KR20040003327A - 횡전계 방식의 액정표시장치 및 그 제조방법 - Google Patents
횡전계 방식의 액정표시장치 및 그 제조방법 Download PDFInfo
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- KR20040003327A KR20040003327A KR1020020037993A KR20020037993A KR20040003327A KR 20040003327 A KR20040003327 A KR 20040003327A KR 1020020037993 A KR1020020037993 A KR 1020020037993A KR 20020037993 A KR20020037993 A KR 20020037993A KR 20040003327 A KR20040003327 A KR 20040003327A
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- South Korea
- Prior art keywords
- liquid crystal
- crystal display
- substrate
- pixel electrode
- electrode
- Prior art date
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 122
- 238000000034 method Methods 0.000 title description 25
- 239000010409 thin film Substances 0.000 claims abstract description 34
- 238000004519 manufacturing process Methods 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims description 130
- 239000010408 film Substances 0.000 claims description 82
- 230000005684 electric field Effects 0.000 claims description 33
- 230000001681 protective effect Effects 0.000 claims description 21
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 11
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 11
- 239000004642 Polyimide Substances 0.000 claims description 10
- 229920001721 polyimide Polymers 0.000 claims description 10
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 8
- 238000002161 passivation Methods 0.000 claims description 8
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 8
- -1 acryl Chemical group 0.000 claims description 5
- 238000000059 patterning Methods 0.000 claims description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 87
- 230000008569 process Effects 0.000 description 19
- 125000006850 spacer group Chemical group 0.000 description 14
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 238000005530 etching Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 9
- 239000011159 matrix material Substances 0.000 description 7
- 239000011521 glass Substances 0.000 description 6
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- 229910004205 SiNX Inorganic materials 0.000 description 5
- 230000008901 benefit Effects 0.000 description 5
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 5
- 229910021417 amorphous silicon Inorganic materials 0.000 description 4
- 239000011651 chromium Substances 0.000 description 4
- 210000004027 cell Anatomy 0.000 description 3
- 239000003086 colorant Substances 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 210000002858 crystal cell Anatomy 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 239000003566 sealing material Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000003204 osmotic effect Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000000790 scattering method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000010947 wet-dispersion method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/134309—Electrodes characterised by their geometrical arrangement
- G02F1/134363—Electrodes characterised by their geometrical arrangement for applying an electric field parallel to the substrate, i.e. in-plane switching [IPS]
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133345—Insulating layers
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136277—Active matrix addressed cells formed on a semiconductor substrate, e.g. of silicon
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/12—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode
- G02F2201/121—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode common or background
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/12—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode
- G02F2201/123—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode pixel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
Abstract
Description
Claims (8)
- 교차 배치되어 화소영역을 정의하는 복수개의 게이트 배선 및 데이터 배선;상기 게이트 배선과 데이터 배선의 교차부위에 형성되는 박막 트랜지스터;상기 화소영역상에 데이터 배선과 동일한 방향으로 일정한 간격을 갖고 형성되는 복수개의 제 1, 제 2 절연막 패턴;상기 박막 트랜지스터에 연결되면서 상기 제 1 절연막 패턴상에 형성되는 화소전극;상기 화소전극과 일정간격을 갖고 상기 제 2 절연막 패턴상에 형성되는 공통전극을 포함하여 구성됨을 특징으로 하는 횡전계 방식의 액정표시장치.
- 제 1 항에 있어서, 상기 화소전극과 공통전극은 지그재그 형태인 것을 특징으로 하는 횡전계 방식의 액정표시장치.
- 제 1 항에 있어서, 상기 제 1, 제 2 절연막 패턴은 박막 트랜지스터가 형성된 이외의 화소영역에 형성됨을 특징으로 하는 횡전계 방식의 액정표시장치.
- 제 1 기판상에 형성되는 박막 트랜지스터와,상기 박막 트랜지스터의 소정부분이 노출되도록 콘택홀을 갖고 제 1 기판의 전면에 형성되는 보호막과,상기 보호막상에 형성되는 복수개의 제 1, 제 2 절연막 패턴과,상기 콘택홀을 통해 상기 박막 트랜지스터와 연결되면서 상기 보호막과 제 1 절연막 패턴상에 형성되는 화소전극과,상기 화소전극과 일정한 간격을 갖고 상기 제 2 절연막 패턴 및 보호막상에 형성되는 공통전극과,상기 제 1 기판과 대응하여 합착되는 제 2 기판과,상기 제 1 기판과 제 2 기판 사이에 형성되는 액정층을 포함하여 구성됨을 특징으로 하는 횡전계 방식의 액정표시장치.
- 제 4 항에 있어서, 상기 제 1, 제 2 절연막 패턴은 아크릴, 폴리 이미드, BCB, 실리콘 산화막, 실리콘 질화막 중에서 어느 하나인 것을 특징으로 하는 횡전계 방식의 액정표시장치.
- 제 4 항에 있어서, 상기 제 1, 제 2 기판의 셀 갭은 상기 화소전극 및 공통전극에 의해 결정됨을 특징으로 하는 횡전계 방식의 액정표시장치.
- 제 1 기판상에 박막 트랜지스터를 형성하는 단계;상기 제 1 기판의 전면에 보호막을 형성하는 단계;상기 보호막상에 절연막을 형성하고 선택적으로 패터닝하여 상기 보호막상에 복수개의 제 1, 제 2 절연막 패턴을 형성하는 단계;상기 박막 트랜지스터의 소정부분이 노출되도록 상기 보호막을 선택적으로 제거하여 콘택홀을 형성하는 단계;상기 콘택홀을 통해 박막 트랜지스터와 연결되면서 상기 제 1 절연막 패턴에 화소전극을 형성함과 동시에 상기 화소전극과 일정한 간격을 갖고 상기 제 2 절연막 패턴상에 공통전극을 형성하는 단계;상기 제 1 기판과 제 2 기판 사이에 액정층을 형성하는 단계를 포함하여 형성함을 특징으로 하는 횡전계 방식의 액정표시장치의 제조방법.
- 제 7 항에 있어서, 상기 절연막은 아크릴, 폴리 이미드, BCB, 실리콘 산화막, 실리콘 질화막 중에서 어느 하나를 사용하여 형성하는 것을 특징으로 하는 횡전계 방식의 액정표시장치의 제조방법.
Priority Applications (1)
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KR1020020037993A KR100840680B1 (ko) | 2002-07-02 | 2002-07-02 | 횡전계 방식의 액정표시장치 및 그 제조방법 |
Applications Claiming Priority (1)
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KR1020020037993A KR100840680B1 (ko) | 2002-07-02 | 2002-07-02 | 횡전계 방식의 액정표시장치 및 그 제조방법 |
Publications (2)
Publication Number | Publication Date |
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KR20040003327A true KR20040003327A (ko) | 2004-01-13 |
KR100840680B1 KR100840680B1 (ko) | 2008-06-24 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8564754B2 (en) | 2010-07-06 | 2013-10-22 | Samsung Display Co., Ltd. | Liquid crystal display |
Families Citing this family (1)
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KR101931699B1 (ko) | 2012-08-07 | 2018-12-24 | 삼성디스플레이 주식회사 | 액정 표시 장치 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP3378177B2 (ja) * | 1997-08-21 | 2003-02-17 | シャープ株式会社 | 表示装置 |
KR100293431B1 (ko) * | 1997-08-22 | 2001-08-07 | 구본준, 론 위라하디락사 | 횡전계방식액정표시소자 |
JP2000347171A (ja) * | 1999-06-07 | 2000-12-15 | Matsushita Electric Ind Co Ltd | 液晶表示素子及びその製造方法 |
KR100348288B1 (ko) * | 2000-08-11 | 2002-08-09 | 엘지.필립스 엘시디 주식회사 | 횡전계방식 액정표시장치 |
KR100393642B1 (ko) * | 2000-09-14 | 2003-08-06 | 엘지.필립스 엘시디 주식회사 | 광시야각 액정 표시 장치 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8564754B2 (en) | 2010-07-06 | 2013-10-22 | Samsung Display Co., Ltd. | Liquid crystal display |
US8773605B2 (en) | 2010-07-06 | 2014-07-08 | Samsung Display Co., Ltd. | Liquid crystal display |
USRE47455E1 (en) | 2010-07-06 | 2019-06-25 | Samsung Display Co., Ltd. | Liquid crystal display |
USRE49271E1 (en) | 2010-07-06 | 2022-11-01 | Samsung Display Co., Ltd. | Liquid crystal display |
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Publication number | Publication date |
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KR100840680B1 (ko) | 2008-06-24 |
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