KR102088869B1 - 광학적 위치 측정 장치 - Google Patents
광학적 위치 측정 장치 Download PDFInfo
- Publication number
- KR102088869B1 KR102088869B1 KR1020140126684A KR20140126684A KR102088869B1 KR 102088869 B1 KR102088869 B1 KR 102088869B1 KR 1020140126684 A KR1020140126684 A KR 1020140126684A KR 20140126684 A KR20140126684 A KR 20140126684A KR 102088869 B1 KR102088869 B1 KR 102088869B1
- Authority
- KR
- South Korea
- Prior art keywords
- scanning
- optical
- measuring device
- position measuring
- scanning beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02049—Interferometers characterised by particular mechanical design details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/36—Forming the light into pulses
- G01D5/38—Forming the light into pulses by diffraction gratings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Optical Transform (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102013220184.2 | 2013-10-07 | ||
| DE102013220184 | 2013-10-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20150040744A KR20150040744A (ko) | 2015-04-15 |
| KR102088869B1 true KR102088869B1 (ko) | 2020-03-16 |
Family
ID=51541018
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020140126684A Active KR102088869B1 (ko) | 2013-10-07 | 2014-09-23 | 광학적 위치 측정 장치 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9410797B2 (https=) |
| EP (1) | EP2857802B1 (https=) |
| JP (1) | JP6320267B2 (https=) |
| KR (1) | KR102088869B1 (https=) |
| CN (1) | CN104515468B (https=) |
| DE (1) | DE102014218623A1 (https=) |
| ES (1) | ES2604157T3 (https=) |
| TW (1) | TWI627379B (https=) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102013220214A1 (de) | 2013-10-07 | 2015-04-09 | Dr. Johannes Heidenhain Gmbh | Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück |
| US9829409B2 (en) * | 2015-04-28 | 2017-11-28 | Sumix Corporation | Interferometric measurement method for guide holes and fiber holes parallelism and position in multi-fiber ferrules |
| DE102016200847A1 (de) | 2016-01-21 | 2017-07-27 | Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung | Optische Positionsmesseinrichtung |
| DE102017209093A1 (de) * | 2017-05-31 | 2018-12-06 | Osram Gmbh | Lichtleiteranordnung für ein mobiles kommunikationsgerät zur optischen datenübertragung, mobiles kommunikationsgerät und verfahren zur optischen datenübertragung |
| DE102017213330A1 (de) * | 2017-08-02 | 2019-02-07 | Dr. Johannes Heidenhain Gmbh | Abtastplatte für eine optische Positionsmesseinrichtung |
| JP7060370B2 (ja) | 2017-12-18 | 2022-04-26 | 株式会社ミツトヨ | スケールおよびその製造方法 |
| FR3090904B1 (fr) * | 2018-12-19 | 2021-02-19 | Office National Detudes Rech Aerospatiales | Composant optique monolithique a plusieurs voies |
| DE102019210023A1 (de) * | 2019-07-08 | 2021-01-14 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| CN117128851A (zh) * | 2022-05-20 | 2023-11-28 | 上海微电子装备(集团)股份有限公司 | 位置测量装置、位置测量方法以及光刻设备 |
| JP2025536142A (ja) * | 2022-11-10 | 2025-10-31 | エーエスエムエル ネザーランズ ビー.ブイ. | 位置測定システム及びリソグラフィ装置 |
| CN115900782B (zh) * | 2022-12-30 | 2025-05-27 | 四川云盾光电科技有限公司 | 一种绝对式测角装置及方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120032067A1 (en) * | 2010-06-09 | 2012-02-09 | Nikon Corporation | Two dimensional encoder system and method |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6249626B1 (en) * | 1998-03-06 | 2001-06-19 | Lucent Technologies, Inc. | Multimode fiber optical power monitoring tap for optical transmission systems |
| DE10235669B4 (de) * | 2002-08-03 | 2016-11-17 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| JP2005147828A (ja) * | 2003-11-14 | 2005-06-09 | Mitsutoyo Corp | 変位検出装置 |
| DE102005029917A1 (de) | 2005-06-28 | 2007-01-04 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| DE102005043569A1 (de) * | 2005-09-12 | 2007-03-22 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US7602489B2 (en) | 2006-02-22 | 2009-10-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7483120B2 (en) | 2006-05-09 | 2009-01-27 | Asml Netherlands B.V. | Displacement measurement system, lithographic apparatus, displacement measurement method and device manufacturing method |
| JP2008098604A (ja) * | 2006-09-12 | 2008-04-24 | Canon Inc | 露光装置及びデバイス製造方法 |
| DE102006042743A1 (de) * | 2006-09-12 | 2008-03-27 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| US20080079920A1 (en) * | 2006-09-29 | 2008-04-03 | Heiko Hommen | Wafer exposure device and method |
| DE102008007319A1 (de) * | 2008-02-02 | 2009-08-06 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
| JP5602420B2 (ja) | 2009-12-10 | 2014-10-08 | キヤノン株式会社 | 変位測定装置、露光装置、及び精密加工機器 |
| US20130001412A1 (en) * | 2011-07-01 | 2013-01-03 | Mitutoyo Corporation | Optical encoder including passive readhead with remote contactless excitation and signal sensing |
| DE102013203211A1 (de) * | 2012-06-15 | 2013-12-19 | Dr. Johannes Heidenhain Gmbh | Vorrichtung zur interferentiellen Abstandsmessung |
-
2014
- 2014-09-03 TW TW103130408A patent/TWI627379B/zh active
- 2014-09-17 DE DE102014218623.4A patent/DE102014218623A1/de not_active Withdrawn
- 2014-09-17 ES ES14185047.9T patent/ES2604157T3/es active Active
- 2014-09-17 EP EP14185047.9A patent/EP2857802B1/de active Active
- 2014-09-23 KR KR1020140126684A patent/KR102088869B1/ko active Active
- 2014-10-03 JP JP2014204525A patent/JP6320267B2/ja active Active
- 2014-10-07 US US14/508,097 patent/US9410797B2/en active Active
- 2014-10-08 CN CN201410525795.8A patent/CN104515468B/zh active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120032067A1 (en) * | 2010-06-09 | 2012-02-09 | Nikon Corporation | Two dimensional encoder system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2857802A2 (de) | 2015-04-08 |
| KR20150040744A (ko) | 2015-04-15 |
| DE102014218623A1 (de) | 2015-04-09 |
| TW201527712A (zh) | 2015-07-16 |
| US9410797B2 (en) | 2016-08-09 |
| JP6320267B2 (ja) | 2018-05-09 |
| TWI627379B (zh) | 2018-06-21 |
| CN104515468B (zh) | 2018-04-10 |
| JP2015075486A (ja) | 2015-04-20 |
| EP2857802B1 (de) | 2016-09-14 |
| EP2857802A3 (de) | 2015-07-01 |
| CN104515468A (zh) | 2015-04-15 |
| US20150098090A1 (en) | 2015-04-09 |
| ES2604157T3 (es) | 2017-03-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20140923 |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| A302 | Request for accelerated examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20190704 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 20140923 Comment text: Patent Application |
|
| PA0302 | Request for accelerated examination |
Patent event date: 20190704 Patent event code: PA03022R01D Comment text: Request for Accelerated Examination Patent event date: 20140923 Patent event code: PA03021R01I Comment text: Patent Application |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20191025 Patent event code: PE09021S01D |
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| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20200220 |
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| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20200309 Patent event code: PR07011E01D |
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| PR1002 | Payment of registration fee |
Payment date: 20200310 End annual number: 3 Start annual number: 1 |
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| PR1001 | Payment of annual fee |
Payment date: 20240304 Start annual number: 5 End annual number: 5 |