KR20040091626A - 슬러리 분배를 위한 굴곡면을 가진 유지링을 구비한화학적 물리적 연마장치 및 방법 - Google Patents
슬러리 분배를 위한 굴곡면을 가진 유지링을 구비한화학적 물리적 연마장치 및 방법 Download PDFInfo
- Publication number
- KR20040091626A KR20040091626A KR10-2004-7011284A KR20047011284A KR20040091626A KR 20040091626 A KR20040091626 A KR 20040091626A KR 20047011284 A KR20047011284 A KR 20047011284A KR 20040091626 A KR20040091626 A KR 20040091626A
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- retaining ring
- substrate
- polishing head
- subcarrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US35167102P | 2002-01-22 | 2002-01-22 | |
| US60/351,671 | 2002-01-22 | ||
| PCT/US2003/001803 WO2003061904A1 (en) | 2002-01-22 | 2003-01-21 | Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface for slurry distribution |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20040091626A true KR20040091626A (ko) | 2004-10-28 |
Family
ID=27613520
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2004-7011284A Ceased KR20040091626A (ko) | 2002-01-22 | 2003-01-21 | 슬러리 분배를 위한 굴곡면을 가진 유지링을 구비한화학적 물리적 연마장치 및 방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7118456B2 (https=) |
| JP (1) | JP2005515904A (https=) |
| KR (1) | KR20040091626A (https=) |
| TW (1) | TWI289494B (https=) |
| WO (1) | WO2003061904A1 (https=) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7198561B2 (en) * | 2000-07-25 | 2007-04-03 | Applied Materials, Inc. | Flexible membrane for multi-chamber carrier head |
| US6869335B2 (en) * | 2002-07-08 | 2005-03-22 | Micron Technology, Inc. | Retaining rings, planarizing apparatuses including retaining rings, and methods for planarizing micro-device workpieces |
| TWI393209B (zh) | 2003-02-10 | 2013-04-11 | 荏原製作所股份有限公司 | 研磨基板之方法 |
| RU2240280C1 (ru) | 2003-10-10 | 2004-11-20 | Ворлд Бизнес Ассошиэйтс Лимитед | Способ формирования упорядоченных волнообразных наноструктур (варианты) |
| US7768018B2 (en) * | 2003-10-10 | 2010-08-03 | Wostec, Inc. | Polarizer based on a nanowire grid |
| US20050126708A1 (en) * | 2003-12-10 | 2005-06-16 | Applied Materials, Inc. | Retaining ring with slurry transport grooves |
| US7255771B2 (en) * | 2004-03-26 | 2007-08-14 | Applied Materials, Inc. | Multiple zone carrier head with flexible membrane |
| US20070224864A1 (en) * | 2005-05-24 | 2007-09-27 | John Burns | CMP retaining ring |
| US7520795B2 (en) * | 2005-08-30 | 2009-04-21 | Applied Materials, Inc. | Grooved retaining ring |
| US7326105B2 (en) | 2005-08-31 | 2008-02-05 | Micron Technology, Inc. | Retaining rings, and associated planarizing apparatuses, and related methods for planarizing micro-device workpieces |
| JP2008177248A (ja) * | 2007-01-16 | 2008-07-31 | Tokyo Seimitsu Co Ltd | 研磨ヘッド用リテーナリング |
| US7520796B2 (en) * | 2007-01-31 | 2009-04-21 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad with grooves to reduce slurry consumption |
| DE102007026292A1 (de) | 2007-06-06 | 2008-12-11 | Siltronic Ag | Verfahren zur einseitigen Politur nicht strukturierter Halbleiterscheiben |
| USD633452S1 (en) | 2009-08-27 | 2011-03-01 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing apparatus |
| USD634719S1 (en) | 2009-08-27 | 2011-03-22 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing apparatus |
| USD711330S1 (en) | 2010-12-28 | 2014-08-19 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing |
| KR101775464B1 (ko) * | 2011-05-31 | 2017-09-07 | 삼성전자주식회사 | 화학 기계적 연마 장치의 리테이너 링 |
| WO2013006077A1 (en) | 2011-07-06 | 2013-01-10 | Wostec, Inc. | Solar cell with nanostructured layer and methods of making and using |
| EP2740162B1 (en) | 2011-08-05 | 2019-07-03 | Wostec, Inc. | Light emitting diode with nanostructured layer, method of making a light emitting diode and nanomask used in the method. |
| US9057704B2 (en) | 2011-12-12 | 2015-06-16 | Wostec, Inc. | SERS-sensor with nanostructured surface and methods of making and using |
| WO2013109157A1 (en) | 2012-01-18 | 2013-07-25 | Wostec, Inc. | Arrangements with pyramidal features having at least one nanostructured surface and methods of making and using |
| US9050700B2 (en) | 2012-01-27 | 2015-06-09 | Applied Materials, Inc. | Methods and apparatus for an improved polishing head retaining ring |
| US9134250B2 (en) | 2012-03-23 | 2015-09-15 | Wostec, Inc. | SERS-sensor with nanostructured layer and methods of making and using |
| WO2014142700A1 (en) | 2013-03-13 | 2014-09-18 | Wostec Inc. | Polarizer based on a nanowire grid |
| EP3161857B1 (en) | 2014-06-26 | 2021-09-08 | Wostec, Inc. | Method of forming a wavelike hard nanomask on a topographic feature |
| US10672427B2 (en) | 2016-11-18 | 2020-06-02 | Wostec, Inc. | Optical memory devices using a silicon wire grid polarizer and methods of making and using |
| USD839224S1 (en) * | 2016-12-12 | 2019-01-29 | Ebara Corporation | Elastic membrane for semiconductor wafer polishing |
| WO2018156042A1 (en) | 2017-02-27 | 2018-08-30 | Wostec, Inc. | Nanowire grid polarizer on a curved surface and methods of making and using |
| CN113276018B (zh) * | 2021-06-15 | 2022-10-04 | 北京烁科精微电子装备有限公司 | 一种化学机械抛光用保持环 |
| WO2024049890A1 (en) * | 2022-09-01 | 2024-03-07 | Applied Materials, Inc. | Retainer for chemical mechanical polishing carrier head |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2826009A (en) * | 1954-12-10 | 1958-03-11 | Crane Packing Co | Work holder for lapping machines |
| US5597346A (en) | 1995-03-09 | 1997-01-28 | Texas Instruments Incorporated | Method and apparatus for holding a semiconductor wafer during a chemical mechanical polish (CMP) process |
| US5643061A (en) * | 1995-07-20 | 1997-07-01 | Integrated Process Equipment Corporation | Pneumatic polishing head for CMP apparatus |
| US5695392A (en) * | 1995-08-09 | 1997-12-09 | Speedfam Corporation | Polishing device with improved handling of fluid polishing media |
| US5944593A (en) * | 1997-09-01 | 1999-08-31 | United Microelectronics Corp. | Retainer ring for polishing head of chemical-mechanical polish machines |
| US6241582B1 (en) * | 1997-09-01 | 2001-06-05 | United Microelectronics Corp. | Chemical mechanical polish machines and fabrication process using the same |
| US6527624B1 (en) * | 1999-03-26 | 2003-03-04 | Applied Materials, Inc. | Carrier head for providing a polishing slurry |
| US6224472B1 (en) * | 1999-06-24 | 2001-05-01 | Samsung Austin Semiconductor, L.P. | Retaining ring for chemical mechanical polishing |
| US6267643B1 (en) * | 1999-08-03 | 2001-07-31 | Taiwan Semiconductor Manufacturing Company, Ltd | Slotted retaining ring for polishing head and method of using |
| EP1177859B1 (en) | 2000-07-31 | 2009-04-15 | Ebara Corporation | Substrate holding apparatus and substrate polishing apparatus |
-
2003
- 2003-01-21 JP JP2003561827A patent/JP2005515904A/ja not_active Ceased
- 2003-01-21 KR KR10-2004-7011284A patent/KR20040091626A/ko not_active Ceased
- 2003-01-21 WO PCT/US2003/001803 patent/WO2003061904A1/en not_active Ceased
- 2003-01-21 TW TW092101247A patent/TWI289494B/zh not_active IP Right Cessation
- 2003-01-22 US US10/349,769 patent/US7118456B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20030171076A1 (en) | 2003-09-11 |
| TWI289494B (en) | 2007-11-11 |
| JP2005515904A (ja) | 2005-06-02 |
| WO2003061904B1 (en) | 2003-10-09 |
| WO2003061904A1 (en) | 2003-07-31 |
| TW200402348A (en) | 2004-02-16 |
| US7118456B2 (en) | 2006-10-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR20040091626A (ko) | 슬러리 분배를 위한 굴곡면을 가진 유지링을 구비한화학적 물리적 연마장치 및 방법 | |
| US7104875B2 (en) | Chemical mechanical polishing apparatus with rotating belt | |
| US6893327B2 (en) | Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface | |
| US6050882A (en) | Carrier head to apply pressure to and retain a substrate | |
| US6302767B1 (en) | Chemical mechanical polishing with a polishing sheet and a support sheet | |
| US9199354B2 (en) | Flexible diaphragm post-type floating and rigid abrading workholder | |
| US5643053A (en) | Chemical mechanical polishing apparatus with improved polishing control | |
| JP3857982B2 (ja) | 化学−機械研磨ヘッドの止めリング、研磨装置、スラリー循環システム、および方法 | |
| JP5562370B2 (ja) | 化学的機械研磨(cmp)ヘッド、装置及び方法 | |
| US20070141960A1 (en) | Retaining rings, and associated planarizing apparatuses, and related methods for planarizing micro-device workpieces | |
| US6241583B1 (en) | Chemical mechanical polishing with a plurality of polishing sheets | |
| US20040018804A1 (en) | Retaining rings, planarizing apparatuses including retaining rings, and methods for planarizing micro-device workpieces | |
| US20110300782A1 (en) | Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces | |
| US6110012A (en) | Chemical-mechanical polishing apparatus and method | |
| JP3595011B2 (ja) | 研磨制御を改善した化学的機械的研磨装置 | |
| US6273797B1 (en) | In-situ automated CMP wedge conditioner | |
| US6540590B1 (en) | Chemical mechanical polishing apparatus and method having a rotating retaining ring | |
| US6641461B2 (en) | Chemical mechanical polishing apparatus having edge, center and annular zone control of material removal |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |