KR101954293B1 - Test extend gender to test solid state disk - Google Patents

Abstract

The test extended gender for a solid state disc of the present invention tests an SSD in which a UART port is formed to support a lower pattern formed at one end of a disk substrate and a communication interface environment of a signal transmitted and received at the other end of the disk substrate. The test extended type gender for a solid state disc includes a substrate portion on one side of which a socket for inserting the lower pattern is disposed and a test module on the other side in contact with the UART port is disposed, And a disk mounting part for connecting the UART port to the test module when the lower substrate is inserted into the socket and rotated downward when the disk substrate is slidably inserted.

Description

TEST EXTEND GENDER TO TEST SOLID STATE DISK FOR SOLID STATE DISK}

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a test extended gender for a solid state disk, and more particularly, to a test extended gender for a solid state disk, which can simultaneously test a universal asynchronous transceiver (UART) It is about test gender.

Typically, an SSD tester device is used to test solid state disks (SSDs) on PCB-free products that have no casings.

1 is a view showing a conventional solid state disc.

Referring to FIG. 1, a conventional solid state disk 10 (hereinafter referred to as SSD) has a disk substrate 11 on a rectangular plate.

A universal asynchronous transceiver (UART) port 13, which is connected to the inner circuit of the disk substrate 11, is disposed at an upper end side of the disk substrate 11. The URAT port 13 may include ten terminals, and the ten terminals may include a transmit (Tx) terminal and a receive (Rx) terminal.

A lower pattern 12 connected to the inner circuit of the disc substrate 11 is provided at the lower end of the disc substrate 11.

It is required to determine whether the electrical characteristics of the UART port 13 and the lower pattern 12 are abnormal or not by testing whether or not the UART port 13 and the lower pattern 12 are abnormal during the product production process of the SSD 10 having the above configuration.

2 is a view showing a gender for testing a conventional lower pattern.

Therefore, conventionally, the test gender 20 shown in Fig. 2 is used.

The conventional test gender 20 has a gender body 21 having a slot 21a into which the lower end of the disk substrate 11 is inserted.

Although not shown in the drawing, the gender body 21 is formed with a terminal connected to the lower pattern 12 provided at the lower end of the disk substrate 11 inserted into the slot 21a.

Thus, the test apparatus can check the normal operation and electrical characteristics of the lower pattern 12 through the terminals.

However, in the conventional test gender 20, only the lower end portion of the disc substrate 11 is inserted, so that only the lower test pattern 12 described above can be tested. In addition, The asynchronous transceiver (UART) port 13 has a problem that can not be tested.

Accordingly, in the conventional SSD manufacturing process, only the lower pattern except for the universal asynchronous transceiver (UART) port is inspected, resulting in an increase in the product defect rate and a corresponding increase in recall.

A prior art related to the present invention is Korean Patent Registration No. 10-1677709 (Registration Date: 2016.11.14), which discloses a gender structure for SSD testing.

It is an object of the present invention to provide a test extended gender for a solid state disc which can simultaneously test a universal asynchronous transceiver (UART) port and a sub pattern provided in a solid state disc.

In order to achieve the above object, a test extended type gender for a solid state disk of the present invention includes a lower pattern formed at one end of a disk substrate and a UART port supporting a communication interface environment of signals transmitted and received at the other end of the disk substrate Test the SSD.

The test extended type gender for a solid state disc includes a substrate portion on one side of which a socket for inserting the lower pattern is disposed and a test module on the other side in contact with the UART port is disposed, And a disk mounting part for connecting the UART port to the test module when the lower substrate is inserted into the socket and rotated downward when the disk substrate is slidably inserted.

The disk mounting portion includes a hinge portion formed at one end of the substrate portion, a main base having one end hinged to the hinge end and rotated along the up and down direction, and a disk base slidingly connected to the main base, And a sliding base on which the lower pattern is inserted into the socket as the sliding base is slidably moved.

It is preferable that a stopper is provided on the main base.

The stopper includes a pair of rotating members, both ends of which are rotatably connected to both ends of the main base, and a connecting member connecting the pair of rotating members.

The end portions of the pair of rotation members may extend to a predetermined length and support the upper surface of the base portion as the pair of rotation members are rotated to move the main base upward to maintain the set posture .

Wherein the base portion is provided on both sides of the main base to restrict a position at which the main base is rotated upward and a pair of A latch portion is further provided.

Each of the pair of latch portions includes a fixed body provided on the base portion and a pair of latch portions which are slid along the side of the main base on the fixed body and are brought into close contact with the base portion It is preferable to have a latch member for restricting the position.

At both sides of the main base, a step is formed in which the first stopping jaw is formed at the lower end.

A second locking protrusion connected to the step is formed at the upper ends of both sides of the main base.

The end portion of the latch member is moved along the step when the main base is rotated up and down, and caught by the first stopping jaw when the main base is rotated along the upside.

The main base is disposed to be engaged with the second engaging jaws when the main base is rotated downward to closely contact the upper surface of the base plate and is slid along the side of the main base on the fixed body.

And a return spring for elastically guiding the main base to be rotated upward is further provided at the hinge end.

It is preferable that an extension board inserted into the test gender connected to the external test apparatus at the end portion and formed with the connection pattern is further formed on the side portion of the board portion.

The connection pattern is preferably electrically connected to the socket and the test module.

The present invention has the effect of simultaneously testing a universal asynchronous transceiver (UART) port and a lower pattern provided in a solid state disk.

1 is a view showing a conventional solid state disc.
2 is a view showing a gender for testing a conventional lower pattern.
3 is a perspective view showing a test extended gender for a solid state disc of the present invention.
4 is a plan view showing a test extended gender for a solid state disc according to the present invention.
5 to 7 are perspective views illustrating a process of loading an SSD into a test extended type gender for a solid state disc of the present invention.
8 to 10 are perspective views illustrating a process of unloading an SSD on a test extended gender for a solid state disc according to the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings so that those skilled in the art can easily carry out the present invention.

The present invention may be embodied in many different forms and is not limited to the embodiments described herein.

In order to clearly illustrate the present invention, parts not related to the description are omitted, and the same or similar components are denoted by the same reference numerals throughout the specification.

Hereinafter, the term "an upper (or lower)" or a "top (or lower)" of the substrate means that any structure is disposed or arranged in any manner, as long as any structure is provided or disposed in contact with the upper surface .

Furthermore, the present invention is not limited to a configuration that does not include any other configuration between the substrate and any configuration provided or disposed on (or under) the substrate.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a test extended gender for a solid state disc according to the present invention will be described with reference to the accompanying drawings.

FIG. 3 is a perspective view showing a test extended type gender for a solid state disc according to the present invention, and FIG. 4 is a plan view showing a test extended type gender for a solid state disc according to the present invention.

3 and 4, the SSD 10 having the disk substrate 11 may be loaded or unloaded in the test extended type electric conductor for the solid state disk of the present invention.

That is, the SSD 10 in which the UART port 13 is formed to support the communication interface environment of signals transmitted and received at the other end of the disk substrate and the lower pattern 12 formed at one end of the disk substrate 11 is tested Can be adopted.

The test expanded type gender for a solid state disc of the present invention comprises a substrate portion 100 and a disc mounting portion 200.

Each of the above configurations will be described.

In the substrate portion 100,

A socket 110 for inserting the lower pattern 12 is disposed on one side of the substrate 100 and a test module 120 for contacting the UART port 13 is disposed on the other side of the socket 100. At this time, The URAT port 13 may include ten terminals, and the ten terminals may include a transmit (Tx) terminal and a receive (Rx) terminal. The test module 120 may be in contact with all or a portion of the terminals of the UART port 13. That is, the test module 120 may contact all of the terminals of the UART port 13 or may contact some of the terminals of the UART port 13, for example, the transmit (Tx) terminal and the receive (Rx) terminal.

On the side of the substrate unit 100, an extension substrate 130 is formed which is inserted into a test gender (a structure like the reference numeral 20 in FIG. 2) connected to an external test apparatus at an end and in which a connection pattern 131 is formed .

Here, the connection pattern 131 may be electrically connected to the socket 110 and the test module 120.

disk Mounting part

The disk mounting part 200 according to the present invention is rotatably connected to one end of the substrate part 100 and the lower pattern 12 is inserted into the socket 110 when the disk substrate 11 is slidably inserted. And the UART port 13 is brought into contact with the test module 120 when the UART port 13 is rotated downward.

The disk mounting portion 200 includes a hinge 210 formed at one end of the base 100 and a main base 220 hinged to the hinge 210 at one end and rotated up and down, The sliding base 230 is slidably connected to the main base 220 and the lower pattern 12 is inserted into the socket 110 as the disk substrate 11 is seated and slid .

The hinge 210 may further include a return spring 211 elastically guiding the main base 220 so as to rotate upward.

The main base 220 is provided with a stopper 240.

The stopper 240 includes a pair of rotary members 241 having both ends rotatably connected to both ends of the main base 220 and a connecting member 242 connecting the pair of rotary members 241 .

The ends of the pair of rotating members 241 are extended to a predetermined length so that the pair of rotating members 241 are rotated to support the upper surface of the base plate 100, It is possible to move upward to maintain the set posture.

In addition, the substrate unit 100 according to the present invention is disposed on both sides of the main base 220 to limit a position where the main base 220 is rotated upward, and the main base 220 A pair of latch portions 250 are provided to limit the position of the latch portion 250 so as to be in close contact with the substrate portion 100.

Each of the pair of latches 250 includes a fixed body 251 mounted on the base 100 so as to be positioned on both sides of the main base 220, And a latch member 252 slidably moving along the side of the substrate 220 and restricting its position to be in contact with the substrate 100 as it is being slid.

On both sides of the main base 220, a step 221 is formed in which a first stopping protrusion 222 is formed at a lower end.

In addition, a second latching protrusion 223 connected to the step 221 is formed at the upper end of each side of the main base 220.

In this case, the end of the latch member 252 described above is moved along the step 221 when the main base 220 is rotated up and down, and when the main base 220 is rotated along the upward direction, (Not shown).

The end of the latch member 252 is rotated downward so that the main base 220 is closely contacted to the upper surface of the substrate unit 100 and the side of the main base 220 is fixed on the fixed body 251 And may be arranged so as to be caught by the second latching jaw 223 when sliding along the second latching jaw 223.

Hereinafter, a process of loading the SSD into the test expandable gender for the solid state disk of the present invention will be described.

5 to 7 are perspective views illustrating a process of loading an SSD into a test extended type gender for a solid state disc of the present invention.

5, the main base 220 is disposed in close contact with the upper portion of the substrate unit 100, and the sliding base 230 is in an initial state in which the main base 220 does not protrude from the main base 220.

In this state, when the connecting member 242 is rotated upward, a pair of rotating members 241 connected to both ends thereof are also rotated to rotate, and the ends of each of the pair of rotating members 241, So that the main base 220 can be lifted upward with the hinge end 210 as a center of rotation.

At this time, the ends of the respective latch members 252 disposed on both sides of the main base 220 are formed on both sides of the main base 220 when the main base 220 is rotated up and down The rotation position can be regulated by being moved along the step 221 and moving along the upper direction to engage with the first engagement step 222 formed at the lower end of the step 221. [

At this time, the return spring 211 provided at the hinge end 210 is in a state where an elastic return force is formed.

Then, the sliding base 230 is forcibly slid to protrude outward from the other end of the main base 220.

Thus, the main base 220 and the sliding base 230 are formed with an area where the SSD 10 can be seated.

Therefore, the SSD 10 is seated on the main base 220 and the sliding base 230.

Referring to FIG. 6, the sliding base 230 is forcibly slid along the main base 220 so as to return to the original position.

7, the SSD 10 placed on the main base 220 and the sliding base 230 is moved toward the one end side of the main base 220 by the sliding base 230 moved to the home position And the position can be fixed in that state.

In this state, the main base 220 is rotated downward through an external force.

At this time, the pair of rotary members 241 are rotated in the home position in a state in which the ends of the pair of rotary members 241 are in contact with the upper surface of the substrate unit 100.

The pair of latch members 252 are detached from the first latching jaw 222 and are moved through the side surface of the step 221 to be engaged with the second latching jaw 223 formed at the upper end of the step 221, .

At this time, the latch member 252 of one phase slides along the fixing member 251 and is caught by the second latching jaw 223 formed at the upper end of the step 221, so that the main base 220 is rotated upward Can be regulated.

At the same time, the lower pattern 12 formed at the lower end of the SSD 10 is inserted into the socket 110 formed at one side of the substrate 100, and is formed at the upper end of the SSD 10 The UART port 13 is brought into contact with the test module 120 formed on the upper end of the substrate unit 100 on the other side thereof.

Since the socket 110 and the test module 120 are connected to the connection pattern 131, the lower pattern 12 and the UART port 13, which are formed at different positions in the SSD 10, It is possible to prepare for the test of the operation normality and the electrical characteristics of the battery at the same time.

The process of unloading the SSD to the test extended gender for the solid state disc of the present invention will be described.

8 to 10 are perspective views illustrating a process of unloading the SSD 10 to the test gender for the solid state disk of the present invention.

In the present invention, the process of unloading the SSD 10 seated as described above may be performed in the reverse order.

8, the state in which the pair of latch members 252 are held by the second latching jaws 223 is released, and the connecting member 242 is rotated upward through the pair of rotating members 241 , So that the main base 220 can be rotated upward to be positioned as shown in FIG.

Then, the sliding base 230 is moved to protrude outward from the other end of the main base 220.

Accordingly, the SSD 10 seated on the main base 220 and the sliding base 230 can be detached, and the SSD 10 can be unloaded to the outside.

10, the unloading process of the SSD 10 can be completed by returning the main base 220 and the sliding base 230 to the home position after the SSD 10 is unloaded .

Through the above arrangement and operation, the embodiment according to the present invention can simultaneously test the universal asynchronous transceiver (UART) port and the lower pattern provided in the solid state disk.

Although the embodiments of the test gender for a solid state disc according to the present invention have been described above, it is apparent that various modifications can be made without departing from the scope of the present invention.

Therefore, the scope of the present invention should not be limited to the above-described embodiments, but should be determined by the scope of the appended claims and equivalents thereof.

It is to be understood that the foregoing embodiments are illustrative and not restrictive in all respects and that the scope of the present invention is indicated by the appended claims rather than the foregoing description, It is intended that all changes and modifications derived from the equivalent concept be included within the scope of the present invention.

100:
110: Socket
120: Test module
130: Extension board
200:
210: Hinged end
211: return spring
220: Main base
230: Sliding base
240: Stopper
250: latch portion

Claims (7)

A test extended gender for a solid state disc inserted in a test gender for testing an SSD in which a UART port supporting a communication interface environment of a signal transmitted and received at the other end of the disc substrate is formed, As a result,
The test gender for the solid state disc,
A substrate portion on one side of which a socket for inserting the lower pattern is disposed and on which a test module for contacting the UART port is disposed,
And a disk mounting portion rotatably connected to one end of the substrate portion to allow the UART port to contact the test module when the disk substrate is slidably inserted and the lower pattern is inserted into the socket and rotated downward And a test extension gender for a solid state disc.
The method according to claim 1,
The disk mounting portion includes:
A hinge section formed at one end of the substrate section,
A main base having one end hinged to the hinge end and rotated up and down,
And a sliding base which is slidably connected to the main base and in which the lower pattern is inserted into the socket as the disk substrate is seated and slidably moved.
3. The method of claim 2,
The main base is provided with a stopper,
The stopper
A pair of rotation members whose both ends are rotatably connected to both ends of the main base,
And a connecting member for connecting the pair of rotating members,
And the ends of the pair of rotating members extend to a predetermined length so as to support the upper surface of the base portion as the pair of rotating members is rotated to move the main base upward to maintain the set posture Test for solid state disks.
3. The method of claim 2,
In the substrate portion,
A pair of latch portions disposed on both sides of the main base for limiting a position where the main base is rotated upward and restricting a position of the main base when the main base is moved downward, ,
Wherein each of the pair of latch portions includes:
A fixing body installed on the substrate,
And a latch member slidably moving along the side of the main base on the fixed body and restricting its position to be brought into close contact with the rotated portion and the substrate portion as the sliding body is slidably moved. .
5. The method of claim 4,
At both sides of the main base, a step is formed in which a first stopping jaw is formed at the lower end,
A second locking protrusion connected to the step is formed at the upper ends of both side portions of the main base,
The end of the latch member
The main base is moved along the step when the main base is rotated up and down, and is caught by the first stopper when rotated along the upside,
Wherein the main body is arranged to be engaged with the second engaging jaws when the main base is rotated downward so as to be in close contact with the upper surface of the base part and is slid along the side of the main base on the fixed body. Test Extended Gender.
3. The method of claim 2,
At the hinge end,
Further comprising a return spring for elastically guiding the main base to be rotated upward.
The method according to claim 1,
On the side of the substrate portion,
Wherein an extension board is further formed at an end of which a connection pattern to be inserted into the test gender connected to the external test apparatus is formed,
In the connection pattern,
And the test module is electrically connected to the socket and the test module.

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