KR102767442B1 - 구조화 조명 현미경법을 위한 향상된 계산 효율 - Google Patents

구조화 조명 현미경법을 위한 향상된 계산 효율 Download PDF

Info

Publication number
KR102767442B1
KR102767442B1 KR1020227013332A KR20227013332A KR102767442B1 KR 102767442 B1 KR102767442 B1 KR 102767442B1 KR 1020227013332 A KR1020227013332 A KR 1020227013332A KR 20227013332 A KR20227013332 A KR 20227013332A KR 102767442 B1 KR102767442 B1 KR 102767442B1
Authority
KR
South Korea
Prior art keywords
image
matrix
phase
images
delete delete
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020227013332A
Other languages
English (en)
Korean (ko)
Other versions
KR20220085781A (ko
Inventor
로버트 에즈라 랑글루아
앤드류 제임스 영
앤드류 닷지 헤이베르그
보 루
Original Assignee
일루미나, 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 일루미나, 인코포레이티드 filed Critical 일루미나, 인코포레이티드
Publication of KR20220085781A publication Critical patent/KR20220085781A/ko
Application granted granted Critical
Publication of KR102767442B1 publication Critical patent/KR102767442B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/60—Systems using moiré fringes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G06T3/4053—Scaling of whole images or parts thereof, e.g. expanding or contracting based on super-resolution, i.e. the output image resolution being higher than the sensor resolution
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G06T3/4053—Scaling of whole images or parts thereof, e.g. expanding or contracting based on super-resolution, i.e. the output image resolution being higher than the sensor resolution
    • G06T3/4069—Scaling of whole images or parts thereof, e.g. expanding or contracting based on super-resolution, i.e. the output image resolution being higher than the sensor resolution by subpixel displacements
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20024—Filtering details
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20048—Transform domain processing
    • G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20221—Image fusion; Image merging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30004—Biomedical image processing
    • G06T2207/30024—Cell structures in vitro; Tissue sections in vitro

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Immunology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Image Processing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
KR1020227013332A 2019-10-21 2020-10-21 구조화 조명 현미경법을 위한 향상된 계산 효율 Active KR102767442B1 (ko)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US201962924138P 2019-10-21 2019-10-21
US201962924130P 2019-10-21 2019-10-21
US62/924,138 2019-10-21
US62/924,130 2019-10-21
US17/075,694 2020-10-21
US17/075,692 US11525990B2 (en) 2019-10-21 2020-10-21 Systems and methods for structured illumination microscopy
US17/075,692 2020-10-21
PCT/US2020/056718 WO2021081129A1 (en) 2019-10-21 2020-10-21 Increased calculation efficiency for structured illumination microscopy
US17/075,694 US11340437B2 (en) 2019-10-21 2020-10-21 Increased calculation efficiency for structured illumination microscopy

Publications (2)

Publication Number Publication Date
KR20220085781A KR20220085781A (ko) 2022-06-22
KR102767442B1 true KR102767442B1 (ko) 2025-02-13

Family

ID=75491505

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020227013332A Active KR102767442B1 (ko) 2019-10-21 2020-10-21 구조화 조명 현미경법을 위한 향상된 계산 효율
KR1020227013331A Active KR102902249B1 (ko) 2019-10-21 2020-10-21 구조화 조명 현미경법을 위한 시스템 및 방법

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020227013331A Active KR102902249B1 (ko) 2019-10-21 2020-10-21 구조화 조명 현미경법을 위한 시스템 및 방법

Country Status (11)

Country Link
US (4) US11340437B2 (https=)
EP (2) EP4049232B1 (https=)
JP (2) JP7637131B2 (https=)
KR (2) KR102767442B1 (https=)
CN (3) CN116360086B (https=)
AU (2) AU2020371626B2 (https=)
BR (2) BR112022007292A2 (https=)
IL (2) IL292170B2 (https=)
MX (2) MX2022004773A (https=)
WO (2) WO2021081129A1 (https=)
ZA (2) ZA202204436B (https=)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021081129A1 (en) 2019-10-21 2021-04-29 Illumina, Inc. Increased calculation efficiency for structured illumination microscopy
US11060138B1 (en) * 2020-01-17 2021-07-13 Element Biosciences, Inc. Nucleic acid sequencing systems
US11188778B1 (en) * 2020-05-05 2021-11-30 Illumina, Inc. Equalization-based image processing and spatial crosstalk attenuator
DE102020123668A1 (de) * 2020-09-10 2022-03-10 Carl Zeiss Microscopy Gmbh Verfahren zur Bildauswertung für die SIM-Mikroskopie und SIM-Mikroskopieverfahren
DE102020211380A1 (de) * 2020-09-10 2022-03-10 Carl Zeiss Microscopy Gmbh Verfahren zum superauflösenden Auswerten von strukturiert beleuchteten Mikroskopbildern und Mikroskop mit strukturierter Beleuchtung
US20220101494A1 (en) * 2020-09-30 2022-03-31 Nvidia Corporation Fourier transform-based image synthesis using neural networks
US11361194B2 (en) 2020-10-27 2022-06-14 Illumina, Inc. Systems and methods for per-cluster intensity correction and base calling
GB202106287D0 (en) * 2021-04-30 2021-06-16 Univ Dublin Technological Method and system for spatial frequency spectrum optimisation of written text to closely resemble a natural environment
US12524867B2 (en) * 2021-05-21 2026-01-13 Kla Corporation System and method for optical wafer characterization with image up-sampling
CN113160096B (zh) * 2021-05-27 2023-12-08 山东中医药大学 一种基于视网膜模型的低光图像增强方法
EP4374343B1 (en) 2021-07-19 2025-12-03 Illumina, Inc. Intensity extraction with interpolation and adaptation for base calling
US11455487B1 (en) 2021-10-26 2022-09-27 Illumina Software, Inc. Intensity extraction and crosstalk attenuation using interpolation and adaptation for base calling
AU2022316142A1 (en) 2021-07-21 2024-02-22 Element Biosciences, Inc. Optical systems for nucleic acid sequencing and methods thereof
CN113917677B (zh) * 2021-09-09 2023-05-05 北京纳析光电科技有限公司 一种三维超分辨率光片显微成像方法和显微镜
EP4427086A4 (en) * 2021-11-04 2025-12-03 Us Health SYSTEMS AND METHODS OF THREE-DIMENSIONAL STRUCTURED ILLUMINATION MICROSCOPY WITH ISOTROPIC SPATIAL RESOLUTION
US20230244746A1 (en) * 2022-02-01 2023-08-03 The Regents Of The University Of Michigan Hardware efficient weight structure for sparse deep neural networks
TWI783896B (zh) * 2022-04-08 2022-11-11 國立清華大學 用於輕元素薄膜的三維影像重建方法及系統
CN114998161A (zh) * 2022-06-02 2022-09-02 中国科学院西安光学精密机械研究所 一种基于完美傅里叶变换的傅里叶叠层显微术高精度重构图像方法
CN115541550B (zh) * 2022-10-21 2025-10-21 南京理工大学 基于主成分分析的结构光照明显微成像方法
CN120500655A (zh) * 2022-12-27 2025-08-15 新加坡国立大学 用于使用结构照明显微镜来进行图像重建的系统和方法
CN116452436A (zh) * 2023-03-15 2023-07-18 宁波江丰生物信息技术有限公司 图像增强方法及宽场荧光成像系统
CN117635506B (zh) * 2024-01-24 2024-04-05 成都航天凯特机电科技有限公司 一种基于AI赋能Mean Shift算法的图像增强方法及装置
WO2026051087A1 (en) * 2024-09-09 2026-03-12 Csr Biotech (Guangzhou) Co., Ltd. Realtime structured illumination super-resolution high-throughput imaging method
DE102024003249A1 (de) * 2024-09-30 2026-04-02 Carl Zeiss Microscopy Gmbh Verfahren zum Auswerten von strukturiert beleuchteten Mikroskopbildern und Mikroskop mit strukturierter Beleuchtung
CN121297720B (zh) * 2025-12-12 2026-04-03 西安唐晶量子科技有限公司 一种vcsel外延片晶圆翘曲度检测方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190234911A1 (en) 2016-09-28 2019-08-01 Research Center For Non Destructive Testing Gmbh High resolution photoacoustic imaging in scattering media using structured illumination

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6169723B1 (en) 1997-07-02 2001-01-02 Telefonaktiebolaget Lm Ericsson Computationally efficient analysis and synthesis of real signals using discrete fourier transforms and inverse discrete fourier transforms
US7054504B2 (en) * 1999-02-25 2006-05-30 Ludwig Lester F Relative optical path phase reconstruction in the correction of misfocused images using fractional powers of the fourier transform
EP4071458B1 (en) * 2005-09-21 2025-11-05 Luminex Corporation Methods and systems for image data processing
US7803609B2 (en) 2006-07-21 2010-09-28 Affymetrix, Inc. System, method, and product for generating patterned illumination
EP2150806A4 (en) * 2007-05-10 2013-01-02 Pacific Biosciences California METHODS AND SYSTEMS FOR ANALYZING FLUORESCENT MATERIAL WITH LIMITED AUTOFLUORESCENCE
DE102008009216A1 (de) * 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
CN102473286B (zh) * 2009-07-08 2014-12-10 工业研究与发展基金会有限公司 超分辨率信号重构的方法和系统
US10051240B2 (en) * 2010-06-14 2018-08-14 Howard Hughes Medical Institute Structured plane illumination microscopy
RU2431889C1 (ru) * 2010-08-06 2011-10-20 Дмитрий Валерьевич Шмунк Способ суперразрешения изображений и нелинейный цифровой фильтр для его осуществления
US8896918B2 (en) * 2010-12-24 2014-11-25 Huron Technologies International Inc. Pathology slide scanner
CA2854675C (en) * 2011-11-08 2017-08-22 Universite Laval Method and system for improving resolution in laser imaging microscopy
US9025881B2 (en) * 2012-02-06 2015-05-05 Nanyang Technological University Methods and apparatus for recovering phase and amplitude from intensity images
US20140323325A1 (en) * 2013-03-06 2014-10-30 Marc Beal Molecular imaging and related methods
PL3661069T3 (pl) * 2013-04-15 2022-01-17 Huawei Technologies Co., Ltd. Sposób raportowania informacji o stanie kanału, sprzęcie użytkownika i stacji bazowej
KR101479249B1 (ko) * 2013-11-08 2015-01-05 한국표준과학연구원 간섭성 구조조명 이미징 방법 및 간섭성 구조조명 현미경 시스템
KR101644411B1 (ko) * 2014-05-21 2016-08-01 주식회사 에이티엠 고해상도 이미지 복원 장치 및 그 방법
WO2016168941A1 (en) 2015-04-23 2016-10-27 The University Of British Columbia Multifocal method and apparatus for stabilization of optical systems
JP6630120B2 (ja) 2015-11-06 2020-01-15 浜松ホトニクス株式会社 画像取得装置、画像取得方法、及び空間光変調ユニット
US20180348500A1 (en) * 2015-11-11 2018-12-06 Scopio Labs Ltd. Scanning microscope with real time response
CN109313328A (zh) * 2016-06-21 2019-02-05 伊鲁米那股份有限公司 超分辨率显微术
GB201620744D0 (en) 2016-12-06 2017-01-18 Roadmap Systems Ltd Multimode fibre optical switching systems
WO2018146562A1 (en) * 2017-02-09 2018-08-16 Technion Research & Development Foundation Ltd. Sparsity-based super-resolution correlation microscopy
CN106770147B (zh) * 2017-03-15 2019-07-19 北京大学 一种结构光照明超分辨显微成像方法
DE102017119531A1 (de) * 2017-08-25 2019-02-28 Carl Zeiss Microscopy Gmbh Hochauflösende 2D-Mikroskopie mit verbesserter Schnittdicke
NL2020623B1 (en) 2018-01-24 2019-07-30 Illumina Inc Structured illumination microscopy with line scanning
NL2020622B1 (en) 2018-01-24 2019-07-30 Lllumina Cambridge Ltd Reduced dimensionality structured illumination microscopy with patterned arrays of nanowells
WO2021081129A1 (en) 2019-10-21 2021-04-29 Illumina, Inc. Increased calculation efficiency for structured illumination microscopy
TWI868262B (zh) * 2019-12-06 2025-01-01 美商伊路米納有限公司 提供參數估計的裝置和方法以及相關的處理器可讀取媒體

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190234911A1 (en) 2016-09-28 2019-08-01 Research Center For Non Destructive Testing Gmbh High resolution photoacoustic imaging in scattering media using structured illumination

Also Published As

Publication number Publication date
AU2020371626B2 (en) 2025-04-03
CA3155485A1 (en) 2021-04-29
IL292169A (en) 2022-06-01
US20230082223A1 (en) 2023-03-16
KR20220090510A (ko) 2022-06-29
US20210116690A1 (en) 2021-04-22
ZA202204436B (en) 2023-12-20
EP4049234A1 (en) 2022-08-31
IL292170B2 (en) 2023-12-01
JP7554824B2 (ja) 2024-09-20
US11525990B2 (en) 2022-12-13
NZ787453A (en) 2025-10-31
KR20220085781A (ko) 2022-06-22
KR102902249B1 (ko) 2025-12-19
BR112022007292A2 (pt) 2022-07-05
CN116360086B (zh) 2026-02-10
BR112022007283A2 (pt) 2022-07-05
WO2021081129A1 (en) 2021-04-29
CN114829906A (zh) 2022-07-29
WO2021081128A1 (en) 2021-04-29
AU2020370160B2 (en) 2025-02-27
US20210118110A1 (en) 2021-04-22
US11828924B2 (en) 2023-11-28
MX2022004773A (es) 2022-05-16
US20220283418A1 (en) 2022-09-08
US11340437B2 (en) 2022-05-24
CN116360086A (zh) 2023-06-30
JP7637131B2 (ja) 2025-02-27
MX2022004774A (es) 2022-05-16
IL292170A (en) 2022-06-01
IL292169B2 (en) 2024-06-01
IL292170B1 (en) 2023-08-01
JP2022553714A (ja) 2022-12-26
AU2020371626A1 (en) 2022-05-12
EP4049234B1 (en) 2023-12-06
CN114829906B (zh) 2023-04-28
ZA202204449B (en) 2024-01-31
IL292169B1 (en) 2024-02-01
AU2020370160C1 (en) 2025-06-05
AU2020370160A1 (en) 2022-05-12
EP4049232B1 (en) 2024-07-31
US11698518B2 (en) 2023-07-11
JP2022553713A (ja) 2022-12-26
EP4049232A1 (en) 2022-08-31
CN114600152A (zh) 2022-06-07

Similar Documents

Publication Publication Date Title
KR102767442B1 (ko) 구조화 조명 현미경법을 위한 향상된 계산 효율
JP7628502B2 (ja) パラメータ推定を提供する装置及び方法
TWI868263B (zh) 從影像中估計值的裝置和方法以及相關的處理器可讀取媒體
RU2829111C1 (ru) Системы и способы микроскопии структурированного освещения
CA3155485C (en) Systems and methods for structured illumination microscopy
RU2820783C1 (ru) Повышенная эффективность расчета для микроскопии структурированного освещения
HK40070209B (en) Systems and methods for structured illumination microscopy
HK40070210B (en) Increased calculation efficiency for structured illumination microscopy
HK40070210A (en) Increased calculation efficiency for structured illumination microscopy
HK40070209A (en) Systems and methods for structured illumination microscopy
RU2825348C1 (ru) Устройство и способ оценки значений по изображениям
CA3135207C (en) Apparatus and method of estimating values from images

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20220420

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20241129

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 20250210

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 20250210

End annual number: 3

Start annual number: 1

PG1601 Publication of registration