KR101358256B1 - Array substrate for liquid crystal display device - Google Patents

Abstract

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device, and more particularly, to an array substrate for a liquid crystal display device capable of easily removing unnecessary charges such as static electricity generated during an array substrate inspection process.

A feature of the present invention is to form a probe test wiring in which an external lightning rod pattern is formed and an inner tube lightning rod pattern corresponding to the external lightning rod pattern on the test pad.

Accordingly, the static electricity generated in the process of separating the contact pin of the needle frame from the test pad during the auto probe inspection process can be discharged and discharged through the outer and inner tube lightning arrester patterns, thereby destroying the thin film transistor. In addition, the disconnection and short-circuit of the gate and data wiring may prevent cross talk or afterimage on the LCD screen.

Auto probe, needle frame, test pad, liquid crystal display

Description

Array substrate for liquid crystal display device

1 is a process flowchart showing a liquid crystal cell process for a liquid crystal display step by step.

FIG. 2 is a view schematically showing an example of an auto probe process of a liquid crystal cell for a general small liquid crystal display device; FIG.

3 is a plan view schematically showing a small liquid crystal cell according to an embodiment of the present invention.

4a to 4b schematically illustrate various structures of an inner tube lightning rod pattern of a test pad;

Description of the Related Art

107: test pad 109: internal lightning rod pattern

130: probe test wiring 131: external lightning rod pattern

GP, DP: Gates and Data Pads

GL, DL: Gate and Data Wiring

AD: Active area PD: Pad part

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device, and more particularly, to an array substrate for a liquid crystal display device capable of easily removing unnecessary charges such as static electricity generated during an array substrate inspection process.

Cathode ray tube (CRT), which is one of the widely used display devices, has been mainly used for monitors such as TVs, measuring devices, and information terminal devices. However, due to the large weight or volume of CRT itself, the miniaturization of electronic products It could not respond actively to the demand for weight reduction.

In order to replace the CRT, flat panel displays such as liquid crystal display devices (LCDs) and plasma display panel devices (PDPs), which have advantages of small size and light weight, are actively used. Has been developed.

Among them, the liquid crystal display device has a liquid crystal panel in which a pair of transparent substrates are bonded together with liquid crystals interposed therebetween as an essential component.

1 is a process flowchart showing a process step by step of a manufacturing process of a liquid crystal panel for a liquid crystal display device.

As illustrated, the first step St 1 is a process for removing foreign substances that may exist on the substrate after forming the upper substrate as the color filter substrate and the lower substrate as the array substrate, before applying the alignment layer. Initial cleaning

The second step St 2 is a step of forming an alignment layer on the color filter substrate and the array substrate, and the third step St 3 prevents the liquid crystal to be interposed between the color filter substrate and the array substrate. A process of printing a pattern and dispersing a spacer having a constant size to precisely and uniformly maintain a gap between the color filter substrate and the array substrate.

The fourth step St 4 is a step of dropping the liquid crystal onto one of the selected substrates, and the fifth step St 5 is a step of bonding the color filter substrate and the array substrate. The sixth step (St 6) for performing the auxiliary inspection process in the state of the substrate.

The auxiliary inspection process is performed through visual observation or microscopic observation while applying a voltage to a gate and a data wiring formed in the liquid crystal cell through an inspection pad formed at an outer portion of the cell.

The auxiliary inspection process is an visual inspection for observing stains, etc. appearing on the screen, and may inspect stains that may occur on the screen due to large foreign matter or rubbing defects.

However, there is a limit to the defects that can be detected through the secondary inspection process as described above. For example, line defects and point defects such as short circuits and disconnections cannot be detected.

The seventh step St 7 is a step of cutting the substrate in cell units, and finally, a main inspection process of the liquid crystal panel, and a more precise inspection process than the auxiliary inspection process in the sixth step St 6. The auto probe inspection of the electric signal application method is performed.

The auto probe inspection is a process for detecting line defects and point defects that are not detected in the auxiliary inspection process, and substantially simulates the liquid crystal panel by supplying voltage to the inspection terminals exposed to the outside. Each defect is detected by driving with.

The liquid crystal cell of good quality is selected through the auto probe inspection process.

2 is a view schematically showing an example of an auto probe process of a liquid crystal cell for a general small liquid crystal display device.

As illustrated, the liquid crystal cell 10 includes a lower array substrate 1 and an upper color filter substrate 3 in which a plurality of pixels are arranged in a matrix through gates and data wirings (not shown). (Not shown) are bonded to each other with the array substrate 1 interposed therebetween. At this time, the array substrate 1 has a larger area than the color filter substrate 3 so that one edge of the array substrate 1 is exposed to the outside.

As such, there are a plurality of gates and data pads GP and DP connected to the gate and the data line (not shown) at one edge of the array substrate 1 exposed to the outside.

The liquid crystal cell 10 applies a test signal to the gate and the data wiring (not shown) through the gate and the data pads GP and DP before the driving unit (not shown) is coupled to the liquid crystal cell 10. Check for abnormalities.

The test signal is applied through a test pad 7 connected to gates and data pads GP and DP. In order to proceed with the auto probe inspection process, a needle frame (or a needle frame) is applied to the test pad 7. By contacting the contact pins 21 of 20), test signals are applied to the respective gates and data wirings (not shown) to check the lighting state of each pixel to check whether the liquid crystal cell 10 is defective.

However, the following problem occurs in the liquid crystal cell 10 having the above structure.

That is, after checking whether the liquid crystal cell 10 is defective through the auto probe inspection, static electricity is generated when the contact pin 21 of the needle frame 20 is separated from the test pad 7. .

Such static electricity is an important cause of deterioration of the image quality of the liquid crystal display due to cross talk or afterimage on the screen of the liquid crystal display due to the destruction of the thin film transistor or the disconnection and short circuit of the gate and data wiring (not shown). .

The present invention is to solve the above problems, by eliminating the static electricity generated during the array substrate inspection process, the cross-talk (crosstalk) on the screen of the liquid crystal display due to the destruction of the thin film transistor or the disconnection and short circuit of the gate and data wiring It aims to prevent the occurrence of talk or afterimage in advance.

In order to achieve the object as described above, the present invention comprises: a substrate comprising an active region and an inactive region, respectively; A plurality of first and second wirings arranged on the active area to cross each other; A driving element configured in an area where the first and second wirings cross each other; A first pad connected to the first wiring and configured at each end of the first wiring; A test pad connected to the first pad and formed in a first direction and having a first lightning rod pattern; The present invention provides an array substrate for a liquid crystal display device comprising a probe test wiring formed in a second direction perpendicular to the first direction and having a second lightning rod pattern formed thereon.

In this case, the second pad connected to the second wiring may be formed in parallel with the first pad, and the probe test wiring may be configured to be adjacent to one side of each test pad.

In addition, the first and second lightning rod patterns are opposed to each other, characterized in that configured to be spaced apart by a predetermined interval, characterized in that the plurality of first and second lightning rod patterns are configured.

In this case, the test pad may include a conductive layer and a transparent electrode layer formed on the conductive layer, wherein the second lightning rod pattern is formed by extending the conductive layer, or the second lightning rod pattern is the transparent electrode layer. It is characterized by extending to form.

Hereinafter, embodiments according to the present invention will be described in detail with reference to the drawings.

3 is a plan view schematically illustrating a liquid crystal cell according to an exemplary embodiment of the present invention.

As shown in the drawing, an active area AD including gate lines GL and data lines DL, gates and data pads GP and DP, and respective gates and data pads GP and DP are provided on the array substrate 110. The test pad 107 connected to) is divided into a configured pad part area PD.

The gate and the data lines GL and DL of the active area AD vertically cross each other, and a thin film transistor is formed at the intersection of the two lines GL and DL, and the gate and the data pads GP and DP. ) Is connected to the gate and data lines GL and DL to apply respective signals to the gate and data lines GL and DL.

In this case, the test pad 107 connected to the gate and the data pads GP and DP is configured to be parallel to the data line DL, and the length of the pad portion region PD is perpendicular to the test pad 107. Probe test wiring 130 is configured along the direction.

In this case, an external lightning rod pattern 131 is formed on the probe test wiring 130, and an inner tube lightning rod pattern 109 is formed on each test pad 107. , 109 are formed spaced apart from each other to face each other.

In this case, although not shown in detail, the thin film transistor includes a gate electrode, a source and drain electrode, an active layer, an ohmic contact layer, and the like.

In this case, when the gate signal is applied to the gate electrode through the gate line GL, the thin film transistor is operated such that the data signal applied to the data line DL is transferred from the source electrode to the drain electrode through the active layer.

Through this, the molecular arrangement of the liquid crystal (not shown) is changed, and the image is realized by controlling the image of the liquid crystal display device according to the signal applied to each pixel.

Accordingly, various test processes are performed to determine whether each of the gates, the data lines GL and DL, and the thin film transistors operate properly. The test pads connected to the gates and the data pads GP and DP may be used. 107) by contacting the contact pin (not shown) of the needle frame (not shown) to apply a test signal to each gate and data wiring (GL, DL) to determine the lighting state of each pixel to determine whether the liquid crystal cell Will be examined.

At this time, after the inspection process is completed, the static electricity is generated in the process of separating the contact pin (not shown) of the needle frame (not shown) from the test pad 107, the static electricity to the test pad 107 The inner lightning rod pattern 109 is configured to be transferred to the external lightning rod pattern 131 of the probe test wiring 130 to be discharged or neutralized.

In more detail, the static electricity generated in the process of separating the contact pin (not shown) of the needle frame (not shown) from the test pad 107 is the inner lightning rod pattern 109 of the test pad 107. It is concentrated in a part, which is a point discharge phenomenon in which electricity is concentrated at a point on the surface of a conductor, and a lightning rod on the roof is also used.

As such, the static electricity concentrated on the inner lightning rod pattern 109 of the test pad 107 is concentrated on the conductor surface, and the current is concentrated on the corner portion. ) Flows to the external lightning rod pattern 131, and the static electricity transferred to the external lightning rod pattern 131 is discharged through the probe test wiring 130.

On the other hand, the inner tube lightning rod pattern 109 is shown so that one is projected on the plan view from one edge of the test pad 107, which may be configured for a rapid discharge of static electricity.

4A to 4B schematically illustrate various structures of an inner tube lightning rod pattern of a test pad.

As shown in FIG. 4A, the test pad 107 includes a conductive layer 101 constituting the gate and data wirings (GL and DL in FIG. 3) and an insulating layer formed on the conductive layer 101. And a transparent electrode layer 103 formed on the insulating layer (not shown).

A contact hole 105 is formed in the insulating layer (not shown) so that the conductive layer 101 and the transparent electrode layer 103 are electrically connected.

At this time, one side of the conductive layer 101 is formed with an inner lightning rod pattern 109 extending the conductive layer 101, the transparent electrode layer 103 has a wide width to cover the conductive layer 101 Although configured to have, the inner tube lightning rod pattern 109 is formed to partially expose, so that the static electricity collected in the inner tube lightning rod pattern 109 is not transferred to the transparent electrode layer 103.

In addition, as illustrated in FIG. 4B, an inner tube lightning arrester pattern 109 may be formed of the transparent electrode layer 103.

As described above, an inner tube lightning rod pattern 109 is formed on the probe test wiring (130 in FIG. 3) and the test pad 107 on which the outer portion lightning rod pattern (131 of FIG. 3) is formed, and during the auto probe inspection process. By discharging the static electricity generated in the process of separating the contact pin (not shown) of the needle frame (not shown) from the test pad 107, destruction of the thin film transistor or gate and data wiring (GL, DL of FIG. 3). Cross talk or afterimage on the screen of the liquid crystal display is prevented due to disconnection and short circuit.

The present invention is not limited to the above-described embodiments, and various modifications may be made without departing from the spirit of the present invention.

As described above, according to the present invention, the probe test wiring having the external lightning rod pattern formed therein and an inner tube lightning rod pattern corresponding to the external lightning rod pattern are formed on the test pad to form contact pins of the needle frame during the auto probe inspection process. By eliminating the static electricity generated in the process of separating from the test pad, it is possible to prevent cross talk or afterimage on the screen of the liquid crystal display due to destruction of the thin film transistor or disconnection and short circuit of the gate and data wiring. It is effective.

Claims (8)

A substrate comprising an active region and an inactive region, respectively; A plurality of first and second wirings arranged on the active area to cross each other; A driving element configured in an area where the first and second wirings cross each other; A first pad connected to the first wiring and configured at each end of the first wiring; A test pad connected to the first pad and formed in a first direction, respectively, and having a first lightning rod pattern formed thereon; A probe test wiring formed in a second direction perpendicular to the first direction and having a second lightning rod pattern corresponding to the first lightning rod pattern; The test pad includes a conductive layer and a transparent electrode layer formed on the conductive layer. The method of claim 1, And a second pad connected to the second wiring is formed parallel to the first pad. The method of claim 1, And the probe test wiring is configured to be adjacent to one side of each of the test pads. The method of claim 1, And the first and second lightning arrester patterns are opposed to each other and spaced apart from each other by a predetermined interval. The method of claim 1, And a plurality of first and second lightning arrester patterns. delete The method of claim 1, And the first lightning rod pattern is formed by extending the conductive layer. The method of claim 1, And the first lightning rod pattern is formed by extending the transparent electrode layer.

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