KR102293806B1 - 메모리 판독 액세스들 동안 전력 글리치들을 감소시키기 위한 정적 랜덤 액세스 메모리(sram) 글로벌 비트라인 회로들 및 관련 방법들 및 시스템들 - Google Patents
메모리 판독 액세스들 동안 전력 글리치들을 감소시키기 위한 정적 랜덤 액세스 메모리(sram) 글로벌 비트라인 회로들 및 관련 방법들 및 시스템들 Download PDFInfo
- Publication number
- KR102293806B1 KR102293806B1 KR1020167016777A KR20167016777A KR102293806B1 KR 102293806 B1 KR102293806 B1 KR 102293806B1 KR 1020167016777 A KR1020167016777 A KR 1020167016777A KR 20167016777 A KR20167016777 A KR 20167016777A KR 102293806 B1 KR102293806 B1 KR 102293806B1
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- South Korea
- Prior art keywords
- sram
- bitline
- global bitline
- data
- global
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/419—Read-write [R-W] circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1048—Data bus control circuits, e.g. precharging, presetting, equalising
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/18—Bit line organisation; Bit line lay-out
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Static Random-Access Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/090,288 US9019752B1 (en) | 2013-11-26 | 2013-11-26 | Static random access memory (SRAM) global bitline circuits for reducing power glitches during memory read accesses, and related methods and systems |
| US14/090,288 | 2013-11-26 | ||
| PCT/US2014/067269 WO2015081056A1 (en) | 2013-11-26 | 2014-11-25 | Static random access memory (sram) global bitline circuits for reducing power glitches during memory read accesses, and related methods and systems |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20160089473A KR20160089473A (ko) | 2016-07-27 |
| KR102293806B1 true KR102293806B1 (ko) | 2021-08-24 |
Family
ID=52023690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167016777A Active KR102293806B1 (ko) | 2013-11-26 | 2014-11-25 | 메모리 판독 액세스들 동안 전력 글리치들을 감소시키기 위한 정적 랜덤 액세스 메모리(sram) 글로벌 비트라인 회로들 및 관련 방법들 및 시스템들 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9019752B1 (enExample) |
| EP (3) | EP3757998A1 (enExample) |
| JP (1) | JP6639391B2 (enExample) |
| KR (1) | KR102293806B1 (enExample) |
| CN (1) | CN105765661B (enExample) |
| ES (1) | ES2733375T3 (enExample) |
| HU (1) | HUE043832T2 (enExample) |
| WO (1) | WO2015081056A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10446201B2 (en) * | 2017-06-26 | 2019-10-15 | Samsung Electronics Co., Ltd. | Distributed global-bitline keeper/precharge/header circuit for low voltage operation |
| US10147483B1 (en) * | 2017-09-19 | 2018-12-04 | Qualcomm Incorporated | Robust write driver scheme for static random access memory compilers |
| US10783938B2 (en) | 2018-06-29 | 2020-09-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | SRAM with local bit line, input/output circuit, and global bit line |
| US10741263B2 (en) * | 2018-12-31 | 2020-08-11 | Micron Technology, Inc. | Standby biasing techniques to reduce read disturbs |
| US10984843B2 (en) | 2019-03-01 | 2021-04-20 | International Business Machines Corporation | RAM memory with pre-charging circuitry coupled to global bit-lines and method for reducing power consumption |
| US11615837B2 (en) | 2020-09-22 | 2023-03-28 | Qualcomm Incorporated | Pseudo-triple-port SRAM datapaths |
| US12400690B2 (en) * | 2022-08-10 | 2025-08-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Global boosting circuit |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070171747A1 (en) * | 2006-01-23 | 2007-07-26 | Freescale Semiconductor, Inc. | Memory and method for sensing data in a memory using complementary sensing scheme |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4721776B2 (ja) * | 2004-07-13 | 2011-07-13 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
| US7167385B2 (en) * | 2005-02-11 | 2007-01-23 | International Business Machines Corporation | Method and apparatus for controlling the timing of precharge in a content addressable memory system |
| US7440335B2 (en) * | 2006-05-23 | 2008-10-21 | Freescale Semiconductor, Inc. | Contention-free hierarchical bit line in embedded memory and method thereof |
| US7423900B2 (en) * | 2006-11-15 | 2008-09-09 | Sony Computer Entertainment Inc. | Methods and apparatus for low power SRAM using evaluation circuit |
| US7679979B1 (en) | 2008-08-30 | 2010-03-16 | Fronteon Inc | High speed SRAM |
| US7668037B2 (en) | 2007-11-06 | 2010-02-23 | International Business Machines Corporation | Storage array including a local clock buffer with programmable timing |
| JP5418207B2 (ja) * | 2009-12-24 | 2014-02-19 | 富士通セミコンダクター株式会社 | 半導体メモリ、半導体メモリの動作方法およびシステム |
| US8325543B2 (en) | 2010-02-26 | 2012-12-04 | International Business Machines Corporation | Global bit select circuit interface with false write through blocking |
| US8345497B2 (en) | 2010-06-23 | 2013-01-01 | International Business Machines Corporation | Internal bypassing of memory array devices |
| US8599642B2 (en) | 2010-06-23 | 2013-12-03 | International Business Machines Corporation | Port enable signal generation for gating a memory array device output |
| US8587990B2 (en) * | 2010-07-12 | 2013-11-19 | International Business Machines Corporation | Global bit line restore by most significant bit of an address line |
| JP5505274B2 (ja) * | 2010-11-22 | 2014-05-28 | 富士通セミコンダクター株式会社 | スタティックram |
| US8422313B2 (en) | 2010-12-16 | 2013-04-16 | International Business Machines Corporation | Reduced power consumption memory circuitry |
| JP5776418B2 (ja) * | 2011-07-29 | 2015-09-09 | 富士通セミコンダクター株式会社 | 半導体記憶装置及び半導体記憶装置の制御方法 |
| US8934308B2 (en) | 2011-10-14 | 2015-01-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Tracking bit cell |
| US8755239B2 (en) | 2011-11-17 | 2014-06-17 | Texas Instruments Incorporated | Read assist circuit for an SRAM |
-
2013
- 2013-11-26 US US14/090,288 patent/US9019752B1/en active Active
-
2014
- 2014-11-25 EP EP20191521.2A patent/EP3757998A1/en active Pending
- 2014-11-25 WO PCT/US2014/067269 patent/WO2015081056A1/en not_active Ceased
- 2014-11-25 ES ES14812101T patent/ES2733375T3/es active Active
- 2014-11-25 EP EP19169671.5A patent/EP3531422A1/en not_active Withdrawn
- 2014-11-25 EP EP14812101.5A patent/EP3074980B1/en active Active
- 2014-11-25 JP JP2016533547A patent/JP6639391B2/ja active Active
- 2014-11-25 CN CN201480062055.3A patent/CN105765661B/zh active Active
- 2014-11-25 KR KR1020167016777A patent/KR102293806B1/ko active Active
- 2014-11-25 HU HUE14812101A patent/HUE043832T2/hu unknown
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070171747A1 (en) * | 2006-01-23 | 2007-07-26 | Freescale Semiconductor, Inc. | Memory and method for sensing data in a memory using complementary sensing scheme |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2016537760A (ja) | 2016-12-01 |
| US9019752B1 (en) | 2015-04-28 |
| EP3757998A1 (en) | 2020-12-30 |
| CN105765661A (zh) | 2016-07-13 |
| EP3074980B1 (en) | 2019-04-17 |
| JP6639391B2 (ja) | 2020-02-05 |
| ES2733375T3 (es) | 2019-11-28 |
| CN105765661B (zh) | 2018-08-28 |
| HUE043832T2 (hu) | 2019-09-30 |
| EP3074980A1 (en) | 2016-10-05 |
| WO2015081056A1 (en) | 2015-06-04 |
| KR20160089473A (ko) | 2016-07-27 |
| EP3531422A1 (en) | 2019-08-28 |
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Legal Events
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| PA0105 | International application |
Patent event date: 20160623 Patent event code: PA01051R01D Comment text: International Patent Application |
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Patent event code: PA02012R01D Patent event date: 20191111 Comment text: Request for Examination of Application |
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| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20201021 Patent event code: PE09021S01D |
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| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20210524 |
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| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20210819 Patent event code: PR07011E01D |
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| PR1002 | Payment of registration fee |
Payment date: 20210819 End annual number: 3 Start annual number: 1 |
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