KR19980069556A - Wafer Detection Device - Google Patents

Wafer Detection Device Download PDF

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Publication number
KR19980069556A
KR19980069556A KR1019970006677A KR19970006677A KR19980069556A KR 19980069556 A KR19980069556 A KR 19980069556A KR 1019970006677 A KR1019970006677 A KR 1019970006677A KR 19970006677 A KR19970006677 A KR 19970006677A KR 19980069556 A KR19980069556 A KR 19980069556A
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KR
South Korea
Prior art keywords
wafer
carrier
wafers
present
sensor
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KR1019970006677A
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Korean (ko)
Inventor
박정근
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문정환
엘지반도체 주식회사
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Priority to KR1019970006677A priority Critical patent/KR19980069556A/en
Publication of KR19980069556A publication Critical patent/KR19980069556A/en

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Abstract

본 발명에 의한 웨이퍼 감지장치는 웨이퍼 캐리어내에 탑재된 웨이퍼의 위치 및 숫자를 감지하기 위해 상기 웨이퍼 캐리어의 외부 일측에 레이져센서를 설치하여, 작업전에 캐리어내의 웨이퍼 수량 및 위치가 파악되고, 작업시작 위치로 빠른 동작이동이 가능하며, 시간손실을 줄여줄 뿐만아니라, 오동작시 대량불량이 발생하는 요인을 사전에 점검하여 방지하도록 하였다.In the wafer detection apparatus according to the present invention, a laser sensor is installed on an outer side of the wafer carrier in order to detect the position and number of wafers mounted in the wafer carrier, and the quantity and position of wafers in the carrier are determined before the operation, and the work start position. It is possible to move quickly, reduce time loss, and check and prevent factors that cause mass defects in case of malfunction.

Description

웨이퍼 감지장치Wafer Detection Device

본 발명은 웨이퍼 감지장치에 관한 것으로, 특히 작업전에 캐리어내의 웨이퍼 수량 및 위치가 파악되고, 작업시작 위치로 빠른 동작이동이 가능하며, 시간손실을 줄여줄 뿐만아니라, 오동작시 대량불량이 발생하는 요인을 사전에 점검하여 방지하도록 한 웨이퍼 감지장치에 관한 것이다.The present invention relates to a wafer sensing device, in particular, the number and location of wafers in the carrier before the operation is identified, it is possible to move quickly to the starting position, to reduce the time loss, as well as factors that cause mass defects during malfunction The present invention relates to a wafer sensing device that prevents inspection in advance.

종래의 기술에 의한 웨이퍼 감지장치는 도 2에 도시한 바와 같이, 웨이퍼캐리어 적치대(4)(5)와 감지장치(6)로 기본 구성된 상태에서 도 1과 같이, 웨이퍼 공급용핑거(1), 웨이퍼 센서(2), 상하좌우 웨이퍼핑거 리미트센서(3a)(3b)(3c)(3d)로 구성된다.As shown in FIG. 2, the wafer sensing apparatus according to the related art is a wafer supply finger 1 as shown in FIG. 1 in a state mainly composed of the wafer carrier stacking base 4 and the sensing device 6. And the wafer sensor 2 and the up, down, left, and right wafer finger limit sensors 3a, 3b, 3c, and 3d.

상기의 장치는 자동으로 웨이퍼에 스티키 포일(sticky foil)을 붙이는 장비로써 25장/캐리어 씩 2세트까지 공급 가능하고, 이렇게 공급된 웨이퍼를 웨이퍼 핑거(1)를 이용하여 얼라인먼트(alignment)부로 이송하여 방향을 잡아준 다음, 어태치먼트(attachment)부로 이송하여, 여기서 포일을 마운터(mounter)하면 픽업 암(pick up Arm)을 이용해 언로딩시켜 카세트에 담으면 작업이 완료된다. 종래 기술의 동작부위는 웨이퍼 자동 로딩공정에 관한 것으로 웨이퍼가 담긴 캐리어를 공급하면 웨이퍼 핑거와 여기에 부착된 웨이퍼센서(2)가 삽입된 상태에서 엘리베이터(12)가 하강하게 되면서 웨이퍼 센서의 동작에 의해 캐리어 속의 웨이퍼 유,무를 확인하고, 웨이퍼가 있으면 공급하는 방식이다.The above device is a device that automatically sticks a sticky foil on a wafer, and can supply up to 25 sheets / carrier two sets, and transfers the wafer to the alignment unit using the wafer finger 1. Orientation is then carried to the attachment section where the foil is mounted, where it is unloaded using a pick up arm and placed in a cassette to complete the operation. The operating part of the prior art relates to an automatic wafer loading process. When the carrier containing the wafer is supplied, the elevator 12 descends while the wafer finger and the wafer sensor 2 attached thereto are inserted into the wafer sensor. By checking the presence or absence of the wafer in the carrier, if there is a wafer, it is supplied.

종래의 기술에서는 캐리어(11) 속의 웨이퍼를 웨이퍼센서(2)가 동작할 때 까지 계속 엘리베이터(12)가 동작하므로, 웨이퍼가 캐리어 상단에 있는 경우는 계속적으로 찾는 동작을 행하기 때문에 이로 인한 시간손실이 발생하고, 웨이퍼센서(2)의 감도저하를 가져올 수 있으며, 고장발생시는 웨이퍼를 확인하지 못하고 계속적으로 동작하여 공급된 웨이퍼가 대량 파손되게 되는 문제점이 있는 바, 본 발명의 목적은 상기와 같은 문제점을 고려하여 안출한 것으로, 작업전에 캐리어내의 웨이퍼 수량 및 위치가 파악되고, 작업시작 위치로 빠른 동작이동이 가능하며, 시간손실을 줄여줄 뿐만아니라, 오동작시 대량불량이 발생하는 요인을 사전에 점검하여 방지하도록 한 웨이퍼 감지장치를 제공함에 있다.In the related art, the elevator 12 continues to operate the wafer in the carrier 11 until the wafer sensor 2 operates. Therefore, when the wafer is at the upper end of the carrier, the elevator 12 continuously searches for the wafer. This may cause a decrease in the sensitivity of the wafer sensor 2, and when a failure occurs, there is a problem in that the wafers are continuously broken without checking the wafers so that the supplied wafers are damaged in a large amount. In consideration of the problem, the quantity and location of wafers in the carrier are identified before the operation, the operation can be quickly moved to the starting position of work, the time loss is reduced, and the factors that cause mass defects in case of malfunction It is to provide a wafer sensing device to check and prevent.

도 1은 종래의 기술에 의한 웨이퍼 감지장치를 나타내는 사시도.1 is a perspective view showing a wafer sensing device according to the prior art.

도 2는 종래의 기술에 의한 웨이퍼의 적치대를 나타내는 정면도.Fig. 2 is a front view showing the loading base of the wafer according to the prior art.

도 3은 종래의 기술에 의한 웨이퍼 감지장치를 나타내는 평면도.3 is a plan view showing a wafer sensing device according to the prior art.

도 4는 본 발명에 의한 웨이퍼 감지장치를 나타내는 평면도.4 is a plan view showing a wafer sensing device according to the present invention.

(도면의 주요부분에 대한 부호의 설명)(Explanation of symbols for the main parts of the drawing)

1 ; 웨이퍼핑거11 ; 웨이퍼 캐리어One ; Wafer finger 11; Wafer carrier

12 ; 엘리베이터21a,21b ; 레이져 센서12; Elevators 21a and 21b; Laser sensor

이러한, 본 발명의 목적은 웨이퍼 캐리어내에 탑재된 웨이퍼의 위치 및 숫자를 감지하기 위해 상기 웨이퍼 캐리어의 외부 일측에 레이져센서를 설치함으로써 달성된다.This object of the present invention is achieved by installing a laser sensor on the outer side of the wafer carrier to detect the position and number of wafers mounted in the wafer carrier.

이하, 본 발명에 의한 웨이퍼 감지장치를 첨부도면에 도시한 실시예에 따라서 설명한다.Hereinafter, a wafer sensing apparatus according to the present invention will be described according to the embodiment shown in the accompanying drawings.

도 4는 본 발명에 의한 웨이퍼 감지장치를 나타내는 평면도를 보인 것으로, 이에 도시한 바와 같이, 본 발명에 의한 웨이퍼 감지장치는 웨이퍼 캐리어(11)내에 탑재된 웨이퍼의 위치 및 숫자를 감지하기 위해 상기 웨이퍼 캐리어의 외부 일측에 레이져센서(21a)(21b)를 설치한다.4 is a plan view showing a wafer sensing apparatus according to the present invention. As shown in the drawing, the wafer sensing apparatus according to the present invention detects the position and number of wafers mounted in the wafer carrier 11. The laser sensor 21a, 21b is installed on the outer side of the carrier.

즉 도 2의 카세트 감지 스위치(6)와, 상하부 웨이퍼 적치대(4)(5)를 그대로 사용하고, 도 3과 같이 2세트의 레이져센서(21a)(21b)를 추가로 사용한다.That is, the cassette detecting switch 6 of FIG. 2 and the upper and lower wafer stackers 4 and 5 are used as they are, and two sets of laser sensors 21a and 21b are further used as shown in FIG.

종래 기술의 동작 설명과 같이, 본 발명은 자동 웨이퍼 로딩 고정에 관한 것으로, 웨이퍼 캐리어 공급시 캐리어(11)내의 웨이퍼 수량 및 위치를 외부에서 레이져 센서(21a)(21b)를 이용하여 파악하고 작업 시작시 작업위치로 이동된 후 작업이 이루어 지도록 한다.As described in the operation of the prior art, the present invention relates to the automatic wafer loading fixing, wherein the quantity and position of the wafers in the carrier 11 when the wafer carrier is supplied are grasped from the outside by using the laser sensors 21a and 21b to start work. Work is done after moving to the work position.

종래의 동작방법은 캐리어내의 웨이퍼를 웨이퍼핑거가 삽입된 상태에서 웨이퍼의 유,무를 확인하고, 엘리베이터가 하강하는 방식으로 센서가 웨이퍼를 감지할 때 까지 엘리베이터가 하강동작을 진행하므로 센서의 기능불량시 캐리어 통채로 들어올려 대량의 웨이퍼 파손이 발생할수 있는 바, 본 발명은 캐리어(11) 외부에서 레이져 센서(21a)(21b)가 캐리어(11)외곽에서 캐리어내의 웨이퍼를 카운터하고 각 웨이퍼의 위치를 판독 가능하게 하므로, 작업진행할 웨이퍼 까지의 위치이동이 용이하고 만약 레이져센서의 기능불량이 발생하더라도 외부 판독시 에러 및 작업진행이 중단되므로 캐리어내의 정확한 웨이퍼 판독 및 작업성을 향상시켜 제품불량을 방지할수 있다.The conventional operation method is to check the presence or absence of the wafer in the state in which the wafer finger is inserted into the wafer, and the elevator proceeds the lowering operation until the sensor detects the wafer in the way that the elevator descends, so that the sensor malfunctions. Since a large amount of wafer breakage may occur due to the lifting of the carrier barrel, the present invention provides that the laser sensors 21a and 21b counter the wafers in the carrier outside the carrier 11 and adjust the position of each wafer outside the carrier 11. Because it is possible to read, it is easy to move the position to the wafer to be processed, and if the laser sensor malfunctions, error and work stops when reading externally, which improves accurate wafer reading and workability in the carrier to prevent product defects. have.

이상에서 설명한 바와 같이, 본 발명에 의한 웨이퍼 감지장치는 웨이퍼 캐리어내에 탑재된 웨이퍼의 위치 및 숫자를 감지하기 위해 상기 웨이퍼 캐리어의 외부 일측에 레이져센서를 설치하여, 작업전에 캐리어내의 웨이퍼 수량 및 위치가 파악되고, 작업시작 위치로 빠른 동작이동이 가능하며, 시간손실을 줄여줄 뿐만아니라, 오동작시 대량불량이 발생하는 요인을 사전에 점검하여 방지하도록 한 효과가 있다.As described above, the wafer detection apparatus according to the present invention installs a laser sensor on one side of the outside of the wafer carrier to detect the position and number of the wafers mounted in the wafer carrier, so that the quantity and location of the wafers in the carrier are changed before the operation. It is possible to quickly move to the starting position of the work, and to reduce the time loss, and to prevent and prevent the cause of mass defects in advance.

Claims (1)

웨이퍼 캐리어내에 탑재된 웨이퍼의 위치 및 숫자를 감지하기 위해 상기 웨이퍼 캐리어의 외부 일측에 레이져센서를 설치한 것을 특징으로 하는 웨이퍼 감지장치.Wafer sensing device characterized in that the laser sensor is installed on the outer side of the wafer carrier to detect the position and number of the wafer mounted in the wafer carrier.
KR1019970006677A 1997-02-28 1997-02-28 Wafer Detection Device KR19980069556A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100457342B1 (en) * 1997-10-24 2005-01-17 삼성전자주식회사 Wafer transfer apparatus to prevent wafer from being damaged and improve productivity
WO2010027643A2 (en) * 2008-09-04 2010-03-11 3M Innovative Properties Company Carrier having integral detection and measurement of environmental parameters
US8963552B2 (en) 2012-04-26 2015-02-24 3M Innovative Properties Company Electrostatic discharge event detector

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100457342B1 (en) * 1997-10-24 2005-01-17 삼성전자주식회사 Wafer transfer apparatus to prevent wafer from being damaged and improve productivity
WO2010027643A2 (en) * 2008-09-04 2010-03-11 3M Innovative Properties Company Carrier having integral detection and measurement of environmental parameters
WO2010027643A3 (en) * 2008-09-04 2010-05-14 3M Innovative Properties Company Carrier having integral detection and measurement of environmental parameters
US8963552B2 (en) 2012-04-26 2015-02-24 3M Innovative Properties Company Electrostatic discharge event detector

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