KR102205126B9 - 보스트용 버니어 지연 선을 이용한 저면적의 버퍼를 활용하는 효율적인 스큐 측정 장치 - Google Patents

보스트용 버니어 지연 선을 이용한 저면적의 버퍼를 활용하는 효율적인 스큐 측정 장치

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Publication number
KR102205126B9
KR102205126B9 KR20190169234A KR20190169234A KR102205126B9 KR 102205126 B9 KR102205126 B9 KR 102205126B9 KR 20190169234 A KR20190169234 A KR 20190169234A KR 20190169234 A KR20190169234 A KR 20190169234A KR 102205126 B9 KR102205126 B9 KR 102205126B9
Authority
KR
South Korea
Prior art keywords
bost
delay line
measurement apparatus
low area
area buffer
Prior art date
Application number
KR20190169234A
Other languages
English (en)
Other versions
KR102205126B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR1020190169234A priority Critical patent/KR102205126B1/ko
Application granted granted Critical
Publication of KR102205126B1 publication Critical patent/KR102205126B1/ko
Publication of KR102205126B9 publication Critical patent/KR102205126B9/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020190169234A 2019-12-17 2019-12-17 보스트용 버니어 지연 선을 이용한 저면적의 버퍼를 활용하는 효율적인 스큐 측정 장치 KR102205126B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020190169234A KR102205126B1 (ko) 2019-12-17 2019-12-17 보스트용 버니어 지연 선을 이용한 저면적의 버퍼를 활용하는 효율적인 스큐 측정 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020190169234A KR102205126B1 (ko) 2019-12-17 2019-12-17 보스트용 버니어 지연 선을 이용한 저면적의 버퍼를 활용하는 효율적인 스큐 측정 장치

Publications (2)

Publication Number Publication Date
KR102205126B1 KR102205126B1 (ko) 2021-01-19
KR102205126B9 true KR102205126B9 (ko) 2021-10-27

Family

ID=74237475

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020190169234A KR102205126B1 (ko) 2019-12-17 2019-12-17 보스트용 버니어 지연 선을 이용한 저면적의 버퍼를 활용하는 효율적인 스큐 측정 장치

Country Status (1)

Country Link
KR (1) KR102205126B1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102644321B1 (ko) * 2021-11-30 2024-03-05 한국항공대학교산학협력단 증폭 피드백을 이용한 버니어 기반 시간-디지털 변환기 및 시간-디지털 변환 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI310633B (en) * 2005-08-31 2009-06-01 Via Tech Inc Clock loop circuit with community counters and metohd thereof
JP5243401B2 (ja) * 2009-12-25 2013-07-24 日本電信電話株式会社 電気波形発生器および光送信器
JP6446937B2 (ja) * 2014-09-18 2019-01-09 日本電気株式会社 ロジック解析端末及びロジック解析システムと遅延補正方法並びにプログラム
KR101639064B1 (ko) 2014-11-07 2016-07-12 서울대학교산학협력단 이종 샘플링 지연선 기반 시간-디지털 변환기
KR101957412B1 (ko) * 2017-12-06 2019-03-12 연세대학교 산학협력단 새로운 버니어 지연선 디자인이 적용된 시간 디지털 변환기 및 보스트 회로 장치

Also Published As

Publication number Publication date
KR102205126B1 (ko) 2021-01-19

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