KR102611791B1 - Organic light emitting display device - Google Patents

Abstract

An organic light emitting display device according to an example of the present application includes a display panel having a display area where pixels that display images are located, a non-display area outside the display area that does not display images, and a display panel disposed in the non-display area to It includes a driver IC that drives it, and a lighting inspection switch element disposed in a non-display area and disposed outside the driver IC, and a lighting inspection pad section that inputs a lighting inspection signal to the lighting inspection switch element, and a lighting inspection switch element. By applying a lighting inspection signal to the remaining pixels, the width of the bezel of the organic light emitting display device can be reduced.

Description

Organic light emitting display device {ORGANIC LIGHT EMITTING DISPLAY DEVICE}

This application relates to an organic light emitting display device.

In the information society, many technologies in the field of display devices are being developed to display visual information in the form of images or images. Among display devices, organic light emitting display devices display images using organic light emitting diodes that generate light by recombination of electrons and holes. Organic light emitting display devices are in the spotlight as next-generation displays because they have a fast response speed and are capable of expressing low gray levels due to self-luminescence.

An organic light emitting display device includes a display panel that has a display area equipped with pixels that display images, a non-display area that is placed outside the display area and does not display images, and a driver IC that is placed on the non-display area to drive the display panel. Includes. The organic light emitting display device may have a structure in which the portion of the non-display area where the driver IC is placed is folded and bent to the back of the display area.

Each pixel includes a red sub-pixel, a green sub-pixel, and a blue sub-pixel to express RGB colors. Auto Probe (A/A) is a lighting test that applies a lighting test signal to each sub-pixel to check whether or not each red sub-pixel, green sub-pixel, and blue sub-pixel are running abnormally. P) Perform inspection.

The display device includes a lighting test switch element unit that receives a lighting test signal for performing a lighting test from the lighting test pad unit. The lighting inspection switch element is provided inside the bezel, which is the remaining area after trimming to remove the lighting inspection pad portion in the non-display area of the display device. As a result, a problem arises in which the width of the bezel increases.

This application seeks to provide an organic light emitting display device in which the width of the bezel is reduced by providing the lighting inspection switch element outside the bezel or removing it so that it does not remain in the finished product.

An organic light emitting display device according to an example of the present application includes a display panel having a display area where pixels that display images are located, a non-display area outside the display area that does not display images, and a display panel disposed in the non-display area and using the display panel. It includes a driver IC that drives it, and a lighting inspection switch element disposed in a non-display area and disposed outside the driver IC, and a lighting inspection pad section that inputs a lighting inspection signal to the lighting inspection switch element, and a lighting inspection switch element. By applying a lighting inspection signal to the remaining pixels, the width of the bezel of the organic light emitting display device can be reduced.

An organic light emitting display device according to another example of the present application is a display panel having a display area where pixels that display images are located, a non-display area outside the display area that does not display images, and a display panel arranged in the non-display area to display the image. It includes a driver IC that drives the panel, a lighting inspection switch element unit for lighting inspection of pixels, and a lighting inspection pad unit that inputs a lighting inspection signal to the lighting inspection switch element unit. The driver IC according to another example of the present application receives the lighting test signal from the lighting test pad unit without going through the lighting test switch element part, and the area where the driver IC is placed is folded and bent to the rear of the display area, thereby forming the organic light emitting display device. The width of the bezel can be reduced.

An organic light emitting display device according to another example of the present application includes a display panel having a display area including pixels and a non-display area outside the display area, a driver IC disposed in the non-display area to drive the display panel, and a drive. It includes a lighting test routing wire that extends from the outside of the IC toward the display area and is connected to a data line that supplies data voltage to the pixels. The lighting test routing wire provides a lighting test signal to the pixels during the lighting test. Accordingly, the width of the bezel of the organic light emitting display device can be reduced.

The organic light emitting display device according to the present application can reduce the width of the bezel of the display device by providing a lighting inspection switch element and removing it so that it does not remain in the final product of the organic light emitting display device.

The organic light emitting display device according to the present application can reduce the width of the non-display area by placing the lighting inspection switch element outside the drive IC. In addition, by applying a lighting inspection signal to the driver IC, the presence or absence of abnormalities in the driver IC can be confirmed during the manufacturing process, thereby reducing unnecessary manufacturing costs for inspecting the driver IC for abnormalities.

1 is a conceptual block diagram of an organic light emitting display device according to the present application.
Figure 2 is an internal circuit diagram of a pixel according to an example of the present application.
Figure 3 is a block diagram of an organic light emitting display device according to an example of the present application.
Figure 4 is a block diagram of an organic light emitting display device according to an example of the present application.
Figure 5 is a circuit diagram showing the driving of the DEMUX unit of the organic light emitting display device according to an example of the present application.
Figure 6 is a waveform diagram showing the operation of an organic light emitting display device according to an example of the present application.
Figure 7 is a plan view showing an organic light emitting display device according to another example of the present application.
Figure 8 is a plan view of an organic light emitting display device implemented as a smart watch according to examples of the present application.
Figure 9 is a schematic diagram modeling the static electricity prevention unit according to an example of the present application as a circuit.
Figure 9 is a driving waveform simulation graph of the organic light emitting display device according to the present application.
Figure 10 is a graph showing the relationship between the width of transistors for each RGB color of the organic light emitting display device according to the present application and the corresponding current of the organic light emitting diode.

The advantages and features of the present application and methods for achieving them will become clear by referring to examples described in detail below along with the accompanying drawings. However, the present application is not limited to the examples disclosed below and will be implemented in various different forms, and only the examples of the present application are intended to ensure that the disclosure of the present application is complete and are within the scope of common knowledge in the technical field to which this application pertains. It is provided to fully inform those who have the scope of the invention, and this application is only defined by the scope of the claims.

The shape, size, ratio, angle, number, etc. disclosed in the drawings for explaining an example of the present application are illustrative, and the present application is not limited to the matters shown. Like reference numerals refer to like elements throughout the specification. Additionally, in describing the present application, if it is determined that a detailed description of related known technology may unnecessarily obscure the gist of the present application, the detailed description will be omitted.

When 'includes', 'has', 'consists of', etc. mentioned in this specification are used, other parts may be added unless 'only' is used. When a component is expressed in the singular, the plural is included unless specifically stated otherwise.

When interpreting a component, it is interpreted to include the margin of error even if there is no separate explicit description.

In the case of a description of a positional relationship, for example, if the positional relationship of two parts is described as 'on top', 'on the top', 'on the bottom', 'next to', etc., 'immediately' Alternatively, there may be one or more other parts placed between the two parts, unless 'directly' is used.

In the case of a description of a temporal relationship, for example, if a temporal relationship is described as 'after', 'successfully after', 'after', 'before', etc., 'immediately' or 'directly' Unless used, non-consecutive cases may also be included.

Although first, second, etc. are used to describe various components, these components are not limited by these terms. These terms are merely used to distinguish one component from another. Accordingly, the first component mentioned below may also be the second component within the technical spirit of the present application.

“First horizontal axis direction”, “second horizontal axis direction” and “vertical axis direction” should not be interpreted as only geometric relationships in which the relationship between each other is vertical, and the scope in which the configuration of the present application can function functionally It can mean having a broader direction than within.

The term “at least one” should be understood to include all possible combinations from one or more related items. For example, “at least one of the first, second, and third items” means each of the first, second, or third items, as well as two of the first, second, and third items. It can mean a combination of all items that can be presented from more than one.

Each feature of the various examples of the present application can be combined or combined with each other partially or entirely, and various technological interconnections and operations are possible, and each example can be implemented independently of each other or together in a related relationship. .

Hereinafter, an example of an organic light emitting display device according to the present application will be described in detail with reference to the attached drawings.

1 is a conceptual block diagram of an organic light emitting display device according to the present application. Figure 2 is an internal circuit diagram of a pixel P according to an example of the present application.

Referring to Figures 1 and 2, the organic light emitting display device according to the present application includes a display panel 100, a gate driver 110, a data driver 120, and a timing controller (Timing Controller, T-CON) 130. Includes.

The display panel 100 includes a display area and a non-display area provided around the display area. The display area is an area where pixels (P) are provided to display an image. The non-display area is located on the outside of the display panel 100 and is an area that protects the display area from external shock. The display panel 100 is provided with gate lines (GL1 to GLp, p is a positive integer of 2 or more), data lines (DL1 to DLq, q is a positive integer of 2 or more), and sensing lines (SL1 to SLq). do. The data lines (DL1 to DLq) and the sensing lines (SL1 to SLq) may intersect the gate lines (GL1 to GLp). The data lines (DL1 to DLq) and the sensing lines (SL1 to SLq) may be parallel to each other. The display panel 100 may include a lower substrate on which pixels P are provided and an upper substrate that performs an encapsulation function to protect the pixels P from external foreign substances.

Each of the pixels P may be connected to one of the gate lines GL1 to GLp, one of the data lines DL1 to DLq, and one of the sensing lines SL1 to SLq. Each of the pixels P may include an organic light emitting diode (OLED) and a pixel driver PD that supplies current to the organic light emitting diode (OLED), as shown in FIG. 2 . In Figure 2, for convenience of explanation, the jth (j is a positive integer satisfying 1≤≤j≤≤q) data line DLj, the jth sensing line SLj, and the kth (k is 1≤≤k). Only the scan line (Sk) (a positive integer satisfying ≤≤p) and the pixel (P) connected to the kth sensing signal line (SSk) are shown. The kth scan line (Sk) and the kth sensing signal line (SSk) are included in the kth gate line (GLk).

Referring to FIG. 2 , the pixel P includes an organic light emitting diode (OLED) and a pixel driver (PD) that supplies current to the organic light emitting diode (OLED) and the jth sensing line (SLj).

Organic light-emitting diodes (OLEDs) emit light according to the current supplied through a driving transistor (DT). The anode electrode of the organic light-emitting diode (OLED) is connected to the source electrode of the driving transistor (DT), and the cathode electrode can be connected to the low-potential voltage line (ELVSSL) to which a low-potential power voltage lower than the high-potential power supply voltage is supplied. .

An organic light emitting diode (OLED) may include an anode electrode, a hole transporting layer, an organic light emitting layer, an electron transporting layer, and a cathode electrode. there is. In an organic light emitting diode (OLED), when voltage is applied to the anode and cathode electrodes, holes and electrons are moved to the organic light emitting layer through the hole transport layer and electron transport layer, respectively, and the holes and electrons combine with each other in the organic light emitting layer to emit light.

The pixel driver (PD) is controlled by a driving transistor (DT), a first transistor (ST1) controlled by a scan signal of the kth scan line (Sk), and a sensing signal of the kth sensing signal line (SSk). It may include a controlled second transistor (ST2) and a capacitor (C). When a scan signal is supplied from the kth scan line (Sk) connected to the pixel (P) in the display mode, the pixel driver (PD) operates on the data voltage (VDATA) of the jth data line (DLj) connected to the pixel (P). is supplied, and the current of the driving transistor (DT) according to the data voltage (VDATA) is supplied to the organic light emitting diode (OLED). The pixel driver PD receives the sensing voltage of the jth data line DLj connected to the pixel P when a scan signal is supplied from the kth scan line Sk connected to the pixel P in the sensing mode. , the current from the driving transistor (DT) flows to the jth sensing line (SLj) connected to the pixel (P).

The driving transistor (DT) is provided between the high potential voltage line (ELVDDL) and the organic light emitting diode (OLED). The driving transistor (DT) adjusts the current flowing from the high potential voltage line (ELVDDL) to the organic light emitting diode (OLED) according to the voltage difference between the gate electrode and the source electrode. The gate electrode of the driving transistor (DT) is connected to the first electrode of the first transistor (ST1), the source electrode is connected to the anode electrode of the organic light-emitting diode (OLED), and the drain electrode is connected to the high potential power supply voltage. It can be connected to the upper voltage line (ELVDDL).

The first transistor ST1 is turned on by the kth scan signal of the kth scan line Sk and supplies the voltage of the jth data line DLj to the gate electrode of the driving transistor DT. The gate electrode of the first transistor T1 is connected to the kth scan line Sk, the first electrode is connected to the gate electrode of the driving transistor DT, and the second electrode is connected to the jth data line DLj. It can be. The first transistor ST1 may be commonly referred to as a scan transistor.

The second transistor ST2 is turned on by the kth sensing signal of the kth sensing signal line SSk to connect the jth sensing line SLj to the source electrode of the driving transistor DT. The gate electrode of the second transistor ST2 is connected to the kth sensing signal line SSk, the first electrode is connected to the jth sensing line SLj, and the second electrode is connected to the source electrode of the driving transistor DT. can be connected. The second transistor ST2 may be collectively referred to as a sensing transistor.

The capacitor C is provided between the gate electrode and the source electrode of the driving transistor DT. The capacitor (C) stores the differential voltage between the gate voltage and source voltage of the driving transistor (DT).

In FIG. 2 , the driving transistor DT and the first and second transistors ST1 and ST2 are described as being formed of an N-type MOSFET (Metal Oxide Semiconductor Field Effect Transistor), but the description is not limited thereto. The driving transistor DT and the first and second transistors ST1 and ST2 may be formed of a P-type MOSFET. Additionally, the first electrode may be a source electrode and the second electrode may be a drain electrode, but are not limited thereto. For example, the first electrode may be a drain electrode and the second electrode may be a source electrode.

In the display mode, when a scan signal is supplied to the kth scan line (Sk), the data voltage (VDATA) of the jth data line (DLj) is supplied to the gate electrode of the driving transistor (DT), and the kth sensing signal line ( When a sensing signal is supplied to SSk), the initialization voltage of the jth sensing line (SLj) is supplied to the source electrode of the driving transistor (DT). As a result, in the display mode, the current of the driving transistor (DT) flowing according to the voltage difference between the voltage of the gate electrode and the voltage of the source electrode of the driving transistor (DT) is supplied to the organic light-emitting diode (OLED). ) emits light according to the current of the driving transistor (DT). At this time, the data voltage VDATA is a voltage that compensates for the threshold voltage and electron mobility of the driving transistor DT, so the current of the driving transistor DT does not depend on the threshold voltage and electron mobility of the driving transistor DT. .

In sensing mode, when a scan signal is supplied to the kth scan line (Sk), the sensing voltage of the jth data line (DLj) is supplied to the gate electrode of the driving transistor (DT), and is supplied to the kth sensing signal line (SSk). When a sensing signal is supplied, the initialization voltage of the jth sensing line (SLj) is supplied to the source electrode of the driving transistor (DT). In addition, when a sensing signal is supplied to the kth sensing signal line (SSk), the second transistor (ST2) is turned on and driven according to the voltage difference between the voltage of the gate electrode and the voltage of the source electrode of the driving transistor (DT). The current from the transistor (DT) flows to the jth sensing line (SLj).

The gate driver 110 receives the gate driver control signal GCS from the timing controller 130, generates gate signals according to the gate driver control signal GCS, and supplies them to the gate lines GL1 to GLp.

The data driver 120 receives a data driver control signal (DCS) from the timing controller 130, generates data voltages according to the data driver control signal (DCS), and supplies them to the data lines DL1 to DLq. Additionally, the data driver 120 generates sensing data (SEN) by sensing the voltage and current characteristics of each pixel (P) and supplies it to the timing controller 130.

The timing controller 130 receives from the outside a timing signal (TS) that controls the display timing of an image and digital video data (DATA) containing color-specific information for implementing an image. A timing signal (TS) and digital video data (DATA) are input to the input terminal of the timing controller 130 according to a set protocol. Additionally, the timing controller 130 receives sensing data SEN according to the voltage and current characteristics of each pixel P from the data driver 120.

The timing signal (TS) includes a vertical sync signal (Vsync), a horizontal sync signal (Hsync), a data enable signal (DE), and a dot clock (DCLK). Includes. The timing controller 130 compensates the digital video data (DATA) based on the sensing data (SEN).

The timing controller 130 generates driver control signals for controlling the operation timing of the gate driver 110, data driver 120, scan driver, and sensing driver. The driver control signals include a gate driver control signal (GCS) for controlling the operation timing of the gate driver 110, a data driver control signal (DCS) for controlling the operation timing of the data driver 120, and an operation timing of the scan driver. It includes a scan driver control signal for controlling and a sensing driver control signal for controlling the operation timing of the sensing driver.

The timing controller 130 operates the data driver 120, the scan driver, and the sensing driver in one of the display mode and the sensing mode according to the mode signal. The display mode is a mode in which the pixels (P) of the display panel 100 display an image, and the sensing mode is a mode in which the current or voltage of the driving transistor (DT) of each pixel (P) of the display panel 100 is sensed. am. When the waveform of the scan signal and the sensing signal supplied to each of the pixels P change in each of the display mode and the sensing mode, the data driver control signal (DCS), the scan driver control signal, and The sensing driver control signal can also be changed. Therefore, depending on which mode is the display mode or the sensing mode, the timing controller 130 generates a data driver control signal (DCS), a scan driver control signal, and a sensing driver control signal in response to the corresponding mode.

The timing controller 130 outputs the gate driver control signal (GCS) to the gate driver 110. The timing controller 130 outputs compensated digital video data and a data driver control signal (DCS) to the data driver 120. The timing controller 130 outputs a scan driver control signal to the scan driver. The timing controller 130 outputs a sensing driver control signal to the sensing driver.

Additionally, the timing controller 130 generates a mode signal for driving the data driver 120, the scan driver, and the sensing driver according to which mode is to be driven among the display mode and the sensing mode. The timing controller 130 operates the data driver 120, the scan driver, and the sensing driver in one of the display mode and the sensing mode according to the mode signal.

Figure 3 is a block diagram of an organic light emitting display device according to an example of the present application. The organic light emitting display device according to an example of the present application includes a display panel 100, a driver IC (Driver-IC) 300, and a lighting inspection switch element unit 400. Additionally, the organic light emitting display device according to an example of the present application may optionally further include a DEMUX unit 200.

The display panel 100 has a display area provided with pixels that display images, and a non-display area (NDA) that is disposed outside the display area and does not display images.

The driver IC 300 is disposed on the non-display area (NDA) and drives the display panel 100. The driver IC 300 according to an example of the present application may have the functions of the gate driver 110, the data driver 120, and the timing controller 130 all in one chip. Accordingly, an organic light emitting display device using the driver IC 300 according to an example of the present application can be applied to small electronic devices such as portable terminals and smart watches.

The lighting test switch device unit 400 receives an lighting test signal (APS) for performing a lighting test (Auto Probe, A/P) from the external lighting test pad unit 500. The lighting test signal (APS) is a signal that can check whether each pixel (P) is operating normally. The lighting test pad unit 500 is a pad provided in the lighting test device and outputs a lighting test signal (APS) to the lighting test switch element unit 400.

The lighting test switch element unit 400 applies the lighting test signal (APS) to each of the red sub-pixels (RSP), green sub-pixels (GSP), and blue sub-pixels (BSP) that make up the pixels (P). .

For example, the lighting test switch element unit 400 according to an example of the present application is disposed in the non-display area (NDA) where the driver IC 300 is disposed, and is disposed outside the driver IC 300. As shown in FIG. 3, when the driver IC 300 is disposed in the non-display area (NDA) provided on the upper side of the display panel 100, the lighting inspection switch element unit 400 is located on the upper side of the display panel 100. It is placed in the non-display area (NDA) provided in and is placed outside the driver IC 300.

Additionally, the lighting test switch element portion 400 may be disposed in a portion where the driver IC 300 is not disposed. For example, when the driver IC 300 is disposed in the non-display area (NDA) provided on the upper side of the display panel 100, the lighting inspection switch element unit 400 is located on the lower side of the display panel 100. It is placed in the prepared non-display area (NDA). In this case, a problem occurs in which the width of the non-display area (NDA) provided in the lower direction of the display panel 100 increases.

And, even in the case where the lighting test switch element portion 400 is disposed in the non-display area (NDA) portion where the driver IC 300 is disposed, it is disposed inside the driver IC 300. For example, the lighting test switch element portion 400 is disposed between the display panel 100 and the driver IC 300 in the non-display area (NDA). In this case, a problem occurs in which the width of the non-display area (NDA) of the portion where the driver IC 300 is disposed increases.

The lighting test switch element unit 400 according to an example of the present application is disposed outside the driver IC 300 to prevent the width of the non-display area (NDA) from increasing. Additionally, in order to protect the driver IC 300 from external shock, a non-display area (NDA) must be formed to some extent outside the area where the driver IC 300 is placed. When the lighting inspection switch element portion 400 is placed on the non-display area (NDA), the lighting inspection switch element portion 400 can be placed without increasing the width of the non-display area (NDA).

Additionally, the lighting test switch element unit 400 is used only during the process of performing a lighting test during the manufacturing process of the organic light emitting display device, and is not used when displaying an image. Therefore, there is no need to increase the width of the non-display area NDA in order to protect the lighting inspection switch element portion 400. Therefore, the organic light emitting display device according to an example of the present application has a non-display area (NDA) that does not display images outside the display area where pixels that display images are located, that is, a non-display area (NDA) that is an area excluding the display area of the entire surface area. It is possible to prevent the width of the display area (NDA) from increasing. The organic light emitting display device according to an example of the present application has a non-display area (NDA) visible from the front, that is, a bezel area that is an area of the non-display area (NDA) excluding the area that is bent or bent to the rear or side. Since this can be minimized, an organic light emitting display device with a narrow bezel can be easily implemented.

In addition, the lighting test switch element unit 400 of the organic light emitting display device according to an example of the present application may apply the lighting test signal (APS) to the driver IC 300. Accordingly, the lighting test signal (APS) can be applied via the driver IC 300 rather than directly applied to the display panel 100.

When the lighting inspection signal (APS) is directly applied to the display panel 100, the pixels of the display panel 100 can be inspected for abnormalities, but the driver IC 300 cannot be inspected for abnormalities. Accordingly, after the manufacturing of the organic light emitting display device is completed, a problem occurs in which the organic light emitting display device cannot be used due to a defect in the driver IC 300.

The lighting test switch element unit 400 of the organic light emitting display device according to an example of the present application applies the lighting test signal (APS) to the driver IC 300 and uses the lighting test signal (APS) to test the driver IC 300. The presence or absence of any abnormalities can be checked during the manufacturing process. Accordingly, unnecessary manufacturing costs due to driver IC defects can be reduced.

As described above, the organic light emitting display device according to an example of the present application includes a display panel 100, a driver IC (Driver-IC) 300, a lighting inspection switch element unit 400, and optionally a DEMUX unit. (200) may be further included.

The DEMUX unit 200 receives a driving signal from the driver IC 300 and supplies the driving signal to each red subpixel (RSP), green subpixel (GSP), and blue subpixel (BSP). That is, the DEMUX unit 200 demultiplexes the driving signal.

If the DEMUX unit 200 is present, all RGB subpixels can be driven using one driving signal. In other words, digital video data for each RGB color can be transmitted using a single driving signal but through time-division driving. Accordingly, the number of driving signals can be reduced, making it easy to miniaturize and integrate the driver IC 300.

The DEMUX unit 200 according to an example of the present application is provided inside the non-display area (NDA) where the driver IC 300 and the lighting inspection switch element unit 400 are disposed. As shown in FIG. 3, when the driver IC 300 and the lighting test switch element unit 400 are formed in the upper non-display area (NDA), the DEMUX unit 200 is located on the display panel 100 in the upper non-display area (NDA). ) and the driver IC 300. The DEMUX unit 200 receives the driving signal from the driver IC 300, demultiplexes it, and supplies it to the display panel 100. Therefore, it must be placed between the display panel 100 and the driver IC 300 to prevent electrical interference between the IC chips. The length of the connecting wire can be reduced.

Figure 4 is a block diagram of an organic light emitting display device according to another example of the present application. An organic light emitting display device according to another example of the present application includes a display panel 100, a driver IC (Driver-IC) 300, and a lighting inspection switch element unit 400. Additionally, the organic light emitting display device according to an example of the present application may optionally further include a DEMUX unit 200 and an anti-static unit 600.

The display panel 100 has a display area provided with pixels that display images, and a non-display area (NDA) disposed outside the display area and does not display images.

The driver IC 300 is placed outside the non-display area (NDA) and drives the display panel 100. The driver IC 300 according to an example of the present application can implement all the functions of the gate driver 110, the data driver 120, and the timing controller 130 within one chip. Accordingly, an organic light emitting display device using the driver IC 300 according to an example of the present application can be applied to small electronic devices such as portable terminals and smart watches.

In order to place the driver IC 300 outside the non-display area (NDA), the driver IC 300 according to another example of the present application is placed on the back of the organic light emitting display device. To this end, the portion of the non-display area (NDA) where the driver IC 300 is placed is folded and bent to the rear of the display area. In FIG. 4, the portion where the driver IC 300 is located is a portion that is folded toward the rear of the display panel 100, and can be folded toward the rear based on the bending line BL.

When the driver IC 300 is folded and placed on the back of the display panel 100, the area of the non-display area (NDA) is reduced by the amount that the driver IC 300 occupies in the non-display area (NDA). Accordingly, the width of the non-display area (NDA) can be further reduced, making it possible to implement an organic light emitting display device with a thinner border area.

The lighting test switch device unit 400 receives an lighting test signal (APS) for performing a lighting test (Auto Probe, A/P) from the lighting test pad unit 500. The lighting test signal (APS) is a signal that can check whether each of the pixels (P) is operating normally, and the lighting test signal (APS) is applied to the data line (DL) connected to the pixels (P). The lighting test pad unit 500 is a pad provided in the lighting test device and outputs a lighting test signal (APS) to the lighting test switch element unit 400. The lighting inspection pad unit 500 is connected only during the manufacturing stage of the organic light emitting display device, and is removed by cutting along the trimming line TR through a cutting process after the organic light emitting display device is completed.

The lighting test switch element unit 400 applies the lighting test signal (APS) to each of the red sub-pixels (RSP), green sub-pixels (GSP), and blue sub-pixels (BSP) that make up the pixels (P). .

The lighting test switch element unit 400 according to another example of the present application is disposed outside the non-display area (NDA), which is the portion where the driver IC 300 is disposed, and is disposed on the back of the display panel 100. As shown in FIG. 4 , the lighting test switch element portion 400 is disposed outside the bending line BL of the display panel 100 .

Additionally, the lighting test switch element unit 400 may be disposed in a non-display area (NDA) portion where the driver IC 300 is not disposed. Alternatively, the lighting test switch element portion 400 may be disposed inside the bending line BL even if it is disposed in the non-display area (NDA) where the driver IC 300 is disposed. For example, the lighting test switch element unit 400 is disposed on the non-display area NDA. In this case, a problem occurs in which the width of the non-display area (NDA) increases by the area occupied by the lighting inspection switch element portion 400.

The lighting inspection switch element unit 400 according to another example of the present application is disposed outside the bending line BL and at the rear of the display panel 100 to prevent the width of the non-display area NDA from increasing. can do. Therefore, the organic light emitting display device according to an example of the present application can more easily implement an organic light emitting display device having a narrow bezel.

As described above, the organic light emitting display device according to an example of the present application includes a display panel 100, a driver IC (Driver-IC) 300, a lighting inspection switch element unit 400, and optionally a DEMUX unit. It may further include (200) and an anti-static unit (600).

The DEMUX unit 200 receives a driving signal from the driver IC 300 and supplies the driving signal to each red subpixel (RSP), green subpixel (GSP), and blue subpixel (BSP). Accordingly, the DEMUX unit 200 demultiplexes the driving signal.

If the DEMUX unit 200 is present, all RGB subpixels can be driven using one driving signal. In other words, digital video data for each RGB color can be transmitted using a single driving signal but through time-division driving. Accordingly, the number of driving signals can be reduced, making it easy to miniaturize and integrate the driver IC 300.

The static electricity prevention unit 600 is disposed outside the DEMUX unit 200 in the non-display area (NDA). The static electricity prevention unit 600 prevents static electricity generated from the outside of the display device from being transmitted to the driver IC 300 or the display panel 100. When the electrostatic prevention unit 600 is included, static electricity can be prevented from damaging the driver IC 300 even when the driver IC 300 is bent.

Figure 5 is a circuit diagram showing the driving of the DEMUX unit 200 of the organic light emitting display device according to an example of the present application.

The organic light emitting display device according to an example of the present application includes a single RGB digital video data (DATA_RGB) containing RGB image information, and a data enable signal (DATA_EN) that controls whether to output the RGB digital video data (DATA_RGB). Includes. The data enable signal (DATA_EN) is provided to the lighting test switch element unit 400 through a data enable wiring separately from the data line (DL). In this case, during a lighting test, the lighting test switch device unit 400 is connected to the lighting test pad unit 500 through a data enable wire, and receives a signal through the lighting test pad unit 500.

The lighting test switch is turned on by the data enable signal (DATA_EN), and RGB digital video data (DATA_RGB) is output. The lighting inspection pad unit 500 is connected to the lighting inspection switch element unit 400, and the lighting inspection switch element unit 400 is provided with a lighting inspection switch. Additionally, the source electrode or drain electrode of the lighting test switch and the lighting test routing wire are connected. Accordingly, during the lighting test, RGB digital video data (DATA_RGB) is supplied to the source electrode or drain electrode of the lighting test switch. That is, during a lighting inspection, RGB digital video data (DATA_RGB) is generated in an external lighting inspection device connected to the lighting inspection pad unit 500 and supplied to each pixel through a lighting inspection switch.

And, the DEMUX unit 200 includes a red sub-pixel DEMUX unit 200R, a green sub-pixel DEMUX unit 200G, and a blue sub-pixel DEMUX unit 200B.

The red sub-pixel DEMUX unit 200R turns on the switching element at the timing to supply R digital video data to the red sub-pixel RSP, thereby generating the first resistor R1 and the first capacitor C1. The R digital video data voltage whose size and waveform are adjusted by the load unit is supplied to the red sub-pixels (RSP).

The green sub-pixel DEMUX unit (200G) turns on the switching element at the timing to supply G digital video data to the green sub-pixel (GSP), thereby generating the second resistor (R2) and the second capacitor (C2). The G digital video data voltage, whose size and waveform are adjusted by the load unit, is supplied to the green sub-pixels (GSP).

The blue sub-pixel DEMUX unit (200B) turns on the switching element at the timing to supply B digital video data to the blue sub-pixel (BSP), and turns on the third resistor (R3) and the third capacitor (C3). The B digital video data voltage, whose size and waveform are adjusted by the load unit, is supplied to the blue sub-pixels (BSP).

Figure 6 is a waveform diagram showing the operation of an organic light emitting display device according to an example of the present application.

During the lighting test period (AP), the data enable signal (DATA_EN) maintains the high logic level (H) state. Switching transistors turned on by the data enable signal (DATA_EN) supply signals flowing on the RGB data lines to the pixels. During the lighting inspection period (AP), the lighting inspection signal flows along the RGB data line. Accordingly, a lighting inspection signal can be supplied to the pixels using a single RGB data line. At this time, the DEMUX unit 200 demultiplexes the lighting inspection signal for each color and supplies it to each subpixel. Therefore, lighting inspection of RGB subpixels can be performed in batches using the lighting inspection signal.

During the module driving period (MODULE), the data enable signal (DATA_EN) maintains the low logic level (L) state. The switching transistors are turned off and cannot be electrically connected to the RGB data lines. RGB digital video data (DATA_RGB) is supplied to the pixels from the driver IC source 300S. Since the supplied RGB digital video data (DATA_RGB) is supplied to sub-pixels corresponding to each color by the DEMUX unit 200, the organic light emitting display device can drive the module while displaying an image. At this time, as described in FIG. 5, the DEMUX unit 200 demultiplexes the RGB digital video data (DATA_RGB) for each color and supplies it to each subpixel. Therefore, RGB colors can be expressed while performing time-division driving using one RGB digital video data (DATA_RGB).

Figure 7 is a plan view showing an organic light emitting display device according to another example of the present application.

In another example of the present application, another organic light emitting display device includes a display panel 100 and a driver IC 300.

The display panel 100 has a display area provided with pixels that display images, and a non-display area (NDA) that is disposed outside the display area and does not display images.

The driver IC 300 is disposed on the non-display area (NDA) and drives the display panel 100.

In addition, the driver IC 300 according to another example of the present application does not transmit the lighting test signal (APS) for performing the lighting test from the external lighting test pad unit 500 through the lighting test switch element unit 400. It receives input without At the center of the organic light emitting display device, the lighting inspection signal (APS) is received via the lighting inspection switch element unit 400, but as shown in FIG. 7, the lighting inspection switch element unit (APS) is received at the edge of the organic light emitting display device. The lighting test signal (APS) can be applied directly from the lighting test pad unit 500 to the drive IC 300 through the lighting test routing wire (APRL) without passing through 400).

In the case of such a design, the lighting inspection can be performed even if the lighting inspection switch element 400 of the organic light emitting display device that has gone through the manufacturing process is damaged or the lighting inspection switch element 400 cannot be used in the finished product. There are advantages to this.

Additionally, the driver IC 300 according to another example of the present application supplies the lighting test signal APS to the bending area BE through the driving routing wire DRL.

The bending area BE is an area that is folded toward the rear of the non-display area of the organic light emitting display device. That is, in another example of the present application, the portion where the driver IC 300 is placed is folded and bent to the rear of the display area. Accordingly, the non-display area corresponding to the area where the driver IC 300 is placed is not visible, making it easy to implement a narrow bezel.

In addition, the lighting inspection switch element portion 400 of the organic light emitting display device according to another example of the present application is disposed outside the driver IC 300 and is removed during trimming to remove the lighting inspection pad portion 500. .

For example, trimming to remove the lighting inspection pad portion 500 is performed along the trimming line TR. In this case, only the lighting inspection pad portion 500 is removed, and the lighting inspection switch element portion 400 remains in the finished product.

In another example, during trimming, the lighting inspection switch element portion 400 is removed by cutting along the cutting line CL, which is a portion inside the first width W1 than the trimming line TR. In this case, the lighting inspection switch element 400 may be removed by cutting through the lighting inspection switch element 400 as shown in FIG. 7, or the lighting inspection switch element 400 may be cut inside the lighting inspection switch element 400.

Accordingly, the lighting test switch element portion 400, which is used only during the lighting test process, can be removed from the completed organic light emitting display device. Therefore, unnecessary parts in terms of driving the organic light emitting display device can be removed and the width of the non-display area can be reduced.

During the trimming process of cutting and removing the portion where the lighting inspection pad portion 500 is formed, the lighting inspection switch element portion 400 may remain in the finished product or may be removed. Cut along the line between the lighting inspection pad portion 500 and the lighting inspection switch element portion 400, for example, along the outer line of the lighting inspection switch element portion 400, so that the lighting inspection switch element portion 400 remains. can do. When cutting along the outer line of the lighting inspection switch element portion 400 so that the lighting inspection switch element portion 400 remains, defects between wires that may occur during cutting can be prevented.

Additionally, as described above, it may be cut to penetrate the lighting test switch element portion 400. Alternatively, the lighting inspection switch element portion 400 may be completely removed by cutting the line formed inside the lighting inspection switch element portion 400. When cutting through the lighting inspection switch element 400 to remove the lighting inspection switch element 400 or cutting the inside of the lighting inspection switch element 400, the lighting inspection switch element 400 is removed in the final product. ) can be eliminated. Accordingly, the thickness of the bezel can be further reduced to provide a display device with a slim design.

Figure 8 is a plan view of an organic light emitting display device implemented as a smart watch according to examples of the present application.

The smart watch implemented according to the examples of this application has a display area for displaying images in the center, and pixels for displaying images are formed in the display area. In Figure 8, only one of the pixels is expressed in detail. In addition, in FIG. 8, one pixel includes a driving transistor (DT), first and second switching transistors (ST1, ST2), first and second emission control transistors (EMT1, EMT2), initialization transistor (INIT), and a storage capacitor. (Cst), and an organic light emitting diode (OLED) are shown. And, the present invention is not limited to this, and the pixel according to an example of the present application may be implemented in other ways.

The DEMUX unit 200 is disposed at a corner of the display area. The driver IC 300 is disposed in a portion that protrudes out of the non-display area. The portion that protrudes out may be bent and placed at the rear of the display area. The lighting test switch element portion 400 is disposed outside the driver IC 300. The static electricity prevention unit 600 is disposed between the DEMUX unit 200 and the driver IC 300. The functions of the DEMUX unit 200, driver IC 300, lighting test switch element unit 400, and static electricity prevention unit 600 are the same as those described in conjunction with FIGS. 3 and 4, so they can be briefly described or omitted. To perform a lighting test, the lighting test routing wire (APRL) connects the lighting test switch element unit 400 and the driver IC 300. Specifically, the lighting test routing wire (APRL) is connected to the output terminal of the driver IC. The data line DL connected to the driver IC 300 extends past the bottom of the anti-static unit 600 and the DEMUX unit 200 and is then disposed on the display area. In order to provide RGB digital video data (DATA_RGB) signal for each display pixel, the data line DL is connected to the DEMUX unit 200 to apply the RGB digital video data (DATA_RGB) to the DEMUX unit 200. In this case, the RGB digital video data (DATA_RGB) may be a lighting test signal (APS) provided through the lighting test pad unit 500. The data line DL extending from the DEMUX unit 200 and disposed on the display area is connected to the second switching transistor ST2 and supplies the data voltage VDATA to the driving transistor DT.

The first power line 700 extends from the driver IC 300, passes through the driver IC 300 and the lower part of the static electricity prevention unit 600, and is then arranged singly on one side of the display area. Additionally, it extends from the edge of the display area, extends past the lower part of the DEMUX unit 200, and is then disposed on the display area. The first power line 700 disposed on the display area is connected to the second emission control transistor EMT2 and supplies the high potential power voltage VDD to the second emission control transistor EMT2.

The second power line 800 extends from the driver IC 300 and is arranged to surround the edge of the display area. The second power line 800 is connected to the cathode electrode of the organic light emitting diode (OLED). The second power line 800 supplies a low potential power supply voltage (VSS).

The first emission control line 910 is formed at the left edge of the display area. The first emission control line 910 controls whether the first emission control transistor (EMT1) is turned on.

The second emission control line 920 is formed at the right edge of the display area. The second emission control line 920 controls whether the second emission control transistor EMT2 is turned on.

The first scan line 930 is formed at the left edge of the display area. The first scan line 930 controls whether the first switching transistor ST1 is turned on.

The second scan line 940 is formed at the right edge of the display area. The second scan line 940 controls whether the second switching transistor ST2 is turned on.

The data line DL supplies a data voltage to the source electrode of the second switching transistor ST2, so that the driving transistor DT can receive the data voltage.

The initialization line INIL supplies an initialization voltage to the source electrode of the initialization transistor INIT, allowing the initialization transistor INIT to supply an initialization voltage to the anode electrode of the organic light emitting diode (OLED).

Figure 9 is a driving waveform simulation graph of the organic light emitting display device according to the present application. Figure 10 is a graph showing the relationship between the width of transistors for each RGB color of the organic light emitting display device according to the present application and the corresponding current of the organic light emitting diode.

As shown in FIG. 9, the organic light emitting display device according to the present application performs time division driving of RGB digital video data (DATA_RGB) using the DEMUX unit 200 to generate data voltages for each RGB. In addition, although some voltage fluctuation (RIPPLE) phenomenon is recognized at the start of driving in each sub-pixel, it can be confirmed that there is no problem in driving.

And, as shown in FIG. 10, it can be seen that the organic light emitting display device according to the present application can allow an ideal current to flow because the reduction rate of the current flowing through the organic light emitting diode decreases as the width of the transistor increases. However, even if the width of the transistor is reduced to 10㎛, the current reduction rate is less than 6%, so it can be seen that there is no problem in transistor integration. In this case, the width of the transistor may be the width of the channel.

Therefore, through FIGS. 9 and 10 , it can be seen that even if the lighting test switch element portion 400 is disposed outside the drive IC 300, there is no problem in driving the organic light emitting diode. In addition, the organic light emitting display device according to the present application can reduce the width of the bezel by providing a lighting inspection switch element or removing it so that it does not remain in the finished product.

An organic light emitting display device according to an embodiment of the present application can be described as follows.

In the display panel according to an example of the present application, the organic light emitting display device is a display panel having a display area where pixels that display images are located, a non-display area outside the display area that does not display an image, and the non-display area. It includes a driver IC that is disposed and drives the display panel, and a lighting inspection switch element portion disposed in a non-display area and disposed outside the driver IC, and a lighting inspection pad portion that inputs a lighting inspection signal to the lighting inspection switch element portion. , the lighting inspection switch element unit can reduce the width of the bezel of the organic light emitting display device by applying a lighting inspection signal to the pixels.

The lighting test switch element unit can apply the lighting test signal to the driver IC.

The pixels include red sub-pixels, green sub-pixels, and blue sub-pixels, and may further include a DEMUX portion disposed adjacent to the display panel than the lighting inspection switch device portion.

The DEMUX unit may convert the lighting inspection signal into a red sub-pixel inspection signal for inspecting red sub-pixels, a green sub-pixel inspection signal for inspecting green sub-pixels, and a blue sub-pixel inspection signal for inspecting blue sub-pixels. .

The part of the non-display area where the driver IC is placed can be bent by folding it to the back of the display area.

The driver IC may be placed on the back of the display panel.

The lighting test switch element unit may be disposed on the rear of the display panel.

An organic light emitting display device according to another example of the present application is a display panel having a display area where pixels that display images are located, a non-display area outside the display area that does not display images, and a display panel arranged in the non-display area to display the image. It includes a driver IC that drives the panel, a lighting inspection switch element unit for lighting inspection of pixels, and a lighting inspection pad unit that inputs a lighting inspection signal to the lighting inspection switch element unit. The driver IC according to another example of the present application receives the lighting test signal from the lighting test pad unit without going through the lighting test switch element part, and the area where the driver IC is placed is folded and bent to the rear of the display area, thereby forming the organic light emitting display device. The width of the bezel can be reduced.

The lighting test switch element part is placed outside the driver IC, and can be removed when trimming to remove the lighting test pad part after the lighting test.

The lighting inspection switch element portion may be removed along a line penetrating the lighting inspection switch element portion, or may be removed along a line inside the lighting inspection switch element portion.

The lighting test switch element unit may be configured as a lighting test switch that is turned on by a data enable signal provided through a data enable wiring.

An organic light emitting display device according to another example of the present application includes a display panel having a display area including pixels and a non-display area outside the display area, a driver IC disposed in the non-display area to drive the display panel, and a drive. It includes a lighting test routing wire that extends from the outside of the IC toward the display area and is connected to a data line that supplies data voltage to the pixels. The lighting test routing wire provides a lighting test signal to the pixels during the lighting test. Accordingly, the width of the bezel of the organic light emitting display device can be reduced.

The pixels are composed of sub-pixels including a red sub-pixel, a green sub-pixel, and a blue sub-pixel, and the organic light emitting display device further includes a DEMUX unit that supplies data voltage to each sub-pixel, and the lighting test routing wire is connected to the driver IC. and is connected to the DEMUX unit to provide a lighting inspection signal for each sub-pixel.

The organic light emitting display device may further include a lighting test signal element unit connected to a lighting test routing wire.

The lighting test signal device unit is turned on by a data enable signal, and the data enable signal may be provided through a data enable wire separate from the data line.

Through the above-described content, those skilled in the art will be able to see that various changes and modifications can be made without departing from the technical idea of the present invention. Therefore, the technical scope of the present invention should not be limited to what is described in the detailed description of the specification, but should be defined by the scope of the patent claims.

100: display panel 110: gate driver
120: data driver 130: timing controller
200: DEMUX unit 300: Driver IC
400: Lighting inspection switch element section 500: Lighting inspection pad section
600: anti-static unit 700: first power line
800: second power line
910, 920: first and second light emission control lines
930, 940: first and second scan lines

Claims (18)

A display panel having a display area where a plurality of pixels that display an image are located, and a non-display area outside the display area that does not display an image;
a driver IC disposed in the non-display area;
A gate driver including at least one scan driver and an emission control driver;
A DEMUX unit connected to the plurality of pixels; and
It includes a lighting inspection switch element disposed in the non-display area and receiving a lighting inspection signal,
Each of the plurality of pixels,
An anode electrode, a cathode electrode, and a light emitting element located between the anode electrode and the cathode electrode; and
It includes a driving transistor that drives the light emitting device, at least one switching transistor, and at least one light emission control transistor,
The display device wherein the DEMUX unit and the lighting test switch element unit are disposed between the driver IC and the display area. According to claim 1,
A display device wherein a non-display area of the display panel is bent. According to claim 1,
A display device in which a portion where the driver IC is disposed is bent to the back of the display area. According to claim 1,
A lighting inspection pad unit where a lighting inspection signal is input is provided in the non-display area,
A display device wherein the driver IC is disposed between the lighting inspection pad portion and the display area. According to claim 1,
A display device further comprising an anti-static unit for preventing static electricity. According to claim 5,
A display device wherein the DEMUX unit is disposed between the static electricity prevention unit and the display area. According to claim 1,
The portion where the lighting inspection switch element unit is disposed is bent to the rear of the display area,
A display device in which the portion where the DEMUX portion is disposed is not bent. According to claim 1,
The display device wherein the at least one switching transistor is an N-type transistor. According to claim 1,
A display device in which the DEMUX unit is driven by the driver IC during a lighting inspection period for the plurality of pixels. According to claim 1,
The display device wherein the lighting test switch element unit is configured as a lighting test switch that is turned on by a data enable signal provided through a data enable wiring. According to claim 1,
The DEMUX unit drives at least two pixels of different colors using one driving signal transmitted from the driver IC. According to claim 11,
The DEMUX unit drives the at least two pixels using a time division driving method. According to claim 1,
Each of the plurality of pixels,
A first switching transistor whose turn-on state is controlled by the first scan line;
a second switching transistor whose turn-on status is determined by the second scan line;
a driving transistor that receives a data voltage through the second switching transistor;
a first emission control transistor whose turn-on status is determined by the first emission control line;
a second light emission control transistor whose turn-on status is determined by a second light emission control line;
an organic light emitting diode connected between the first light emission control transistor and a second power line;
an initialization transistor that supplies an initialization voltage to the anode electrode of the organic light emitting diode; and
A display device comprising a storage capacitor provided between the first switching transistor and the initialization transistor. According to claim 13,
A first electrode of the first switching transistor is connected to a second electrode of the second light emission control transistor, and a second electrode of the first switching transistor is connected to a first electrode of the storage capacitor,
A first electrode of the second switching transistor is connected to a data line, a second electrode of the second switching transistor is connected to a second electrode of the driving transistor,
A first electrode of the first emission control transistor is connected to a second electrode of the driving transistor, and a second electrode of the first emission control transistor is connected to the anode electrode,
A high potential power voltage is supplied to the first electrode of the second emission control transistor, and the second electrode of the second emission control transistor is connected to the first electrode of the driving transistor,
The first electrode of the initialization transistor is connected to an initialization line to which an initialization voltage is supplied, and the second electrode of the initialization transistor is connected to a second electrode of the first light emission control transistor,
The anode of the organic light emitting diode is connected to the second electrode of the first light emission control transistor and the second electrode of the initialization transistor,
The first electrode of the storage capacitor is connected to the second electrode of the first switching transistor, and the second electrode of the storage capacitor is connected to the second electrode of the initialization transistor and the second electrode of the first light emission control transistor. , display device. According to claim 1,
The DEMUX unit is disposed on the outside of the display area,
The driver IC is disposed in a protruding portion of the non-display area,
The DEMUX portion is disposed between the display area and the protruding portion,
The protruding portion of the non-display area is bent and placed at the rear of the display area,
A display device wherein the driver IC is disposed between the lighting inspection switch element portion and the DEMUX portion disposed in a protruding portion of the non-display area. A display panel having a display area where a plurality of pixels for displaying an image are located, and a non-display area outside the display area that includes a trimming line and a bending line and does not display an image;
A gate driver including at least one scan driver and an emission control driver;
a driver IC disposed in the non-display area and driving the display panel; and
It includes a lighting inspection switch element disposed in the non-display area and receiving a lighting inspection signal,
Each of the plurality of pixels,
An anode electrode, a cathode electrode, and a light emitting element located between the anode electrode and the cathode electrode; and
It includes a driving transistor that drives the light emitting device, at least one switching transistor, and at least one light emission control transistor,
The display device wherein the driver IC and the lighting inspection switch element are disposed between the trimming line and the bending line. According to claim 16,
The driver IC is located closer to the bending line than the lighting inspection switch element portion. According to claim 16,
The display device wherein the non-display area is bent based on the bending line, and the driver IC and the lighting inspection switch element are disposed on the rear of the display area.