KR20030043435A - 피조 간섭계용 위상천이 구동장치 - Google Patents
피조 간섭계용 위상천이 구동장치 Download PDFInfo
- Publication number
- KR20030043435A KR20030043435A KR1020010074610A KR20010074610A KR20030043435A KR 20030043435 A KR20030043435 A KR 20030043435A KR 1020010074610 A KR1020010074610 A KR 1020010074610A KR 20010074610 A KR20010074610 A KR 20010074610A KR 20030043435 A KR20030043435 A KR 20030043435A
- Authority
- KR
- South Korea
- Prior art keywords
- leaf spring
- fixing ring
- fixed
- fixing
- driving
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/0201—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal phase variation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
- G01B9/02068—Auto-alignment of optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
- G01B9/02074—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer of the detector
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Optics & Photonics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
Description
Claims (4)
- 중공의 고정체(2)와 구동체(3)를 구비하되, 상기 고정체(2) 및 구동체(3)의 각 일측부에 상호 대향되게 내측플랜지(21) 및 외측플랜지(31)가 일체로 형성되고, 이들 사이에 압전소자(4)가 개재되게 하여 상기 압전소자(4)에 의해 고정체(2) 내부에서 구동체(3)가 미세구동될 수 있도록 구성되며, 고정체(2) 및 구동체(3)의 양단부에 각각 중공의 제1 판스프링(1) 및 제2 판스프링(1A)의 내경 및 외경이 각각 고정되어 상기 제1 판스프링(1) 및 제2 판스프링(1A)에 의해 구동체(3)가 원위치될 수 있도록 구성한 것을 특징으로 한 피조 간섭계용 위상천이 구동장치.
- 제1항에 있어서 상기 압전소자(4)는,양단부에 볼(4A)을 구비하여 상기 볼(4A)에 의해 점접촉이 이루어지도록 구성한 것을 특징으로 한 피조 간섭계용 위상천이 구동장치.
- 제1항에 있어서 상기 제1 판스프링(1) 및 제2 판스프링(1A)은,동심원 형태로 중공된 원형판으로 형성되어 구동의 직진도가 확보될 수 있도록 구성한 것을 특징으로 한 피조 간섭계용 위상천이 구동장치.
- 제1항에 있어서,상기 제1 판스프링(1) 및 제2 판스프링(1A)의 내경은 제1 고정링(5) 및 제2고정링(6)이 구비되어 상기 제1 고정링(5) 및 제2 고정링(6)이 구동체(3)의 일측부 및 타측부에 각각 나사결합되는 것에 의해 고정되고, 외경은 제3 고정링(7) 및 제4 고정링(8)이 구비되어 상기 제3 고정링(7) 및 제4 고정링(8)이 고정체(2)의 일측부 및 타측부에 나사결합되는 것에 의해 고정된 것을 특징으로 한 피조 간섭계용 위상천이 구동장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0074610A KR100434866B1 (ko) | 2001-11-28 | 2001-11-28 | 피조 간섭계용 위상천이 구동장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0074610A KR100434866B1 (ko) | 2001-11-28 | 2001-11-28 | 피조 간섭계용 위상천이 구동장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030043435A true KR20030043435A (ko) | 2003-06-02 |
KR100434866B1 KR100434866B1 (ko) | 2004-06-07 |
Family
ID=29571835
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0074610A KR100434866B1 (ko) | 2001-11-28 | 2001-11-28 | 피조 간섭계용 위상천이 구동장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100434866B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113048875A (zh) * | 2021-03-11 | 2021-06-29 | 西安电子科技大学 | 一种光学移相装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3225659B2 (ja) * | 1992-12-28 | 2001-11-05 | 富士写真光機株式会社 | レーザ干渉計のアライメント装置 |
JPH08114412A (ja) * | 1994-10-18 | 1996-05-07 | Toshio Honda | 耐振動型干渉計 |
JP3041205B2 (ja) * | 1994-10-19 | 2000-05-15 | 富士写真光機株式会社 | 干渉計用基準板 |
JPH08313205A (ja) * | 1995-05-23 | 1996-11-29 | Fuji Photo Optical Co Ltd | 斜入射干渉計装置 |
JP2001174213A (ja) * | 1999-12-20 | 2001-06-29 | Mitsutoyo Corp | 平面計測用位相シフト干渉計の光学的位相制御装置、光学的位相制御方法及び光学的位相制御プログラムを格納した記憶媒体 |
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2001
- 2001-11-28 KR KR10-2001-0074610A patent/KR100434866B1/ko active IP Right Grant
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113048875A (zh) * | 2021-03-11 | 2021-06-29 | 西安电子科技大学 | 一种光学移相装置 |
Also Published As
Publication number | Publication date |
---|---|
KR100434866B1 (ko) | 2004-06-07 |
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