KR102880604B1 - 임프린트 방법, 임프린트 장치, 및 물품 제조 방법 - Google Patents
임프린트 방법, 임프린트 장치, 및 물품 제조 방법Info
- Publication number
- KR102880604B1 KR102880604B1 KR1020220121319A KR20220121319A KR102880604B1 KR 102880604 B1 KR102880604 B1 KR 102880604B1 KR 1020220121319 A KR1020220121319 A KR 1020220121319A KR 20220121319 A KR20220121319 A KR 20220121319A KR 102880604 B1 KR102880604 B1 KR 102880604B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- plate
- holding
- support
- imprint
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
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- H01L21/6838—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2021-158395 | 2021-09-28 | ||
| JP2021158395A JP7710350B2 (ja) | 2021-09-28 | 2021-09-28 | インプリント方法、インプリント装置、および物品の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20230045567A KR20230045567A (ko) | 2023-04-04 |
| KR102880604B1 true KR102880604B1 (ko) | 2025-11-05 |
Family
ID=85718246
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020220121319A Active KR102880604B1 (ko) | 2021-09-28 | 2022-09-26 | 임프린트 방법, 임프린트 장치, 및 물품 제조 방법 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US12292681B2 (https=) |
| JP (1) | JP7710350B2 (https=) |
| KR (1) | KR102880604B1 (https=) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080042320A1 (en) | 2005-06-07 | 2008-02-21 | Canon Kabushiki Kaisha | Processing apparatus, processing method, and process for producing chip |
| JP2008537513A (ja) | 2005-01-31 | 2008-09-18 | モレキュラー・インプリンツ・インコーポレーテッド | 基板上に配置された固化層からモールドを分離させる方法 |
| JP2010067796A (ja) | 2008-09-11 | 2010-03-25 | Canon Inc | インプリント装置 |
| US20200168580A1 (en) | 2017-09-21 | 2020-05-28 | Ev Group E. Thallner Gmbh | Apparatus and method for bonding substrates |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006083519A2 (en) | 2005-01-31 | 2006-08-10 | Molecular Imprints, Inc. | Method of retaining a substrate to a wafer chuck |
| US7798801B2 (en) * | 2005-01-31 | 2010-09-21 | Molecular Imprints, Inc. | Chucking system for nano-manufacturing |
| KR20090004910A (ko) | 2006-04-03 | 2009-01-12 | 몰레큘러 임프린츠 인코퍼레이티드 | 유체 챔버의 어레이를 포함하는 처킹 시스템 |
| EP2210732B1 (en) * | 2007-09-28 | 2020-01-22 | Toray Industries, Inc. | Method and device for manufacturing sheet having fine shape transferred thereon |
| JP5606254B2 (ja) * | 2009-09-30 | 2014-10-15 | 京セラ株式会社 | 吸着用部材およびこれを用いた吸着装置、並びに光照射装置および荷電粒子線装置 |
| JP5824379B2 (ja) * | 2012-02-07 | 2015-11-25 | キヤノン株式会社 | インプリント装置、インプリント方法、及び物品の製造方法 |
| JP7284639B2 (ja) * | 2019-06-07 | 2023-05-31 | キヤノン株式会社 | 成形装置、および物品製造方法 |
-
2021
- 2021-09-28 JP JP2021158395A patent/JP7710350B2/ja active Active
-
2022
- 2022-09-21 US US17/949,296 patent/US12292681B2/en active Active
- 2022-09-26 KR KR1020220121319A patent/KR102880604B1/ko active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008537513A (ja) | 2005-01-31 | 2008-09-18 | モレキュラー・インプリンツ・インコーポレーテッド | 基板上に配置された固化層からモールドを分離させる方法 |
| US20080042320A1 (en) | 2005-06-07 | 2008-02-21 | Canon Kabushiki Kaisha | Processing apparatus, processing method, and process for producing chip |
| JP2010067796A (ja) | 2008-09-11 | 2010-03-25 | Canon Inc | インプリント装置 |
| US20200168580A1 (en) | 2017-09-21 | 2020-05-28 | Ev Group E. Thallner Gmbh | Apparatus and method for bonding substrates |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7710350B2 (ja) | 2025-07-18 |
| KR20230045567A (ko) | 2023-04-04 |
| JP2023048850A (ja) | 2023-04-07 |
| US12292681B2 (en) | 2025-05-06 |
| US20230097588A1 (en) | 2023-03-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| D22 | Grant of ip right intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D22-EXM-PE0701 (AS PROVIDED BY THE NATIONAL OFFICE) |
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| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
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| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
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| Q13 | Ip right document published |
Free format text: ST27 STATUS EVENT CODE: A-4-4-Q10-Q13-NAP-PG1601 (AS PROVIDED BY THE NATIONAL OFFICE) |
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| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |