KR101650761B1 - Flexible Substrate Chemical Vapor Deposition System - Google Patents
Flexible Substrate Chemical Vapor Deposition System Download PDFInfo
- Publication number
- KR101650761B1 KR101650761B1 KR1020150044402A KR20150044402A KR101650761B1 KR 101650761 B1 KR101650761 B1 KR 101650761B1 KR 1020150044402 A KR1020150044402 A KR 1020150044402A KR 20150044402 A KR20150044402 A KR 20150044402A KR 101650761 B1 KR101650761 B1 KR 101650761B1
- Authority
- KR
- South Korea
- Prior art keywords
- cooling
- flexible substrate
- cooling block
- substrate
- block
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 159
- 238000005229 chemical vapour deposition Methods 0.000 title claims abstract description 20
- 238000001816 cooling Methods 0.000 claims abstract description 182
- 238000000151 deposition Methods 0.000 claims abstract description 40
- 230000008021 deposition Effects 0.000 claims abstract description 35
- 239000000463 material Substances 0.000 claims abstract description 29
- 238000001704 evaporation Methods 0.000 claims description 27
- 230000008020 evaporation Effects 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 15
- 239000002826 coolant Substances 0.000 claims description 5
- 238000011084 recovery Methods 0.000 claims description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 1
- 229910052710 silicon Inorganic materials 0.000 claims 1
- 239000010703 silicon Substances 0.000 claims 1
- 238000007740 vapor deposition Methods 0.000 claims 1
- 230000008016 vaporization Effects 0.000 abstract 3
- 238000009834 vaporization Methods 0.000 abstract 3
- 238000004519 manufacturing process Methods 0.000 description 8
- 239000002184 metal Substances 0.000 description 5
- 238000005137 deposition process Methods 0.000 description 2
- 239000003507 refrigerant Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Images
Classifications
-
- H01L21/205—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
The present invention relates to a chemical vapor deposition system capable of performing chemical vapor deposition on a flexible substrate, and more particularly, to a chemical vapor deposition system capable of preventing damage to a substrate during a process of cooling a substrate heated during a vapor deposition process for a flexible substrate To a flexible substrate chemical vapor deposition system.
BACKGROUND OF THE INVENTION [0002] Recent semiconductor devices or display devices are manufactured through various manufacturing processes including a deposition process. When the substrate is heated by the various manufacturing processes and becomes hot, the substrate is cooled to a room temperature in the middle, and then transferred to the next process chamber or the manufacturing process is completed.
Many techniques have been proposed to reduce the time required for the overall manufacturing process by shortening the cooling time since it takes a long time for the high-temperature flexible substrate to cool naturally to a normal temperature level.
Among these conventional technologies are Korean Patent Laid-Open No. 10-2014-0143589 entitled "Flexible WOLED Display and Rolled-Roll Deposition for Production of Thin Film for Flexible OLED Lighting," hereinafter referred to as Prior Art 1).
According to Prior Art 1, a technique is disclosed in which a metal belt is cooled to cool a flexible substrate, and a cooled metal belt is brought into contact with a lower surface of the flexible substrate to cool the flexible substrate.
However, according to the prior art 1, since the temperature of the metal belt rises while the cooled metal belt is in contact with the flexible substrate and is cooled by thermal conduction, the metal belt also has a temperature The cooling efficiency was inevitably lowered. Therefore, it is difficult to uniformly cool the substrate uniformly and it is difficult to shorten the cooling time.
SUMMARY OF THE INVENTION An object of the present invention is to provide a flexible substrate chemical vapor deposition system capable of continuously cooling a flexible substrate more rapidly and uniformly while a deposition material is deposited.
According to an aspect of the present invention, there is provided a flexible substrate chemical vapor deposition system including: an evaporation source for evaporating a deposition material to be deposited on a flexible substrate; A vacuum chamber for containing the evaporation source and providing a space for depositing the evaporation material; A substrate supply device provided in the vacuum chamber, the substrate supply device providing the flexible substrate on which the deposition material is to be deposited; And a substrate cooling device provided on one side of the flexible substrate for cooling the heat of the flexible substrate, wherein the substrate cooling device includes: a cooling block for cooling the flexible substrate in contact with one side surface of the flexible substrate; And a cooling block moving means for moving the cooling block such that the cooling block is in contact with one side surface of the flexible substrate and moves together with the flexible substrate. May be included as one feature.
Here, the cooling block moving means of the substrate cooling apparatus includes a cooling chain which is coupled with the cooling block to support the cooling block, and moves together with the cooling block; And a rotation roller for allowing the cooling chain to circulate so that the cooling block can move.
Here, the cooling block moving means of the substrate cooling apparatus may include: a cooling belt that is coupled with the cooling block to support the cooling block, and moves together with the cooling block; And a rotation roller for allowing the cooling chain to circulate so that the cooling block can move.
Here, a plurality of the cooling blocks may be provided, and at least one of the cooling blocks may contact one side surface of the substrate.
Further, each of the plurality of cooling blocks may further include a cooling device for cooling the cooling block.
Further, the substrate cooling apparatus may further include a coolant supply device for supplying coolant to each of the plurality of cooling blocks.
Here, the substrate supply apparatus may include: a supply roller for supplying the flexible substrate to a deposition position where deposition of the deposition material is performed; A recovery roller for recovering the flexible substrate on which the deposition material is deposited; And a direction roller disposed between the supply roller and the collection roller to assist the flexible substrate to be continuously supplied to the deposition position to pass through the deposition position; May be another feature of the present invention.
The controller may further include a controller configured to control the cooling block to move at a speed equivalent to that of the flexible substrate in contact with one side surface of the flexible substrate.
A support belt for supporting the cooling block at a lower side of the cooling block so that the cooling block moving means coupled to the cooling block does not have a load due to the load of the cooling block; May be further included.
Further, the support belt may be characterized in that it circulates at a speed equivalent to the moving speed of the cooling block in contact with the lower side of the cooling block.
In the flexible substrate chemical vapor deposition system according to the present invention, since the cooling block can be cooled by heat conduction in contact with one surface of the flexible substrate, the cooling time can be further shortened, thereby reducing the production process time.
Since the cooling block is continuously cooled even in the state of being in contact with the flexible substrate, the cooling efficiency can be continuously maintained, and even cooling over the entire substrate can be suppressed.
In addition, since the flexible substrate moves at the same speed as the flexible substrate, no damage is caused to one surface of the flexible substrate, thereby improving the production efficiency.
1 and 2 are cross-sectional views schematically showing a cross-sectional view of a flexible substrate chemical vapor deposition system according to an embodiment of the present invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.
1 is a schematic cross-sectional view of a flexible substrate chemical vapor deposition system according to an embodiment of the present invention.
1, a flexible substrate chemical vapor deposition system according to an embodiment of the present invention includes an
The evaporation source (100) evaporates the evaporation material to be deposited on the surface of the flexible substrate (20). The
The
The
Unlike a normal substrate, the
This substrate supply apparatus includes a
The
The
The
The
The
The
The
It is preferable that a plurality of
The
A cooling device (not shown) for cooling the
Alternatively, in order to maintain the cooled low-temperature state of the
In this way, it is preferable that the
The cooling block moving means 320 moves the
The cooling block moving means 320 may have various forms including a rotating roller 323 and a cooling chain 321, or a configuration including a rotating roller and a cooling belt . Fig. 1 schematically shows a configuration including a rotating roller 323 and a cooling chain 321. Fig.
First, the cooling chain 321 of the cooling block moving means 320 is coupled with the
The rotation of the rotation roller 323 causes the cooling chain 321 to rotate and move within a predetermined range. Herein, the predetermined period may be a period in which deposition of the evaporation material is performed on the surface of the
The
Here, at least one
Here, the
The case where the cooling block moving means 320 includes the cooling chain 321 and the rotating roller 323 is also the same as the case including the cooling belt and the rotating roller as the cooling block moving means. There is a difference in that the cooling chain 321 rotates in a gear-like manner while being engaged with the rotating roller 323, but the cooling belt rotates using a force pushed against the outer peripheral surface of the rotating roller. Basically, (310) can be circulated and rotated, so that repetitive description will be omitted.
The cooling block moving means 320 coupled to the
Here, it is preferable that the
When the
A control unit (not shown) may be further included in the flexible substrate chemical vapor deposition system according to the present invention to control or adjust the moving speed of the
As described above, in the flexible substrate chemical vapor deposition system according to the present invention, since the cooling block can be cooled by thermal conduction in contact with one surface of the flexible substrate, the cooling time can be further shortened, There are advantages to be able to. Also, the cooling block can be continuously cooled even in the state of being in contact with the flexible substrate, so that the cooling efficiency can be improved. Furthermore, since the cooling block is uniformly cooled throughout the substrate, damage to the substrate due to uneven cooling can be suppressed. Further, since the flexible substrate moves at the same speed as the flexible substrate, there is no damage to one surface of the flexible substrate, which is advantageous in increasing the production efficiency.
While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, It is to be understood that the scope of the present invention is to be construed as being limited only by the embodiments, and the scope of the present invention should be understood as the following claims and their equivalents.
10: Vacuum chamber 20: Flexible substrate
100: evaporation source 210: feed roller
220:
300: substrate cooling apparatus 310: cooling block
320: cooling chain 410: support belt
420: Support Belt Circulation Roller
Claims (10)
A vacuum chamber for containing the evaporation source and providing a space for depositing the evaporation material;
A substrate supply device provided in the vacuum chamber, the substrate supply device providing the flexible substrate on which the deposition material is to be deposited; And
And a substrate cooling device provided on one side of the flexible substrate for cooling the heat of the flexible substrate,
The substrate cooling apparatus includes:
A cooling block for cooling the flexible substrate in contact with one side surface of the flexible substrate; And
A cooling block moving means for moving the cooling block to move together with the flexible substrate while keeping the cooling block in contact with one side surface of the flexible substrate; Wherein the flexible substrate chemical vapor deposition system comprises a flexible substrate chemical vapor deposition system.
Wherein the cooling block moving means of the substrate cooling apparatus includes:
A cooling chain in engagement with the cooling block to support the cooling block and move with the cooling block; And
And a rotating roller for allowing the cooling chain to circulate so that the cooling block can be moved.
Wherein the cooling block moving means of the substrate cooling apparatus includes:
A cooling belt in engagement with the cooling block to support the cooling block and move with the cooling block; And
And a rotation roller for allowing the cooling belt to circulate so that the cooling block can be moved.
Wherein a plurality of cooling blocks are provided, and at least one of the cooling blocks is in contact with one side surface of the substrate.
In each of the plurality of cooling blocks,
And a cooling device for cooling the cooling block is incorporated in the flexible substrate chemical vapor deposition system.
The substrate cooling apparatus includes:
And a coolant supply device for supplying coolant to each of the plurality of cooling blocks.
The substrate supply apparatus includes:
A supply roller for supplying the flexible substrate to a deposition position where vapor deposition of the evaporation material is performed;
A recovery roller for recovering the flexible substrate on which the deposition material is deposited; And
A direction roller positioned between the supply roller and the collection roller to assist the flexible substrate to be continuously supplied to the deposition position and pass through the deposition position; Wherein the substrate is a silicon substrate.
Further comprising a controller for controlling the cooling block to move at a speed equivalent to that of the flexible substrate in contact with one side surface of the flexible substrate.
A support belt for supporting the cooling block at a lower side of the cooling block so that the cooling block moving means coupled to the cooling block does not have a load due to the load of the cooling block; Further comprising the step of: depositing a flexible substrate chemical vapor deposition system on the flexible substrate.
The support belt
Wherein the cooling block is rotated at a speed equivalent to the moving speed of the cooling block in contact with the lower side of the cooling block.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150044402A KR101650761B1 (en) | 2015-03-30 | 2015-03-30 | Flexible Substrate Chemical Vapor Deposition System |
PCT/KR2015/009509 WO2016159460A1 (en) | 2015-03-30 | 2015-09-10 | Flexible substrate chemical vapor deposition system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150044402A KR101650761B1 (en) | 2015-03-30 | 2015-03-30 | Flexible Substrate Chemical Vapor Deposition System |
Publications (1)
Publication Number | Publication Date |
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KR101650761B1 true KR101650761B1 (en) | 2016-08-24 |
Family
ID=56884406
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020150044402A KR101650761B1 (en) | 2015-03-30 | 2015-03-30 | Flexible Substrate Chemical Vapor Deposition System |
Country Status (1)
Country | Link |
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KR (1) | KR101650761B1 (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4369531B2 (en) * | 2008-02-20 | 2009-11-25 | パナソニック株式会社 | Thin film forming apparatus and thin film forming method |
KR100952172B1 (en) * | 2008-03-28 | 2010-04-09 | 안우영 | Patten sputtering apparatus for direct patten forming and method for circuit forming of flexible printed circuit board |
KR20100094553A (en) * | 2007-12-05 | 2010-08-26 | 파나소닉 주식회사 | Thin film forming apparatus and thin film forming method |
JP4657385B2 (en) * | 2009-04-22 | 2011-03-23 | パナソニック株式会社 | Thin film forming apparatus and thin film forming method |
-
2015
- 2015-03-30 KR KR1020150044402A patent/KR101650761B1/en active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20100094553A (en) * | 2007-12-05 | 2010-08-26 | 파나소닉 주식회사 | Thin film forming apparatus and thin film forming method |
JP4369531B2 (en) * | 2008-02-20 | 2009-11-25 | パナソニック株式会社 | Thin film forming apparatus and thin film forming method |
KR100952172B1 (en) * | 2008-03-28 | 2010-04-09 | 안우영 | Patten sputtering apparatus for direct patten forming and method for circuit forming of flexible printed circuit board |
JP4657385B2 (en) * | 2009-04-22 | 2011-03-23 | パナソニック株式会社 | Thin film forming apparatus and thin film forming method |
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