KR101438182B1 - Attachment for controlling the flow rate and temperature of brine - Google Patents
Attachment for controlling the flow rate and temperature of brine Download PDFInfo
- Publication number
- KR101438182B1 KR101438182B1 KR1020140079090A KR20140079090A KR101438182B1 KR 101438182 B1 KR101438182 B1 KR 101438182B1 KR 1020140079090 A KR1020140079090 A KR 1020140079090A KR 20140079090 A KR20140079090 A KR 20140079090A KR 101438182 B1 KR101438182 B1 KR 101438182B1
- Authority
- KR
- South Korea
- Prior art keywords
- brine
- pipe
- temperature
- outlet
- heat exchanger
- Prior art date
Links
- 239000012267 brine Substances 0.000 title claims abstract description 257
- HPALAKNZSZLMCH-UHFFFAOYSA-M sodium;chloride;hydrate Chemical compound O.[Na+].[Cl-] HPALAKNZSZLMCH-UHFFFAOYSA-M 0.000 title claims abstract description 257
- 238000000034 method Methods 0.000 claims abstract description 67
- 239000000498 cooling water Substances 0.000 claims description 33
- 239000004065 semiconductor Substances 0.000 abstract description 23
- 239000003507 refrigerant Substances 0.000 abstract description 10
- 238000007710 freezing Methods 0.000 abstract description 8
- 230000008014 freezing Effects 0.000 abstract description 8
- 239000002826 coolant Substances 0.000 abstract description 4
- 230000001276 controlling effect Effects 0.000 description 19
- 238000005057 refrigeration Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000004886 process control Methods 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000004148 unit process Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Other Air-Conditioning Systems (AREA)
Abstract
Description
The present invention relates to a device used for stable process temperature control in a semiconductor process or the like, and more particularly, to a device that can be installed close to a semiconductor device to precisely control the temperature of a brine supplied to a semiconductor device from a chiller using a refrigeration cycle And an additional device for controlling the brine temperature and the flow rate.
Chiller is a temperature control device for stable process control in semiconductor device manufacturing process.
Typically, the semiconductor process is performed in accordance with a predetermined order in a process chamber of each unit process, and various kinds of auxiliary devices are configured so that a normal process can be performed in the process chamber.
In addition, the semiconductor process includes a process environment requiring a high temperature such as an oxidation process. Alternatively, each component or ancillary equipment installed to perform a semiconductor process may be self-generated.
In order to proceed with a normal semiconductor process, both the former and the latter must be cooled to a certain temperature or below, and a coolant circulation system is configured in the semiconductor process facility.
Therefore, a chiller is required for stable process control in a semiconductor device manufacturing process. In particular, in the semiconductor device manufacturing process, chiller is mainly used in etching and exposure processes in various processes. By maintaining the temperature of the electrode plate and chamber where excessive heat is generated during the process, the wafer is damaged and productivity And the like.
A conventional chiller for absorbing heat generated during the process of equipment used in a semiconductor process is configured as shown in Fig.
4, the
Hereinafter, the circulation path of the refrigerant will be described first, and then the circulation path of the brine will be described.
The refrigerant changed from the compressor (14) to the high temperature and high pressure state is condensed while releasing heat from the condenser (15). The refrigerant that has released heat is decompressed through the
The brine circulating in the
In the
It is an object of the present invention to provide an attachment capable of minimizing the power consumption of a chiller using a refrigeration cycle and controlling the temperature and flow rate of the brine. Another object of the present invention is to provide an additional device for brine temperature and flow control, which can be easily installed between existing process equipment and chiller without changing the existing process equipment and the structure of the chiller.
In order to achieve the above object, a brine temperature and flow rate control device according to the present invention is installed between a process facility where a brine is used for process temperature control and a chiller.
This device is supplied to the first inlet, which is a path through which the brine circulating process equipment is introduced, the second inlet which is a passage through which the brine passes through the chiller, the first outlet which is a passage through which the brine supplied to the chiller is discharged, And a second outlet which is a passage through which the brine is discharged.
It is also possible to supply cooling water to the second heat exchanger and the first heat exchanger configured to cause heat exchange between the brine cooled by the chiller and the brine supplied from the process facility so that heat exchange takes place between the cooling water and the brine And a cooling water pipe.
The first brine pipe forming a path connecting the first inlet, the first heat exchanger and the first outlet, and the second brine pipe forming a path connecting the second inlet, the second heat exchanger and the first brine pipe, A third brine pipe forming a path connecting the pipe, the first brine pipe, the second heat exchanger and the second outlet; and a third brine pipe provided between the second inlet side second brine pipe and the second outlet side third brine pipe And a brine pipe having a first bypass pipe and configured to allow the brine to flow.
A first three-way valve installed in the first brine pipe and configured to connect the first brine pipe and the third brine pipe, and a second three-way valve installed in the first brine pipe and configured to connect the first brine pipe and the second brine pipe, And a third three-way valve installed in the second brine pipe and configured to connect the second brine pipe and the first bypass pipe.
In the high temperature operation mode, the brine introduced through the first inlet is discharged to the first outlet after the heat exchange with the cooling water in the first heat exchanger, and the brine introduced through the second inlet is discharged to the second outlet, , The second three-way valve and the third three-way valve are controlled. In the low-temperature operation mode, the brine introduced through the first inlet is discharged to the second outlet after heat exchange with the brine cooled in the chiller in the second heat exchanger, And a controller configured to control the first three-way valve, the second three-way valve, and the third three-way valve so that the cooled brine introduced through the first heat exchanger is discharged to the first outlet after heat exchange with the brine supplied from the process facility in the second heat exchanger .
The above-described brine temperature and flow control addition apparatus preferably further includes a cooling water flow rate control valve provided in the cooling water pipe. It is also preferable to further include a first brine flow rate control valve provided in the second brine pipe.
It is preferable to further include a second bypass pipe provided between the first inlet-side first brine pipe and the second outlet-side third brine pipe, and a second brine flow rate control valve provided in the second bypass pipe . Here, the third brine pipe is provided with a flow rate sensor, and the controller is preferably configured to receive the brine flow rate data from the flow rate sensor and to control the second brine flow rate control valve.
It is further preferred that the apparatus further comprises temperature sensors respectively installed in the first inlet, the second inlet, the first outlet, and the brine pipe adjacent to the second outlet.
The apparatus may further include a brine storage tank installed in a third brine pipe between the second heat exchanger and the second outlet.
The brine temperature and flow control addition device according to the present invention cools the brine through heat exchange with the cooling water in the high temperature operation mode. Therefore, it is possible to reduce the power consumption due to the operation of the refrigerant cycle of the unnecessary chiller. Further, by controlling the flow rate of the cooling water even in the heat exchange with the cooling water, heater operation for maintaining the brine temperature required in the semiconductor processing facility can be minimized.
Further, the brine temperature and flow control device according to the present invention can be easily installed in a conventional semiconductor process facility.
In addition, the brine temperature and flow control device according to the present invention can control not only the temperature of the brine but also the flow rate.
BRIEF DESCRIPTION OF DRAWINGS FIG. 1 is a configuration diagram showing a state in which an additional device for controlling brine temperature and flow rate according to the present invention is installed between a refrigeration chiller and a process facility.
Figs. 2 and 3 are flowcharts of the brine temperature and flow control device shown in Fig. 1. Fig.
4 is a flow diagram of a conventional refrigeration chiller.
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The following embodiments are provided by way of example so that those skilled in the art can fully understand the spirit of the present invention. Therefore, the present invention is not limited to the embodiments described below, but may be embodied in other forms.
BRIEF DESCRIPTION OF DRAWINGS FIG. 1 is a configuration diagram showing a state in which an additional device for controlling brine temperature and flow rate according to the present invention is installed between a refrigeration chiller and a process facility. Figs. 2 and 3 are flowcharts of the brine temperature and flow control device shown in Fig. 1. Fig.
1, the brine circulating the
The brine temperature and flow rate controlling
In the low temperature processing mode in which the brine setting temperature of the
Figs. 2 and 3 are flowcharts of the brine temperature and flow control device shown in Fig. 1. Fig. Hereinafter, referring to FIGS. 2 and 3, a more detailed description will be given.
2 and 3, the brine temperature and flow
In the first heat exchanger (25), heat exchange occurs between the cooling water and the brine supplied from the process facility (1). As the
In the second heat exchanger (26), heat exchange occurs between the brine cooled by the chiller (10) and the brine supplied from the process facility (1). The
The cooling
The brine piping 28 forms a path through which the brine supplied from the
The second brine pipe 28-2 forms a path connecting the
The third brine pipe 28-3 forms a path connecting the first three-
The brine pipe 28 is connected to the first brine pipe 28-3 disposed between the second brine pipe 28-2 on the
The first three-
The second three-
The third three-
A
The
The
Hereinafter, the operation of the brine temperature and flow
If the brine setting temperature of the
The brine supplied to the freezing
In summary, in the high temperature operation mode, the brine temperature and flow
Hereinafter, the operation of the brine temperature and flow
When the brine setting temperature of the
The cold brine introduced into the brine temperature and flow
In summary, in the low temperature operation mode, the brine temperature and flow
In the high temperature operation mode, a brine circulating through the
This embodiment is different from the conventional example shown in Fig. 4 in that the brine cooled by the
While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
1: Process equipment 10: Chiller
20: Additional device for brine temperature and flow control
21: first inlet 22: first outlet
23: second inlet 24: second outlet
25: first heat exchanger 26: second heat exchanger
27: cooling water piping 28: brine piping
29: brine storage tank 30: controller
31: first three-way valve 32: second three-way valve
33: third three-way valve 34: cooling water flow control valve
35, 37: communication line 38: first brine flow rate control valve
39: second brine flow rate control valve 40: flow rate sensor
41: pump 42: temperature sensor
Claims (7)
The first inlet, which is the passage through which the brine circulating the process equipment flows, the second inlet which is the passage through which the brine passes through the chiller, the first outlet which is the passage through which the brine supplied to the chiller is discharged, A second outlet,
A first heat exchanger configured to cause heat exchange between the cooling water and the brine,
A second heat exchanger configured to cause heat exchange between the brine cooled by the chiller and the brine supplied from the process facility,
A cooling water pipe configured to supply cooling water to the first heat exchanger,
A first brine pipe forming a path connecting the first inlet, the first heat exchanger and the first outlet, and a second brine pipe forming a path connecting the second inlet, the second heat exchanger and the first brine pipe, A third brine pipe forming a path connecting the first brine pipe, the second heat exchanger and the second outlet, and a third brine pipe forming a path connecting the second brine pipe, the second outlet pipe, A brine pipe provided with a bypass pipe and configured to flow brine,
A first three-way valve installed in the first brine pipe and configured to connect the first brine pipe and the third brine pipe, a second three-way valve installed in the first brine pipe, and configured to connect the first brine pipe and the second brine pipe, A third three-way valve installed in the second brine pipe and configured to connect the second brine pipe and the first bypass pipe,
In the high temperature operation mode, the brine introduced through the first inlet is discharged to the first outlet after heat exchange with the cooling water in the first heat exchanger, and the first three-way valve, In the low temperature operation mode, the brine introduced through the first inlet is discharged to the second outlet after the heat exchange with the brine cooled in the chiller in the second heat exchanger, and the second inlet And a controller configured to control the first three-way valve, the second three-way valve and the third three-way valve so that the cooled brine introduced through the second heat exchanger is discharged to the first outlet after heat exchange with the brine supplied from the process facility in the second heat exchanger Apparatus for temperature and flow control.
And a cooling water flow rate control valve provided in the cooling water pipe.
And a first brine flow rate control valve provided in the second brine pipe.
A second bypass pipe provided between the first brine piping of the first inlet side and the third brine pipe of the second outlet side and a second brine flow rate control valve provided on the second bypass pipe, Additional device.
A flow sensor is installed in the third brine pipe,
And the controller is configured to receive the brine flow rate data from the flow rate sensor and to control the second brine flow rate control valve.
Further comprising temperature sensors respectively installed in the first inlet, the second inlet, the first outlet, and the second outlet and the brine pipe adjacent to the brine.
And a brine storage tank installed in a third brine pipe between the second heat exchanger and the second outlet.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140079090A KR101438182B1 (en) | 2014-06-26 | 2014-06-26 | Attachment for controlling the flow rate and temperature of brine |
PCT/KR2015/006328 WO2015199399A1 (en) | 2014-06-26 | 2015-06-22 | Attachment for controlling temperature and flow rate of brine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140079090A KR101438182B1 (en) | 2014-06-26 | 2014-06-26 | Attachment for controlling the flow rate and temperature of brine |
Publications (1)
Publication Number | Publication Date |
---|---|
KR101438182B1 true KR101438182B1 (en) | 2014-09-05 |
Family
ID=51759490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020140079090A KR101438182B1 (en) | 2014-06-26 | 2014-06-26 | Attachment for controlling the flow rate and temperature of brine |
Country Status (2)
Country | Link |
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KR (1) | KR101438182B1 (en) |
WO (1) | WO2015199399A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101948084B1 (en) * | 2018-12-04 | 2019-02-14 | 홍석진 | Water box system for semiconductor wafer manufacturing |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004014617A (en) | 2002-06-04 | 2004-01-15 | Daikin Ind Ltd | Semiconductor manufacturing apparatus |
JP2006253454A (en) | 2005-03-11 | 2006-09-21 | Tokyo Electron Ltd | Temperature control system and substrate processor |
KR100725720B1 (en) | 2005-11-07 | 2007-06-08 | 유니셈(주) | Chiller apparatus for semiconductor process device |
KR100754842B1 (en) | 2006-11-01 | 2007-09-04 | (주)피티씨 | Chiller apparatus for semiconductor equipment and method controlling the same |
-
2014
- 2014-06-26 KR KR1020140079090A patent/KR101438182B1/en active IP Right Grant
-
2015
- 2015-06-22 WO PCT/KR2015/006328 patent/WO2015199399A1/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004014617A (en) | 2002-06-04 | 2004-01-15 | Daikin Ind Ltd | Semiconductor manufacturing apparatus |
JP2006253454A (en) | 2005-03-11 | 2006-09-21 | Tokyo Electron Ltd | Temperature control system and substrate processor |
KR100725720B1 (en) | 2005-11-07 | 2007-06-08 | 유니셈(주) | Chiller apparatus for semiconductor process device |
KR100754842B1 (en) | 2006-11-01 | 2007-09-04 | (주)피티씨 | Chiller apparatus for semiconductor equipment and method controlling the same |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101948084B1 (en) * | 2018-12-04 | 2019-02-14 | 홍석진 | Water box system for semiconductor wafer manufacturing |
Also Published As
Publication number | Publication date |
---|---|
WO2015199399A1 (en) | 2015-12-30 |
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