인한 판넬불량요소는 그다지 크기 않았다. In other words, the liquid crystal display panel of the past was mostly small in size, small in size, and liquid crystal injection caused by gravity caused by the liquid crystal injection method using the capillary phenomenon caused by the pressure difference. The panel failure factor was not large.

그런데 최근 급증한 대형 및 초대형 액정판넬의 경우 기판내부에 액정의 주 입량은 물론 액정의 분표면적이 아주 넓어 판넬생산공정 중 취급시 주어지는 중력변화에 영향을 받은 고점성의 액정이 양판넬 상호간 지지력이 취약한 부분인 판넬의 중앙부분에 아주 많은 액정이 몰리는 액정중력불량의 발생우려가 아주 높아 최근 액정판넬생산의 새로운 문제점으로 대두되고 있다.However, in the case of large and super-large liquid crystal panels, which recently increased rapidly, the amount of liquid crystal injected into the substrate as well as the liquid surface area of the liquid crystal are very large, and high viscosity liquid crystals affected by the gravity change given during handling during the panel production process have weak support between the two panels. There is a high possibility of the occurrence of liquid crystal gravity defects in which a large amount of liquid crystal is concentrated in the center portion of the phosphorescent panel has recently emerged as a new problem of liquid crystal panel production.

이는 양판넬간 사방 접착(실란트 등)된 부분과 판넬의 중앙부분과의 거리가 극히 짧은 소형 판넬의 경우에 판넬의 전체면적에 대하여 양판넬간 상호 지지력이 상당하게 유지되고 있기 때문에 주입된 액정이 중력에 따라 한곳으로 많이 몰릴는 현상이 잘나타나지 않는다.This is because in the case of a small panel where the distance between all four sides (such as sealant) between the two panels and the center of the panel is very short, the mutually supportive force between the two panels is substantially maintained for the entire panel area. Gravity does not appear to be driven to one place much.

그런데 판넬의 사방 접착부분과 판넬의 중안부분간의 거리가 아주 멀어 판넬간 지지력의 취약부분이 크게 노출된 판넬의 대형화 추세와 동반하여 그 중력불량현상은 날로 급증할 수밖에 없다. However, the distance between all four sides of the panel and the central part of the panel is so great that the gravity failure is inevitably increasing with the trend of panel enlargement, in which the weak part of the bearing capacity between panels is greatly exposed.

뿐만 아니라 최근 액정디스플레이 판넬의 양 기판속 액정 주입시 액정주입품질의 우수성이 이미 입증된 모세관현상을 이용한 액정주입방법으로 행하지 아니하고, 각 판넬 크기별 절단 전의 원판 글라스에 실라트로 임의 구획된 각각의 부분에 일정량의 액정 셀(CALL)을 각각 떨어트린 다음 그 위에 상부 원판글라스를 포갠 후 필요 크기로 절단 완성하는 대량생산 위주의 액정주입방법을 취함에 따라 액정의 농도 뭉침현상(중력불량현상)을 더욱 가중시키고 있다. In addition, the liquid crystal injection method using capillary phenomenon, which has already proved the superiority of the liquid crystal injection quality when the liquid crystal is injected into both substrates of the liquid crystal display panel, is not carried out, but is divided into each part arbitrarily partitioned into silt in the original glass before cutting for each panel size Each concentration of liquid crystal cell (CALL) is dropped, and the upper disc glass is stacked on top of it, and then the mass production-oriented liquid crystal injection method of cutting to the required size is taken to further increase concentration concentration (gravity defect) of liquid crystals. I'm making it.

한편, 상기한 액정중력불량은 육안으로 쉽게 식별이 어려울 뿐 아니라 식별 가능한 도구를 이용한 검사과정에 있어서도 상당한 시간과 까다롭고 정밀한 검사공 정 및 생산성을 감안한 합리화 자동화된 연속검사방안이 요구되나 현재까지 이에 부합하는 합리화된 중력검사수단은 현재까지 보고된 바 없다.On the other hand, the above-mentioned liquid crystal gravity defect is difficult to be easily identified with the naked eye, and even in the inspection process using an identifiable tool, a rationalized automated continuous inspection method considering a considerable time, a demanding and precise inspection process, and productivity is required. No suitable rationalized gravity test has been reported to date.

이에 본 발명에서는 상기한 문제점을 일소하기 위해 창안한 것으로서, 액정디스플레이 판넬 생산공정 중 중력에 영향을 받아 액정이 한곳으로 뭉쳐진 중력불량현상을 기본적으로 치유/방지함은 물론 특히 생산 완성된 판넬 중 중력불량여부에 대하여 아주 정밀하면서도 체계적이고 연속/자동으로 신속검사할 수 있는 차세대 검사장비를 제공함에 주안점을 두고 그 기술적 과제로서 완성한 것이다.Therefore, the present invention was devised to solve the above problems, and the effect of gravity during the liquid crystal display panel production process basically healed / prevented the poor gravity phenomenon in which the liquid crystals were gathered in one place, as well as the production of panel gravity in particular. It is a technical task that focuses on providing next-generation inspection equipment that can inspect the defect accurately and systematically and continuously / automatically and quickly.

위 기술적 과제를 달성하기 위해 본원에서는 첨부된 각 도면에 의거 보다 상세히 설명하면 하기와 같다.In order to achieve the above technical problem, the present disclosure will be described in more detail based on the accompanying drawings.

즉, 본 발명은 액정디스플레이판넬의 중력불량 검사장치를 구성함에 있어서,That is, the present invention in the configuration of the gravity defect inspection device of the liquid crystal display panel,

도 1에서 도시된 바와 같이 선단에 생산 완료된 다수개의 액정 디스플레이 판넬이 적재된 LCD 카세트(K)를 검사방향과 항온쳄버가 10~15 경사각에 맞게 75~80 반전한 후 리프트의 승강작동을 통해 항온쳄버내(1층 혹은 2층 쳄버)로 각각 공급하는 판넬 카세트공급장치(100)와,As shown in FIG. 1, the LCD cassette (K) loaded with a plurality of liquid crystal display panels produced at the front end is inverted by 75 to 80 according to the inspection direction and the constant temperature chamber according to the 10 to 15 inclination angles, and then the constant temperature through the lift operation. A panel cassette supply device (100) for supplying each into a chamber (1st or 2nd layer chamber),

상기 카세트공급장치(100)로부터 공급받은 판넬 카세트(K)를 검사 양호 경사 각인 10~15 로 경사진 가운데 이동하면서 항온 히팅처리될 수 있게 하는 경사용 컨베이어장치(210)가 설치되고, 쳄퍼내에 검사 전 판넬의 항온 적정온도인 약 50~75℃온도의 열풍을 구동하는 히터부(220)가 설치되며, 상기 히터열을 쳄버내로 고루게 순환시키기 위한 순환팬(230)이 각각 설치된 1, 2층 타입의 항온쳄버장치(200)와,An inclined conveyor device 210 is installed to allow constant temperature heating while moving the panel cassette K supplied from the cassette supply device 100 in an inclined state with a good inclination mark of 10 to 15, and inspected in the wafer. Heater 220 for driving hot air of about 50 ~ 75 ℃ temperature constant temperature of the front panel is installed, the first and second floors each provided with a circulation fan 230 for evenly circulating the heater heat into the chamber Thermostatic chamber device 200 of the type,

상기 항온쳄버(200)의 1층 내지 2층에서 각각 항온처리된 판넬 카세트를 리프트 승강작동하여 인출한 후 다음 공정인 중력검사쳄버장치의 컨베이어로 전달하는 카세트로딩용 엘리베이터장치(300)와,Elevator cassette 300 for cassette loading for transferring the panel cassettes incubated in each of the first to second floors of the constant temperature chamber 200 by lift lift operation and then transferring them to the conveyor of the gravity inspection chamber device, which is the next process;

상기 엘리베이터로 부터 일정시간동안 히팅처리된 액정판넬 카세트를 건네받은 후 그 카세트(K)에서 검사할 대상체인 액정판넬을 하나씩 취출하여 중력검사대(420)에 안착/대응시키는 판넬취출로봇(410)이 설치되며, 상기 대응된 판넬이 안착된 가운데 저면방향에서 백라이트 빛을 비춰 작업자가 판넬의 액정중력불량여부를 용이하게 판정(양품 혹은 불량품)할 수 있게 하는 중력검사대(410)가 설치된 액정판넬 중력불량검사용쳄버(400)와,After receiving the liquid crystal panel cassette heated for a predetermined time from the elevator, the panel take-out robot 410 which takes out the liquid crystal panel which is the object to be inspected from the cassette K one by one and mounts / corresponds to the gravity test table 420 is provided. LCD panel gravity installed on the gravity test stand 410 is installed, and the gravity test table 410 is installed so that the operator can easily determine (defective or defective) the liquid crystal gravity of the panel by shining the backlight light in the bottom direction while the corresponding panel is seated Inspection chamber 400,

상기 중력검사대(410)에서 검사완료(양품 혹은 불량품)된 판넬을 상기 검사대(410)에서 인계받아 판넬 얼라인부로 자동 이동시키는 판넬이동케리어(510)가 설치되고, 상기 케리어(510)에 의해 이동된 판넬을 대기중인 후방 공카세트의 스롯에 정확하게 적재하기 위해 판넬을 중간에서 정렬해주는 판넬 정렬대(520)가 구비하며, 상기 정렬대의 후방 상단에는 얼라인된 판넬을 하나씩 취출하여 후방 대기중인 공카세트의 스롯에 하나씩 수납시키는 판넬 제2 취출로봇(530)이 각각 설치되는 검 사된 판넬정열부(500)와,A panel moving carrier 510 is installed to take over the inspection completed (good or bad) panel from the gravity inspection table 410 and automatically moves to the panel alignment unit, and moves by the carrier 510. A panel alignment stage 520 is provided for aligning the panel in the middle to accurately load the prepared panel into the slot of the waiting rear empty cassette. The inspected panel alignment unit 500 is installed to each of the panel second take-out robot 530 to accommodate one by one in the slot,

상기 판넬정열부(500)에서 정열되고 카세트에 수납된 판넬을 배출방향으로 반전한 후 언로딩 배출하는 카세트언로딩부(600)로 이루어져서 된 것이다.It consists of a cassette unloading unit 600 that is arranged in the panel alignment unit 500 and inverted in the discharge direction after the panel stored in the cassette in the discharge direction.

이와 같이 구성되는 본 발명의 액정판넬중력불량검사장치는 판넬에 일정한 온도를 가하는 항온장치에서부터 판넬 검사시에 필요한 판넬 경사각과 동일한 경사(10~15°)조건으로 히팅, 이송 및 로딩대응 됨에 따라서 검사시 갑작스런 판넬의 각도변화 및 이로 인한 액정농도변화가 없어 검사의 효율성을 보다 높일 수 있으며,The liquid crystal panel gravity defect inspection device of the present invention configured as described above is inspected according to the heating, conveying, and loading corresponding to the same inclination (10 to 15 °) as the panel inclination angle required for the panel inspection from a constant temperature device that applies a constant temperature to the panel. When there is no sudden change of panel angle and liquid crystal concentration change due to this, the efficiency of inspection can be improved.

뿐만 아니라 상기한 항온쳄버장치와 카세트로딩용 엘리베이터장치 엘리베이트, 액정판넬 중력불량검사용쳄버에는 각 물류의 출입을 자동개폐가능한 자동개폐용도어가 장치되어 있어 물류를 Load 및 Unload하는 동안에도 적은 에너지로 항시 일정한 온도(50~75℃)를 유지할 수 있고,In addition, the above-mentioned constant temperature chamber device, cassette loading elevator device elevator, and liquid crystal panel gravity defect inspection chamber are equipped with an automatic opening / closing door capable of automatically opening / closing each logistic. I can maintain a constant temperature (50-75 degrees Celsius),

또, 상기 카세트로딩용 엘리베이터의 기능이 1층과 2층을 승강작동하하면서 항온장치의 1층, 2층의 카세트를 즉시 로딩할 수 있기 때문에 보다 신속하면서 많은 물류를 한번에 커버할 수 있으며,In addition, the function of the cassette loading elevator can load the cassettes on the first and second floors of the thermostat while lifting and lowering the first and second floors, so that it can cover a lot of logistics at a time,

또 상기 판넬취출로봇이 쳄버의 내부에 각각 장착되어 있는 가운데 물류이동을 수행할 수 있도록 구성됨에 따라 챔버 외부에 장착되어 물류 및 검사시간지연, 열손실 및 이에 따른 액정검사의 부정확성을 유발했던 기존과는 달리 챔버내의 히터온도를 항시 일정하게 유지시킬 수 있어 유지온도와 밀접한 관계의 중력 검사시 보다 정확하고 원활하게 진행할 수 있다.In addition, the panel take-out robot is mounted inside the chamber to perform logistic movement while being mounted inside the chamber, and thus is mounted outside the chamber to induce logistic and inspection time delay, heat loss, and inaccurate liquid crystal inspection. Unlike this, the heater temperature in the chamber can be kept constant at all times, so that it can proceed more precisely and smoothly in the gravity test of a close relationship with the holding temperature.

그리고 검사된 양호판넬 혹은 불량판넬에 대한 기록을 BCR 등의 정보화장치를 통해 데이터화함에 따라 상기 양불판정된 판넬을 각각 따로 분리 적재하지 아니하고 하나의 카세트에 함께 수납하여도 무방함으로 작업의 원활성은 물론 판넬을 보다 효율적이고 체계적으로 관리될 수 있다.In addition, as the record of the inspected good panel or the defective panel is converted into data through an information device such as a BCR, the defective panel may be stored together in one cassette without separate loading, so as to facilitate the operation. Panels can be managed more efficiently and systematically.

이상과 같은 본 발명의 중량불량검사장치는 전술된 바와 같이 생산된 모든 액정디스플레이 판넬에 대한 중력불량여부를 완벽하고도 정확하게 검사할 수 있음은 물론 일부분의 액정농도편중현상 치유 및 방지의 기능까지 제공되어 액정판넬의 품질유지 및 향상에 지대한 공헌을 할 것으로 기대되는 획기적인 발명이다.As described above, the weight defect inspection apparatus of the present invention can completely and accurately inspect the gravity defect of all the liquid crystal display panels produced as described above, as well as provide a function of healing and preventing partial liquid crystal concentration deviation. It is a revolutionary invention that is expected to make a significant contribution to the quality maintenance and improvement of the liquid crystal panel.

Claims (1)

선단에 생산 완료된 다수개의 액정 디스플레이 판넬이 적재된 LCD 카세트(K)를 검사방향과 항온쳄버가 10~15 경사각에 맞게 75~80 반전한 후 리프트의 승강작동을 통해 항온쳄버내(1층 혹은 2층 쳄버)로 각각 공급하는 판넬 카세트공급장치(100)와,The LCD cassette (K) loaded with a number of liquid crystal display panels produced at the front end is inverted 75 ~ 80 according to the inspection direction and the constant temperature chamber by 10 to 15 inclination angles, and then lifted in the constant temperature chamber (1F or 2F). Panel cassette supply apparatus 100 for supplying each to a layer chamber, 상기 카세트공급장치(100)로부터 공급받은 판넬 카세트(K)를 검사 양호 경사각인 10~15 로 경사진 가운데 이동하면서 항온 히팅처리될 수 있게 하는 경사용 컨베이어장치(210)가 설치되고, 쳄퍼내에 검사 전 판넬의 항온 적정온도인 약 50~75℃온도의 열풍을 구동하는 히터부(220)가 설치되며, 상기 히터열을 쳄버내로 고루게 순환시키기 위한 순환팬(230)이 각각 설치된 1, 2층 타입의 항온쳄버장치(200)와,An inclined conveyor device 210 is installed to allow constant temperature heating while moving the panel cassette K supplied from the cassette supply device 100 at an inclined angle of 10 to 15, which is a good inclination angle, and is inspected in the wafer. Heater 220 for driving hot air of about 50 ~ 75 ℃ temperature constant temperature of the front panel is installed, the first and second floors each provided with a circulation fan 230 for evenly circulating the heater heat into the chamber Thermostatic chamber device 200 of the type, 상기 항온쳄버(200)의 1층 내지 2층에서 각각 항온처리된 판넬 카세트를 리프트 승강작동하여 인출한 후 다음 공정인 중력검사쳄버장치의 컨베이어로 전달하는 카세트로딩용 엘리베이터장치(300)와,Elevator cassette 300 for cassette loading for transferring the panel cassettes incubated in each of the first to second floors of the constant temperature chamber 200 by lift lift operation and then transferring them to the conveyor of the gravity inspection chamber device, which is the next process; 상기 엘리베이터로 부터 일정시간동안 히팅처리된 액정판넬 카세트를 건네받은 후 그 카세트(K)에서 검사할 대상체인 액정판넬을 하나씩 취출하여 중력검사대(420)에 안착/대응시키는 판넬취출로봇(410)이 설치되며, 상기 대응된 판넬이 안착된 가운데 저면방향에서 백라이트 빛을 비춰 작업자가 판넬의 액정중력불량여부를 용이하게 판정(양품 혹은 불량품)할 수 있게 하는 중력검사대(410)가 설치된 액정 판넬 중력불량검사용쳄버(400)와,After receiving the liquid crystal panel cassette heated for a predetermined time from the elevator, the panel take-out robot 410 which takes out the liquid crystal panel which is the object to be inspected from the cassette K one by one and mounts / corresponds to the gravity test table 420 is provided. And a liquid crystal panel gravity failure in which a gravity inspection table 410 is installed to allow the operator to easily determine whether the panel has a liquid crystal deficiency (good or bad) by illuminating the backlight in the bottom direction while the corresponding panel is seated. Inspection chamber 400, 상기 중력검사대(410)에서 검사완료(양품 혹은 불량품)된 판넬을 상기 검사대(410)에서 인계받아 판넬 얼라인부로 자동 이동시키는 판넬이동케리어(510)가 설치되고, 상기 케리어(510)에 의해 이동된 판넬을 대기중인 후방 공카세트의 스롯에 정확하게 적재하기 위해 판넬을 중간에서 정렬해주는 판넬 정렬대(520)가 구비하며, 상기 정렬대의 후방 상단에는 얼라인된 판넬을 하나씩 취출하여 후방 대기중인 공카세트의 스롯에 하나씩 수납시키는 판넬 제2 취출로봇(530)이 각각 설치되는 검사된 판넬정열부(500)와,A panel moving carrier 510 is installed to take over the inspection completed (good or bad) panel from the gravity inspection table 410 and automatically moves to the panel alignment unit, and moves by the carrier 510. A panel alignment stage 520 is provided for aligning the panel in the middle to accurately load the prepared panel into the slot of the waiting rear empty cassette. Inspected panel alignment unit 500 and the panel second take-out robot 530 for receiving one by one in the slot of each, 상기 판넬정열부(500)에서 정열되고 카세트에 수납된 판넬을 배출방향으로 반전한 후 언로딩 배출하는 카세트언로딩부(600)로 이루어져서 된 것을 특징으로 액정디스플레이 판넬의 중력검사장치.And a cassette unloading unit (600) for discharging and unloading the panels arranged in the panel alignment unit (500) in the discharge direction after inverting the panels accommodated in the discharge direction.
KR1020050096829A 2005-10-14 2005-10-14 Gravity inspection system of liquid crystal display panel KR100729642B1 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101289627B1 (en) * 2006-06-26 2013-07-30 엘지디스플레이 주식회사 Method for conveying glass substrate for liquid crystal display
USD805099S1 (en) 2010-01-27 2017-12-12 Apple Inc. Display screen or portion thereof with animated graphical user interface
USD813267S1 (en) 2014-09-09 2018-03-20 Apple Inc. Display screen or portion thereof with animated graphical user interface

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101289627B1 (en) * 2006-06-26 2013-07-30 엘지디스플레이 주식회사 Method for conveying glass substrate for liquid crystal display
USD805099S1 (en) 2010-01-27 2017-12-12 Apple Inc. Display screen or portion thereof with animated graphical user interface
USD813267S1 (en) 2014-09-09 2018-03-20 Apple Inc. Display screen or portion thereof with animated graphical user interface

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