KR101383041B1 - Board type strain gauge sensor and board body thereof - Google Patents

Abstract

Substrate-type strain measurement sensor and the substrate body of the present invention, the substrate body having a plurality of beams formed side by side spaced apart from each other and connected to the frame located in the frame and a space having a center penetrated space, and It is characterized in that it comprises a strain gauge attached to the beam to measure the strain, thereby making it possible to measure the degree of deformation using the substrate body itself as a deformation structure without having to provide a separate deformation structure, the cost of the production And time is saved.

Description

Board type strain gauge sensor and board body

The present invention relates to strain measurement technology, and more particularly, to a strain measurement sensor and its structure, the method of fabrication of which is simplified while more precisely measuring the deformation due to pressure and the like at a plurality of points.

A pressure sensor is a device that measures pressure in a specific system, and is widely used for various applications such as industrial measurement, automatic control, medical, automotive engineer, environmental control, and electric appliances. The measurement principle of a pressure sensor is to measure an electrical change due to displacement, deformation, etc., and various types of sensors are put into practical use.

Types of pressure sensors include mechanical pressure sensors using bellows or bellows, pressure resistive electronic pressure sensors using strain gauges, and capacitive electronic pressure sensors measuring the displacement of capacitances between two objects. In particular, piezoresistive sensors using strain gauges are the most popular in terms of performance and price.

Strain refers to the degree of deformation or strain, which is the ratio of the length of an object stretched or shrunk to its original length when stretched or compressed. In the field of dealing with element analysis, it is a term used when a structure or a mechanical element receives external force and deformation occurs. A strain gauge is a gauge attached to the surface of a structure to measure the state and amount of the strain due to such strain. An electric strain gauge measures the strain of the structure by varying the resistance, There are mechanical strain gauges that measure mechanically.

An electric strain gage device uses a metal with a large resistance change. When a metal having a large resistance change is used, resistance is measured by forming a resistance wire in the form of a wire or a foil on an insulator.

Sensors equipped with such strain gauges prevent malfunctions or safety accidents of machines and the like, and enable the user to quickly recognize and respond to an unexpected situation. Also, the smaller the volume of such a sensor, the less influence on other driving parts and the better the space efficiency.

Therefore, a sensor that is small in size and easy to fabricate and capable of precisely detecting deformation due to pressure or the like is required.

SUMMARY OF THE INVENTION An object of the present invention for solving the above problems is to provide a substrate-type strain measurement sensor and its substrate body that are easy to manufacture and relatively small in size while being able to precisely measure the deformation due to pressure. will be.

Substrate-type deformation measurement sensor of the present invention for achieving the above object, a frame having a space penetrated in the center, and a plurality of beams located in the penetrated space and both ends connected to the frame and spaced apart from each other It characterized in that it comprises a substrate body having a strain gauge attached to the beam and measuring the strain of the beam.

In the substrate type strain measurement sensor of the present invention, the plurality of beams are characterized in that the M x N matrix (M, N is a natural number).

In the substrate type strain measurement sensor of the present invention, the substrate body is characterized in that made of a flexible or rigid material.

In the substrate type strain measurement sensor of the present invention, the beam is disconnected from the center, and one end of the beam includes two sub-beams connected to the frame.

In the substrate-type strain measurement sensor of the present invention, the beam is a column, a cylinder, a pyramid whose end is cut, a pillar whose thickness is thinner than other portions, a pillar whose thickness is thicker than other portions, and one or more gradients in the longitudinal direction. Characterized in that one or more of the pillars having a shape.

The substrate-type strain measuring sensor of the present invention further comprises a signal processing module located on an integral substrate with the substrate body or on a separate substrate to process a signal according to the strain measured by the strain gauge. do.

In the substrate-type strain measurement sensor of the present invention, the signal processing module, the amplifying unit for amplifying the signal transmitted from the strain gauge, a signal processing unit for digitizing the signal transmitted by the amplifier, and the offset of the semiconductor strain gauges And at least one of an offset adjusting unit to adjust.

The substrate body of the substrate-type strain measurement sensor of the present invention for achieving the above object, the frame in the form of a substrate having a space penetrated in the center, and the end is located in the penetrated space in the form of a support beam in the frame And a plurality of beams connected to and spaced apart from each other and attached to a strain gauge for measuring strain.

According to the substrate-type deformation measurement sensor and the substrate body according to the present invention can be expected the following effects.

First, it is possible to measure the deformation degree using the substrate body itself as a deformation structure without having to provide a separate deformation structure, thereby reducing the cost and time according to the manufacturing.

Second, there is an advantage that the size is relatively small by directly attaching the strain gauge to the thin substrate body.

Third, by forming a penetrated space in the planar substrate body, and attaching a strain gauge to the beam formed according to this, the strain according to the pressure is increased and thus the strain measurement is easy.

1 is a block diagram of a substrate-type deformation measurement sensor according to a first embodiment of the present invention.
2 is a block diagram of a substrate-type deformation measurement sensor according to a second embodiment of the present invention.
3 is a block diagram of a substrate-type deformation measurement sensor according to a third embodiment of the present invention.
4 is a block diagram of a substrate-type deformation measurement sensor according to a fourth embodiment of the present invention.
5 is a block diagram of a substrate-type deformation measurement sensor according to a fifth embodiment of the present invention.
6 is a configuration diagram of a signal processing module according to the fourth embodiment or the fifth embodiment.

In the following description, only parts necessary for understanding the embodiments of the present invention will be described, and the description of other parts will be omitted so as not to obscure the gist of the present invention.

The terms and words used in the present specification and claims should not be construed as limited to ordinary or dictionary meanings and the inventor is not limited to the meaning of the terms in order to describe his invention in the best way. It should be interpreted as meaning and concept consistent with the technical idea of the present invention. Therefore, the embodiments described in the present specification and the configurations shown in the drawings are merely preferred embodiments of the present invention, and are not intended to represent all of the technical ideas of the present invention, so that various equivalents And variations are possible.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a block diagram of a substrate-type deformation measurement sensor 100 according to a first embodiment of the present invention.

Referring to FIG. 1, the strain measurement sensor 100 of the first embodiment includes a frame 110, a plurality of beams 120, and a strain gauge 130.

The frame 110 has a space penetrating the center of the frame 110 to surround the plurality of beams 120.

The plurality of beams 120 are formed in the form of a supporting beam in a perforated shape of the frame 110. At this time, each of the plurality of beams 120 is spaced apart from one another.

The strain gauge 130 is located in a plurality of beams 120 to measure the strain of each of the beams 120.

In the strain measurement sensor 100, the frame 110 and the plurality of beams 120 form a through shape by drilling holes in the substrate body itself of a printed circuit board, such as a printed circuit board (PCB) or a flexible printed circuit board (FPCB). Can be formed in a manner. Accordingly, the substrate body including the frame 110 and the plurality of beams 120 may be made of a flexible or rigid material.

That is, in the deformation measuring sensor 100, a deformation rate is not measured by attaching a separate deformation structure on the substrate, but a plurality of beams 120 may be formed on the substrate body and used as the deformation structure.

In the strain measurement sensor 100, both ends of the beam 120 are attached to the frame 110, and thus the strain according to the pressure is greatest at the center thereof. Accordingly, it is preferable that the measurement center of the strain gage 130 is positioned at the center of each beam 120. [

At this time, the beam 120 is easy to measure the strain according to the pressure, the column, the cylinder, the pyramid truncated end, both ends of the pillar is thinner than the other part, both ends are thicker than the other part, one in the longitudinal direction It can have various shapes, such as a pillar which has the above gradient shape.

The wiring 131 which transmits the measured signal to the strain gauge 130 is connected to the back or inside of the substrate through a wiring hole located in the frame 110 or an edge of the frame 110 and a through space located between the plurality of beams 120. It is connected to the conductor circuit of the back.

Since the shape of the plurality of beams 120 in the strain measurement sensor 100 are spaced apart from each other, and both ends have a structure connected to the frame, the strain gauge is attached to a general planar substrate to measure the strain compared to the case of measuring strain. Accordingly the strain is remarkably improved.

In addition, the deformation measuring sensor 100 may have a shape of a plurality of beams 120, and may detect which part of each beam 120 is pressurized by comparing strains in each beam.

In addition, since the substrate body itself is used as the deformation structure, the thickness of the deformation measurement sensor 100 is reduced, and since the deformation structure is a beam 120 positioned apart from the planar structure, the size of the entire sensor 100 is reduced. Measurement accuracy is improved.

That is, when the strain gauge is placed on the planar structure to measure the strain according to the pressure, the strain due to the pressure is not large as a whole, the measurement accuracy is lowered. In addition, it is difficult to measure the pressure at a multi-point because it is advantageous to measure the strain at the edge of the substrate while the strain is relatively large at the center of the substrate and the strain gauge is located at the center of the substrate.

On the other hand, in the strain measurement sensor 100 of the first embodiment, not only the position where the pressure is applied by measuring the strain in each beam 120 can be checked, but also the strain gauge 130 of the center portion of each beam 120 There is an advantage that the strain measurement performance is relatively uniform.

2 is a block diagram of a substrate-type deformation measurement sensor 200 according to a second embodiment of the present invention. The deformation measurement sensor 200 of the second embodiment is an embodiment in which the shapes of the deformation measurement sensor 100 and the plurality of beams 120 of the first embodiment are different. Hereinafter, the deformation measuring sensor 200 of the second embodiment will be described with reference to a part having a difference compared with the deformation measuring sensor 100 of the first embodiment.

Referring to FIG. 2, the strain measurement sensor 200 of the second embodiment includes a frame 110, a plurality of beams 120, and a strain gauge 130.

The frame 110 has a space penetrating the center of the frame 110 to surround the plurality of beams 120.

The plurality of beams 120 are formed to be spaced apart in a penetrating shape of the frame 110 in the form of a support beam, and have two sub beams 121 and 122 cut off at the center thereof.

Strain gauge 130 is located in each of the sub-beams (121, 122) to measure the strain of each of the sub-beams (121, 122).

In the strain measurement sensor 200, the frame 110 and the sub beams 121 and 122 may be formed in a manner of forming a through shape by drilling a hole in the substrate body itself of a printed circuit board such as a PCB or an FPCB. same.

In the strain measurement sensor 200, a strain according to pressure is the largest at a portion where the sub beams 121 and 122 are connected to the frame 110. Accordingly, it is preferable that the strain gage 130 is located at the center of strain measurement.

In the strain measurement sensor 200 of the second embodiment, each of the plurality of beams 120 includes two sub-beams 121 and 122, through which the strain at two portions where the beam 120 is attached to the frame 110. Since it can be measured, it is easy to detect the pressure applied to a plurality of points.

Since the configuration and effects thereof of the deformation measurement sensor 200 of the second embodiment are similar to those of the deformation measurement sensor 100 of the first embodiment, description thereof will be omitted.

3 is a block diagram of a substrate-type deformation measurement sensor 300 according to a third embodiment of the present invention. The deformation measurement sensor 300 of the third embodiment is an embodiment configured by arranging the deformation measurement sensors 100 according to the first embodiment.

Referring to FIG. 3, the strain measurement sensor 300 of the third embodiment includes a frame 110, a plurality of beams 120, and a strain gauge 130.

In FIG. 3, the plurality of beams 120 are attached to both ends of the frame 110 and are spaced apart from each other with a through space of the substrate interposed therebetween. At this time, as the strain measurement sensor 300 of the third embodiment takes the form of arranging the plurality of strain measurement sensors 100, the plurality of beams 120 is a single beam 120 M × N matrix (M, N Is a natural number).

At this time, the substrate may be made of a PCB or FPCB material, and thus the substrate body including the frame 110 and the plurality of beams 120 may be made of a flexible or rigid material.

The plurality of beams 120 may include, for example, a prismatic column, a cylinder, a pyramid whose end is cut, a pillar thinner than other portions at both ends, a pillar thicker than the other portions at both ends, and one or more gradient shapes in the longitudinal direction. It may have a shape such as a pillar having.

The deformation measuring sensor 300 of the third embodiment has an advantage of measuring the pressure applied to a plurality of points in a wider space than the first and second embodiments.

Since the configuration and effects thereof of the deformation measurement sensor 300 according to the third embodiment are similar to those of the deformation measurement sensor 100 of the first embodiment and the deformation measurement sensor 200 of the second embodiment, a description thereof will be omitted. Shall be.

4 is a configuration diagram of the substrate-type deformation measurement sensor 400 according to the fourth embodiment of the present invention, FIG. 5 is a configuration diagram of the substrate-type deformation measurement sensor 500 according to the fifth embodiment, and FIG. A configuration diagram of the signal processing module 140 included in the strain measurement sensors 400 and 500 is shown.

4 to 5, the substrate type strain measurement sensors 400 and 500 may include a frame 110, a plurality of beams 120, a strain gauge 130, and a signal processing module 140.

The frame 110 has a space penetrating the center of the frame 110 to surround the plurality of beams 120.

The plurality of beams 120 are formed in the form of a supporting beam in a perforated shape of the frame 110. At this time, each of the plurality of beams 120 is spaced apart from one another.

The strain gauge 130 is located in a plurality of beams 120 to measure the strain of each of the beams 120. The wiring 131 of the strain gauge 130 is connected to a conductor circuit such as the back or the inside of the substrate through the wiring hole 132.

The signal processing module 140 is a structure for processing the signal of the strain gage 130.

In the strain measurement sensor 400 of the fourth exemplary embodiment, the signal processing module 140 exists on the same substrate as the substrate body of the strain measurement sensor 400, and the strain measured by the strain gauge 130 through the conductor circuit of the substrate. Receive a measurement signal. The configuration of the strain measurement sensor 400 facilitates the fabrication of the strain measurement sensor 400 including the signal processing module 140.

On the other hand, in the deformation measuring sensor 500 of the fifth embodiment, the signal processing module 140 is present on a substrate separate from the substrate body including the frame 110 and the plurality of beams 120 and strained through connection wirings. The gauge 130 receives the strain measurement signal measured. According to the configuration of the strain measurement sensor 500, since each substrate does not have to exist on the same plane, installation of the strain measurement sensor 500 is facilitated.

Referring to FIG. 6, the signal processing module 140 includes an amplification unit 141, a signal processing unit 142, and an offset adjustment unit 143.

The amplifying unit 141 amplifies the signal of the strain gage 130 formed of a thin film semiconductor or the like, thereby amplifying the signal of the strain gage 130 to such an extent that it can properly analyze it. The amplified signal is transmitted to the signal processing unit 142 or the offset adjustment unit 143.

The signal processing unit 142 receives the amplified signal from the amplifying unit 141 and digitizes it. That is, when the strain gauge 130 transmits the sensing information, the signal processing unit 142 may digitize the sensing information to control the pressure generated in the plurality of beams 120 to be numerical values.

The offset adjustment unit 143 is configured to process the sensing information offset of the strain gage 130. [ For example, a strain gage 130 of a thin film semiconductor type may experience deformation in the course of attaching to a plurality of beams 120. Thus, the strain gage 130 performs resistance sensing in the absence of pressure, and the offset adjustment unit supports initialization according to the result of the sensing. This process improves the measurement error when measuring strain due to pressure.

It should be noted that the embodiments disclosed in the present specification and drawings are only illustrative of specific examples for the purpose of understanding, and are not intended to limit the scope of the present invention. It will be apparent to those skilled in the art that other modifications based on the technical idea of the present invention are possible in addition to the embodiments disclosed herein.

100, 200, 300, 400, 500: strain sensor
110: frame
120: beam
130: Strain gauge
131: Wiring
132: wiring hole
140: Signal processing module
141:
142:
143:

Claims (8)

A substrate body having a frame having a center penetrating space and a plurality of beams positioned at the penetrating space and connected to both ends of the frame and spaced apart from each other; And
A strain gauge attached to the beam to measure a strain of the beam;
Lt; / RTI >
The plurality of beams is a substrate-type strain measurement sensor, characterized in that formed in the form of a single beam arranged in an M x N matrix (M, N is a natural number). delete The method of claim 1,
And said substrate body is made of a flexible or rigid material. The method of claim 1,
And said beam has two sub-beams, one end of which is connected to the frame, the center being disconnected. The method of claim 1,
The beam is formed of at least one of a pillar, a cylinder, a pyramid with a truncated end, a pillar thinner than the other end, a pillar thicker than the other end, and a column having one or more gradient shapes in the longitudinal direction. Substrate-type strain measurement sensor characterized in that. The method of claim 1,
A signal processing module located on an integrated substrate with the substrate body or on a separate substrate to process a signal according to the strain measured by the strain gauge;
Substrate-type deformation measurement sensor further comprises. The method according to claim 6,
The signal processing module
An amplifying unit for amplifying a signal transmitted from the strain gauge;
A signal processing unit for digitizing a signal transmitted by the amplifying unit; And
An offset adjusting unit for adjusting the offset of the semiconductor strain gages;
Substrate-shaped strain measurement sensor comprising at least one of. A frame in the form of a substrate having a space therethrough; And
A plurality of beams positioned in the penetrated space and connected to both ends in a support beam shape, spaced apart from each other, and attached to a strain gauge for measuring strain;
/ RTI >
The plurality of beams is a substrate body of a substrate-type strain measurement sensor, characterized in that the single beam arranged in a form of M x N matrix (M, N is a natural number).

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