KR101401012B1 - 단차형 리테이닝 링 - Google Patents

단차형 리테이닝 링 Download PDF

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Publication number
KR101401012B1
KR101401012B1 KR1020097009811A KR20097009811A KR101401012B1 KR 101401012 B1 KR101401012 B1 KR 101401012B1 KR 1020097009811 A KR1020097009811 A KR 1020097009811A KR 20097009811 A KR20097009811 A KR 20097009811A KR 101401012 B1 KR101401012 B1 KR 101401012B1
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KR
South Korea
Prior art keywords
retaining ring
annular
carrier head
lower portion
recess
Prior art date
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KR1020097009811A
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English (en)
Korean (ko)
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KR20090066328A (ko
Inventor
샤운 반 데르 빈
스티븐 엠. 주니가
Original Assignee
어플라이드 머티어리얼스, 인코포레이티드
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Application filed by 어플라이드 머티어리얼스, 인코포레이티드 filed Critical 어플라이드 머티어리얼스, 인코포레이티드
Publication of KR20090066328A publication Critical patent/KR20090066328A/ko
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • B24B37/32Retaining rings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10Methods of surface bonding and/or assembly therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
KR1020097009811A 2006-10-13 2007-02-28 단차형 리테이닝 링 Active KR101401012B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/549,622 US7789736B2 (en) 2006-10-13 2006-10-13 Stepped retaining ring
US11/549,622 2006-10-13
PCT/US2007/005251 WO2008045132A1 (en) 2006-10-13 2007-02-28 Stepped retaining ring

Publications (2)

Publication Number Publication Date
KR20090066328A KR20090066328A (ko) 2009-06-23
KR101401012B1 true KR101401012B1 (ko) 2014-05-29

Family

ID=38292642

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020097009811A Active KR101401012B1 (ko) 2006-10-13 2007-02-28 단차형 리테이닝 링

Country Status (7)

Country Link
US (5) US7789736B2 (enExample)
EP (1) EP2076359B8 (enExample)
JP (1) JP5330998B2 (enExample)
KR (1) KR101401012B1 (enExample)
CN (2) CN102275127B (enExample)
TW (1) TWI389190B (enExample)
WO (1) WO2008045132A1 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008062355A (ja) * 2006-09-08 2008-03-21 Fujitsu Ltd 研磨装置及び電子装置の製造方法
US7789736B2 (en) 2006-10-13 2010-09-07 Applied Materials, Inc. Stepped retaining ring
US8337111B2 (en) * 2009-12-08 2012-12-25 GM Global Technology Operations LLC Axial retention assembly
US8967978B2 (en) 2012-07-26 2015-03-03 Pratt & Whitney Canada Corp. Axial retention for fasteners in fan joint
DE102013214020A1 (de) 2013-07-17 2015-02-19 Stabilo International Gmbh Digitaler Stift
JP6403981B2 (ja) * 2013-11-13 2018-10-10 株式会社荏原製作所 基板保持装置、研磨装置、研磨方法、およびリテーナリング
US10252397B2 (en) * 2014-10-30 2019-04-09 Applied Materials, Inc. Methods and apparatus for profile and surface preparation of retaining rings utilized in chemical mechanical polishing processes
TWM504343U (zh) * 2014-12-05 2015-07-01 Kai Fung Technology Co Ltd 化學機械研磨固定裝置
US10500695B2 (en) 2015-05-29 2019-12-10 Applied Materials, Inc. Retaining ring having inner surfaces with features
TWD179095S (zh) * 2015-08-25 2016-10-21 荏原製作所股份有限公司 基板保持環
US10688750B2 (en) * 2017-10-03 2020-06-23 Applied Materials, Inc. Bonding structure of E chuck to aluminum base configuration
WO2019070757A1 (en) * 2017-10-04 2019-04-11 Applied Materials, Inc. RING RING DESIGN
DE102018110881A1 (de) * 2018-05-07 2019-11-07 Schaeffler Technologies AG & Co. KG Anordnung zur Fliehkraftsicherung zumindest eines auf einer Rotorwelle einer elektrischen Maschine zur Lagesicherung axial festgesetzten Sicherungsrings und Verwendung einer solchen Anordnung
KR102708235B1 (ko) * 2019-06-03 2024-09-23 주식회사 케이씨텍 기판의 연마 장치용 캐리어 헤드의 리테이너 링
CN110181355B (zh) * 2019-06-27 2021-08-17 西安奕斯伟硅片技术有限公司 一种研磨装置、研磨方法及晶圆
CN112536713A (zh) * 2019-09-23 2021-03-23 清华大学 一种保持环
CN110524412B (zh) * 2019-09-30 2024-07-12 清华大学 一种化学机械抛光保持环和化学机械抛光承载头
KR102817778B1 (ko) * 2020-04-29 2025-06-05 어플라이드 머티어리얼스, 인코포레이티드 균일성 개선을 위한 히터 커버 플레이트
KR102727514B1 (ko) * 2020-11-09 2024-11-08 주식회사 케이씨텍 리테이너링 및 이를 포함하는 기판 연마 장치
US20230023915A1 (en) * 2021-07-21 2023-01-26 Applied Materials, Inc. Interlocked stepped retaining ring
US20230129597A1 (en) * 2021-10-27 2023-04-27 Sch Power Tech Co., Ltd. Retaining Ring for Wafer Polishing
WO2024224356A2 (en) * 2023-04-28 2024-10-31 Shpp Global Technologies B.V. Article for chemical mechanical polishing process and chemical mechanical polishing system including the article
CN119786402A (zh) * 2024-12-20 2025-04-08 拓荆创益(沈阳)半导体设备有限公司 晶圆托盘、薄膜沉积设备及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200338451Y1 (ko) * 2003-04-30 2004-01-16 어플라이드 머티어리얼스, 인코포레이티드 두 부분으로 이루어진 리테이닝 링

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5738574A (en) 1995-10-27 1998-04-14 Applied Materials, Inc. Continuous processing system for chemical mechanical polishing
US5948204A (en) 1996-12-30 1999-09-07 Intel Corporation Wafer carrier ring method and apparatus for chemical-mechanical planarization
US6068548A (en) 1997-12-17 2000-05-30 Intel Corporation Mechanically stabilized retaining ring for chemical mechanical polishing
US6251215B1 (en) 1998-06-03 2001-06-26 Applied Materials, Inc. Carrier head with a multilayer retaining ring for chemical mechanical polishing
US6186880B1 (en) * 1999-09-29 2001-02-13 Semiconductor Equipment Technology Recyclable retaining ring assembly for a chemical mechanical polishing apparatus
CN2517109Y (zh) * 2001-12-06 2002-10-16 陈水源 一种晶片研磨用定位环
CN2538485Y (zh) * 2002-01-23 2003-03-05 陈水源 晶圆研磨定位环
DE10247180A1 (de) 2002-10-02 2004-04-15 Ensinger Kunststofftechnologie Gbr Haltering zum Halten von Halbleiterwafern in einer chemisch-mechanischen Poliervorrichtung
TWM255104U (en) 2003-02-05 2005-01-11 Applied Materials Inc Retaining ring with flange for chemical mechanical polishing
DE50304463D1 (de) 2003-04-04 2006-09-14 Leister Process Tech Verfahren und Vorrichtung zum überlappenden Verschweissen von flächigen Kunststoffmaterialien
US6821192B1 (en) * 2003-09-19 2004-11-23 Applied Materials, Inc. Retaining ring for use in chemical mechanical polishing
JP2007537052A (ja) 2004-05-13 2007-12-20 アプライド マテリアルズ インコーポレイテッド 導電部を備えた保持リング
US7789736B2 (en) * 2006-10-13 2010-09-07 Applied Materials, Inc. Stepped retaining ring
TWM485089U (zh) 2014-01-10 2014-09-01 Tanong Prec Technology Co Ltd 微霧系統

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200338451Y1 (ko) * 2003-04-30 2004-01-16 어플라이드 머티어리얼스, 인코포레이티드 두 부분으로 이루어진 리테이닝 링

Also Published As

Publication number Publication date
KR20090066328A (ko) 2009-06-23
US20190030679A1 (en) 2019-01-31
CN102275127A (zh) 2011-12-14
CN102275127B (zh) 2015-01-07
TWI389190B (zh) 2013-03-11
US11958164B2 (en) 2024-04-16
JP2010505638A (ja) 2010-02-25
US20130231031A1 (en) 2013-09-05
CN101522370B (zh) 2011-08-17
TW200818293A (en) 2008-04-16
US10040168B2 (en) 2018-08-07
EP2076359B1 (en) 2016-07-13
US7789736B2 (en) 2010-09-07
CN101522370A (zh) 2009-09-02
US9694470B2 (en) 2017-07-04
WO2008045132A1 (en) 2008-04-17
EP2076359A1 (en) 2009-07-08
US20100303584A1 (en) 2010-12-02
US20170312882A1 (en) 2017-11-02
JP5330998B2 (ja) 2013-10-30
US20080096467A1 (en) 2008-04-24
US8465345B2 (en) 2013-06-18
EP2076359B8 (en) 2017-08-16

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