KR102345172B1 - 기판 탈가스용 챔버 - Google Patents

기판 탈가스용 챔버 Download PDF

Info

Publication number
KR102345172B1
KR102345172B1 KR1020187029133A KR20187029133A KR102345172B1 KR 102345172 B1 KR102345172 B1 KR 102345172B1 KR 1020187029133 A KR1020187029133 A KR 1020187029133A KR 20187029133 A KR20187029133 A KR 20187029133A KR 102345172 B1 KR102345172 B1 KR 102345172B1
Authority
KR
South Korea
Prior art keywords
slit
workpiece
pockets
chamber
pocket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020187029133A
Other languages
English (en)
Korean (ko)
Other versions
KR20180123522A (ko
Inventor
로기어 로데르
마르틴 쉐페르
위르겐 바이카르트
Original Assignee
에바텍 아크티엔게젤샤프트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에바텍 아크티엔게젤샤프트 filed Critical 에바텍 아크티엔게젤샤프트
Publication of KR20180123522A publication Critical patent/KR20180123522A/ko
Application granted granted Critical
Publication of KR102345172B1 publication Critical patent/KR102345172B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67109Apparatus for thermal treatment mainly by convection
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D5/00Supports, screens or the like for the charge within the furnace
    • F27D5/0037Supports specially adapted for semi-conductors
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D9/00Cooling of furnaces or of charges therein
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67161Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
    • H01L21/67178Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67303Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67303Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
    • H01L21/67309Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements characterized by the substrate support
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/58After-treatment
    • C23C14/5806Thermal treatment
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D9/00Cooling of furnaces or of charges therein
    • F27D2009/007Cooling of charges therein

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Tunnel Furnaces (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Vacuum Packaging (AREA)
KR1020187029133A 2016-03-08 2016-03-08 기판 탈가스용 챔버 Active KR102345172B1 (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2016/054909 WO2017152958A1 (en) 2016-03-08 2016-03-08 Chamber for degassing substrates

Publications (2)

Publication Number Publication Date
KR20180123522A KR20180123522A (ko) 2018-11-16
KR102345172B1 true KR102345172B1 (ko) 2021-12-31

Family

ID=55527913

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020187029133A Active KR102345172B1 (ko) 2016-03-08 2016-03-08 기판 탈가스용 챔버

Country Status (6)

Country Link
US (2) US11776825B2 (enExample)
EP (1) EP3427291B1 (enExample)
JP (1) JP6800237B2 (enExample)
KR (1) KR102345172B1 (enExample)
CN (1) CN108780766B (enExample)
WO (1) WO2017152958A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10998209B2 (en) 2019-05-31 2021-05-04 Applied Materials, Inc. Substrate processing platforms including multiple processing chambers
US11901198B2 (en) * 2019-07-12 2024-02-13 Axcelis Technologies, Inc. Toxic outgas control post process
KR102707382B1 (ko) * 2020-06-10 2024-09-13 삼성전자주식회사 매거진 지지 장치 및 이를 포함하는 반도체 제조 장비
US12080571B2 (en) 2020-07-08 2024-09-03 Applied Materials, Inc. Substrate processing module and method of moving a workpiece
US11749542B2 (en) 2020-07-27 2023-09-05 Applied Materials, Inc. Apparatus, system, and method for non-contact temperature monitoring of substrate supports
US11817331B2 (en) 2020-07-27 2023-11-14 Applied Materials, Inc. Substrate holder replacement with protective disk during pasting process
US11747660B2 (en) * 2020-07-28 2023-09-05 HKC Corporation Limited Degassing machine and degassing system
US11600507B2 (en) 2020-09-09 2023-03-07 Applied Materials, Inc. Pedestal assembly for a substrate processing chamber
US11610799B2 (en) 2020-09-18 2023-03-21 Applied Materials, Inc. Electrostatic chuck having a heating and chucking capabilities
US12195314B2 (en) 2021-02-02 2025-01-14 Applied Materials, Inc. Cathode exchange mechanism to improve preventative maintenance time for cluster system
US11674227B2 (en) 2021-02-03 2023-06-13 Applied Materials, Inc. Symmetric pump down mini-volume with laminar flow cavity gas injection for high and low pressure
US12002668B2 (en) 2021-06-25 2024-06-04 Applied Materials, Inc. Thermal management hardware for uniform temperature control for enhanced bake-out for cluster tool
CN119465018B (zh) * 2025-01-13 2025-04-18 上海陛通半导体能源科技股份有限公司 一种用于pvd设备的脱气腔
CN119465019B (zh) * 2025-01-13 2025-04-18 上海陛通半导体能源科技股份有限公司 一种半导体元器件高温脱气之后快速冷却装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000504876A (ja) 1996-02-16 2000-04-18 イートン コーポレーション 加工物にイオン注入するためのイオン注入装置
US7381052B2 (en) 2002-01-24 2008-06-03 Applied Materials, Inc. Apparatus and method for heating substrates

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3656454A (en) 1970-11-23 1972-04-18 Air Reduction Vacuum coating apparatus
US5607009A (en) 1993-01-28 1997-03-04 Applied Materials, Inc. Method of heating and cooling large area substrates and apparatus therefor
FR2747112B1 (fr) * 1996-04-03 1998-05-07 Commissariat Energie Atomique Dispositif de transport d'objets plats et procede de transfert de ces objets entre ledit dispositif et une machine de traitement
US6602348B1 (en) * 1996-09-17 2003-08-05 Applied Materials, Inc. Substrate cooldown chamber
US6460369B2 (en) 1999-11-03 2002-10-08 Applied Materials, Inc. Consecutive deposition system
SG185822A1 (en) 2000-02-01 2012-12-28 Tokyo Electron Ltd Substrate processing apparatus and substrate processing method
US6698718B2 (en) * 2001-08-29 2004-03-02 Wafermasters, Inc. Rotary valve
JP4821074B2 (ja) 2001-08-31 2011-11-24 東京エレクトロン株式会社 処理システム
US6497734B1 (en) * 2002-01-02 2002-12-24 Novellus Systems, Inc. Apparatus and method for enhanced degassing of semiconductor wafers for increased throughput
JP4319434B2 (ja) * 2003-03-11 2009-08-26 東京エレクトロン株式会社 ゲートバルブ及び真空容器
US7282097B2 (en) * 2004-06-14 2007-10-16 Applied Materials, Inc. Slit valve door seal
KR20060033234A (ko) 2004-10-14 2006-04-19 삼성전자주식회사 급속 열처리 장치
US20060156979A1 (en) 2004-11-22 2006-07-20 Applied Materials, Inc. Substrate processing apparatus using a batch processing chamber
US20060127067A1 (en) 2004-12-13 2006-06-15 General Electric Company Fast heating and cooling wafer handling assembly and method of manufacturing thereof
US7665951B2 (en) * 2006-06-02 2010-02-23 Applied Materials, Inc. Multiple slot load lock chamber and method of operation
WO2008144670A1 (en) * 2007-05-18 2008-11-27 Brooks Automation, Inc. Load lock fast pump vent
CN101620988A (zh) * 2008-06-30 2010-01-06 佳能安内华股份有限公司 堆叠装载锁定室及包含其的衬底处理设备
US8420981B2 (en) 2009-11-13 2013-04-16 Tel Nexx, Inc. Apparatus for thermal processing with micro-environment
US20120220116A1 (en) 2011-02-25 2012-08-30 Applied Materials, Inc. Dry Chemical Cleaning For Semiconductor Processing
US20120285621A1 (en) * 2011-05-10 2012-11-15 Applied Materials, Inc. Semiconductor chamber apparatus for dielectric processing
KR101898677B1 (ko) * 2012-04-30 2018-09-13 삼성전자주식회사 멀티 스택 큐어 시스템 및 그 운전 방법
KR101224520B1 (ko) * 2012-06-27 2013-01-22 (주)이노시티 프로세스 챔버
US20140273525A1 (en) 2013-03-13 2014-09-18 Intermolecular, Inc. Atomic Layer Deposition of Reduced-Leakage Post-Transition Metal Oxide Films
WO2014143846A1 (en) * 2013-03-15 2014-09-18 Applied Materials, Inc Multi-position batch load lock apparatus and systems and methods including same
US9245767B2 (en) * 2013-09-12 2016-01-26 Applied Materials, Inc. Anneal module for semiconductor wafers
US9349620B2 (en) 2014-07-09 2016-05-24 Asm Ip Holdings B.V. Apparatus and method for pre-baking substrate upstream of process chamber
CN110120360B (zh) * 2014-12-11 2023-01-13 瑞士艾发科技 用于衬底脱气的室
US10403552B1 (en) * 2018-04-02 2019-09-03 Varian Semiconductor Equipment Associates, Inc. Replacement gate formation with angled etch and deposition

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000504876A (ja) 1996-02-16 2000-04-18 イートン コーポレーション 加工物にイオン注入するためのイオン注入装置
US7381052B2 (en) 2002-01-24 2008-06-03 Applied Materials, Inc. Apparatus and method for heating substrates

Also Published As

Publication number Publication date
EP3427291B1 (en) 2022-04-13
CN108780766B (zh) 2022-03-04
KR20180123522A (ko) 2018-11-16
JP6800237B2 (ja) 2020-12-16
EP3427291A1 (en) 2019-01-16
US11776825B2 (en) 2023-10-03
WO2017152958A1 (en) 2017-09-14
JP2019515484A (ja) 2019-06-06
CN108780766A (zh) 2018-11-09
US20190096715A1 (en) 2019-03-28
US20230395402A1 (en) 2023-12-07

Similar Documents

Publication Publication Date Title
KR102345172B1 (ko) 기판 탈가스용 챔버
CN102934214B (zh) 装载闸批式臭氧硬化
US8246284B2 (en) Stacked load-lock apparatus and method for high throughput solar cell manufacturing
JP2012501549A (ja) 大面積基板処理システム用ロードロックチャンバ
CN109314071B (zh) 十二边形传送腔室和具有十二边形传送腔室的处理系统
KR20140058370A (ko) 기판 처리 장치
US10580671B2 (en) Chamber for degassing substrates
TW201347067A (zh) 加載互鎖裝置
TWI703637B (zh) 熱處理腔室、包括該腔室之設備、工件處理系統及製造熱處理工件的方法
WO2018171908A1 (en) Apparatus for loading a substrate in a vacuum processing system, system for processing a substrate, and method for loading a substrate

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20181008

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20201217

Comment text: Request for Examination of Application

A302 Request for accelerated examination
PA0302 Request for accelerated examination

Patent event date: 20201223

Patent event code: PA03022R01D

Comment text: Request for Accelerated Examination

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20210401

Patent event code: PE09021S01D

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20211018

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 20211227

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 20211228

End annual number: 3

Start annual number: 1

PG1601 Publication of registration
PR1001 Payment of annual fee

Payment date: 20241120

Start annual number: 4

End annual number: 4