KR102277568B1 - Organic light emitting display - Google Patents

Abstract

The present invention includes a plurality of pixels including an organic light emitting diode and two or more driving transistors, wherein each of the plurality of pixels includes two or more branches serving as drains of the two or more driving transistors, and the two or more branches; A first integrated electrode having one connected stem, two or more branches serving as sources of each of the two or more driving transistors, and a second integrated electrode having one stem connected to the two or more branches It relates to an organic light emitting display device, characterized in that formed spaced apart.

Description

Organic light emitting display device {ORGANIC LIGHT EMITTING DISPLAY}

The present invention relates to an organic light emitting display device.

Recently, an organic light emitting display device, which has been spotlighted as a display device, has advantages such as fast response speed, luminous efficiency, luminance, and viewing angle by using an organic light emitting diode (OLED) that emits light by itself.

In such an organic light emitting display device, pixels including organic light emitting diodes are arranged in a matrix form, and the brightness of pixels selected by a scan signal is controlled according to a gray level of data.

Each pixel of the organic light emitting display device includes an organic light emitting diode and a driving transistor for controlling the luminance of a screen by flowing a current through the organic light emitting diode.

The driving transistor in each pixel is made through many processes, and at this time, minute process-induced foreign material(s) may be generated in the driving transistor. As such, when a foreign material is generated in the driving transistor, in particular, the source (Source) of the driving transistor ) - When a foreign material is generated between the drain, a short circuit occurs between the source and the drain, and accordingly, the driving transistor DT is very affected by the voltage difference between the source and the drain regardless of the gate voltage. A large current flows.

Due to this phenomenon, the pixel including the driving transistor in which the foreign material is generated becomes a very bright bright spot compared to other pixels, and becomes a bad pixel.

In the prior art, the bad pixels that became such bright spots were darkened so as not to be easily recognized by the naked eye, and the bad pixels were repaired. That is, the conventional pixel repair method is a method of making a bad pixel that has become a bright spot into an abnormal pixel that has become a dark spot.

In this conventional repair method for defective pixels, the larger the size of the repaired pixel by darkening, or the more repaired pixels by darkening, the more prominently the repaired pixel by darkening, and the screen quality is seriously deteriorated. In a serious case, there has been a problem in that the display panel itself must be discarded.

Against this background, it is an object of the present invention to provide an organic light emitting display device having a driving transistor structure capable of efficient repair processing.

Another object of the present invention is to provide a new concept of pixel repair that does not deteriorate screen quality and does not require discarding of a display panel even when the size or number of repaired pixels is increased.

Another object of the present invention is to provide an organic light emitting display device having a repairable pixel structure and a driving transistor structure so that a bad pixel can operate like a normal pixel.

Another object of the present invention is to provide an organic light emitting display device that compensates for a decrease in luminance that may occur after repairing a defective pixel to a normal pixel.

In order to achieve the above object, in one aspect, the present invention includes a plurality of pixels including an organic light emitting diode and two or more driving transistors, wherein each of the plurality of pixels has a drain of each of the two or more driving transistors. A first integrated electrode formed by connecting two or more branches and one stem to be connected, and two or more branches serving as sources of each of the two or more driving transistors are connected to each other, There is provided an organic light emitting display device, characterized in that the formed second integrated electrodes are spaced apart.

In another aspect, the present invention provides a display panel comprising: a display panel in which a plurality of pixels are defined according to intersections of data lines and gate lines; and a data driver supplying a data signal to the data lines, wherein each of the plurality of pixels includes an organic light emitting diode and n (n≥2) driving transistors, wherein at least one of the plurality of pixels includes: , among the n driving transistors, only m (1≤m<n) driving transistors supply current to the organic light emitting diode.

As described above, according to the present invention, there is an effect of providing an organic light emitting display device having a driving transistor structure capable of efficient repair processing.

Further, according to the present invention, even if the size or number of repaired pixels is increased, the screen quality is not deteriorated and there is an effect of providing a new concept of pixel repair in which the display panel is not discarded.

In addition, according to the present invention, there is an effect of providing an organic light emitting display device having a repairable pixel structure and a driving transistor structure so that a bad pixel can operate like a normal pixel.

In addition, according to the present invention, there is an effect of providing an organic light emitting display device that compensates for a decrease in luminance that may occur after repairing a defective pixel to a normal pixel.

1 is a diagram schematically illustrating an organic light emitting display device according to an exemplary embodiment.
2 is a diagram illustrating repair of a bad pixel to a normal pixel in an organic light emitting display panel according to an exemplary embodiment.
3 is a diagram schematically illustrating a repairable pixel structure in an organic light emitting display panel according to an exemplary embodiment.
4 to 6 are exemplary views of a structure of a driving transistor in a repairable pixel in an organic light emitting display panel according to an exemplary embodiment.
7 is an equivalent circuit diagram of a pixel of an organic light emitting display panel according to an exemplary embodiment.
8 to 10 are diagrams for explaining a repairable pixel structure and a repair method in an organic light emitting display panel according to an exemplary embodiment.
11 is an equivalent circuit diagram of a repaired pixel in an organic light emitting display panel according to an exemplary embodiment.
12 is a diagram illustrating compensating for a decrease in luminance of a repaired pixel in an organic light emitting display panel according to an exemplary embodiment.
13 is a diagram illustrating a pixel structure, a sensing unit, and a compensating unit for compensating for a decrease in luminance of a repaired pixel in an organic light emitting display panel according to an exemplary embodiment.
14 is a timing diagram of a sensing mode for compensating for a decrease in luminance of a repaired pixel in an organic light emitting display panel according to an exemplary embodiment.
15 to 18 are circuit diagrams illustrating operation of each step of a sensing mode for compensating for a decrease in luminance of a repaired pixel in an organic light emitting display panel according to an exemplary embodiment.
19 is a diagram illustrating luminance according to whether or not a luminance reduction compensation process of a repaired pixel is performed in an organic light emitting display panel according to an exemplary embodiment.
20 is a flowchart illustrating a method of driving an organic light emitting display device according to an exemplary embodiment.
21 is an exemplary diagram of a structure of a driving transistor in each pixel of an organic light emitting display device according to an exemplary embodiment.
22A to 22D are diagrams for explaining structural features related to repair in the transistor structure of FIG. 21 .
23 is another exemplary diagram of a structure of a driving transistor in each pixel of an organic light emitting display device according to an exemplary embodiment.
24A to 24D are diagrams for explaining structural features related to repair in the transistor structure of FIG. 23 .

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, some embodiments of the present invention will be described in detail with reference to exemplary drawings. In adding reference numerals to components of each drawing, the same components may have the same reference numerals as much as possible even though they are indicated in different drawings. In addition, in describing the present invention, if it is determined that a detailed description of a related known configuration or function may obscure the gist of the present invention, the detailed description may be omitted.

In addition, in describing the components of the present invention, terms such as first, second, A, B, (a), (b), etc. may be used. These terms are only for distinguishing the elements from other elements, and the essence, order, order, or number of the elements are not limited by the terms. When it is described that a component is “connected”, “coupled” or “connected” to another component, the component may be directly connected or connected to the other component, but other components may be interposed between each component. It will be understood that each component may be “interposed” or “connected”, “coupled” or “connected” through another component.

1 is a diagram schematically illustrating an organic light emitting display device 100 according to an exemplary embodiment.

Referring to FIG. 1 , in an organic light emitting display device 100 according to an exemplary embodiment, a plurality of pixels (P: Pixels) according to intersections of data lines DL1 to DLm and gate lines GL1 to GLn The display panel 110 in which is defined, the data driver 120 supplying data signals to the data lines DL1 to DLm according to the control signal of the timing controller 140 , and the control signal of the timing controller 140 . Accordingly, it includes a gate driver 130 that supplies scan signals to the gate lines GL1 to GLn, and a timing controller 140 that controls driving of the data driver 120 and the gate driver 130 .

Here, the gate driver 130 may be attached to one side of the display panel 110 by, for example, a tape automated bonding (TAB) method, or may be attached to one side of the display panel 110 by a gate drive IC in panel (GIP) method. It may be formed directly on one side.

Each of the plurality of pixels P defined according to the intersection of the data lines DL1 to DLm and the gate lines GL1 to GLn in the display panel 110 includes an organic light-emitting diode (OLED) and and a driving transistor (DT) for controlling the luminance of the screen by flowing a current through the organic light emitting diode (OLED).

The driving transistor DT in each pixel P is made through many processes, and at this time, minute process-induced foreign material(s) may be generated in the driving transistor DT, and as such, the foreign material in the driving transistor DT When this occurs, in particular, when a foreign material is generated between the source and the drain of the driving transistor DT, a short occurs between the source and the drain, and thus the source-drain regardless of the gate voltage. A very large current flows in the driving transistor DT due to the voltage difference between them.

Due to this phenomenon, the pixel including the driving transistor DT in which the foreign material is generated becomes a bright spot that is very bright compared to other pixels, and becomes a bad pixel. In the prior art, the bad pixels that became such bright spots were darkened so as not to be easily recognized by the naked eye, and the bad pixels were repaired. That is, the conventional pixel repair method is a method of darkening defective pixels that have become bright points to make them into abnormal pixels.

In the repair method of such a bad pixel, the larger the size of the repaired pixel is darkened, the more the repaired pixel is darkened, the more conspicuous it is. In severe cases, the display panel itself must be discarded.

Accordingly, an embodiment provides a repair method in which a bad pixel that becomes a bright point operates as a normal pixel (a pixel that emits a predetermined color), rather than the conventional repair method of darkening the bad pixel that has become a bright spot. That is, the pixel repair method according to an exemplary embodiment is a method of making a bad pixel that is a bright point into a normal pixel that emits a predetermined color.

The pixel repair according to the exemplary embodiment described herein may be performed during a panel manufacturing process before product shipment, or may be performed according to an after-sales service request from a customer after product shipment.

In order to apply the pixel repair method according to the exemplary embodiment, each of the plurality of pixels in the display panel 110 includes an organic light emitting diode (OLED) and n (n≥2) driving transistors DTs.

Also, in each of the plurality of pixels in the display panel 110 , n (n≧2) driving transistors DT are connected in parallel to each other and all operate to supply current to the organic light emitting diode OLED.

Meanwhile, in at least one of the plurality of pixels in the display panel 110 , a pixel defect occurs and a pixel repair process is performed, so that only m (1≤m<n) driving transistors among n driving transistors are organic light emitting diodes (OLEDs). OLED) can supply current. As described above, when only m (1≤m<n) driving transistors among n driving transistors (ie, two or more driving transistors) supply current to the organic light emitting diode (OLED), m driving transistors out of n driving transistors The transistor may be circuitly connected to the organic light emitting diode (OLED) and may be connected in parallel to each other to supply current to the organic light emitting diode (OLED).

However, the remaining driving transistors excluding m transistors among the n driving transistors are circuitly disconnected from the organic light emitting diode (OLED) through a pixel repair process. That is, the remaining driving transistors except for the m transistors among the n driving transistors are cut so as not to conduct a current to be supplied to the organic light emitting diode (OLED).

The pixel repair method according to the above-described exemplary embodiment is conceptually illustrated in FIG. 2 .

FIG. 2 is a diagram illustrating repair of a bad pixel to a normal pixel in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment.

Referring to FIG. 2 , in the display panel 110 of the organic light emitting display device 100 , for example, a plurality of pixels P are defined in a red-green-blue-white (RGBW) structure. Of course, a plurality of pixels P may be defined in a red-green-blue (RGB) structure.

Referring to FIG. 2 , for example, when a green (G) pixel becomes a bright point and becomes a bad pixel, when the repair according to an exemplary embodiment is performed, the bad pixel that becomes a bright point normally operates as a green (G) pixel.

In order to apply the pixel repair method according to the exemplary embodiment, each pixel P in the display panel 110 of the organic light emitting display device 100 according to the exemplary embodiment is subjected to the repair according to the exemplary embodiment. It has a possible pixel structure.

Such a repairable pixel structure will be briefly described with reference to FIG. 3 .

3 is a diagram schematically illustrating a repairable pixel structure in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment.

Referring to FIG. 3 , in the display panel 110 , each of the plurality of pixels P defined according to the intersection of the data lines DL1 to DLm and the gate lines GL1 to GLn is an organic light emitting diode (OLED). and two or more driving transistors DT1 and DT2 for receiving the driving voltage EVDD and simultaneously (together) connected to the organic light emitting diode OLED to drive the organic light emitting diode OLED, and the gate line GL. A switching transistor (SWT) controlled by a scan signal supplied through the data line DL and connected between the control terminals of the two or more driving transistors DT1 and DT2, and two or more driving transistors DT1 and DT2 and a storage capacitor (Cstg: Storage Capacitor) connected between the control terminal and the output terminal (or supply terminal) of the .

In FIG. 3 , each pixel P has two driving transistors DT connected to the organic light emitting diode OLED and connected in parallel to each other in order to drive the organic light emitting diode OLED. For convenience, in each pixel P, the driving transistors DT are simultaneously connected to the organic light emitting diodes (OLED) to drive the organic light emitting diodes (OLEDs). As long as they are connected in parallel, there are three driving transistors DT. It could be more than a dog. However, in the following, for convenience of description, each pixel P is connected together with the organic light emitting diode OLED to drive the organic light emitting diode OLED. In order to drive the organic light emitting diode OLED, two driving transistors DT1 , DT1 , DT2) is included.

The two or more driving transistors DT1 and DT2 may be n-type or p-type transistors, and depending on the type, a control terminal of each of the two or more driving transistors DT1 and DT2 is a gate, and the two or more driving transistors DT1 and DT2 Each supply terminal may be a drain or a source, and an output terminal of each of the two or more driving transistors DT1 and DT2 may be a source or a drain.

As described above, the two or more driving transistors DT1 and DT2 included in each pixel are connected in parallel to the organic light emitting diode (OLED).

Structures of two or more driving transistors DT1 and DT2 in each of these pixels are exemplarily shown in FIGS. 4 to 6 .

4 to 6 are exemplary views of a structure of a driving transistor in a repairable pixel in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment. However, it is assumed that two driving transistors DT1 and DT2 are included in each of the pixels P defined in the display panel 110 .

Referring to FIG. 4 , two driving transistors DT1 and DT2 included in each of the pixels P defined in the display panel 110 are connected in parallel to each other.

Among the two driving transistors, it is assumed that the control terminal of DT1 is the gate G1, the supply terminal is the drain D1, the output terminal is the source S1, the control terminal of DT2 among the two driving transistors is the gate G2, the supply terminal is the drain D2, and the output terminal is the output terminal. Referring to this source S2, the drain D1 of DT1 and the drain D2 of DT2 are connected to one, and the source S1 of DT1 and the source S2 of DT2 are connected to one.

Accordingly, the current Iin is supplied to the portion where the drain D1 of DT1 and the drain D2 of DT2 are connected, and a portion (Idt1) of the supplied current (Iin) flows from the drain D1 of DT1 to the source S1 and the remaining portion (Idt2) It flows from the drain D2 of DT2 to the source S2, and the source S1 of DT1 and the source S2 of DT2 are combined at the connection part and output to the organic light emitting diode (OLED).

The amount of current (Iin) supplied to the part where the drain D1 of DT1 and the drain D2 of DT2 are connected, and the current (Iout) output to the organic light emitting diode (OLED) by adding up at the part where the source S1 of DT1 and the source S2 of DT2 are connected The amount of current is the same. That is, it becomes a current relational expression such as "Iin = Idt1 + Idt2 = Iout".

Meanwhile, as shown in FIG. 4 , of the two driving transistors, a gate G1 that is a control terminal of DT1 and a gate G2 that is a control terminal of DT2 may be separate gates.

The gates G1 and G2, which are control terminals of the two driving transistors DT1 and DT2, respectively, may be formed as shown in FIG. 5 according to a formation method.

As shown in (a) of FIG. 5 (same as FIG. 4), the gates G1 and G2, which are control terminals of the two driving transistors DT1 and DT2, respectively, may be separately formed. Of course, in other positions, the gates G1 and G2, which are control terminals of the two driving transistors DT1 and DT2, are circuitly connected.

Also, as shown in (b) and (c) of FIG. 5 , gates G1 and G2 that are control terminals of the two driving transistors DT1 and DT2 may be formed in common.

On the other hand, the active layer of each of the two driving transistors DT1 and DT2 may be separately formed like the gate in FIG. 5 (a), like the gate in FIGS. 5 (b) and (c). It may be formed in common.

6 is another exemplary diagram of a structure of a driving transistor in a pixel capable of being repaired in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment, and a source S1 of each of the two driving transistors DT1 and DT2 is shown. Unlike FIGS. 4 and 5 in which S2) and the drains D1 and D2 have the same shape, the sources S1 and S2 and the drains D1 and D2 of the two driving transistors DT1 and DT2 have different shapes. may be made of

The structure of the driving transistor shown in FIG. 6 is called a U-type or a finger-type by imitating the shape of the drain structure (or the source structure).

In the driving transistor structure as shown in FIG. 6 , the two driving transistors DT1 and DT2 are connected in parallel.

Among the two driving transistors, it is assumed that the control terminal of DT1 is the gate G1, the supply terminal is the drain D1, the output terminal is the source S1, the control terminal of DT2 among the two driving transistors is the gate G2, the supply terminal is the drain D2, and the output terminal is the output terminal. Referring to this source S2, the drain D1 of DT1 and the drain D2 of DT2 are connected to one, and the source S1 of DT1 and the source S2 of DT2 are connected to one.

Accordingly, the current Iin is supplied to the portion where the drain D1 of DT1 and the drain D2 of DT2 are connected, and some of the current Iin supplied to the two driving transistors DT1 and DT2 (Idt1_in) is transferred from the drain D1 of DT1 to the source S1 and the remaining portion (Idt2_in) flows from the drain D2 of DT2 to the source S2, and is combined at a portion where the source S1 of DT1 and the source S2 of DT2 are connected and output as an organic light emitting diode (OLED).

Of the currents Iin supplied to the two driving transistors DT1 and DT2, the current Idt1_in flowing to DT1 is branched into Idt1a and Idt1b, and then merged into Idt1_out. Of the currents Iin supplied to the two driving transistors DT1 and DT2, the current Idt2_in flowing to DT2 is branched into Idt2a and Idt2b, and then merged into Idt2_out. The combined Idt1_out and Idt2_out are combined back into Iout at a portion where the source S1 of DT1 and the source S2 of DT2 are connected, and output to the organic light emitting diode (OLED).

The amount of current (Iin) supplied to the part where the drain D1 of DT1 and the drain D2 of DT2 are connected, and the current (Iout) output to the organic light emitting diode (OLED) by adding up at the part where the source S1 of DT1 and the source S2 of DT2 are connected The amount of current is the same. In addition, if the currents Idt1a and Idt1b branched in DT1 are summed, the current Idt1_in input to DT1 and the current Idt1_out output from DT1 are equal to each other. If the currents Idt2a and Idt2b branched in DT2 are summed, the current Idt2_in input to DT2 and the current Idt2_out output from DT2 are equal to each other. That is, a current relational expression such as "Iin = Idt1_in+Idt2_in = (Idt1a+Idt1b)+(Idt2a+Idt2b) = Idt1_out+Idta2_out = Iout" becomes a current relational expression.

4 to 6 are only examples of a structure of a driving transistor in which two or more driving transistors are connected in parallel so that repair is possible, and the structure of the driving transistor is not limited thereto. Any driving transistor structure can be designed as long as the branched current flows through the transistor, and the branched current flows to the organic light emitting diode (OLED).

An equivalent circuit diagram for each of the above-described pixel structures may be illustrated as shown in FIG. 7 .

Referring to FIG. 7 , the first driving transistor DT1 and the second driving transistor DT2 are connected in parallel, and the drains of each of the first driving transistor DT1 and the second driving transistor DT2 are connected to receive the driving voltage EVDD in common. , sources of the first driving transistor DT1 and the second driving transistor DT2 are connected in common to a first electrode (eg, an anode) of the organic light emitting diode (OLED). A gate of each drain of each of the first driving transistor DT1 and the second driving transistor DT2 is connected to the source of the switching transistor SWT.

Referring to FIG. 7 , a storage capacitor Cstg is connected between a gate and a source of each of the first driving transistor DT1 and the second driving transistor DT2 .

Referring to FIG. 7 , a gate of the switching transistor SWT is connected to the gate line GL to receive a scan signal SCAN, and a drain of the switching transistor SWT is a digital analog converter (DAC) in the data driver 120 . ), the analog data voltage is applied.

Meanwhile, in order to initialize the sources of the driving transistors DT1 and DT2 during the driving operation, a sensing transistor SENT supplying the reference voltage Vref to the sources of the driving transistors DT1 and DT2 may be connected.

Referring to FIG. 7 , a data line capacitor Cdl is formed on the data line DL.

When the plurality of pixels defined in the display panel 110 have the driving transistor structure and the pixel structure described above, and each of the plurality of pixels operates as a normal pixel, the two or more driving transistors DT1 and DT2 in each pixel are all It operates to drive an organic light emitting diode (OLED).

If a specific pixel becomes a bad pixel among a plurality of pixels, only some of the two or more driving transistors DT1 and DT2 may operate to drive the organic light emitting diode OLED.

In other words, when all of the plurality of pixels P defined in the display panel 110 are normal pixels before becoming bad pixels, the two or more driving transistors DT1 and DT2 included in each of all the pixels P are all operated. to drive an organic light emitting diode (OLED).

If a specific pixel among the plurality of pixels defined in the display panel 110 becomes a bad pixel, the two or more driving transistors DT1 and DT2 included in each of the remaining pixels other than the specific pixel operate to operate the corresponding organic light emitting diode ( OLED), but not all of the two or more driving transistors DT1 and DT2 included in a specific pixel operate, but some of the two or more driving transistors DT1 and DT2 do not operate and only the remaining part of the organic light emitting diode ( OLED) is driven.

In a specific pixel that has become a bad pixel, some of the two or more driving transistors DT1 and DT2 do not operate and only the other part operates to drive the organic light emitting diode (OLED), so that the specific pixel that has become a bad pixel is repaired, Accordingly, it operates like a normal pixel emitting a predetermined color.

Here, the specific pixel was a bad pixel that became a bright spot due to a foreign matter in at least one driving transistor among the two or more driving transistors DT1 and DT2. It is a pixel repaired to a normal pixel by driving the corresponding organic light emitting diode (OLED).

In order to repair a specific pixel that has become a bad pixel to operate as a normal pixel, according to an exemplary embodiment, at least one driving transistor having a foreign substance among two or more driving transistors DT1 and DT2 included in the specific pixel is circuitly removed. and has a driving transistor structure such that only the remaining driving transistors except for the at least one driving transistor in which the foreign material is generated operate.

A structure of a driving transistor in a pixel capable of being repaired according to an exemplary embodiment will be described.

Among the plurality of pixels defined in the display panel 110 , at least one driving transistor having a foreign substance among two or more driving transistors included in a specific pixel is cut in the circuit, so that the remainder except for at least one driving transistor having a foreign substance Only the driving transistor operates. Accordingly, a specific pixel that becomes a bright point and becomes a bad pixel operates as a normal pixel and is repaired.

8 is a repair diagram illustrating that, when a process foreign material is generated in the second driving transistor DT2, the second driving transistor DT2 is cut in a circuit and only the first driving transistor DT1 is operated to drive the organic light emitting diode (OLED). ) is an example diagram.

As described above, in order to circuitly cut at least one driving transistor in which a foreign material is generated among the two or more driving transistors in one pixel, at least one driving transistor in which the foreign material is generated can be cut in a circuit, one pixel In each of the two or more driving transistors, a cutting part that can be cut during pixel repair may be formed.

FIG. 9 shows two driving transistors DT1 and DT2 in which cut portions are formed to enable pixel repair.

FIG. 9A is a view illustrating that the cutting portions C1d, C1s, C2d, and C2s are formed in the driving transistor structure of FIG. 4 , and FIG. 9B is the cutting portion C1d in the driving transistor structure of FIG. 6 . , C1s, C2d, C2s) is a diagram showing the formation.

Referring to FIGS. 9A and 9B , in a plurality of pixels, one of a supply terminal (drain or source), an output terminal (source or drain), and a control terminal (gate) of two or more driving transistors DT1 and DT2, respectively. At least one or more cutting portions C1d, C1s, C2d, and C2s that can be cut during repair are formed.

Referring to FIGS. 9A and 9B , the cutting part is located between a point where the respective supply ends of the two or more driving transistors DT1 and DT2 are joined and each supply end, or the two or more driving transistors DT1, DT1, DT2) It can be said that it is located between the point where each output terminal is combined and each output terminal.

Referring to FIGS. 9A and 9B , the two or more driving transistors DT1 and DT2 can be cut without circuit damage only in the driving transistor in which a foreign material is generated among the two or more driving transistors DT1 and DT2 in the plurality of pixels. ) should be formed to be spaced apart more than a specified distance.

That is, in the plurality of pixels, the cutting portions C1d, C1s, C2d, and C2s formed in each of the two or more driving transistors DT1 and DT2 are formed to be spaced apart from each other by a predetermined distance or more.

Meanwhile, two or more driving transistors included in each of the plurality of pixels have the same transistor structural characteristics and related circuit characteristics. Here, the transistor structural characteristic information includes sizes, channel lengths, and channel widths of a control terminal (Gate), a supply terminal (Drain/Source), and an output terminal (Source/Drain) of each of two or more driving transistors.

Meanwhile, a gate of each of the two or more driving transistors DT1 and DT2 is one common gate electrode ( FIGS. 5B and 5C ) or different partial gate electrodes protruding from one gate electrode. (Fig. 4, Fig. 5 (a), Fig. 6) may be.

As illustrated in FIG. 9 , the driving transistor structure and the pixel in which cutting portions C1d, C1s, C2d, and C2s are formed to repair the pixel when a foreign material is generated in one of the two driving transistors DT1 and DT2 When a foreign material is generated in the second driving transistor DT2 among the two or more driving transistors DT1 and DT2 of a specific pixel among a plurality of pixels having a structure, the second driving transistor DT2 becomes a bright spot so that the specific pixel, which is a defective pixel, operates as a normal pixel. FIG. 10 shows cuttings C2d and C2S formed to cut the driving transistor DT2.

As shown in FIGS. 10A and 10B , all of the cutting portions C2d and C2S formed to cut the second driving transistor DT2 are cut to repair only the first driving transistor DT1 to operate. Alternatively, only one (C2d or C2S) of the cutting portions C2d and C2S formed to cut the second driving transistor DT2 may be cut to repair only the first driving transistor DT1 to operate.

As described above, when the second driving transistor DT2 in which the foreign matter in the process is generated is cut, only the first driving transistor DT1 operates and the pixel is repaired from a bad pixel that is a bright point to a normal pixel that emits a predetermined color, An equivalent circuit diagram of the corresponding pixel may be shown as in FIG. 11 .

11 is an equivalent circuit diagram of a repaired pixel in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment. In FIG. 7 showing an equivalent circuit diagram of a pixel before being repaired, a second driving transistor in which foreign matter is generated. Only (DT2) is a cut circuit diagram.

Meanwhile, under the aforementioned structure in which two or more driving transistors for driving an organic light emitting diode (OLED) are used in one pixel, some of the two or more driving transistors in the bad pixel are cut and only the remaining part is operated to normalize the bad pixel. In the case of repairing to a pixel, since the width of the driving transistor operating in the repaired pixel is reduced compared to before the repair, a decrease in current occurs in the driving transistor operating after the repair, and accordingly, the luminance in the repaired pixel is decreased. will decrease

For example, when two driving transistors DT1 and DT2 are included in one pixel, the width of the driving transistor in a pixel operating as a normal pixel in which one of the two driving transistors is cut and only the other driving transistor operates is two Since the driving transistor is half the width of the driving transistor in the pixel in which all the driving transistors operate, a current decrease occurs in the driving transistor, and thus the luminance in the repaired pixel is decreased.

This phenomenon is exemplarily shown in FIG. 12 .

12 is a diagram illustrating compensating for a decrease in luminance of a repaired pixel in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment.

12 , in the RGBW pixel structure, when a green (G) pixel becomes a bad pixel and is repaired into a normal pixel according to the repair method (some driving transistor cutting method) according to an embodiment, the repaired green ( G) The pixel does not purely emit green (G), which is a predetermined color, but emits green (g) with reduced luminance.

Accordingly, the organic light emitting display device 100 according to an exemplary embodiment may compensate the green (g) with reduced luminance to the pure green (G).

To this end, as shown in FIG. 13 , the organic light emitting display device 100 according to an exemplary embodiment includes a sensing unit 1310 sensing the luminance of each pixel, and each pixel sensed by the sensing unit 1310 . It may further include a compensating unit 1320 for compensating for the difference in luminance of , and by using these components 1310 and 1320, it is possible to compensate for the decrease in luminance of the repaired pixel.

The above-described compensation unit 1320 may calculate a luminance difference for each pixel based on the sensed luminance of each luminance, and determine in which pixel how much luminance should be compensated as a luminance compensation value.

Thereafter, the compensator 1320 outputs the determined luminance compensation value to the data driver 120 so that when the data driver 120 supplies the data voltage to the corresponding pixel, the data voltage converted according to the luminance compensation value is supplied. can do. Alternatively, the compensator 1320 may convert data to be supplied to the data driving unit 120 according to the determined luminance compensation value and supply the converted data to the data driving unit 120 .

By the compensator 1320 , the data driver 120 supplies a changed data voltage for compensating for a decrease in luminance with respect to at least one pixel that has undergone the repair process to the corresponding data line.

The compensator 1320 may be included in the timing controller 140 , and in some cases, included in the timing driver 120 , or outside the timing driver 120 and the timing controller 140 . may be included.

Also, the luminance of each pixel sensed by the sensing unit 1310 may be stored and updated in a memory (not shown).

Meanwhile, in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment, each pixel has a pixel structure for compensating for a decrease in luminance due to the repair, when being repaired.

13 shows a pixel structure for compensating for a decrease in luminance due to repair in the display panel 110 of the organic light emitting display device 100 according to an embodiment, and a sensing unit 1310 and a compensating unit 1320 using the same. is a diagram showing

Referring to FIG. 13 , each of the plurality of pixels further includes a sensing transistor SENT that is controlled by a sensing signal SENSE and connected to an output terminal of a driving transistor to supply a reference voltage to enable luminance sensing.

Here, the sensing signal SENSE supplied to the sensing transistor SENT may be supplied through a gate line different from the gate line supplying the scan signal SCAN to the switching transistor SWT in the corresponding pixel, or the same gate line may be supplied through

Referring to FIG. 13 , the organic light emitting display device 100 according to an exemplary embodiment includes a sensing unit 1310 configured to sense a voltage Vsam of an output terminal of a sensing transistor SENT included in each of a plurality of pixels; A compensating unit 1320 that performs compensation processing for a difference in luminance between the luminance of a specific pixel repaired from a bad pixel to a normal pixel and the luminance of another non-repaired pixel according to the voltage or current sensed by each of the plurality of pixels; include

The luminance decrease compensation method of the repaired pixel briefly described above will be described in more detail with reference to the timing diagram of FIG. 14 and the operation circuit diagram of each step of FIGS. 15 to 18 .

14 is a timing diagram of a sensing mode for compensating for a decrease in luminance of a pixel repaired in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment.

Referring to FIG. 14 , a sensing mode for compensating for a decrease in luminance of a pixel repaired in the display panel 110 of the organic light emitting display device 100 according to an embodiment includes an initial step, a program step ( Program Step), a preparation step (Standby Step), and a sensing step (Sensing Step).

Referring to FIG. 14 , a sensing mode for compensating for a decrease in luminance of a repaired pixel is performed in the order of an initialization step, a program step, a standby step, and a sensing step. To proceed, the timing controller 140 is connected between the ADC and the sensing node Ns to control that the switching transistor SWT, the sensing transistor SENT, and the sampling voltage Vsam are read to the ADC (Analog Digital Converter). Controls the switching operation of each of the sampling switch (SAM) for on-off, the pre-charge (Vpre) supply terminal (existing voltage supply terminal), and the switch (SPRE) for turning on-off the connection between the sensing node (Ns).

By controlling the signal level of the scan signal SCAN to the switching transistor SWT, the switching operation of the switching transistor SWT may be controlled. In addition, by controlling the signal level of the sensing signal SENSE to the sensing transistor SENT, the switching operation of the sensing transistor SENT may be controlled. Accordingly, the voltage difference Vgs between the gate and the source of the first driving transistor DT1 may be controlled, so that the switching operation of the first driving transistor DT1 may be controlled.

Hereinafter, each step operation of the sensing mode for compensating for the decrease in luminance of the repaired pixel will be described with reference to FIGS. 15 to 18 .

15 to 18 are circuit diagrams for each step of a sensing mode for compensating for a decrease in luminance of a pixel repaired in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment.

15 is an operation circuit diagram of an Initial Step, FIG. 16 is an operation circuit diagram of a Program Step, FIG. 17 is an operation circuit diagram of a Standby Step, and FIG. 18 is a Sensing Step ) is the circuit diagram of the operation.

Referring to FIG. 15 which is an operation circuit diagram of the initial step, the initial step of the sensing operation to compensate for the decrease in luminance of the repaired pixel is a step of initializing the voltage of each node. A level scan signal SCAN is supplied to turn off the switching transistor SWT, and a low level sensing signal SENSE is supplied to turn off the sensing transistor SENT.

In this initialization step (Initial Step), the sampling switch (SAM) that turns on-off the connection between the ADC and the sensing node (Ns) is turned off.

In this initialization step (Initial Step), Vdata is not applied.

In addition, in the initialization step (Initial Step), the switch (SPRE) for turning on-off the connection between the Vpre supply terminal and the sensing node (Ns) is turned off and then turned on.

Referring to FIG. 16 , which is an operation circuit diagram of the program step, the program step is a step of charging the storage capacitor Cstg connected between the gate and the source of the first driving transistor DT1. .

In order to charge the storage capacitor Cstg, in the program step, when the data voltage Vdata is applied, the scan signal SCAN of a low level is changed to a high level and the switching transistor SWT is turned on. When turned on, the constant voltage Vdata is applied to the gate of the first driving transistor DT1.

At this time, since the signal level of the sensing signal SENSE is changed to a high level while the SPRE switch is on and the sensing transistor SENT is turned on, a constant voltage Vpre (Vref(Vref() reference voltage) is applied.

Accordingly, the constant voltages Vdata and Vpre are applied across the storage capacitor Cstg connected between the gate and the source of the first driving transistor DT1, and the amount of charge corresponding to the potential difference ΔV as much as Vdata-Vpre is the storage capacitor Cstg. is charged in

While the storage capacitor Cstg is being charged, the potential difference |Vpre-EVSS| between the constant voltage Vpre applied to the source of the first driving transistor DT1 and the base voltage EVSS is higher than the threshold voltage of the organic light emitting diode OLED. The constant voltage Vpre or the base voltage EVSS is adjusted so as not to be high, so that no current flows through the organic light emitting diode (OLED).

After the storage capacitor Cstg is charged, the high-level scan signal SCAN changes to a low level to turn off the switching transistor SWT, and the high-level sensing signal SENSE changes to a low level to turn the sensing transistor SENT ) is turned off. Thereafter, at the end of the program step, the SPRE switch is turned off, so that the constant voltage Vpre is not applied to the source of the first driving transistor DT1 .

Referring to FIG. 17 , which is an operation circuit diagram of the standby step, the standby step is a step in which the voltage of the sensing node Ns for luminance sensing is changed.

At the start of the standby step, a constant potential difference Vdata-Vpre is formed between the gate and the source of the first driving transistor DT1 so that the first driving transistor DT1 is turned on, and the switching transistor (SWT), sensing transistor (SENT), SPRE switch, and SAM switch are all off. Also, at the start of the standby step, no current flows through the organic light emitting diode (OLED).

After the standby step is started, the sensing signal SENSE changes to a high level and the sensing transistor SENT is turned on during the standby step period.

Accordingly, a current flows from the supply terminal of the driving voltage EVDD through the first driving transistor DT1 turned on and the sensing transistor SENT to the sensing capacitor Csense whose one side is grounded, and the sensing capacitor ( While Csense) is being charged, the voltage Vsam of the sensing node Ns is continuously boosted.

As such, when the voltage Vsam of the sensing node Ns is boosted, the source voltage of the first driving transistor DT1 is also boosted. Accordingly, the source voltage of the first driving transistor DT1 becomes high enough to drive the organic light emitting diode OLED, and current starts to flow through the organic light emitting diode OLED.

In order to sense the voltage Vsam of the sensing node Ns, by changing the signal level of the sensing signal SENSE to a low level and turning off the sensing transistor SENT, the standby step is terminated, and the sensing The Sensing Step begins.

Referring to FIG. 18 , which is an operation flowchart of the sensing step, in a state in which the sensing transistor SENT is turned off, the SAM switch is turned on so that the ADC of the sensing unit 1310 operates the voltage ( Vsam) is read to complete the sensing mode.

Thereafter, the compensator 1320 calculates the luminance of each pixel based on the voltage Vsam sensed by each pixel, and compensates for a difference between the calculated luminances of each pixel, that is, the luminance of the repaired pixel and the In order to compensate for the difference in luminance between non-repaired pixels, the data voltage (compensation data voltage) is supplied to the repaired pixel by adding the voltage value corresponding to the luminance difference to the data voltage to be supplied to the repaired pixel. can do it

As described above, the graph of FIG. 19 shows how the luminance of the repaired pixel is compensated according to the sensing process and the luminance reduction compensation process for the repaired pixel.

19 is a diagram illustrating the luminance of a pixel repaired in the display panel 110 of the organic light emitting display device 100 according to an exemplary embodiment according to the presence or absence of luminance reduction compensation processing.

19A is a graph showing the luminance and reference luminance according to the data voltage supplied from each source IC (S-IC) supplying the data voltage when the luminance reduction compensation process of the repaired pixel is not performed. and, (b) of FIG. 19 shows the luminance and reference luminance according to the data voltage supplied from each source IC (S-IC) supplying the data voltage when the luminance reduction compensation process of the repaired pixel is performed. It is a graph.

Referring to FIG. 19A , it can be seen that the luminance is reduced compared to the reference luminance when the luminance decrease compensation process of the repaired pixel is not performed.

On the other hand, referring to FIG. 19B , it can be seen that when the luminance reduction compensation process of the repaired pixel is performed, the luminance that was reduced due to the repair is increased to the same level as the reference luminance. Accordingly, the difference in luminance between the repaired pixel and the non-repaired pixel is also reduced.

Hereinafter, the driving method of the organic light emitting display device 100 described above will be described once again with reference to the flowchart of FIG. 20 .

20 is a flowchart illustrating a method of driving the organic light emitting display device 100 according to an exemplary embodiment. However, a case where there is a bad pixel will be described as a driving method of the organic light emitting display device 100 .

20 is a method of driving the organic light emitting display device 100 according to an embodiment, in which two or more driving transistors (eg, DT1 and DT2) connected in parallel with the organic light emitting diode (OLED) are all operated to operate the organic light emitting diode (OLED). A normal driving step (S2010) of driving the OLED) and, when the corresponding pixel becomes a bad pixel, only some (eg, DT1) of two or more driving transistors (eg, DT1, DT2) operate to drive the organic light emitting diode Step (S2020) and the like.

Meanwhile, referring to FIG. 20 , in order to compensate for a phenomenon in which the luminance decreases as only a portion (eg, DT1) of the corresponding pixel operates among all of the two or more driving transistors (eg, DT1 and DT2), an organic light source according to an embodiment In the driving method of the electroluminescent display device 100 , after the repair step S2020 , sensing connected to an output terminal (eg, source) of an operable driving transistor (eg, DT1) among two or more driving transistors (eg, DT1, DT2) Based on the sensing step (S2030) of sensing the voltage or current supplied to the organic light emitting diode (OLED) by controlling the operation of the transistor (SWT) and the sensing result in the sensing step (S2030), two or more driving transistors (eg, : A compensation step (S2040) of performing compensation processing for compensating for a decrease in luminance caused by the operation of both DT1 and DT2, but only some (eg, DT1) may be further included.

Hereinafter, the structure of the driving transistor shown in FIGS. 4 and 5 and the structure of the other driving transistor shown in FIG. 6 will be described in more detail with reference to FIGS. 21 to 22 and FIGS. 23 to 24 . As described above, each of the plurality of pixels defined in the display panel 110 includes two or more driving transistors DT1 , DT2 , ... in addition to the organic light emitting diode. However, in FIGS. 21 to 24 , the description For convenience, only the two driving transistors DT1 and DT2 are shown.

21 is an exemplary diagram of a structure of a driving transistor in each pixel of the organic light emitting display device 100 according to an exemplary embodiment.

Referring to FIGS. 21A and 21B , in each of the plurality of pixels, the first integrated electrode 2110 having a portion serving as a drain (or source) of each of the two or more driving transistors DT1 , DT2 , and 2100 is provided. ) and the second integrated electrode 2120 having a portion serving as a source (or drain) of each of the two or more driving transistors DT1 and DT2 is formed to be spaced apart.

Referring to FIGS. 21A and 21B , the first integrated electrode 2110 includes two or more branches 2112a, which become drains D1 and D2 of two or more driving transistors DT1 and DT2, respectively. 211b) and one stem 2111 connected to these two or more branches 2112a and 2112b.

Referring to FIGS. 21A and 21B , the second integrated electrode 2120 includes two or more branches 2122a and 2122b serving as the sources S1 and S2 of the two or more driving transistors DT1 and DT2, respectively. and one stem 2121 connected to these two or more branches 2122a and 2122b.

In each of the plurality of pixels, individual gate electrodes 2130a and 2130b are formed to be spaced apart from each other for two or more driving transistors DT1 and DT2, respectively, as shown in (a) of FIG. 21, or (b) of FIG. As shown in , one integrated gate electrode 2130 may be formed for two or more driving transistors DT1 and DT2 .

Referring to FIGS. 21A and 21B , branches 2112a and 2112b serving as drains D1 and D2 in the first integrated electrode 2110 and sources S1 and S2 in the second integrated electrode 2120 are provided. ), a channel of each of two or more driving transistors DT1 and DT2 is formed between the branches 2122a and 2122b.

Referring to FIGS. 21A and 21B , the first integrated electrode 2110 has a ┴ shape, and the second integrated electrode 2120 has a ┬ shape. In addition, the first integrated electrode 2110 and the second integrated electrode 2120 are spaced apart from each other to form a channel of each of the two or more driving transistors DT1 and DT2 .

On the other hand, in order for the two or more driving transistors DT1 and DT2 to equally share the current driving capability of one driving transistor, that is, the current flowing through the stem 2111 of the first integrated electrode 2110 is divided into two or more branches. (2112a, 2112b) branch equally to each, and the current flowing through each of the two or more branches (2122a, 2122b) of the second integrated electrode 2120 is combined in the stem 2120 to be output, the following structural structure There may be characteristics.

Referring to FIGS. 21A and 21B , the sizes of two or more branches 2112a and 2112b in the first integrated electrode 2110 may be the same as each other. For example, in the first integrated electrode 2110 , the widths Wd1 and Wd2 of the two or more branches 2112a and 2112b are the same, and the lengths Ld1 and Ld2 of the two or more branches 2112a and 2112b are the same. (Wd1 = Wd2, Ld1 = Ld2).

Also, the sizes of the two or more branches 2122a and 2122b in the second integrated electrode 2120 may be the same. For example, in the second integrated electrode 2120 , the widths Ws1 and Ws2 of the two or more branches 2122a and 2122b are the same, and the lengths Ls1 and Ls2 of the two or more branches 2122a and 2122b are the same. (Ws1 = Ws2, Ld1 = Ld2).

Meanwhile, referring to FIGS. 21A and 21B , the first integrated electrode 2110 and the second integrated electrode 2120 may have a symmetrical shape and thus may have the same size.

In this case, the widths Wd1 and Wd2 of the two or more branches 2112a and 2112b in the first integrated electrode 2110 and the width Ws1 of the two or more branches 2122a and 2122b in the second integrated electrode 2120 are Ws2) are all the same, and the lengths Ld1 and Ld2 of the two or more branches 2112a and 2112b in the first integrated electrode 2110 and the lengths Ld1 and Ld2 of the two or more branches 2122a and 2122b in the second integrated electrode 2120 are the same. The lengths Ls1 and Ls2 are all the same (Wd1=Wd2=Ws1=Ws2, Ld1=Ld2=Ls1=Ls2).

The widths Wd1 and Wd2 of the two or more branches 2112a and 2112b in the first integrated electrode 2110 and the widths Ws1 and Ws2 of the two or more branches 2122a and 2122b in the second integrated electrode 2120 are , may be determined according to the number of branches and the width (Wd, Ws) of the stem. Here, the number of branches is equal to the number of driving transistors. In FIG. 21, the number of branches is 2.

Meanwhile, in relation to the aforementioned pixel repair process, at least one of the two or more branches 2112a and 2112b of the first integrated electrode 2110 is cut in at least one of the plurality of pixels that has undergone the repair process, At least one of the two or more branches 2122a and 2122b in the second integrated electrode 2120 is cut, or at least one of the two or more branches 2112a and 2112b in the first integrated electrode 2110 and the second integrated electrode At least one of the two or more branches 2122a and 2122b in 2120 may be cut to correspond to each other.

The pixel repair process is a process for causing a bad pixel to operate as a normal pixel, and is a process for preventing a driving transistor that causes a bad pixel among two or more driving transistors from operating normally due to circuit breakage.

In the pixel that has been subjected to such a pixel repair process, as described above, the problem is solved through, for example, a laser cutting process so that the driving transistor causing the bad pixel among the two or more driving transistors is circuitly disconnected. A branch serving as a drain or source of the driving transistor is cut from at least one of the first integrated electrode 2110 and the second integrated electrode 2120 .

In order to make this pixel repair process (eg, laser cutting of a branch) more accurate and easier, the transistor structure in each pixel may have a unique structural feature. This will be described in more detail with reference to FIGS. 22A to 22D.

22A to 22D are diagrams for explaining a transistor structure for more accurate and easy pixel repair processing. However, in FIGS. 22A to 22D , for convenience of explanation, the individual gate electrodes 2130a and 2130b and the integrated gate electrode 2130 are not shown, and the first integrated electrode 2110 and the second integrated electrode 2120 are not shown. display only

22A shows a region having a smaller width (which may have a meaning of thickness) than other regions in two or more branches 2112a , 2112b , 2122a , 2122b of each of the first integrated electrode 2110 and the second integrated electrode 2120 , respectively. (CA: Cuttable Area) does not exist.

In FIGS. 22B to 22D , different from FIG. 22A , a region CA having a smaller width than the other regions is present in each of two or more branches of at least one of the first integrated electrode 2110 and the second integrated electrode 2120 . is the case

Here, the area CA having a smaller width than the other areas in the entire area of one branch is one of the portions where the branch can be cut (C1d, C2d, C1s, and C2s are marked respectively in (a) of FIG. 9). As one, it is a part that can be cut more easily and accurately than other parts. That is, the CA area is a part that is easy to cut.

Referring to FIG. 22B , only in the first integrated electrode 2110 of the first integrated electrode 2110 and the second integrated electrode 2120, the two or more branches 2112a and 2112b each have a smaller width than the other regions ( CA) may be present.

Here, in each of the two or more branches 2112a and 2112b of the first integrated electrode 2110 , the area CA having a smaller width than the other areas is cut of the corresponding branch 2112a or 2112b in the first integrated electrode 2110 . As one of these possible parts, it is a part that can be cut more easily and accurately compared to other parts.

22B has a structure suitable for cutting only the branch 2112a or 2112b serving as the drain (or source) of the corresponding driving transistor in order to disconnect the driving transistor to be disabled among the two driving transistors DT1 and DT2.

For example, when the driving transistor DT1 among the two driving transistors DT1 and DT2 is to be disconnected in a circuit, the branch 2112a serving as the drain (or source) of the driving transistor DT1 to be disconnected is divided into four cutting lines ( Cut along CL1 of the Cutting Line, CL1, CL2, CL3, CL4).

Referring to FIG. 22C , only in the second integrated electrode 2120 of the first integrated electrode 2110 and the second integrated electrode 2120, the two or more branches 2122a and 2122b each have a smaller width than the other regions ( CA) may be present.

Here, in each of the two or more branches 2122a and 2122b of the second integrated electrode 2120 , the area CA having a smaller width than the other areas is cut of the corresponding branch 2122a or 2122b in the second integrated electrode 2120 . As one of these possible parts, it is a part that can be cut more easily and accurately compared to other parts.

In the case of FIG. 22C , a structure suitable for cutting only the branch 2122a or 2122b serving as the source (or drain) of the corresponding driving transistor in order to disconnect the driving transistor to be disabled among the two driving transistors DT1 and DT2.

For example, when the driving transistor DT2 among the two driving transistors DT1 and DT2 is to be circuitly disconnected, the branch 2122b serving as the source (or drain) of the driving transistor DT2 to be disconnected is divided into four cutting lines ( Cut along CL4 among CL1, CL2, CL3, and CL4).

Referring to FIG. 22D , in the first integrated electrode 2110 , there is an area CA in which each of the two or more branches 2112a and 2112b has a smaller width than the other areas, and also in the second integrated electrode 2120 , two or more branches ( There may be an area CA in which each of 2122a and 2122b has a smaller width than the other areas.

Here, in each of the two or more branches 2112a and 2112b of the first integrated electrode 2110 , a region having a width smaller than that of another region is a cutable portion of the corresponding branch 2112a or 2112b in the first integrated electrode 2110 . As one of the parts, it is a part that can be cut more easily and accurately compared to other parts. In addition, in each of the two or more branches 2122a and 2122b of the second integrated electrode 2120 , the area CA having a smaller width than the other areas is the second integrated electrode 2120 when the corresponding branch 2122a or 2122b is cut. As one of the possible parts, it is a part that can be cut more easily and accurately compared to other parts.

In the case of FIG. 22D , a branch 2112a or 2112b serving as a drain (or source) of the corresponding driving transistor and a source (or drain) in order to disconnect the driving transistor to be disabled among the two driving transistors DT1 and DT2 It is a structure suitable for cutting both branches 2122a or 2122b.

For example, when the driving transistor DT1 among the two driving transistors DT1 and DT2 is to be circuitly disconnected, the branch 2112a serving as the drain (or source) of the driving transistor DT1 to be disconnected is divided into four cutting lines ( Cut along CL1 among CL1, CL2, CL3, and CL4, and cut the branch 2122a serving as the source (or drain) of the driving transistor DT1 to be disconnected along CL3 of the four cutting lines CL1, CL2, CL3, CL4. just cut it

23 is another exemplary diagram of a structure of a driving transistor in each pixel of the organic light emitting display device 100 according to an exemplary embodiment.

Referring to FIGS. 23A and 23B , each of the plurality of pixels includes a first integrated electrode 2310 having a portion serving as a drain of each of the two or more driving transistors DT1 and DT2 , and two or more driving transistors DT1 and DT2 , respectively. A second integrated electrode 2320 having a portion serving as a source of each of the transistors DT1 and DT2 is formed to be spaced apart.

Referring to FIGS. 23A and 23B , the first integrated electrode 2310 includes two or more branches 2312a serving as drains D1 and D2 of two or more driving transistors DT1, DT2, and 2300, respectively; 2312b) and one stem 2311 connected to these two or more branches 2312a, 2312b.

Referring to FIGS. 23A and 23B , the second integrated electrode 2320 has two or more branches 2322a and 2322b serving as the sources S1 and S2 of the two or more driving transistors DT1 and DT2, respectively. and one stem 2321 connected to the two or more branches.

In each of the plurality of pixels, individual gate electrodes 2330a and 2330b are formed to be spaced apart from each other with respect to two or more driving transistors DT1 and DT2, respectively, as shown in FIG. 23(a), or in FIG. 23(b) As shown in , one integrated gate electrode 2330 may be formed for two or more driving transistors DT1 and DT2 .

Referring to FIGS. 23A and 23B , branches 2312a and 2312b serving as drains D1 and D2 in the first integrated electrode 2310 and sources S1 and S2 in the second integrated electrode 2320 are ), a channel of each of two or more driving transistors DT1 and DT2 is formed between the branches 2322a and 2322b.

Referring to FIGS. 23A and 23B , each of the branches 2312a and 2312b of the first integrated electrode 2310 may have a U shape, and the second integrated electrode 2320 may have a ┬ shape. .

The branches 2322a and 2322b of the second integrated electrode 2320 are interposed between the spaces formed by bending each of the branches 2312a and 2312b of the first integrated electrode 2310 into a U-shape. That is, the branch 2312a serving as the drain D1 of DT1 in the first integrated electrode 2310 is formed by bending a U-shape, and the branch 2322a serving as the source S1 of DT1 in the second integrated electrode 2320 is formed between the spaces. ) is involved.

Similarly, the branch 2312b serving as the drain D2 of DT2 in the first integrated electrode 2310 is formed by bending U-shape, and the branch 2322b serving as the source S2 of DT2 in the second integrated electrode 2320 is formed between the spaces. ) is involved.

On the other hand, in order for the two or more driving transistors DT1 and DT2 to equally share the current driving capability of one driving transistor, that is, the current flowing through the stem 2311 of the first integrated electrode 2310 has two or more branches. In order to make the current flowing through each of the two or more branches 2322a and 2322b of the second integrated electrode 2320 equally branched to each of 2312a and 2312b be combined and output to the stem 2320, the following structural structure is There may be characteristics.

Meanwhile, referring to FIGS. 23A and 23B , the sizes of the two or more branches 2312a and 2312b in the first integrated electrode 2310 may be the same as each other. For example, in the first integrated electrode 2310 , the widths Wd1 and Wd2 of the two or more branches 2312a and 2312b are the same, and the lengths Ld1 and Ld2 of the two or more branches 2312a and 2312b are the same. (Wd1 = Wd2, Ld1 = Ld2).

Also, the sizes of the two or more branches 2322a and 2322b in the second integrated electrode 2320 may be the same as each other. For example, in the second integrated electrode 2320 , the widths Ws1 and Ws2 of the two or more branches 2322a and 2322b are the same, and the lengths Ls1 and Ls2 of the two or more branches 2322a and 2322b are the same. (Ws1 = Ws2, Ld1 = Ld2).

Meanwhile, unlike the transistor structure illustrated in FIG. 21 , in the transistor structure illustrated in FIG. 23 , the first integrated electrode 2310 and the second integrated electrode 2320 are asymmetric in shape and have different sizes.

Meanwhile, referring to FIGS. 23A and 23B , the widths Wd1 and Wd2 of the two or more branches 2312a and 2312b of the first integrated electrode 2310 and the width Wd1 and Wd2 of the second integrated electrode 2320 are The widths Ws1 and Ws2 of the two or more branches 2322a and 2322b may be determined according to the number of branches and the widths Wd and Ws of the stem. Here, the number of branches is equal to the number of driving transistors. In FIG. 23, the number of branches is 2.

Meanwhile, in relation to the aforementioned pixel repair process, at least one of the two or more branches 2312a and 2312b of the first integrated electrode 2310 is cut in at least one of the plurality of pixels that has undergone the repair process, At least one of the two or more branches 2322a and 2322b in the second integrated electrode 2320 is cut, or at least one of the two or more branches 2312a and 2312b in the first integrated electrode 2310 and the second integrated electrode At least one of the two or more branches 2322a and 2322b in 2320 may be cut to correspond to each other.

The pixel repair process is a process for causing a bad pixel to operate as a normal pixel, and is a process for preventing a driving transistor that causes a bad pixel among two or more driving transistors from operating normally due to circuit breakage.

In the pixel that has been subjected to such a pixel repair process, as described above, the problem is solved through, for example, a laser cutting process so that the driving transistor causing the bad pixel among the two or more driving transistors is circuitly disconnected. A branch serving as a drain or source of the driving transistor is cut from at least one of the first integrated electrode 2310 and the second integrated electrode 2320 .

In order to make this pixel repair process (eg, laser cutting of a branch) more accurate and easier, the transistor structure in each pixel may have a unique structural feature. This will be described in more detail with reference to FIGS. 24A to 24D.

24A to 24D are diagrams for explaining a transistor structure for more accurate and easy pixel repair processing. However, in FIGS. 24A to 24D , for convenience of explanation, the individual gate electrodes 2330a and 2330b and the integrated gate electrode 2330 are not shown, and the first integrated electrode 2310 and the second integrated electrode 2320 are not shown. display only

24A shows a region having a smaller width (which may have a meaning of thickness) in two or more branches 2312a , 2312b , 2322a , 2322b of each of the first integrated electrode 2310 and the second integrated electrode 2320 than other regions. (CA) does not exist.

In FIGS. 24B to 24D , in each of two or more branches of at least one of the first integrated electrode 2310 and the second integrated electrode 2320 , a region CA having a smaller width than that of the other region exists in FIGS. 24B to 24D , differently from FIG. 24A . is the case

Here, in the entire area of one branch, the area CA having a smaller width than the other area is one of the portions where the branch can be cut (the portions marked with C1d, C2d, C1s, and C2s in FIG. 9B , respectively). As one, it is a part that can be cut more easily and accurately than other parts. That is, the CA area is a part that is easy to cut.

Referring to FIG. 24B , only in the first integrated electrode 2310 of the first integrated electrode 2310 and the second integrated electrode 2320, the two or more branches 2312a and 2312b each have a smaller width than the other regions ( CA) may be present.

Here, in each of the two or more branches 2312a and 2312b of the first integrated electrode 2310 , the area CA having a smaller width than the other areas is cut by the corresponding branch 2312a or 2312b in the first integrated electrode 2310 . As one of these possible parts, it is a part that can be cut more easily and accurately compared to other parts.

In the case of FIG. 24B , a structure suitable for cutting only the branch 2312a or 2312b serving as the drain (or source) of the corresponding driving transistor in order to disconnect the driving transistor to be disabled among the two driving transistors DT1 and DT2.

For example, when the driving transistor DT1 of the two driving transistors DT1 and DT2 is to be circuitly disconnected, the branch 2312a serving as the drain (or source) of the driving transistor DT1 to be disconnected is divided into four cutting lines ( Cut along CL1 of the Cutting Line, CL1, CL2, CL3, CL4).

Referring to FIG. 24C , only in the second integrated electrode 2320 of the first integrated electrode 2310 and the second integrated electrode 2320, the two or more branches 2322a and 2322b each have a smaller width than the other regions ( CA) may be present.

Here, in each of the two or more branches 2322a and 2322b of the second integrated electrode 2320 , the area CA having a smaller width than the other areas is cut of the corresponding branch 2322a or 2322b in the second integrated electrode 2320 . As one of these possible parts, it is a part that can be cut more easily and accurately compared to other parts.

In the case of FIG. 24C , the structure is suitable for cutting only the branch 2322a or 2322b serving as the source (or drain) of the corresponding driving transistor in order to disconnect the driving transistor to be disabled among the two driving transistors DT1 and DT2.

For example, when the driving transistor DT2 among the two driving transistors DT1 and DT2 is to be circuitly disconnected, the branch 2322b serving as the source (or drain) of the driving transistor DT2 to be disconnected is divided into four cutting lines ( Cut along CL4 among CL1, CL2, CL3, and CL4).

Referring to FIG. 24D , in the first integrated electrode 2310 , there is a region CA in which two or more branches 2312a and 2312b each have a smaller width than the other regions, and also in the second integrated electrode 2320, two or more branches ( There may be an area CA in which each of 2322a and 2322b has a smaller width than the other areas.

Here, in each of the two or more branches 2312a and 2312b of the first integrated electrode 2310 , the region having a smaller width than the other regions is the cutable portion of the corresponding branch 2312a or 2312b in the first integrated electrode 2310 . As one of the parts, it is a part that can be cut more easily and accurately compared to other parts. In addition, in each of the two or more branches 2322a and 2322b of the second integrated electrode 2320 , the area CA having a smaller width than the other areas is the second integrated electrode 2320 , in which the corresponding branch 2322a or 2322b is cut. As one of the possible parts, it is a part that can be cut more easily and accurately compared to other parts.

In the case of FIG. 24D , a branch 2312a or 2312b serving as a drain (or source) of the corresponding driving transistor in order to disconnect a driving transistor to be disabled among the two driving transistors DT1 and DT2 and a branch 2312a or 2312b serving as a source (or drain) It is a structure suitable for cutting both branches 2322a or 2322b.

For example, when the driving transistor DT1 of the two driving transistors DT1 and DT2 is to be circuitly disconnected, the branch 2312a serving as the drain (or source) of the driving transistor DT1 to be disconnected is divided into four cutting lines ( Cut along CL1 among CL1, CL2, CL3, and CL4, and cut the branch 2322a serving as the source (or drain) of the driving transistor DT1 to be disconnected along CL3 of the four cutting lines CL1, CL2, CL3, CL4. just cut it

As described above, according to the present invention, there is an effect of providing an organic light emitting display device having a driving transistor structure of a new concept capable of efficient repair processing.

Also, according to the present invention, even if the size or number of repaired pixels is increased, the screen quality is not deteriorated and a new concept of pixel repair can be achieved without the need to discard the display panel.

In addition, according to the present invention, there is provided an organic light emitting display device 100 having a repairable pixel structure and a driving transistor structure, a display panel 110 therefor, and a driving method so that a defective pixel can operate like a normal pixel. has the effect of

Also, according to the present invention, there is an effect of providing an organic light emitting display device 100 that compensates for a decrease in luminance that may occur after repairing a defective pixel to a normal pixel, a display panel 110 thereof, and a driving method.

The above description and the accompanying drawings are merely illustrative of the technical spirit of the present invention, and those of ordinary skill in the art to which the present invention pertains can combine configurations within a range that does not depart from the essential characteristics of the present invention. , various modifications and variations such as separation, substitution and alteration will be possible. Therefore, the embodiments disclosed in the present invention are not intended to limit the technical spirit of the present invention, but to explain, and the scope of the technical spirit of the present invention is not limited by these embodiments. The protection scope of the present invention should be construed by the following claims, and all technical ideas within the scope equivalent thereto should be construed as being included in the scope of the present invention.

100: organic light emitting display device
110: display panel
120: data driving unit
130: gate driver
140: timing controller

Claims (17)

A plurality of pixels including an organic light emitting diode, two or more driving transistors, a switching transistor, a storage capacitor, and a sensing transistor, wherein in each of the plurality of pixels,
Each of the two or more driving transistors includes a gate, a first node and a second node, a first node of each of the two or more driving transistors is a drain or a source of each of the two or more driving transistors, The second node is the source or drain of each of the two or more driving transistors,
The switching transistor is turned on by the scan signal applied to the gate to connect the data line and the gate of at least one of the two or more driving transistors,
The sensing transistor is turned on by a sensing signal applied to the gate to connect a sensing node and at least one second node of the two or more driving transistors, and a gate line connected to the gate of the sensing transistor is the switching transistor. same or different from the gate line connected to the gate,
In each of all or part of the plurality of pixels,
a first integrated electrode formed by connecting two or more branches serving as a drain or source of each of the two or more driving transistors and one stem;
A second integrated electrode is formed by connecting two or more branches serving as sources or drains of each of the two or more driving transistors and one stem, and the stem of the second integrated electrode is electrically connected to the sensing node through the sensing transistor. connected,
The first integrated electrode and the second integrated electrode are formed to be spaced apart,
A sensing capacitor is electrically connected to the sensing node, and when the sensing transistor is turned on, the second node of the at least two driving transistors and the sensing capacitor are connected;
At least one first pixel of the plurality of pixels may include at least one of two or more branches of the first integrated electrode being cut, at least one of two or more branches of the second integrated electrode being cut, or the at least one of the two or more branches in the first integrated electrode and at least one of the two or more branches in the second integrated electrode are all cut by a repair process;
The sensing mode for the first pixel includes a first timing period and a second timing period proceeding after the first timing period,
During the first timing period, a data voltage and a reference voltage are respectively applied to both ends of the storage capacitor included in the first pixel, and a potential difference between both ends of the storage capacitor is a voltage obtained by subtracting the reference voltage from the data voltage;
During the second timing period, a voltage of a second node of some of the two or more driving transistors included in the first pixel is boosted, and some of the two or more driving transistors are boosted through the sensing transistor included in the first pixel. The sensing capacitor connected to the second node of is charged, the voltage of the sensing node is boosted, the switching transistor included in the first pixel is turned off, and the potential difference between both ends of the storage capacitor is the first timing equal to the potential difference over the period,
and a data driver configured to supply a changed data voltage changed according to the boosted voltage of the sensing node to the first pixel after the second timing period. According to claim 1,
In each of the plurality of pixels,
An organic light emitting display device, wherein an individual gate electrode is formed to be spaced apart from each other for each of the two or more driving transistors, or a single integrated gate electrode is formed for the two or more driving transistors. According to claim 1,
and a channel of each of the at least two driving transistors is formed between a branch serving as a drain or source in the first integrated electrode and a branch serving as a source or drain in the second integrated electrode. According to claim 1,
The first integrated electrode has a ┴ shape, and the second integrated electrode has a ┬ shape,
and the first integrated electrode and the second integrated electrode are formed to face each other. According to claim 1,
Each branch in the first integrated electrode is U-shaped, and the second integrated electrode is ┬-shaped,
The organic light emitting display device of claim 1, wherein each branch of the second integrated electrode is interposed between spaces formed by bending each branch of the first integrated electrode into a U-shape. delete According to claim 1,
The organic light emitting display device, characterized in that the size of the two or more branches in the first integrated electrode or the second integrated electrode is the same. According to claim 1,
Each of the two or more branches of at least one of the first integrated electrode and the second integrated electrode has a region having a width smaller than that of the other region. 9. The method of claim 8,
The region having a small width,
The organic light emitting display device according to claim 1, wherein the first integrated electrode or the second integrated electrode is a part in which a corresponding branch can be cut. According to claim 1,
The size of the two or more branches in the first integrated electrode and the size of the two or more branches in the second integrated electrode are the same. According to claim 1,
and the first integrated electrode and the second integrated electrode are symmetrical and have the same size. According to claim 1,
and the first integrated electrode and the second integrated electrode are asymmetric and have different sizes. According to claim 1,
The width of the two or more branches in each of the first integrated electrode and the second integrated electrode is determined according to the number of branches and the width of the stem. a display panel in which a plurality of pixels are defined according to intersections of data lines and gate lines; and
a data driver supplying a data signal to the data lines;
Each of the plurality of pixels includes an organic light emitting diode, n (n≥2) driving transistors, a switching transistor, a storage capacitor and a sensing transistor,
At least one first pixel among the plurality of pixels,
Only m (1≤m<n) driving transistors among the n driving transistors supply current to the organic light emitting diode, and the remaining driving transistors except for the m driving transistors among the n driving transistors are used as the organic light emitting diode. It is a pixel that has been repaired so that the current to be supplied does not conduct.
Each of the n driving transistors includes a gate, a first node, and a second node, a first node of each of the n driving transistors is a drain or a source of each of the n driving transistors, The second node is the source or drain of each of the two or more driving transistors,
The switching transistor is turned on by the scan signal applied to the gate to connect the data line and the gates of the m driving transistors among the n driving transistors,
The sensing transistor is turned on by a sensing signal applied to a gate to connect a sensing node and a second node of the m driving transistors among the n driving transistors, and the gate line connected to the gate of the sensing transistor is the same or different from the gate line connected to the gate of the switching transistor,
A sensing capacitor is electrically connected to the sensing node, and when the sensing transistor is turned on, the second node of the m driving transistors and the sensing capacitor are connected;
The sensing mode for the first pixel includes a first timing period and a second timing period proceeding after the first timing period,
During the first timing period, a data voltage and a reference voltage are respectively applied to both ends of the storage capacitor included in the first pixel, and a potential difference between both ends of the storage capacitor is a voltage obtained by subtracting the reference voltage from the data voltage;
During the second timing period, the voltage of the second node of the m driving transistors included in the first pixel is boosted, and the second node of the m driving transistors includes the sensing transistor included in the first pixel. The sensing capacitor connected to is charged, the voltage of the sensing node is boosted, the switching transistor included in the first pixel is turned off, and the potential difference between both ends of the storage capacitor is the potential difference during the first timing period same as,
and a data driver configured to supply a changed data voltage changed according to the boosted voltage of the sensing node to the first pixel after the second timing period. delete delete 15. The method of claim 14,
The data driver,
After the second timing period, the changed data voltage changed according to the boosted voltage of the sensing node is supplied to the first pixel through a corresponding data line, and the changed data voltage is based on the boosted voltage of the sensing node. , a data voltage for compensating for a luminance difference between the luminance of the first pixel and the luminance of a normal pixel that has not been repaired.

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