KR102377193B1 - 패널 검사장치 - Google Patents

패널 검사장치 Download PDF

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Publication number
KR102377193B1
KR102377193B1 KR1020200099623A KR20200099623A KR102377193B1 KR 102377193 B1 KR102377193 B1 KR 102377193B1 KR 1020200099623 A KR1020200099623 A KR 1020200099623A KR 20200099623 A KR20200099623 A KR 20200099623A KR 102377193 B1 KR102377193 B1 KR 102377193B1
Authority
KR
South Korea
Prior art keywords
testing panel
testing
panel
Prior art date
Application number
KR1020200099623A
Other languages
English (en)
Other versions
KR20210157272A (ko
Inventor
남현우
이초롱
Original Assignee
남현우
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 남현우 filed Critical 남현우
Publication of KR20210157272A publication Critical patent/KR20210157272A/ko
Application granted granted Critical
Publication of KR102377193B1 publication Critical patent/KR102377193B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/05—Flexible printed circuits [FPCs]
KR1020200099623A 2020-06-19 2020-08-10 패널 검사장치 KR102377193B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020200075198 2020-06-19
KR20200075198 2020-06-19

Publications (2)

Publication Number Publication Date
KR20210157272A KR20210157272A (ko) 2021-12-28
KR102377193B1 true KR102377193B1 (ko) 2022-03-22

Family

ID=79178324

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020200099623A KR102377193B1 (ko) 2020-06-19 2020-08-10 패널 검사장치

Country Status (1)

Country Link
KR (1) KR102377193B1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102399196B1 (ko) * 2022-03-31 2022-05-18 주식회사 프로이천 베어링을 포함하는 핀보드

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101309621B1 (ko) * 2011-12-23 2013-09-17 주식회사 케이피에스 디스플레이 패널 검사용 프로브 유니트
KR101255094B1 (ko) * 2013-01-30 2013-04-23 주식회사 프로이천 분리형 필름타입 프로브 블록
KR200471343Y1 (ko) * 2013-06-10 2014-02-25 주식회사 프로이천 수직형 매니퓰레이터
KR101907447B1 (ko) * 2017-01-13 2018-10-12 주식회사 이엘피 표시 패널 검사 장치
KR101954744B1 (ko) * 2017-09-14 2019-05-23 (주)디이엔티 Oled 패널 검사용 펠릿
KR101961692B1 (ko) 2018-08-03 2019-07-17 주식회사 프로이천 디스플레이 패널의 테스트 장치
KR102004441B1 (ko) * 2019-03-25 2019-07-29 주식회사 프로이천 핀 보드 조립체

Also Published As

Publication number Publication date
KR20210157272A (ko) 2021-12-28

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GRNT Written decision to grant