KR20020001632A - A integrated circuit and a method of manufacturing an integrated circuit - Google Patents

Abstract

PURPOSE: Equipment and process are provided to estimate generation or possibility of failure in an integrated circuit by measuring resistivity, conductivity, crosstalk or other electric characteristics on conductive regions, through bonding pads. CONSTITUTION: The equipment and process estimate generation or possibility of failure in an integrated circuit and the process includes a process for forming the conductive regions like a runner around a substrate or a dice. The conductive regions are arranged on one or more different metallization layers in the integrated circuit, and connected to one or more bonding pads. The dice is estimated by measuring resistivity, conductivity, crosstalk or other electric characteristics on the conductive regions through the bonding pads. The estimation can be used for predicating that a runner formed in the integrated circuit is damaged or its possibility exists.

Description

A integrated circuit and a method of manufacturing an integrated circuit

Field of invention

FIELD OF THE INVENTION The present invention generally relates to integrated circuits and packaging, and more particularly, to apparatus and methods for accessing integrated circuits.

Background of the Invention

Integrated circuits are typically fabricated with multiple levels of patterned metallization electrically separated by interlayer dielectrics comprising via selected locations to provide electrical connections between the patterned metallization layers. Interconnect line width as integrated circuits are scaled to smaller sizes in frequent efforts to provide increased performance (e.g., by increasing device speed and providing greater circuit functionality in a given area of chips). The size becomes narrower and the number of metal levels increases. This makes it more susceptible to deleterious effects such as delamination and damage induced by stress transfer of the mold composite. Stress transfers are interconnections caused by compliance mismatches and thermal expansion coefficient mismatches between conductive runners and surroundings (eg, overlying and / or underlying dielectric materials or mold composites). It is related to the mass transport of interconnect material in response to the mechanical stress gradients present in it.

According to thermal technology, the stress may be compressible or extensible. Elongation stress can lead to void information, while compressive stress can mudify information. The voids continue to grow to reduce stress until they are bad enough to continue growing, and moving the voids can also coalesce with other voids to provide an effective void growth mechanism. For example, consider a process of depositing an interlayer dielectric or other dielectric material located on a semiconductor substrate over an aluminum (Al) line (sometimes called a "runner") located on a substrate. Typically, such deposition is carried out by chemical vapor deposition (CVD). After deposition, as the structure cools to room temperature, aluminum wires with coefficients of thermal expansion much larger than the interlayer dielectrics are expected to contract more than those located above the interlayer dielectrics.

An interlayer dielectric with very good adhesion to the aluminum layer prevents the aluminum wire from shrinking to the desired equilibrium length, resulting in elongation stress in the aluminum wire. The stretching stress is greatest at the edges of the aluminum wire and decreases towards the center, so there is a non-zero stretching stress gradient across the width of the aluminum wire. This stress gradient corresponds to the chemical potential gradient which represents the thermodynamic driving force for mass transport. Thus, aluminum atoms diffuse to reduce the total strain energy in the aluminum wire. Typically over many months or years of time, mass transport of this conductive layer generates voids in the conductive runners that can lead to damage. The voids can traverse the aluminum wire as a whole (i.e. open circuit) or reduce the cross-sectional area where the current can be conducted so that the electromigration effects are exacerbated and / or the case of thermal damage where the current conduction is catastrophic. .

In order to evaluate the stress transfer characteristics of the transfer runners, a method for evaluating these effects is essential. In particular, such methods must provide a device that provides an easy assessment of potential stress problems.

1 is a plan view of an integrated circuit in a partially fabricated state in accordance with an exemplary embodiment of the present invention.

FIG. 2 is a schematic diagram of the integrated circuit shown in FIG. 1 along line Z-Z. FIG.

3A and 3B are enlarged views of portions of the integrated circuit shown in FIG.

4 is a plan view of an integrated circuit according to another exemplary embodiment of the present invention.

5 is an enlarged view of an integrated circuit in accordance with another exemplary embodiment of the present invention.

6 is a block diagram of an integrated circuit under test in accordance with an exemplary embodiment of the present invention.

Explanation of symbols on the main parts of the drawings

10 die 20 adhesive pads

30a, 30b, 30c: conductive regions

Summary of the Invention

The present invention relates to an apparatus and process for assessing the likelihood or occurrence of damage to an integrated circuit. This process involves forming a conductive region, such as a runner, around the substrate or die. The conductive region can be located in one or more different metallization layers in the integrated circuit. The conductive region is bonded to one or more adhesive pads. The die is evaluated by measuring the resistance, conductivity, cross talk or other electrical properties in the conductive area through the adhesive pads. The assessment can then be used to predict, for example, whether or not the runners included in the integrated circuit are damaged.

It is noted that both the foregoing general description and the following detailed description are exemplary, but do not limit the invention.

The invention is best understood from the following detailed description with reference to the accompanying drawings. According to the general practice in the semiconductor industry, it is emphasized that various features of the drawings are not accumulated. On the contrary, the size of the various features may be arbitrarily enlarged or reduced for clarity.

Detailed description of the invention

In short, exemplary embodiments of the present invention provide an apparatus and process for assessing the occurrence and likelihood of damage in an integrated circuit. This process involves forming a conductive region, such as a runner, around the substrate or die. The conductive region can be located in two or more different metallization layers in the integrated circuit. The conductive region is bonded to one or more adhesive pads. The die is evaluated by measuring the resistance, conductivity, cross talk or other electrical properties in the conductive area through the adhesive pads. The evaluation can then be used to predict, for example, whether or not the runners included in the integrated circuit are damaged or likely to be damaged. This process involves forming conductive regions such as runners around the substrate or die.

Referring now to the drawings, wherein like reference numerals refer to like elements. 1 is a plan view of a die or substrate 10 according to the present invention. FIG. 2 is a schematic diagram of the integrated circuit shown in FIG. 1 along line Z-Z. Die 10 includes adhesive pads 20 and conductive regions 30a, 30b, 30c. Conductive regions 30a, 30b, 30c may be formed of a conductive material such as a metal, metal alloy, conductive silicide, conductive nitride, conductive organic polymer, or combinations thereof. The metals may include copper, aluminum, tungsten, titanium or combinations thereof. The adhesive pads 20 may be formed in star shape, square, rectangle, circle or other shape.

In addition, the material for the conductive regions 30a, 30b, 30c may be selected the same or substantially the same as the materials forming the conductive region 40. The conductive regions 30a, 30b, 30c may be formed when the conductive region 40 is formed. Conductive region 40 is, for example, inter-level interconnects (eg, plugs) or runners for interconnect devices formed in die 10. That is, conductive region 40 is used to interconnect structures within die 10 to form an integrated circuit.

Typically, stresses associated with fabrication processes for forming integrated circuits appear largely at the periphery of the die. For example, the stress applied to the die increases from the center of the die 50 toward the outer region 60. As mentioned above, this occurs due to the mismatch between the conductive regions 30a, 30b, 30c, 40 and other materials forming the integrated circuit. Other materials include inter-level dielectrics, mold composites, substrate or die 10.

Conductive regions 30a, 30b, 30c may be located in many zones associated with the die. For example, conductive regions 30a, 30b, 30c may be formed in the peripheral or outer region of the die. Alternatively, conductive regions 30a, 30b, 30c may be formed between the outer edge of die 10 and the adhesive pads 20. In other embodiments, the conductive regions 30a, 30b, 30c may be formed closer to the outer edge 15 than to the conductive region 40. Conductive regions 30a, 30b, 30c may also be positioned such that the conductive regions experience a force equal to or greater than the force exerted on the conductive region 40, and the adhesive pads 20 to facilitate testing. Can be coupled to. In another alternative embodiment, at least one of the conductive regions 30a, 30b, 30c may be formed on die 10 or another layer and connected to at least two adhesive pads that may be used while testing the conductive region. Can be.

Different expansion rates cause stress between the die, mold composite 80 formed on the die, inter-level dielectric (not shown), one or all of the conductive regions. These stresses can damage the conductive regions. A large amount of stress must be applied to these conductive regions 30a, 30b, 30c because they are formed toward the outer region 60 of the die 10. As a result, the conductive regions 30a, 30b, 30c are more likely to be damaged because a greater amount of stress is applied to the conductive regions 30a, 30b, 30c. Thus, damage to the conductive regions 30a, 30b, 30c can be used to predict damage to the conductive region 40. Therefore, determining that the conductive regions 30a, 30b, 30c are damaged or likely to be damaged can be used to reject the die 10 and to determine whether the die 10 should be rejected. 10) can be used to require a wider range of tests.

Adhesive pads 20 and conductive regions 30a, 30b, 30c may be formed on the same metallization layer or on different metallization layers. When formed on different metallization layers, adhesive pads 20 may be interconnected with conductive regions using plugs.

Damage to the conductive regions 30a, 30b, 30c can be determined by measuring changes in electrical properties of the conductive regions using well known techniques. For example, the change in resistance or resistance over time can be measured for the conductive regions 30a, 30b, 30c. Conductance of the conductive regions 30a, 30b, 30c can be measured. Crosstalk between two or more conductive lines can be measured. These are typical texts. One of many known tests for evaluating conductive materials can be used.

In addition to measuring the electrical properties of the conductive regions, the die may be subjected to thermal, electrical and / or other stresses to induce damage to the conductive regions. In this way, the measured electrical properties of the conductive regions can be used to predict the likelihood of damage of the conductive runners 40 or the likelihood that the conductive runners will be damaged under some specified time or under certain conditions. That is, the conductive regions can be used to evaluate aspects of integrated circuit performance during stress testing. This may lead to faster testing and lower test costs for determining the effects of stresses on the conductive regions formed in the integrated circuit.

The electrical properties of the conductive regions include adhesive pads 20 coupled to the conductive regions 30a, 30b, 30c, and probes 305 for forming an electrical connection between the adhesive pads 20 (see FIG. 6). ) Or other suitable means to electrically couple to the tester 300 (see FIG. 6) and to the tester 300 to evaluate the conductive regions. The test may be performed at a number of different points during the manufacture of the die 10. These manufacturing periods include (1) one or more dielectric layers, (2) passivation, or (3) forming the molding composite on die 10. If electrical test evaluation is performed on one or more dies 10, the data may be used to reject or accept the draw from which die (s) 10 are selected for testing. Alternatively, each of the dies 10 may be tested at a low cost test and stable at a predetermined potential, as allowed by the exemplary embodiment.

As shown in FIGS. 3A and 3B, the spacing between conductive regions 30a, 30b, 30c may be varied to evaluate the stress effects across the different regions of die 10. For example, the spacing X1 between the conductive regions 30a and 30b may be smaller than the spacing X2 between the conductive regions 30b and 30c. As a result, deleterious effects of stresses on closely spaced conductive regions (eg, runners or interconnects) can be detected. 3A shows that the interval X1 is larger than the interval X2, but this can be changed so that the interval X2 is larger than the interval X1 (see FIG. 3B). Three conductive regions 30a, 30b, 30c are shown for illustrative purposes, but one or more conductive regions may be included on the die. For example, one conductive region 30 or five conductive regions 30 may be included on die 10.

4 illustrates another embodiment according to the present invention. In FIG. 4, the corner regions 75 of the conductive regions 70 are 45 degrees θ such that the stresses radiating from the center 50 of the die toward the corners of the die are substantially perpendicular to the corner regions 75. 45 °) has a chamfer. In this way, the amount of elongated hoop stress of the conductive regions 70 in the corner regions 75 is increased. θ may be between 0 ° and 90 °. Conductive regions 70 are evaluated using the same process described above with respect to FIG. 1.

5 illustrates another exemplary embodiment of the present invention. In this embodiment, the heights Y1, Y2, Y3, Y4, Y5 of the conductive regions are changed relative to the top surface 100 of the die 10. This can be accomplished by forming openings or vias with different depths of the underlying layer and depositing a conductive layer. The conductive layer is patterned using well known lithography and etching techniques. Multiple etching and lithography steps can be used to form variable height conductors. Similarly, multiple etching and lithography steps can be used to form variable depth openings or vias.

The variable depth conductive regions accentuate the stress on the conductive regions at different locations along the heights of the different conductive regions. For example, stresses may be applied on the conductive region 200 at the height of Z1 from the bottom of the conductive region 200 or at the region 205. This is different from the conductive region 210 where the conductive region extends over the via at a different height Z2 than the conductive region 210. Stresses will be exerted on conductive region 210 in region 215. As a result, differences can be identified that can cause damage to the materials forming the conductive regions, such as those caused by the material slope of the conductive runners.

For example, consider conductive regions consisting of copper. Impurities may be included in the copper (Cu) films from the electroplating pathways or carefully co-plated. Typically, the impurities are bleach (eg propane sulfone pan derivative), carrier (eg polyalkylene glycol), leveler (eg sulfonic acid with amine, amide, dihydride functional groups) Alkanes), chloride ions. The impurities naturally form a slope along the thickness of the copper films as they are grown. Carbon may be one of the most prominent elements present in copper films after electroplating. The concentration of carbon generally increases from the top to the bottom of the copper film. The presence of these additional elements and materials in the copper film can cause weak spots in the copper film, especially if they vary across the thickness of the copper film. The embodiment shown in FIG. 5 provides an apparatus for stressing on potential weak spots in conductive regions to assess whether the conductive regions are damaged or likely to be damaged.

6 is a block diagram illustrating an integrated circuit 310 that includes conductive regions 30a, 30b, 30c when tested using the tester 300. The tester includes probes 305 connected to adhesive pads for testing the conductive regions 30a, 30b, 30c.

Although the present invention has been described with reference to exemplary embodiments, it is not limited to these embodiments. Rather, the appended claims should be construed to cover other modifications and embodiments of the present invention that can be made by those skilled in the art without departing from the true spirit and scope of the present invention.

According to the present invention, it is possible to effectively evaluate the possibility or occurrence of damage to the integrated circuit.

Claims (15)

In an integrated circuit, A substrate; A plurality of adhesive pads formed on the substrate; And a first conductive region formed in an outer region of the substrate and coupled to at least two of the plurality of adhesive pads. The method of claim 1, And the first conductive region surrounds the plurality of adhesive pads. The method of claim 2, And the first conductive region has a chamfered region. The method of claim 1, Further comprising second conductive regions adapted to interconnect devices formed in the integrated circuit, The first conductive region is separate from the interconnect devices. The method of claim 1, And the first conductive region comprises at least two separate first conductive regions. The method of claim 5, Wherein said at least two separate first conductive regions have a varying height relative to an upper surface of the substrate. The method of claim 1, And the first conductive region is formed around the integrated circuit. The method of claim 1, Wherein the first conductive region comprises at least two individual conductive regions, each of the individual conductive regions being coupled to at least two of the plurality of adhesive pads. A test system adapted for testing the integrated circuit of claim 1, comprising: And a tester configured to test electrical characteristics of the first conductive region through the at least two adhesive pads. In an integrated circuit, A substrate; A plurality of adhesive pads; And a conductive runner formed around the substrate and the plurality of adhesive pads and electrically coupled to at least two of the plurality of adhesive pads. The method of claim 10, And a plurality of said conductive runners. The method of claim 11, At least two of the plurality of conductive runners have a varying height relative to an upper surface of the substrate. The method of claim 10, And the conductive runner has a chamfered area. The method of claim 10, Devices formed on the integrated circuit; Further comprising circuit conductive runners adapted to interconnect with the devices to form a circuit; And the conductive runners are separate from the devices. In the integrated circuit manufacturing method, Forming at least two adhesive pads on the substrate; Forming a conductive region over an area located between the at least two adhesive pads and an outer edge of the substrate; Electrically coupling the adhesive pads to the conductive region; And the conductive region is not electrically coupled to devices formed on the substrate.