KR102526101B1 - 복합물들의 열 열화를 측정하기 위한 시스템 및 방법 - Google Patents

복합물들의 열 열화를 측정하기 위한 시스템 및 방법 Download PDF

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KR102526101B1
KR102526101B1 KR1020160115720A KR20160115720A KR102526101B1 KR 102526101 B1 KR102526101 B1 KR 102526101B1 KR 1020160115720 A KR1020160115720 A KR 1020160115720A KR 20160115720 A KR20160115720 A KR 20160115720A KR 102526101 B1 KR102526101 B1 KR 102526101B1
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interior
parabolic mirror
thermal degradation
housing
composites
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KR20170033238A (ko
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폴 에이치. 주니어 쉘리
조지 제이. 워너
밀란 밀로세빅
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더 보잉 컴파니
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
    • G01N17/002—Test chambers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; Plastics; Rubber; Leather
    • G01N33/442—Resins; Plastics
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/008—Systems specially adapted to form image relays or chained systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G02B17/061—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors on-axis systems with at least one of the mirrors having a central aperture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors
    • G01N2201/0637—Elliptic

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Environmental Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Ecology (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Mathematical Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020160115720A 2015-09-16 2016-09-08 복합물들의 열 열화를 측정하기 위한 시스템 및 방법 Active KR102526101B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/855,892 2015-09-16
US14/855,892 US9791365B2 (en) 2015-09-16 2015-09-16 System and method for measuring thermal degradation of composites

Publications (2)

Publication Number Publication Date
KR20170033238A KR20170033238A (ko) 2017-03-24
KR102526101B1 true KR102526101B1 (ko) 2023-04-25

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US (1) US9791365B2 (https=)
EP (1) EP3144671B1 (https=)
JP (1) JP6883959B2 (https=)
KR (1) KR102526101B1 (https=)
CN (1) CN106546548B (https=)
AU (1) AU2016208251B2 (https=)
BR (1) BR102016019315B1 (https=)
CA (1) CA2938605C (https=)
SG (1) SG10201606986UA (https=)

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Publication number Priority date Publication date Assignee Title
CN111982339B (zh) * 2020-08-26 2022-09-16 中国烟草总公司郑州烟草研究院 一种负载温敏型标识物的检测试纸及制备方法和应用
CN111982336B (zh) * 2020-08-26 2022-05-20 中国烟草总公司郑州烟草研究院 一种基于温敏型标识物的烟草热加工强度检测方法
US20220375324A1 (en) * 2021-05-24 2022-11-24 Mpics Innovations Pte. Ltd Sensor device for detecting disinfecting state

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050067569A1 (en) * 2003-09-30 2005-03-31 Shelley Paul H. Method for measurement of composite heat damage with infrared spectroscopy
US20140273240A1 (en) * 2013-03-15 2014-09-18 The Boeing Company Method and system for detecting exposure of composites to high-temperature

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Publication number Priority date Publication date Assignee Title
NL269391A (https=) 1961-09-19
GB2197962A (en) 1986-11-10 1988-06-02 Compact Spindle Bearing Corp Catoptric reduction imaging apparatus
JPH1054792A (ja) * 1996-08-09 1998-02-24 Chino Corp 光学的測定装置
US6903339B2 (en) * 2002-11-26 2005-06-07 The Boeing Company Method of measuring thickness of an opaque coating using infrared absorbance
WO2006009077A1 (ja) * 2004-07-16 2006-01-26 Fujifilm Corporation 蛍光検出方法
JP5181604B2 (ja) * 2007-09-28 2013-04-10 アイシン・エィ・ダブリュ株式会社 ワニス含浸検査装置及び検査方法
KR20100000480A (ko) * 2008-06-25 2010-01-06 이재현 발광 다이오드 키보드
KR20100129989A (ko) * 2009-06-02 2010-12-10 허재승 자동제어센서
DE102012017049A1 (de) 2012-08-29 2014-03-06 Khs Gmbh Vorrichtung zum Inspizieren von Gegenständen
EP2873155A1 (en) * 2012-08-29 2015-05-20 Huawei Technologies Co., Ltd. Method and device for performance evaluation of forward error correction (fec) codes

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050067569A1 (en) * 2003-09-30 2005-03-31 Shelley Paul H. Method for measurement of composite heat damage with infrared spectroscopy
US20140273240A1 (en) * 2013-03-15 2014-09-18 The Boeing Company Method and system for detecting exposure of composites to high-temperature

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Publication number Publication date
JP6883959B2 (ja) 2021-06-09
EP3144671A1 (en) 2017-03-22
CA2938605C (en) 2023-01-17
US20170074782A1 (en) 2017-03-16
AU2016208251B2 (en) 2021-02-18
CN106546548A (zh) 2017-03-29
SG10201606986UA (en) 2017-04-27
KR20170033238A (ko) 2017-03-24
CA2938605A1 (en) 2017-03-16
BR102016019315A2 (pt) 2017-03-21
BR102016019315B1 (pt) 2021-12-14
EP3144671B1 (en) 2023-12-20
US9791365B2 (en) 2017-10-17
AU2016208251A1 (en) 2017-03-30
CN106546548B (zh) 2021-02-12
JP2017058367A (ja) 2017-03-23

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