KR102433911B1 - Portable multi-tester probe - Google Patents

Abstract

The present invention includes a plurality of probes having probe pins having different contact areas and shapes coupled to each other at the tip; a housing having a longitudinal hollow portion to accommodate the probe and having multiple slits through which the outer periphery is arranged to be spaced apart from each other; a plurality of manipulation units individually inserted into the multiple slits so as to be able to move forward and backward, one end of which is respectively connected to the rear end of the plurality of probes; and a jig in which multiple insertion holes of the same radial arrangement as the multiple slits are formed so that the plurality of probes are individually inserted. It relates to a multi-test probe comprising and effective measurement.

Description

Multi-tester probe {Portable multi-tester probe}

The present invention relates to a multi-tester probe, and more particularly, a multi-probe equipped with a plurality of probes having various contact areas in a one-touch method for easy replacement so as to quickly and efficiently measure electrical characteristics such as poor contact of electrical products. It is about the tester probe.

In general, a multi-function measuring device that can measure voltage, current, resistance, and phase in electrical and electronic devices is called a multi-meter or multi-tester, and generally It is divided into analog and digital methods.

1 is a view showing a digital multi-tester according to the prior art.

The digital multi-tester (1) is a device that converts the measured value into a digital value and displays it as an accurate numerical value. used

Referring to FIG. 1 , the multi-tester body 3 is provided with a female terminal 3c and a pair of probes 4 connected to the female terminal. In addition, the probe includes a handle portion 6 that is an insulator so that a user can grip it, and includes a probe 5 that is a conductor at one end of the handle portion, and a male terminal selectively coupled to the female terminal of the tester body at the other end of the handle portion. A lead wire 9 provided with a terminal 7 is integrally provided with the probe.

The multi-tester measures parameters such as voltage, current, and resistance between electronic components and a continuity test to check contact failure by bringing the probe 5 into contact with the object to be measured, and the measured value is displayed on the display unit 3a ) is displayed in

On the other hand, the probe 5 has a sharp and pointed shape with a protruding end, and is provided integrally with the handle at the probe end so that the measurement is made so as to contact the subject. There is a problem in that it is easily damaged, such as bending or breaking.

In addition, as complex and miniaturized precision electronic devices are increasing in recent years, it is necessary to have various shapes and surface areas of probes in order to accurately measure the parameters of these small electronic components without errors.

Therefore, there is a need for a multi-tester probe that is easy to replace and can be applied to various working conditions and subjects with complex shapes, is safe from breakage and safety accidents, and is easy to store and handle.

The problem to be solved by the present invention is to solve the problems of the prior art, and it is an object of the present invention to provide a multi-tester probe that can be applied to a subject having various shapes and contact areas and has improved safety for workers. .

In addition, an object of the present invention is to provide a multi-tester probe that is easy to store and handle, while allowing rapid and efficient measurement because the replacement of the probe is made in a one-touch method so that it is easy to selectively replace the probe suitable for the subject. .

Objects of the present invention are not limited to the objects mentioned above, and other objects not mentioned will be clearly understood by those skilled in the art from the following description.

A multi-tester probe according to the present invention for achieving the above object, a plurality of probes having probe pins having different contact areas and shapes are coupled to each other at the tip; a housing having a longitudinal hollow portion to accommodate the probe and having multiple slits through which the outer periphery is arranged to be spaced apart from each other; a plurality of manipulation units individually inserted into the multiple slits so as to be able to move forward and backward, one end of which is respectively connected to the rear end of the plurality of probes; a jig in which multiple insertion holes of the same radial arrangement as the multiple slits are formed so that the plurality of probes are individually inserted; Including, wherein the housing has a shape that a cross-sectional area becomes narrower toward the front end, the upper housing is formed with a guide hole through which the probe probe pin protrudes or enters at the end; and a lower housing detachably coupled to the other end of the upper housing and provided with the multiple slits, wherein the upper and lower housings are composed of an insulator, wherein the upper housing is made of an opaque material, and The lower housing further includes a rear cap, and the rear cap includes: a coupling part detachably coupled to the rear end of the lower housing on one side; It characterized in that it includes; an adapter to which a lead wire terminal is connected to the other side connected to the measuring instrument to transmit and receive electrical signals, wherein the probe includes a probe bar having a length that can be accommodated in the housing; a probe pin detachably coupled to the front end of the probe bar; and an elastic part provided between the probe bar and the probe pin to vary the interval (d) with an elastic force.

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In addition, the present invention, the manipulation unit, the pressing unit inserted into the multiple slit in a form protruding outward of the housing; and,

and a return spring in the connection part with the probe, and when the pressing part is advanced so as to be caught on the locking jaw formed at the front end of the multiple slits, the probe protrudes, and when the pressing part is released from the locking jaw, the operation part by the operation of the return spring And it provides a multi-tester probe, characterized in that the probe is in situ.

According to the multi-tester probe of the present invention as described above, since the user can control the protrusion and retraction of the probe provided at the tip of the probe, storage and handling are easy, and the safety of the operator is improved.

In addition, the multi-tester probe of the present invention allows for the selective replacement of the probe suitable for the subject because the replacement of the probe is made in a one-touch method, and it can be applied to the subject having various shapes and contact areas, so that it is possible to measure quickly and efficiently. have.

1 is a view showing a digital multi-tester according to the prior art.
2 is a perspective view illustrating a multi-tester probe according to an embodiment of the present invention, and FIG. 3 is an exploded perspective view.
FIG. 4 is a partially coupled view of FIG. 3 .
5 is a view showing various types of probe pins according to an embodiment of the present invention.
6 is an operation state diagram of a probe according to an embodiment of the present invention.

Advantages and features of the present invention and methods of achieving them will become apparent with reference to the embodiments described below in detail in conjunction with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but will be implemented in a variety of different forms, only these embodiments allow the disclosure of the present invention to be complete, and common knowledge in the technical field to which the present invention belongs It is provided to fully inform the possessor of the scope of the invention, and the present invention is only defined by the scope of the claims.

Detailed contents for carrying out the present invention will be described in detail with reference to the accompanying drawings below. Irrespective of the drawings, like reference numbers refer to like elements, and "and/or" includes each and every combination of one or more of the recited items.

Although the first, second, etc. are used to describe various elements, these elements are not limited by these terms, of course. These terms are only used to distinguish one component from another. Therefore, it goes without saying that the first component mentioned below may be the second component within the spirit of the present invention.

The terminology used herein is for the purpose of describing the embodiments and is not intended to limit the present invention. In this specification, the singular also includes the plural, unless specifically stated otherwise in the phrase. As used herein, “comprises” and/or “comprising” does not exclude the presence or addition of one or more other components in addition to the stated components.

Unless otherwise defined, all terms (including technical and scientific terms) used herein may be used with the meaning commonly understood by those of ordinary skill in the art to which the present invention belongs. In addition, terms defined in a commonly used dictionary are not to be interpreted ideally or excessively unless clearly defined in particular.

Spatially relative terms "below", "beneath", "lower", "above", "upper", etc. It can be used to easily describe the correlation between a component and other components. A spatially relative term should be understood as a term that includes different directions of components during use or operation in addition to the directions shown in the drawings. For example, when a component shown in the drawing is turned over, a component described as “beneath” or “beneath” of another component may be placed “above” of the other component. can Accordingly, the exemplary term “below” may include both directions below and above. Components may also be oriented in other orientations, and thus spatially relative terms may be interpreted according to orientation.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Figure 2 is a perspective view showing a multi-tester probe according to an embodiment of the present invention, Figure 3 is an exploded perspective view.

2 and 3, the multi-tester probe according to the embodiment of the present invention,

A plurality of probes 130 coupled to the tip of the probe pins 133 having different contact areas and shapes;

a housing 110 having a longitudinal hollow portion to accommodate the probe and having multiple slits 112 arranged radially spaced apart from each other on the outer periphery;

a plurality of manipulation units 140 individually inserted into the multiple slits so as to be able to move forward and backward, one end connected to the rear end of the plurality of probes; and,

a jig 120 in which multiple insertion holes 121 of the same radial arrangement as the multiple slits are formed so that the plurality of probes are individually inserted; It is characterized in that it includes.

In this case, the housing 110 may include an upper housing 110a and a lower housing 110b detachably coupled to the rear end of the upper housing.

The upper housing 110a is provided with a guide hole 111 in which the probe pin 133 of the probe 130 is protruded or retracted at the end of the shape in which the cross-sectional area becomes narrower toward the front end. In addition, the lower housing 110b is provided with multiple slits 112 formed elongated in the longitudinal direction of the lower housing on the outer periphery and spaced apart from each other by a predetermined distance in a radial direction.

On the other hand, in the present invention, the housing 110 may be composed of a pen type with a long body part in a cylindrical shape so that the electrical characteristic test of the subject P can be easily performed in a state held by an operator, and is made of an insulating material. It is preferable to be manufactured.

In this case, the upper housing 110a of the housing may be made of an opaque insulator. When the upper housing 110a is made of an opaque material, a plurality of probe pins 133 having different shapes and contact areas are visually distinguished, and then used according to the subject P to be probed. By selectively advancing the operation unit 140 in the axial direction by the operator, the probe pin 133 is protruded out of the guide hole 111 so that the selective replacement of the probe pin can be easily made.

On the other hand, the plurality of insertion holes 121 formed in the jig 120 and the multiple slits 112 formed through the outer periphery of the lower housing are radially arranged at the same number and spacing. This is a means for individually operating the plurality of probes 130 inserted into the jig by the manipulation unit 140, and the operation method according to the radial arrangement of the probes will be described in more detail later with reference to FIG. 4 .

Subsequently, the rear end of the lower housing 110b may include a rear cap 150 into which a terminal of a lead wire 90 connected to a measuring instrument is inserted in order to be connected to a multi-tester, etc., which is a measuring instrument 3 ′ to exchange electrical signals. have.

At this time, the rear cap 150 includes a coupling part 151 on one side to enable detachment from the lower housing 110b, and on the other side a lead wire connected to a measuring instrument 3' such as a multi-tester through electrical communication. It may include an adapter 152 to which 90 is connected.

In addition, although not shown in the drawings, a clip or ring means may be provided at the rear end of the lower housing in addition to the rear cap for user convenience and prevention of loss.

On the other hand, in the embodiment of the present invention, when one terminal of both terminals of the lead wire 90 connected to the measuring instrument 3' is connected to the adapter 152 in the embodiment of the present invention as shown in FIG. 3, the lead wire 90 in the embodiment Although it is shown that the means of the adapter 152 are connected to the female terminal (not shown) of the adapter 152, the adapter 152 is not limited to the female terminal in the present invention, and the If it is connectable, it may be formed of an adapter 152 of any terminal type corresponding thereto.

In this way, the end of the lead wire 90 connected to the adapter is configured to be connectable to the adapter, and the adapter and the wire end may be configured as a combination of a female terminal or a male terminal of a general standard corresponding to each other, through which the conventional lead wire integrated Compared to a probe formed of a , it can be configured to freely connect and disconnect telecommunications depending on whether or not a measuring instrument is used.

On the other hand, the multi-tester probe according to the present invention can be measured by connecting to a variety of compatible measuring instruments 3' in addition to the digital multi-tester described in the background art of the present invention, and when used alone or in plurality, the resistance of the conductor, two points It can be used for measuring the electrical characteristics of electronic products in various fields even in measuring the strength of voltage and current between them or performing a short test.

Subsequently, the probe 130 according to the present invention has a long and thin rod shape, and the probe pins 133 configured by coupling to the tips of the plurality of probes, respectively, have a tip for measuring various types of the subject P. It is provided to have different contact areas and shapes. The configuration of the probe will be described with reference to FIG. 4 .

Figure 4 is a partial binding diagram of Figure 3, showing the components and the binding principle for binding to the probe.

First, referring to FIGS. 3 and 4, in the present invention, the probe 130 includes a probe bar 131 of an acceptable length inside the housing;

a probe pin 133 detachably coupled to the front end of the probe bar; and,

An elastic part 132 provided between the probe bar and the probe pin to vary the interval d with an elastic force; may include.

The elastic part 132 is a hollow or plate-shaped spring as a means for maintaining an appropriate elastic force in measuring electrical characteristics by contacting the probe pin 133 of the probe with the subject P, that is, in the longitudinal direction of the probe. It is provided so as to exhibit an axial elastic force.

Next, in the present invention, the probe bar 133 may be configured with a conductor having a length that can be accommodated inside the housing 110 to enable electrical signal transmission to the probe pin 133 .

In addition, a probe pin 133, which is also a conductor, is provided at the front end of the probe bar, which is a conductor, and the probe is connected to the adapter 152 of the rear cap at the rear end while being inserted into the insertion hole 121 of the jig. It is connected to the short circuit of the wire (w) so that the electric signal is transmitted to the probe pin 133 formed at the front end through the probe which is a conductor. In this case, the connection between the rear end of the probe bar and the wire may be connected by soldering or other connection auxiliary means.

On the other hand, in the present invention, the material of the probe bar 131 is not limited to a conductor, and when the plurality of radially arranged probe bars 131 are all made of a conductor, an error occurs during measurement due to electrical interference due to side contact. In order to prevent this from occurring, the probe 130 may be formed of an insulator.

At this time, when the probe bar is provided with a tubular insulator, a wire w electrically connected to the adapter 152 terminal of the rear cap is extended and inserted into the inner space of the tube to insert a probe pin 133 at the front end of the probe bar. It can be connected to transmit and receive electrical signals.

In this way, the probe bar 131 has a conductive probe pin 133 coupled to the front end, and the probe bar rear end is inserted into the insertion hole 121 of the jig 120, and the non-conductive operating unit 140 is coupled. do. In addition, a wire w is connected to the rear end of the probe bar 131 to be connected to an adapter and a terminal of the lower housing rear cap 150 .

Accordingly, the rear cap 113 is connected to the electrical communication line of a measuring instrument such as a multi-tester with a lead wire, so that measurement values can be transmitted and received.

Next, the operating principle of the elastic part 132 in the probe 130 will be described with reference to FIG. 6 .

6 is an operation state diagram of a probe according to an embodiment of the present invention, and is a view showing a working state in which the probe pin 133 of the present invention is in contact with the subject P. Referring to FIG.

In general, the measured value of the measuring instrument 3' such as a multi-tester connected to the probe is measured in a state where the probe pin 133 of the tip of the probe is in contact with the subject P. At this time, when the user holds the probe 130 In the case of contacting the probe pin with the subject while the user is working, or in particular, if a sharp probe pin is used, damage such as a scratch may occur in the contact area between the probe pin and the subject.

However, as shown in FIG. 6 (b), according to the present invention, the probe pin is in contact with the subject P by the elastic part 132 provided at the rear side of the probe pin 133, and the pressure is applied by the user's movement. Even if this increases, the elastic part distributes the pressing force. Therefore, since the elastic force between the subject P and the probe pin 133 is appropriately varied, the elastic force is constantly applied to the probe pin 133 where the measurement is made while the measurement is made, and the contact state can be continuously maintained. .

As described above, in the configuration of the elastic part 132 according to the present invention, even if the pressing force of the probe pin 133 in contact with the object is frequently changed by the user's minute movement during operation in a state in which the probe pin and the object are in contact with each other, It prevents damage to the contact part and maintains the contact state stably, so that more accurate measurement can be made.

On the other hand, in the case of FIG. 5, among the plurality of probe pins 133 applied to the present invention, the shape of the tip of the probe pin is pointed or a probe pin having a concave groove 134 formed thereon so that it can be connected to a small test object. it has been explained As described above, in the case of the probe pin including the groove in the configuration of the present invention, stable measurement can be made while the probe pin is inserted into the test object in the case of the target object P having a narrow contact area.

According to an embodiment of the present invention, among the plurality of probe pins 133 having various contact areas and shapes, the probe pins can be selectively used in the right place in consideration of the shape and working environment of the subject P.

5 is a view showing various types of probe pins according to an embodiment of the present invention.

Referring to FIG. 5 , the probe pin 133 detachably provided at the front end of the probe 130 of the present invention has a concave groove 134 at the end, in addition to the probe pin (b) having a conventional general diameter pin shape. ) may be provided in various ways, such as a shape (a), a ball shape (c), and a fine probe pin shape (d) with a long and thin end.

On the other hand, in the present invention, the type and shape of the probe pin is not limited as shown in FIG. 5, and it has a variety of contact areas and shapes in addition to the probe pin shown in FIG. 5 so that it can be applied to various subjects P. can be provided.

For example, when the subject P is a very small precision electronic device, a probe pin having a pin shape that is very thin and long enough to be bent may be applied. On the other hand, since the probe pin 133 in the shape of a very thin and long pin is not easy to store, it is easy to break, and it is difficult to precisely measure the electrical characteristics of precision electronic devices and circuit parts having complicated shapes that are gradually being miniaturized.

However, the multi-tester probe according to the present invention is provided with a plurality of replaceable probe pins in one probe device to facilitate replacement of probe pins having various contact areas and shapes in addition to the long and long pin-shaped probe pins. It can be safely stored inside the housing and used without damage by allowing the probe pin to protrude only during measurement.

In addition, in the present invention, the number of the probes 130 and the number of the multiple slits 112 and the insertion holes 121 of the jig coupled thereto are not limited to 4 as shown in the drawings, but 3, 5 A plurality of probes, such as six or six probes, insertion holes and slits may be provided to correspond to each other in the same number and shape. It may be provided in number.

In addition, since the insertion hole 121 of the jig 120 is radially arranged, the plurality of probes inserted into the insertion hole can also maintain the radial arrangement. In this case, the front or rear of the jig may further include a guide part 122 for guiding the long-forward and backward motion of the inserted long probe to be stably made so as not to deviate from a straight line.

As described above, according to the configuration of the housing 110 including the manipulation unit 140 and the guide hole 111, the multi-tester probe according to the present invention is easy to replace the probe, and safe storage of the probe pin is possible and handling is easy. It has the advantage of being easy.

Subsequently, the manipulation unit 140 includes a pressing unit 141 inserted into the multiple slit in a form protruding outward of the housing; and a return spring 142 at the connection portion with the probe 130 .

At this time, the pressing part 141 is a state protruding outward of the lower housing 110b in which the multiple slits are formed at the rear end of the operation part so as to facilitate the forward and backward operations of the operation unit 140, that is, press and return operations. It is preferable that a pressing part having a protrusion shape is provided so that the pressing operation can be easily performed.

In addition, when the manipulation unit 140 is advanced in the axial direction on the multiple slits to protrude the probe pin 133 at the tip of the probe out of the housing through the guide hole 111, the protruding probe must be maintained in a fixed state. Measurements can be made. Accordingly, the front end of the multiple slits may be provided with a locking protrusion 113 for fixing the manipulation unit 140 in an advanced state.

In addition, guide rails are formed on the inner circumferential surface of the multiple slit 112 to which the manipulation unit 140 slides forward and backward to correspond to the shape of the manipulation unit 140 so that the manipulation unit slides forward and backward on the multiple slits. .

According to the configuration of the manipulation unit 140 including the pressing part 141 and the return spring 142 and the configuration of the multiple slit 112 by the locking jaw 113, the pressing part is the front end of the multiple slits. When it advances so as to be caught on the locking jaw 113 formed in the , the probe protrudes, and when the pressing part is released from the locking jaw, the operation unit and the probe are returned to their original positions by the operation of the return spring 142 .

In the above configuration, the plurality of probes 130 are individually protruded to the outside of the housing through the guide hole 111, and the probe pins 133 having different contact areas and shapes are attached to the tip of the plurality of probes to the test object (P). It is provided as a protrusion means for selectively protruding and re-inserting the housing in the axial direction according to the purpose of the housing.

As such, in the multi-tester probe of the present invention, the user can freely select a probe 130 having a probe pin 133 suitable for the working environment of the subject among the plurality of probes 130, and the working environment and the type of the subject are different. It is characterized by being able to quickly replace a probe pin of a different shape in a one-touch method even if it is changed.

Referring to FIG. 4 , the user selects one of the plurality of probes 130 connected thereto by controlling the manipulation unit 140 connected to the rear end of the probe among the probes 130 combined with the probe pins 133 of different shapes. to protrude out of the housing through the guide hole 111 (see FIGS. 2 and 3).

At this time, since the guide hole 111 is formed at the tip of the upper housing 110a according to the present invention in a shape that the cross-sectional area becomes narrower toward the front end, FIG. 4 of the plurality of manipulation units 140 inserted into the multiple slits 112 If one is selected and moved forward in the longitudinal direction, that is, in the axial direction of the housing, one of the probes 130 connected to the manipulation unit moves toward the front of the housing and protrudes out of the housing through the guide hole 111 .

The plurality of probes 130 are radially inserted into the insertion hole 121 of the jig 120 and a plurality of manipulation units 140 are individually coupled to the rear end of the probe to control the forward and backward reciprocating motion of the probe. And the principle of operation will be described in more detail with reference to FIG. 4 as follows.

The protrusion and re-entry process of the probe pin of the present invention is made by controlling the user's temporary manipulation unit 140 .

First, when the user pushes the pressing part 141 of the manipulation unit 140 connected to the desired probe among the manipulation units 140 individually connected to the probe in order to selectively protrude the probe provided with the desired probe pin to advance in the axial direction, the manipulation unit is caught. It is caught on the jaw 113, and the probe pin maintains a state protruding out of the guide hole 111.

Subsequently, the probe pin 133 formed at the tip of the probe is protruded from the guide hole 111 by the forward movement of the manipulation unit 140 so that it comes into contact with the subject P and after measurement is made, the manipulation unit 140 is operated. By retracting into the housing by moving backward, the probe pin 133 is prevented from being damaged while protecting the operator from safety accidents.

To this end, when the user presses the manipulator 140 stuck in the engaging unit in the forward state again to release it from the engaging jaw 113, the manipulation unit 140 moves backward along the multiple slits by the elastic restoring force of the return spring. The probe pin is retracted into the upper housing along the guide hole by providing the force to return to its original position.

As described above, the present invention makes it possible to easily control the protrusion and re-entry of the probe pin 133 provided at the tip of the probe and the pro part in a one-touch manner by the probe protruding means as described above.

In particular, when not in use, since the pointed probe pin 133 is stored embedded in the upper housing 110a, it is possible to prevent the user from being pierced by the pointed probe pin or bent or broken by an external impact. In addition, if you want to use a tester, you can operate the manipulation unit 140 according to the shape and purpose of the subject P, which is the measurement object, and selectively protrude the probe 130 connected with a probe pin suitable for the subject to ensure safe measurement. make it happen

Meanwhile, in the present invention, the number of insertion holes 121 of the jig into which the plurality of probes 130 are individually inserted, the manipulation unit 140 to which the plurality of probes are individually connected, and the number of slits into which the manipulation units are individually inserted are the same in the present invention. In the present invention, the number of the probe 130 , the probe pin 133 , the insertion hole 121 , the multiple slit 120 , and the manipulation unit 140 is not limited, but at least two or more are provided. can be

At this time, the plurality of insertion holes 121 are radially arranged based on the central axis of the jig 120 and accommodated in the housing.

In addition, the plurality of probes 130 are inserted into the insertion hole 121 of the jig 120 and are not fixed, and are provided to move forward and backward in the insertion hole according to the operation of the manipulation unit 140 , and are provided inside the housing 110 . automatically maintains the radial arrangement.

On the other hand, the length of the probe 130 and the probe pin 133, the shape and length of each of the manipulation unit 140 to which the probe 130 is connected, and the multi-slit 112 through which the manipulation unit slides forward and backward are necessarily symmetrical. does not need to be provided with This is because a long probe pin needs to be applied to measure the subject P when the working environment is narrow or cornered.

For example, there are cases where work must be performed in a narrow and narrow space where it is difficult to measure only with the length of a general tim pin, or there are cases where it is necessary to insert a long probe pin, such as a hole-formed subject (P).

In order to enable measurement work even in such an environment, some of the multiple slits 112 according to the present invention may have a longer length. In this case, the advancing distance of the probe connected thereto is increased as much as the length of the slit. Therefore, even a probe having a probe pin of the same length can protrude further forward by the shape of a multiple slit, so that measurement can be made in a work environment that requires a long probe pin.

As described above, the multi-tester probe according to the present invention is composed of a probe having a plurality of probe pins built-in compared to a conventional probe, and the user controls the protrusion and retraction of the probe pins, but one-touch method of the desired probe pins among the plurality of probe pins It has the effect of being able to selectively and quickly replace it.

In addition, it is possible to perform an efficient measurement operation suitable for the shape and work environment of the subject P, and to facilitate storage and handling, while improving the safety of the operator.

Although preferred embodiments of the present invention have been described with reference to the accompanying drawings as described above, those of ordinary skill in the art to which the present invention pertains will implement the present invention in other specific forms without changing the technical spirit or essential features thereof. It can be understood that Therefore, it should be understood that the embodiments described above are illustrative in all respects and not restrictive.

1: Multitester 3: Main unit
3a: display unit 3b: adjustment unit
3c: female terminal 4: probe
5: probe 6: handle
7: means 9, 90: lead wire
P: Subject w: Wire
110: housing 111: guide hole
112: multiple slit 113: jamming jaw
120: jig 121: insertion hole
130: probe 131: probe bar
132: elastic part 133: probe pin
140: operation unit 141: press unit
142: return spring 150: rear cap
151: coupling portion 152: adapter

Claims (5)

A plurality of probes 130 coupled to the tip of the probe pins 133 having different contact areas and shapes;
a housing 110 having a longitudinal hollow portion to accommodate the probe, and having multiple slits 112 arranged radially spaced apart from each other on an outer periphery of the housing 110;
a plurality of manipulation units 140 individually inserted into the multiple slits so as to be able to move forward and backward, one end of which is respectively connected to the rear end of the plurality of probes;
a jig 120 in which multiple insertion holes 121 of the same radial arrangement as the multiple slits are formed to insert the plurality of probes individually; includes
The housing 110 is
an upper housing 110a having a guide hole 111 through which the probe probe pin 133 protrudes or enters at the end in a shape that has a narrower cross-sectional area toward the front end;
and a lower housing (110b) detachably coupled to the other end of the upper housing and provided with the multiple slits (112);
The upper and lower housings are composed of an insulator, characterized in that the upper housing is an opaque material,
The lower housing 110b further includes a rear cap 150,
The rear cap includes a coupling part 151 detachably coupled to the rear end of the lower housing 110b on one side;
and an adapter 152 to which a lead wire 90 terminal is connected to the other side to be connected to the measuring instrument 3 ′ to send and receive electrical signals; and
The probe 130 may include a probe bar 131 of an acceptable length in the housing;
a probe pin 133 detachably coupled to the front end of the probe bar; and,
and an elastic part (132) provided between the probe bar and the probe pin to vary the interval (d) with an elastic force. delete delete delete According to claim 1,
The operation unit 140,
a pressing portion 141 inserted into the multiple slit in a form protruding outward of the housing; and,
a return spring 142 at the connection portion with the probe 130; and
When the pressing part is advanced so as to be caught by the locking jaws 113 formed at the front end of the multiple slits, the probe protrudes. multi-tester probe.

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