KR101956348B1 - 전극 적층체에 있어서의 전극판의 위치 어긋남 검출 방법 및 그 장치 - Google Patents

전극 적층체에 있어서의 전극판의 위치 어긋남 검출 방법 및 그 장치 Download PDF

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KR101956348B1
KR101956348B1 KR1020177022094A KR20177022094A KR101956348B1 KR 101956348 B1 KR101956348 B1 KR 101956348B1 KR 1020177022094 A KR1020177022094 A KR 1020177022094A KR 20177022094 A KR20177022094 A KR 20177022094A KR 101956348 B1 KR101956348 B1 KR 101956348B1
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positive electrode
ray
negative electrode
electrode plate
active material
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KR20170102973A (ko
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히로시 사토
타쿠야 사카타
마사하루 시노하라
히로시 코미나토
요헤이 야마카게
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에리 파워 가부시키가이샤
도시바 아이티 앤 콘트롤 시스템 가부시키가이샤
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/05—Accumulators with non-aqueous electrolyte
    • H01M10/058—Construction or manufacture
    • H01M10/0585—Construction or manufacture of accumulators having only flat construction elements, i.e. flat positive electrodes, flat negative electrodes and flat separators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/04—Construction or manufacture in general
    • H01M10/0413—Large-sized flat cells or batteries for motive or stationary systems with plate-like electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/04—Construction or manufacture in general
    • H01M10/0436—Small-sized flat cells or batteries for portable equipment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/64—Carriers or collectors
    • H01M4/66—Selection of materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/64—Carriers or collectors
    • H01M4/66—Selection of materials
    • H01M4/661—Metal or alloys, e.g. alloy coatings
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Materials Engineering (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Toxicology (AREA)
  • Secondary Cells (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Cell Electrode Carriers And Collectors (AREA)
  • Connection Of Batteries Or Terminals (AREA)
KR1020177022094A 2015-01-13 2016-01-12 전극 적층체에 있어서의 전극판의 위치 어긋남 검출 방법 및 그 장치 KR101956348B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015004462 2015-01-13
JPJP-P-2015-004462 2015-01-13
PCT/JP2016/050682 WO2016114257A1 (ja) 2015-01-13 2016-01-12 電極積層体における電極板の位置ずれ検出方法およびその装置

Publications (2)

Publication Number Publication Date
KR20170102973A KR20170102973A (ko) 2017-09-12
KR101956348B1 true KR101956348B1 (ko) 2019-03-08

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KR1020177022094A KR101956348B1 (ko) 2015-01-13 2016-01-12 전극 적층체에 있어서의 전극판의 위치 어긋남 검출 방법 및 그 장치

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JP (1) JP6402308B2 (zh)
KR (1) KR101956348B1 (zh)
CN (1) CN107112578B (zh)
TW (1) TWI660536B (zh)
WO (1) WO2016114257A1 (zh)

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CN106091999B (zh) * 2016-07-26 2018-08-21 东莞新能源科技有限公司 一种极片错位的检测方法和装置
JP2019067645A (ja) * 2017-10-02 2019-04-25 オートモーティブエナジーサプライ株式会社 電池の検査方法
JP6563469B2 (ja) * 2017-12-15 2019-08-21 本田技研工業株式会社 電極接合方法及び電極接合装置
CN108180826B (zh) * 2017-12-20 2023-12-22 深圳湾新科技有限公司 一种锂电池卷绕层边界的检测设备及检测方法
KR102217201B1 (ko) 2018-03-29 2021-02-18 주식회사 엘지화학 전극조립체의 얼라인 검사 장치 및 그를 이용한 전극조립체의 얼라인 검사 방법
KR102629119B1 (ko) 2018-05-02 2024-01-26 에스케이온 주식회사 전극판 정렬 상태 검사 시스템 및 방법
CN108982534B (zh) * 2018-08-22 2020-12-04 合肥工业大学 一种铝箔输送位置和状态自动检测装置及其检测方法
KR102236815B1 (ko) * 2020-10-16 2021-04-06 박영호 이차전지 전극 탭의 누락 및 접힘 결함 검출장치
CN220895561U (zh) * 2021-03-08 2024-05-03 株式会社Lg新能源 电极组件的制造装置
CN113078422B (zh) * 2021-03-23 2022-11-04 东莞新能安科技有限公司 电芯及用电设备
DE102021117152A1 (de) 2021-07-02 2023-01-05 Volkswagen Aktiengesellschaft Verfahren zur Bestimmung einer Ablagegenauigkeit einer Mehrzahl von Elektrodenblättern in einem Stapel
JP7429722B2 (ja) * 2022-01-25 2024-02-08 プライムプラネットエナジー＆ソリューションズ株式会社 蓄電デバイスの箔位置特定方法及び蓄電デバイスの箔間距離算出方法
DE102023202492B3 (de) 2023-03-21 2024-03-28 Volkswagen Aktiengesellschaft Verfahren zur Prüfung eines Batterieelementestapels bezüglich der Lage von Batterieelementschichten

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JP2004022206A (ja) * 2002-06-12 2004-01-22 Toshiba It & Control Systems Corp 電池検査装置
JP2010096548A (ja) * 2008-10-14 2010-04-30 Nissan Motor Co Ltd 非水電解質二次電池検査装置

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JP2005056602A (ja) * 2003-08-05 2005-03-03 Seimi Chem Co Ltd リチウム二次電池用正極活物質粉末およびその評価方法
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JP4716138B2 (ja) * 2008-01-11 2011-07-06 トヨタ自動車株式会社 電極巻取装置、帯状電極と帯状セパレータとのずれ検知方法、当該ずれ量測定方法、当該ずれ量補正方法、および、電極巻取方法
JP2011039014A (ja) * 2009-08-06 2011-02-24 Toshiba It & Control Systems Corp 電池検査装置
KR20110017761A (ko) * 2009-08-14 2011-02-22 에스비리모티브 주식회사 이차 전지용 전극판 및 이를 포함하는 이차 전지
JP5559618B2 (ja) * 2010-06-21 2014-07-23 株式会社日立パワーソリューションズ タブ付き電極材を内装した筒型電池のタブ検査方法、その検査方法に用いるタブ検査装置、及びタブマーキング装置
JP5458327B2 (ja) * 2011-02-04 2014-04-02 東芝Ｉｔコントロールシステム株式会社 電池検査装置及び電池検査方法
CN103163549A (zh) * 2011-12-19 2013-06-19 中国科学院西安光学精密机械研究所 一种基于微通道板拼接的大面积x射线脉冲探测装置
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JP5502132B2 (ja) * 2012-04-20 2014-05-28 Ｃｋｄ株式会社 検査装置
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JP2010096548A (ja) * 2008-10-14 2010-04-30 Nissan Motor Co Ltd 非水電解質二次電池検査装置

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Publication number Publication date
JP6402308B2 (ja) 2018-10-10
WO2016114257A1 (ja) 2016-07-21
TW201640729A (zh) 2016-11-16
KR20170102973A (ko) 2017-09-12
CN107112578A (zh) 2017-08-29
CN107112578B (zh) 2019-07-05
JPWO2016114257A1 (ja) 2017-10-19
TWI660536B (zh) 2019-05-21

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