KR102044198B1 - 촬상 장치 - Google Patents

촬상 장치 Download PDF

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Publication number
KR102044198B1
KR102044198B1 KR1020177033621A KR20177033621A KR102044198B1 KR 102044198 B1 KR102044198 B1 KR 102044198B1 KR 1020177033621 A KR1020177033621 A KR 1020177033621A KR 20177033621 A KR20177033621 A KR 20177033621A KR 102044198 B1 KR102044198 B1 KR 102044198B1
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KR
South Korea
Prior art keywords
light
fundus
optical path
less
clock
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Expired - Fee Related
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KR1020177033621A
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English (en)
Korean (ko)
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KR20170139126A (ko
Inventor
타로 후카사와
토시하루 스미야
Original Assignee
캐논 가부시끼가이샤
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Priority claimed from PCT/JP2016/001840 external-priority patent/WO2016178298A1/en
Publication of KR20170139126A publication Critical patent/KR20170139126A/ko
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/12—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for looking at the eye fundus, e.g. ophthalmoscopes
    • A61B3/1225—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for looking at the eye fundus, e.g. ophthalmoscopes using coherent radiation
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0062—Arrangements for scanning
    • A61B5/0066—Optical coherence imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02069—Synchronization of light source or manipulator and detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/65—Spatial scanning object beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Surgery (AREA)
  • Public Health (AREA)
  • Radiology & Medical Imaging (AREA)
  • Veterinary Medicine (AREA)
  • Biophysics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Physics & Mathematics (AREA)
  • Ophthalmology & Optometry (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Automation & Control Theory (AREA)
  • Eye Examination Apparatus (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020177033621A 2015-05-01 2016-03-30 촬상 장치 Expired - Fee Related KR102044198B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JPJP-P-2015-094340 2015-05-01
JP2015094340 2015-05-01
JP2015175019A JP6685673B2 (ja) 2015-05-01 2015-09-04 撮像装置
JPJP-P-2015-175019 2015-09-04
PCT/JP2016/001840 WO2016178298A1 (en) 2015-05-01 2016-03-30 Imaging apparatus

Publications (2)

Publication Number Publication Date
KR20170139126A KR20170139126A (ko) 2017-12-18
KR102044198B1 true KR102044198B1 (ko) 2019-12-02

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020177033621A Expired - Fee Related KR102044198B1 (ko) 2015-05-01 2016-03-30 촬상 장치

Country Status (5)

Country Link
US (1) US10478059B2 (enExample)
EP (1) EP3288440B1 (enExample)
JP (1) JP6685673B2 (enExample)
KR (1) KR102044198B1 (enExample)
CN (1) CN107567305B (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020502501A (ja) * 2016-12-20 2020-01-23 ノバルティス アーゲー 広角光干渉断層撮影法のためのシステム及び方法
US10674905B2 (en) 2017-03-31 2020-06-09 Nidek Co., Ltd. OCT apparatus
JP7050282B2 (ja) * 2017-12-22 2022-04-08 株式会社トーメーコーポレーション 光断層画像撮影装置及びそれに用いる光源装置
US11357399B2 (en) * 2018-08-02 2022-06-14 Nidek Co., Ltd. OCT apparatus
JP2020044027A (ja) 2018-09-18 2020-03-26 株式会社トプコン 眼科装置、その制御方法、プログラム、及び記録媒体
JP7261448B2 (ja) * 2018-12-28 2023-04-20 株式会社トーメーコーポレーション 眼科装置
CN114343564B (zh) * 2022-03-17 2022-05-17 北京大学 一种超大范围的oct成像装置和及其成像方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030103212A1 (en) * 2001-08-03 2003-06-05 Volker Westphal Real-time imaging system and method
US8125648B2 (en) * 2006-06-05 2012-02-28 Board Of Regents, The University Of Texas System Polarization-sensitive spectral interferometry
US9784561B2 (en) * 2007-01-19 2017-10-10 Thorlabs, Inc. Optical coherence tomography imaging system and method
US8705047B2 (en) 2007-01-19 2014-04-22 Thorlabs, Inc. Optical coherence tomography imaging system and method
EP2171396B1 (en) 2007-07-12 2020-05-13 Volcano Corporation Apparatus and methods for uniform frequency sample clocking
DE102008063225A1 (de) * 2008-12-23 2010-07-01 Carl Zeiss Meditec Ag Vorrichtung zur Swept Source Optical Coherence Domain Reflectometry
JP5735790B2 (ja) 2010-12-02 2015-06-17 株式会社ニデック 眼科撮影装置
JP2013181790A (ja) * 2012-02-29 2013-09-12 Systems Engineering Inc 周波数走査型ｏｃｔ用サンプリングクロック発生装置の使用方法、周波数走査型ｏｃｔ用サンプリングクロック発生装置
US9400169B2 (en) * 2012-12-06 2016-07-26 Lehigh University Apparatus and method for space-division multiplexing optical coherence tomography
WO2014107287A1 (en) * 2012-12-20 2014-07-10 Kemp Nathaniel J Optical coherence tomography system that is reconfigurable between different imaging modes
JP6039493B2 (ja) * 2013-04-25 2016-12-07 キヤノン株式会社 波長掃引光源の光周波数校正方法とそのプログラム及び記憶媒体、光周波数校正装置、光干渉断層計測装置
JP2015017966A (ja) * 2013-06-13 2015-01-29 キヤノン株式会社 撮像装置および撮像方法
US10317189B2 (en) * 2014-01-23 2019-06-11 Kabushiki Kaisha Topcon Detection of missampled interferograms in frequency domain OCT with a k-clock
JP2016002382A (ja) * 2014-06-18 2016-01-12 キヤノン株式会社 撮像装置
JP6463051B2 (ja) * 2014-09-10 2019-01-30 株式会社トーメーコーポレーション 光断層画像撮影装置
JP6632266B2 (ja) * 2015-09-04 2020-01-22 キヤノン株式会社 撮像装置

Also Published As

Publication number Publication date
CN107567305A (zh) 2018-01-09
JP6685673B2 (ja) 2020-04-22
CN107567305B (zh) 2020-04-14
JP2016209529A (ja) 2016-12-15
US10478059B2 (en) 2019-11-19
US20180140183A1 (en) 2018-05-24
EP3288440B1 (en) 2019-08-14
KR20170139126A (ko) 2017-12-18
EP3288440A1 (en) 2018-03-07

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